{"id":"https://openalex.org/W3003494533","doi":"https://doi.org/10.1109/ieem44572.2019.8978943","title":"Bayesian Estimation Method for Storage Reliability Based on Drift Brownian Motion","display_name":"Bayesian Estimation Method for Storage Reliability Based on Drift Brownian Motion","publication_year":2019,"publication_date":"2019-12-01","ids":{"openalex":"https://openalex.org/W3003494533","doi":"https://doi.org/10.1109/ieem44572.2019.8978943","mag":"3003494533"},"language":"en","primary_location":{"id":"doi:10.1109/ieem44572.2019.8978943","is_oa":false,"landing_page_url":"https://doi.org/10.1109/ieem44572.2019.8978943","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2019 IEEE International Conference on Industrial Engineering and Engineering Management (IEEM)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5073981525","display_name":"Xue\u2010Song Yang","orcid":"https://orcid.org/0000-0003-4269-9414"},"institutions":[{"id":"https://openalex.org/I82880672","display_name":"Beihang University","ror":"https://ror.org/00wk2mp56","country_code":"CN","type":"education","lineage":["https://openalex.org/I82880672"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Xuesong Yang","raw_affiliation_strings":["School of Reliability and Systems Engineering, Beihang University,Beijing,China","School of Reliability and Systems Engineering, Beihang University, Beijing, China"],"affiliations":[{"raw_affiliation_string":"School of Reliability and Systems Engineering, Beihang University,Beijing,China","institution_ids":["https://openalex.org/I82880672"]},{"raw_affiliation_string":"School of Reliability and Systems Engineering, Beihang University, Beijing, China","institution_ids":["https://openalex.org/I82880672"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5081401451","display_name":"Shunong Zhang","orcid":null},"institutions":[{"id":"https://openalex.org/I82880672","display_name":"Beihang University","ror":"https://ror.org/00wk2mp56","country_code":"CN","type":"education","lineage":["https://openalex.org/I82880672"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Shunong Zhang","raw_affiliation_strings":["School of Reliability and Systems Engineering, Beihang University,Beijing,China","School of Reliability and Systems Engineering, Beihang University, Beijing, China"],"affiliations":[{"raw_affiliation_string":"School of Reliability and Systems Engineering, Beihang University,Beijing,China","institution_ids":["https://openalex.org/I82880672"]},{"raw_affiliation_string":"School of Reliability and Systems Engineering, Beihang University, Beijing, China","institution_ids":["https://openalex.org/I82880672"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5100726965","display_name":"Honglin Wang","orcid":"https://orcid.org/0000-0001-8863-9973"},"institutions":[{"id":"https://openalex.org/I82880672","display_name":"Beihang University","ror":"https://ror.org/00wk2mp56","country_code":"CN","type":"education","lineage":["https://openalex.org/I82880672"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Honglin Wang","raw_affiliation_strings":["School of Reliability and Systems Engineering, Beihang University,Beijing,China","School of Reliability and Systems Engineering, Beihang University, Beijing, China"],"affiliations":[{"raw_affiliation_string":"School of Reliability and Systems Engineering, Beihang University,Beijing,China","institution_ids":["https://openalex.org/I82880672"]},{"raw_affiliation_string":"School of Reliability and Systems Engineering, Beihang University, Beijing, China","institution_ids":["https://openalex.org/I82880672"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5073981525"],"corresponding_institution_ids":["https://openalex.org/I82880672"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.23501719,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"1193","last_page":"1198"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10780","display_name":"Reliability and Maintenance Optimization","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10780","display_name":"Reliability and Maintenance Optimization","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12423","display_name":"Software Reliability and Analysis Research","score":0.9850000143051147,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10968","display_name":"Statistical Distribution Estimation and Applications","score":0.9800999760627747,"subfield":{"id":"https://openalex.org/subfields/2613","display_name":"Statistics and Probability"},"field":{"id":"https://openalex.org/fields/26","display_name":"Mathematics"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.7032074332237244},{"id":"https://openalex.org/keywords/bayesian-probability","display_name":"Bayesian probability","score":0.6296274065971375},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.606896698474884},{"id":"https://openalex.org/keywords/brownian-motion","display_name":"Brownian motion","score":0.5375492572784424},{"id":"https://openalex.org/keywords/estimation","display_name":"Estimation","score":0.48689261078834534},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.3601037561893463},{"id":"https://openalex.org/keywords/statistical-physics","display_name":"Statistical