{"id":"https://openalex.org/W2250052816","doi":"https://doi.org/10.1109/ieem.2015.7385749","title":"Reliability modeling for dependent competing failure processes with damage self-recovery phenomenon","display_name":"Reliability modeling for dependent competing failure processes with damage self-recovery phenomenon","publication_year":2015,"publication_date":"2015-12-01","ids":{"openalex":"https://openalex.org/W2250052816","doi":"https://doi.org/10.1109/ieem.2015.7385749","mag":"2250052816"},"language":"en","primary_location":{"id":"doi:10.1109/ieem.2015.7385749","is_oa":false,"landing_page_url":"https://doi.org/10.1109/ieem.2015.7385749","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2015 IEEE International Conference on Industrial Engineering and Engineering Management (IEEM)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5101740387","display_name":"Hanlin Liu","orcid":"https://orcid.org/0000-0002-0995-8384"},"institutions":[{"id":"https://openalex.org/I168719708","display_name":"City University of Hong Kong","ror":"https://ror.org/03q8dnn23","country_code":"HK","type":"education","lineage":["https://openalex.org/I168719708"]}],"countries":["HK"],"is_corresponding":true,"raw_author_name":"Hanlin Liu","raw_affiliation_strings":["Department of Systems Engineering and Engineering Management, City University of Hong Kong, Kowloon, Hong Kong"],"affiliations":[{"raw_affiliation_string":"Department of Systems Engineering and Engineering Management, City University of Hong Kong, Kowloon, Hong Kong","institution_ids":["https://openalex.org/I168719708"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5041351713","display_name":"Ruey-Huei Yeh","orcid":"https://orcid.org/0000-0003-0981-4492"},"institutions":[{"id":"https://openalex.org/I154864474","display_name":"National Taiwan University of Science and Technology","ror":"https://ror.org/00q09pe49","country_code":"TW","type":"education","lineage":["https://openalex.org/I154864474"]}],"countries":["TW"],"is_corresponding":false,"raw_author_name":"Ruey-Huei Yeh","raw_affiliation_strings":["Department of Industrial Management, National Taiwan University of Science and Technology, Taipei, Taiwan"],"affiliations":[{"raw_affiliation_string":"Department of Industrial Management, National Taiwan University of Science and Technology, Taipei, Taiwan","institution_ids":["https://openalex.org/I154864474"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5069590205","display_name":"Baoping Cai","orcid":"https://orcid.org/0000-0002-4499-492X"},"institutions":[{"id":"https://openalex.org/I4210162190","display_name":"China University of Petroleum, East China","ror":"https://ror.org/05gbn2817","country_code":"CN","type":"education","lineage":["https://openalex.org/I4210162190"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Baoping Cai","raw_affiliation_strings":["College of Mechanical and Electronic Engineering, China University of Petroleum, Qingdao, Shandong, China"],"affiliations":[{"raw_affiliation_string":"College of Mechanical and Electronic Engineering, China University of Petroleum, Qingdao, Shandong, China","institution_ids":["https://openalex.org/I4210162190"]}]}],"institutions":[],"countries_distinct_count":3,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5101740387"],"corresponding_institution_ids":["https://openalex.org/I168719708"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.14873115,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"756","last_page":"760"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10780","display_name":"Reliability and Maintenance Optimization","score":0.9986000061035156,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10780","display_name":"Reliability and Maintenance Optimization","score":0.9986000061035156,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11357","display_name":"Risk and Safety Analysis","score":0.9926999807357788,"subfield":{"id":"https://openalex.org/subfields/1804","display_name":"Statistics, Probability and Uncertainty"},"field":{"id":"https://openalex.org/fields/18","display_name":"Decision Sciences"},"domain":{"id":"https://openalex.org/domains/2","display_name":"Social Sciences"}},{"id":"https://openalex.org/T10663","display_name":"Advanced Battery Technologies Research","score":0.9894999861717224,"subfield":{"id":"https://openalex.org/subfields/2203","display_name":"Automotive Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.7686039209365845},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.7258061766624451},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6190246939659119},{"id":"https://openalex.org/keywords/process","display_name":"Process (computing)","score":0.5089826583862305},{"id":"https://openalex.org/keywords/microelectronics","display_name":"Microelectronics","score":0.4871082305908203},{"id":"https://openalex.org/keywords/electric-shock","display_name":"Electric