{"id":"https://openalex.org/W2243270099","doi":"https://doi.org/10.1109/ieem.2015.7385773","title":"Importance measurement of performance shaping factors using dynamic reliability indices","display_name":"Importance measurement of performance shaping factors using dynamic reliability indices","publication_year":2015,"publication_date":"2015-12-01","ids":{"openalex":"https://openalex.org/W2243270099","doi":"https://doi.org/10.1109/ieem.2015.7385773","mag":"2243270099"},"language":"en","primary_location":{"id":"doi:10.1109/ieem.2015.7385773","is_oa":false,"landing_page_url":"https://doi.org/10.1109/ieem.2015.7385773","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2015 IEEE International Conference on Industrial Engineering and Engineering Management (IEEM)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5102794584","display_name":"Zhiqiang Sun","orcid":"https://orcid.org/0000-0002-3815-8888"},"institutions":[{"id":"https://openalex.org/I170215575","display_name":"National University of Defense Technology","ror":"https://ror.org/05d2yfz11","country_code":"CN","type":"education","lineage":["https://openalex.org/I170215575"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Z. Q. Sun","raw_affiliation_strings":["College of Mechatronic Engineering and Automation, National University of Defense Technology, Changsha, P R China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"College of Mechatronic Engineering and Automation, National University of Defense Technology, Changsha, P R China","institution_ids":["https://openalex.org/I170215575"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5061889792","display_name":"Erling Gong","orcid":null},"institutions":[{"id":"https://openalex.org/I170215575","display_name":"National University of Defense Technology","ror":"https://ror.org/05d2yfz11","country_code":"CN","type":"education","lineage":["https://openalex.org/I170215575"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"E. L. Gong","raw_affiliation_strings":["College of Mechatronic Engineering and Automation, National University of Defense Technology, Changsha, P R China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"College of Mechatronic Engineering and Automation, National University of Defense Technology, Changsha, P R China","institution_ids":["https://openalex.org/I170215575"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5100431858","display_name":"Wei Liu","orcid":"https://orcid.org/0000-0002-7612-9391"},"institutions":[{"id":"https://openalex.org/I170215575","display_name":"National University of Defense Technology","ror":"https://ror.org/05d2yfz11","country_code":"CN","type":"education","lineage":["https://openalex.org/I170215575"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"W. Liu","raw_affiliation_strings":["College of Mechatronic Engineering and Automation, National University of Defense Technology, Changsha, P R China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"College of Mechatronic Engineering and Automation, National University of Defense Technology, Changsha, P R China","institution_ids":["https://openalex.org/I170215575"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I170215575"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.11441495,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"20","issue":null,"first_page":"876","last_page":"880"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11357","display_name":"Risk and Safety Analysis","score":0.9993000030517578,"subfield":{"id":"https://openalex.org/subfields/1804","display_name":"Statistics, Probability and Uncertainty"},"field":{"id":"https://openalex.org/fields/18","display_name":"Decision Sciences"},"domain":{"id":"https://openalex.org/domains/2","display_name":"Social Sciences"}},"topics":[{"id":"https://openalex.org/T11357","display_name":"Risk and Safety Analysis","score":0.9993000030517578,"subfield":{"id":"https://openalex.org/subfields/1804","display_name":"Statistics, Probability and Uncertainty"},"field":{"id":"https://openalex.org/fields/18","display_name":"Decision Sciences"},"domain":{"id":"https://openalex.org/domains/2","display_name":"Social Sciences"}},{"id":"https://openalex.org/T10780","display_name":"Reliability and Maintenance Optimization","score":0.9941999912261963,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10876","display_name":"Fault Detection and Control Systems","score":0.982200026512146,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/human-reliability","display_name":"Human reliability","score":0.5834240317344666},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.5813652873039246},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.48291417956352234},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.4436366856098175},{"id":"https://openalex.org/keywords/multiplier","display_name":"Multiplier (economics)","score":0.4224499464035034},{"id":"https://openalex.org/keywords/statistics","display_name":"Statistics","score":0.35135236382484436},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.2834824025630951},{"id":"https://openalex.org/keywords/human-error","display_name":"Human