{"id":"https://openalex.org/W2909764982","doi":"https://doi.org/10.1109/ieem.2018.8607400","title":"Time-dependent Reliability Modelling Method Based on Load-strength Model in the Presence of Environmental Effects","display_name":"Time-dependent Reliability Modelling Method Based on Load-strength Model in the Presence of Environmental Effects","publication_year":2018,"publication_date":"2018-12-01","ids":{"openalex":"https://openalex.org/W2909764982","doi":"https://doi.org/10.1109/ieem.2018.8607400","mag":"2909764982"},"language":"en","primary_location":{"id":"doi:10.1109/ieem.2018.8607400","is_oa":false,"landing_page_url":"https://doi.org/10.1109/ieem.2018.8607400","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2018 IEEE International Conference on Industrial Engineering and Engineering Management (IEEM)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5004704485","display_name":"Jianchun Zhang","orcid":"https://orcid.org/0000-0001-7024-9547"},"institutions":[{"id":"https://openalex.org/I82880672","display_name":"Beihang University","ror":"https://ror.org/00wk2mp56","country_code":"CN","type":"education","lineage":["https://openalex.org/I82880672"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Jian-Chun Zhang","raw_affiliation_strings":["School of Reliability and Systems Engineering, Beihang University, Beijing, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Reliability and Systems Engineering, Beihang University, Beijing, China","institution_ids":["https://openalex.org/I82880672"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5028345316","display_name":"Yu Zhao","orcid":"https://orcid.org/0000-0003-4198-6251"},"institutions":[{"id":"https://openalex.org/I82880672","display_name":"Beihang University","ror":"https://ror.org/00wk2mp56","country_code":"CN","type":"education","lineage":["https://openalex.org/I82880672"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yu Zhao","raw_affiliation_strings":["School of Reliability and Systems Engineering, Beihang University, Beijing, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Reliability and Systems Engineering, Beihang University, Beijing, China","institution_ids":["https://openalex.org/I82880672"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5032957857","display_name":"Xiaobing Ma","orcid":"https://orcid.org/0000-0002-0913-9012"},"institutions":[{"id":"https://openalex.org/I82880672","display_name":"Beihang University","ror":"https://ror.org/00wk2mp56","country_code":"CN","type":"education","lineage":["https://openalex.org/I82880672"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Xiao-Bing Ma","raw_affiliation_strings":["School of Reliability and Systems Engineering, Beihang University, Beijing, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Reliability and Systems Engineering, Beihang University, Beijing, China","institution_ids":["https://openalex.org/I82880672"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.17216759,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"7","issue":null,"first_page":"1699","last_page":"1703"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10928","display_name":"Probabilistic and Robust Engineering Design","score":0.9993000030517578,"subfield":{"id":"https://openalex.org/subfields/1804","display_name":"Statistics, Probability and Uncertainty"},"field":{"id":"https://openalex.org/fields/18","display_name":"Decision Sciences"},"domain":{"id":"https://openalex.org/domains/2","display_name":"Social Sciences"}},"topics":[{"id":"https://openalex.org/T10928","display_name":"Probabilistic and Robust Engineering Design","score":0.9993000030517578,"subfield":{"id":"https://openalex.org/subfields/1804","display_name":"Statistics, Probability and Uncertainty"},"field":{"id":"https://openalex.org/fields/18","display_name":"Decision Sciences"},"domain":{"id":"https://openalex.org/domains/2","display_name":"Social Sciences"}},{"id":"https://openalex.org/T11371","display_name":"Wind and Air Flow Studies","score":0.9979000091552734,"subfield":{"id":"https://openalex.org/subfields/2305","display_name":"Environmental Engineering"},"field":{"id":"https://openalex.org/fields/23","display_name":"Environmental Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11941","display_name":"Power System Reliability and Maintenance","score":0.982699990272522,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.8314613699913025},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.559030294418335},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.5493476390838623},{"id":"https://openalex.org/keywords/degradation","display_name":"Degradation (telecommunications)","score":0.5256109237670898},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.18996858596801758}],"concepts":[{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.8314613699913025},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.559030294418335},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.5493476390838623},{"id":"https://openalex.org/C2779679103","wikidata":"https://www.wikidata.org/wiki/Q5251805","display_name":"Degradation (telecommunications)","level":2,"score":0.5256109237670898},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.18996858596801758},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.0},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/ieem.2018.8607400","is_oa":false,"landing_page_url":"https://doi.org/10.1109/ieem.2018.8607400","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2018 IEEE International Conference on Industrial Engineering and Engineering Management (IEEM)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.6600000262260437,"display_name":"Life in Land","id":"https://metadata.un.org/sdg/15"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":18,"referenced_works":["https://openalex.org/W1970273369","https://openalex.org/W1971140523","https://openalex.org/W1988166121","https://openalex.org/W1994696526","https://openalex.org/W2051217277","https://openalex.org/W2052942865","https://openalex.org/W2063284386","https://openalex.org/W2063299666","https://openalex.org/W2088906221","https://openalex.org/W2122549219","https://openalex.org/W2152208711","https://openalex.org/W2155534005","https://openalex.org/W2167905626","https://openalex.org/W2317521965","https://openalex.org/W2462225951","https://openalex.org/W2610359854","https://openalex.org/W3008870444","https://openalex.org/W6684634020"],"related_works":["https://openalex.org/W2033512842","https://openalex.org/W1815542355","https://openalex.org/W4322734194","https://openalex.org/W3005535424","https://openalex.org/W4233600955","https://openalex.org/W2913665393","https://openalex.org/W2369695847","https://openalex.org/W2994319598","https://openalex.org/W2047067935","https://openalex.org/W1607054433"],"abstract_inverted_index":{"The":[0],"structural":[1],"performance":[2],"and":[3,12,35,43,94],"reliability":[4,55,71,112],"can":[5],"be":[6,21,46],"affected":[7,83],"by":[8,84],"the":[9,28,31,38,53,60,65,70,77,81,85,89,103,106,110],"strength":[10,36,44],"degradation":[11],"significant":[13],"repetitive":[14],"load":[15,34,42,82,93],"events":[16],"whose":[17],"occurrence":[18,78],"rate":[19,79],"may":[20],"different":[22,24],"in":[23,27,73],"environments.":[25],"Furthermore,":[26],"case":[29],"of":[30,80,105],"environment":[32],"affecting":[33],"simultaneously,":[37],"correlation":[39,91],"analysis":[40,108],"between":[41,92],"should":[45],"considered.":[47],"Therefore,":[48],"this":[49],"paper":[50],"deals":[51],"with":[52],"time-dependent":[54,111],"modelling":[56,113],"problem":[57],"based":[58],"on":[59],"load-strength":[61],"model,":[62],"which":[63],"incorporates":[64],"actual":[66,86],"environmental":[67,107],"effects":[68],"into":[69],"estimation":[72],"two":[74],"ways:":[75],"1)":[76],"environment;":[87],"2)":[88],"variable":[90],"strength.":[95],"A":[96],"numerical":[97],"example":[98],"is":[99],"given":[100],"to":[101],"illustrate":[102],"necessity":[104],"for":[109],"<sup":[114],"xmlns:mml=\"http://www.w3.org/1998/Math/MathML\"":[115],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">1</sup>":[116],".":[117]},"counts_by_year":[],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}