{"id":"https://openalex.org/W2911206175","doi":"https://doi.org/10.1109/ieem.2018.8607807","title":"Reliability Assessment for Multi-area Load Frequency Control Systems with Degraded Components","display_name":"Reliability Assessment for Multi-area Load Frequency Control Systems with Degraded Components","publication_year":2018,"publication_date":"2018-12-01","ids":{"openalex":"https://openalex.org/W2911206175","doi":"https://doi.org/10.1109/ieem.2018.8607807","mag":"2911206175"},"language":"en","primary_location":{"id":"doi:10.1109/ieem.2018.8607807","is_oa":false,"landing_page_url":"https://doi.org/10.1109/ieem.2018.8607807","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2018 IEEE International Conference on Industrial Engineering and Engineering Management (IEEM)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5049315434","display_name":"Zhiying Wu","orcid":"https://orcid.org/0000-0001-8023-4357"},"institutions":[{"id":"https://openalex.org/I126520041","display_name":"University of Science and Technology of China","ror":"https://ror.org/04c4dkn09","country_code":"CN","type":"education","lineage":["https://openalex.org/I126520041","https://openalex.org/I19820366"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Zhiying Wu","raw_affiliation_strings":["Department of Automation, University of Science and Technology of China, Hefei, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Automation, University of Science and Technology of China, Hefei, China","institution_ids":["https://openalex.org/I126520041"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5061835916","display_name":"Huadong Mo","orcid":"https://orcid.org/0000-0002-7782-2884"},"institutions":[{"id":"https://openalex.org/I35440088","display_name":"ETH Zurich","ror":"https://ror.org/05a28rw58","country_code":"CH","type":"education","lineage":["https://openalex.org/I2799323385","https://openalex.org/I35440088"]}],"countries":["CH"],"is_corresponding":false,"raw_author_name":"Huadong Mo","raw_affiliation_strings":["Institute of Energy Technology ETH Zurich, Zurich, Switzerland"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Institute of Energy Technology ETH Zurich, Zurich, Switzerland","institution_ids":["https://openalex.org/I35440088"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5021953090","display_name":"Junlin Xiong","orcid":"https://orcid.org/0000-0002-0128-4960"},"institutions":[{"id":"https://openalex.org/I126520041","display_name":"University of Science and Technology of China","ror":"https://ror.org/04c4dkn09","country_code":"CN","type":"education","lineage":["https://openalex.org/I126520041","https://openalex.org/I19820366"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Junlin Xiong","raw_affiliation_strings":["Department of Automation, University of Science and Technology of China, Hefei, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Automation, University of Science and Technology of China, Hefei, China","institution_ids":["https://openalex.org/I126520041"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":3,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.15981615,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"1130","last_page":"1134"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12277","display_name":"Frequency Control in Power Systems","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12277","display_name":"Frequency Control in Power Systems","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11941","display_name":"Power System Reliability and Maintenance","score":0.9749000072479248,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10305","display_name":"Power System Optimization and Stability","score":0.9735000133514404,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.7679315805435181},{"id":"https://openalex.org/keywords/automatic-frequency-control","display_name":"Automatic frequency control","score":0.7318598031997681},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.6203979253768921},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5964742302894592},{"id":"https://openalex.org/keywords/degradation","display_name":"Degradation (telecommunications)","score":0.540501594543457},{"id":"https://openalex.org/keywords/monte-carlo-method","display_name":"Monte Carlo method","score":0.49674898386001587},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.25746577978134155},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.1286778450012207},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.07350519299507141}],"concepts":[{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.7679315805435181},{"id":"https://openalex.org/C25915539","wikidata":"https://www.wikidata.org/wiki/Q220786","display_name":"Automatic frequency control","level":2,"score":0.7318598031997681},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.6203979253768921},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5964742302894592},{"id":"https://openalex.org/C2779679103","wikidata":"https://www.wikidata.org/wiki/Q5251805","display_name":"Degradation (telecommunications)","level":2,"score":0.540501594543457},{"id":"https://openalex.org/C19499675","wikidata":"https://www.wikidata.org/wiki/Q232207","display_name":"Monte Carlo method","level":2,"score":0.49674898386001587},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.25746577978134155},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.1286778450012207},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.07350519299507141},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.0},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/ieem.2018.8607807","is_oa":false,"landing_page_url":"https://doi.org/10.1109/ieem.2018.8607807","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2018 IEEE International Conference on Industrial Engineering and Engineering Management (IEEM)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7","score":0.8700000047683716}],"awards":[],"funders":[{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":22,"referenced_works":["https://openalex.org/W1489327260","https://openalex.org/W1527446163","https://openalex.org/W1837985488","https://openalex.org/W1972328181","https://openalex.org/W1980093208","https://openalex.org/W1993738843","https://openalex.org/W1998549657","https://openalex.org/W2005096439","https://openalex.org/W2008158708","https://openalex.org/W2016297478","https://openalex.org/W2037422790","https://openalex.org/W2045243564","https://openalex.org/W2055754653","https://openalex.org/W2071080293","https://openalex.org/W2074927285","https://openalex.org/W2116323690","https://openalex.org/W2137801673","https://openalex.org/W2342726990","https://openalex.org/W2345306366","https://openalex.org/W2388038733","https://openalex.org/W2524037503","https://openalex.org/W2756229940"],"related_works":["https://openalex.org/W2033512842","https://openalex.org/W1815542355","https://openalex.org/W4322734194","https://openalex.org/W4233600955","https://openalex.org/W2913665393","https://openalex.org/W2369695847","https://openalex.org/W3005535424","https://openalex.org/W2994319598","https://openalex.org/W2047067935","https://openalex.org/W1607054433"],"abstract_inverted_index":{"The":[0],"paper":[1],"evaluates":[2],"system":[3,103],"reliability":[4,34,82,87],"performance":[5,76],"for":[6,48],"multi-area":[7,49],"load":[8,24,36,50,100],"frequency":[9,21,25,37,51,101],"control":[10,26,38,52,102],"systems":[11,27,39,53],"with":[12,54],"degraded":[13,55],"components.":[14,56],"Some":[15],"key":[16],"components":[17,60],"including":[18],"turbines":[19],"and":[20],"sensors":[22],"in":[23],"suffer":[28],"degradation.":[29],"As":[30],"a":[31,43,72,98],"result,":[32],"the":[33,108,111],"of":[35,59,74,110],"is":[40,46,89,104],"jeopardized.":[41],"First,":[42],"dynamic":[44],"model":[45],"proposed":[47,112],"Degradation":[57],"paths":[58],"are":[61,78],"considered":[62],"as":[63],"unit-to-unit":[64],"variability":[65],"due":[66],"to":[67,80,106],"different":[68],"operation":[69],"environments.":[70],"Then,":[71],"series":[73],"operational":[75],"indicators":[77],"used":[79,105],"quantify":[81],"performance.":[83],"In":[84],"addition,":[85],"quantitative":[86],"analysis":[88],"carried":[90],"out":[91],"using":[92],"Monte":[93],"Carlo":[94],"simulation":[95],"method.":[96,113],"Finally,":[97],"three-area":[99],"demonstrate":[107],"effectiveness":[109]},"counts_by_year":[],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}