physics","score":0.3291242718696594},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.327232301235199},{"id":"https://openalex.org/keywords/statistics","display_name":"Statistics","score":0.2646401822566986},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.20829090476036072},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.12384748458862305},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.12212219834327698}],"concepts":[{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.7032074332237244},{"id":"https://openalex.org/C107673813","wikidata":"https://www.wikidata.org/wiki/Q812534","display_name":"Bayesian probability","level":2,"score":0.6296274065971375},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.606896698474884},{"id":"https://openalex.org/C112401455","wikidata":"https://www.wikidata.org/wiki/Q178036","display_name":"Brownian motion","level":2,"score":0.5375492572784424},{"id":"https://openalex.org/C96250715","wikidata":"https://www.wikidata.org/wiki/Q965330","display_name":"Estimation","level":2,"score":0.48689261078834534},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.3601037561893463},{"id":"https://openalex.org/C121864883","wikidata":"https://www.wikidata.org/wiki/Q677916","display_name":"Statistical physics","level":1,"score":0.3291242718696594},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.327232301235199},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.2646401822566986},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.20829090476036072},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.12384748458862305},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.12212219834327698},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C201995342","wikidata":"https://www.wikidata.org/wiki/Q682496","display_name":"Systems engineering","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/ieem44572.2019.8978943","is_oa":false,"landing_page_url":"https://doi.org/10.1109/ieem44572.2019.8978943","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2019 IEEE International Conference on Industrial Engineering and Engineering Management (IEEM)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/12","score":0.4099999964237213,"display_name":"Responsible consumption and production"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":10,"referenced_works":["https://openalex.org/W1995723008","https://openalex.org/W2049045003","https://openalex.org/W2067266460","https://openalex.org/W2089359439","https://openalex.org/W2106023863","https://openalex.org/W2166604047","https://openalex.org/W2310466376","https://openalex.org/W2374639179","https://openalex.org/W4210828853","https://openalex.org/W6675619911"],"related_works":["https://openalex.org/W2033512842","https://openalex.org/W4322734194","https://openalex.org/W4233600955","https://openalex.org/W2913665393","https://openalex.org/W2369695847","https://openalex.org/W3005535424","https://openalex.org/W2994319598","https://openalex.org/W2047067935","https://openalex.org/W1607054433","https://openalex.org/W2110842462"],"abstract_inverted_index":{"At":[0],"present,":[1],"many":[2],"products":[3,18,26],"have":[4],"the":[5,14,41,44,59,63,66,84,91,119,131,134,153,167,173,177,181,188,195,199,203,211,217,220,222,228,232,238,241,247,252,255],"characteristics":[6],"of":[7,17,34,43,50,65,68,90,123,133,156,176,190,202,216,240,246,254],"\u201clong-term":[8],"storage,":[9],"one-time":[10],"use\u201d.":[11],"Therefore,":[12],"evaluating":[13],"storage":[15,60,93,212,233],"reliability":[16,61,213,234],"has":[19],"become":[20],"a":[21,31,76],"hot":[22],"topic.":[23],"However,":[24],"for":[25,30],"that":[27,143],"are":[28,99],"stored":[29],"long":[32,92],"period":[33],"time,":[35,94],"it":[36,54,148],"is":[37,55,139,170,207,225,235,249],"difficult":[38],"to":[39,48,57,102,112,117,152,186,193,209],"determine":[40],"distribution":[42,179],"product":[45],"life":[46,215],"due":[47],"lack":[49],"using":[51],"data,":[52],"so":[53,184],"considered":[56],"analyze":[58],"from":[62],"viewpoint":[64],"amount":[67],"performance":[69,72],"degradation.":[70],"The":[71,106,136,162,244],"degradation":[73,104,239],"process":[74,79,132,155],"as":[75,172,185,227],"continuous":[77],"random":[78],"can":[80,149],"be":[81,113,150],"described":[82],"by":[83,237,251],"drift":[85],"Brownian":[86],"motion.":[87],"In":[88,219],"view":[89],"variable":[95],"stress":[96,160,169],"accelerated":[97],"experiments":[98],"usually":[100],"used":[101,171],"obtain":[103],"data.":[105],"data":[107,157,192],"under":[108,158,166,180],"different":[109,159],"stresses":[110],"need":[111],"integrated":[114],"in":[115,130],"order":[116],"calculate":[118],"final":[120,200],"estimation":[121,141,164,196],"value":[122,201],"parameters,":[124],"which":[125],"will":[126],"inevitably":[127],"cause":[128],"errors":[129],"integration.":[135],"Bayesian":[137],"method":[138,142,248],"an":[140],"considers":[144],"prior":[145,174],"information,":[146],"thus":[147],"applied":[151],"integration":[154],"conditions.":[161],"parameter":[163,178],"obtained":[165],"previous":[168],"information":[175],"next":[182],"stress,":[183],"maximize":[187],"use":[189],"experimental":[191],"reduce":[194],"error.":[197],"Then,":[198],"acceleration":[204],"model":[205],"parameters":[206],"fitted":[208],"evaluate":[210],"and":[214,231],"product.":[218],"case,":[221],"solder":[223,256],"joint":[224,257],"taken":[226],"research":[229],"object,":[230],"evaluated":[236],"shear":[242],"strength.":[243],"feasibility":[245],"demonstrated":[250],"application":[253],"case.":[258]},"counts_by_year":[],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}