error","score":0.2654895782470703},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.25011491775512695},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.24768254160881042},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.11437344551086426}],"concepts":[{"id":"https://openalex.org/C191147762","wikidata":"https://www.wikidata.org/wiki/Q186289","display_name":"Human reliability","level":3,"score":0.5834240317344666},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.5813652873039246},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.48291417956352234},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.4436366856098175},{"id":"https://openalex.org/C124584101","wikidata":"https://www.wikidata.org/wiki/Q1053266","display_name":"Multiplier (economics)","level":2,"score":0.4224499464035034},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.35135236382484436},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.2834824025630951},{"id":"https://openalex.org/C169806903","wikidata":"https://www.wikidata.org/wiki/Q5937752","display_name":"Human error","level":2,"score":0.2654895782470703},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.25011491775512695},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.24768254160881042},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.11437344551086426},{"id":"https://openalex.org/C162324750","wikidata":"https://www.wikidata.org/wiki/Q8134","display_name":"Economics","level":0,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C139719470","wikidata":"https://www.wikidata.org/wiki/Q39680","display_name":"Macroeconomics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/ieem.2015.7385773","is_oa":false,"landing_page_url":"https://doi.org/10.1109/ieem.2015.7385773","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2015 IEEE International Conference on Industrial Engineering and Engineering Management (IEEM)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":12,"referenced_works":["https://openalex.org/W1506162485","https://openalex.org/W1527595038","https://openalex.org/W1704807589","https://openalex.org/W1906223543","https://openalex.org/W1994786679","https://openalex.org/W2061447396","https://openalex.org/W2068509236","https://openalex.org/W2118200271","https://openalex.org/W2181865584","https://openalex.org/W3149303138","https://openalex.org/W4210651582","https://openalex.org/W7028169482"],"related_works":["https://openalex.org/W2033512842","https://openalex.org/W4322734194","https://openalex.org/W3005535424","https://openalex.org/W4233600955","https://openalex.org/W2913665393","https://openalex.org/W2369695847","https://openalex.org/W2994319598","https://openalex.org/W1607054433","https://openalex.org/W2110842462","https://openalex.org/W4233757488"],"abstract_inverted_index":{"The":[0,27,36,131,184],"component":[1],"dynamic":[2],"reliability":[3,14],"index":[4],"(CDRI)":[5],"for":[6,169],"the":[7,20,44,60,76,79,92,114,137,152,155,162,190,197,200,202],"multi-state":[8],"system":[9],"is":[10,43,70,78,100,117,136,159],"transplanted":[11],"to":[12,18,55,87,145],"human":[13,47,206],"domain,":[15],"and":[16,31,124,172],"used":[17],"evaluate":[19],"importance":[21,37,186],"of":[22,38,46,67,81,94,129,133,139,151,154,199],"performance":[23,96],"shaping":[24],"factors":[25],"(PSF).":[26],"concepts":[28],"about":[29],"PSFs":[30],"CDRI":[32,42,77,107,132],"are":[33],"overviewed":[34],"firstly.":[35],"some":[39,134],"PSF,":[40],"namely,":[41],"probability":[45,49,80,138],"error":[48,207],"(HEP)":[50],"changing":[51],"from":[52,84,142],"one":[53,187],"level":[54,57],"another":[56],"caused":[58,90,204],"by":[59,91,205],"PSF's":[61],"state":[62],"shifting.":[63],"In":[64,112],"basic":[65],"version":[66],"CREAM,":[68],"HEP":[69,82,116,140],"predefined":[71],"as":[72,119,165],"four":[73],"intervals.":[74],"So":[75],"increasing":[83],"lower":[85],"interval":[86,89],"upper":[88],"degradation":[93],"common":[95],"conditions":[97],"(CPCs).":[98],"It":[99,158],"concluded":[101],"that":[102,161],"3-level":[103],"CPC":[104,110],"has":[105],"higher":[106,176],"than":[108],"2-level":[109],"does.":[111],"SPAR-H,":[113],"continuous":[115],"classified":[118],"high":[120,143],"value,":[121],"medium":[122,146],"value":[123,126,144,149],"low":[125,148],"intervals":[127],"first":[128],"all.":[130],"PSF":[135,156,188],"decreasing":[141],"or":[147,177,214],"because":[150],"improvement":[153],"state.":[157],"found":[160],"PSFs,":[163],"such":[164],"Available":[166],"time,":[167],"Fitness":[168],"duty,":[170],"Ergonomics/HMI":[171],"Procedures":[173],"with":[174],"much":[175],"smaller":[178],"multiplier":[179],"may":[180],"have":[181],"greater":[182],"CDRI.":[183],"more":[185,191,221],"is,":[189],"emphasis":[192],"should":[193],"be":[194,219],"given.":[195],"With":[196],"help":[198],"conclusion,":[201],"risk":[203],"in":[208],"nuclear":[209],"power":[210],"plant,":[211],"space":[212],"task":[213],"other":[215],"risk-critical":[216],"domains":[217],"can":[218],"reduced":[220],"effectively.":[222]},"counts_by_year":[],"updated_date":"2026-06-26T08:34:08.712188","created_date":"2025-10-10T00:00:00"}