shock","score":0.472265362739563},{"id":"https://openalex.org/keywords/phenomenon","display_name":"Phenomenon","score":0.448933482170105},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.20790159702301025},{"id":"https://openalex.org/keywords/mechanical-engineering","display_name":"Mechanical engineering","score":0.09722068905830383},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.07697060704231262},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.07629066705703735},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.07552212476730347}],"concepts":[{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.7686039209365845},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.7258061766624451},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6190246939659119},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.5089826583862305},{"id":"https://openalex.org/C187937830","wikidata":"https://www.wikidata.org/wiki/Q175403","display_name":"Microelectronics","level":2,"score":0.4871082305908203},{"id":"https://openalex.org/C2776099285","wikidata":"https://www.wikidata.org/wiki/Q244404","display_name":"Electric shock","level":2,"score":0.472265362739563},{"id":"https://openalex.org/C50335755","wikidata":"https://www.wikidata.org/wiki/Q483247","display_name":"Phenomenon","level":2,"score":0.448933482170105},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.20790159702301025},{"id":"https://openalex.org/C78519656","wikidata":"https://www.wikidata.org/wiki/Q101333","display_name":"Mechanical engineering","level":1,"score":0.09722068905830383},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.07697060704231262},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.07629066705703735},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.07552212476730347},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/ieem.2015.7385749","is_oa":false,"landing_page_url":"https://doi.org/10.1109/ieem.2015.7385749","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2015 IEEE International Conference on Industrial Engineering and Engineering Management (IEEM)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[{"id":"https://openalex.org/F4320309893","display_name":"City University of Hong Kong","ror":"https://ror.org/03q8dnn23"},{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"},{"id":"https://openalex.org/F4320322170","display_name":"University of Hong Kong","ror":"https://ror.org/02zhqgq86"},{"id":"https://openalex.org/F4320322942","display_name":"Chinese University of Hong Kong","ror":"https://ror.org/00t33hh48"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":20,"referenced_works":["https://openalex.org/W1974839170","https://openalex.org/W1982286208","https://openalex.org/W1988482885","https://openalex.org/W2001806604","https://openalex.org/W2015631081","https://openalex.org/W2040468805","https://openalex.org/W2048227639","https://openalex.org/W2049169212","https://openalex.org/W2056777003","https://openalex.org/W2067093599","https://openalex.org/W2088078669","https://openalex.org/W2088555868","https://openalex.org/W2098917156","https://openalex.org/W2110554687","https://openalex.org/W2114087231","https://openalex.org/W2127264253","https://openalex.org/W2130270474","https://openalex.org/W2132049856","https://openalex.org/W2136362079","https://openalex.org/W4239218596"],"related_works":["https://openalex.org/W2033512842","https://openalex.org/W4322734194","https://openalex.org/W1607054433","https://openalex.org/W3005535424","https://openalex.org/W4233600955","https://openalex.org/W2913665393","https://openalex.org/W2994319598","https://openalex.org/W2369695847","https://openalex.org/W2110842462","https://openalex.org/W4233757488"],"abstract_inverted_index":{"Systems":[0],"experiencing":[1],"multiple":[2],"dependent":[3],"competing":[4],"failure":[5],"processes":[6],"(MDCFP)":[7],"have":[8],"attracted":[9],"much":[10],"attention":[11],"in":[12,27,42],"the":[13,32,38,56,76,101,109,115],"recent":[14],"years.":[15],"A":[16,47],"system":[17,116],"subject":[18,51],"to":[19,31,35,52,74,98],"MDCFP":[20,53],"with":[21],"damage":[22,39,57],"self-recovery":[23,40,58,77],"phenomenon":[24,59],"is":[25,60,81,104],"considered":[26],"this":[28],"paper.":[29],"Due":[30,97],"intrinsic":[33],"resistance":[34],"abrupt":[36],"damage,":[37],"exists":[41],"many":[43,86],"systems":[44,88],"and":[45,70,83],"products.":[46],"new":[48],"reliability":[49,110,117],"model":[50,80],"by":[54,119],"considering":[55],"developed.":[61],"For":[62],"each":[63],"random":[64],"shock,":[65],"we":[66,113],"propose":[67],"recovery":[68,71],"time":[69],"level":[72],"concept":[73],"describe":[75],"process.":[78],"The":[79],"practical":[82],"realistic":[84],"for":[85],"complex":[87],"such":[89],"as":[90],"electrical":[91],"devices":[92],"or":[93],"microelectronic":[94],"polymeric":[95],"components.":[96],"complexity":[99],"of":[100,108],"model,":[102],"there":[103],"no":[105],"analytical":[106],"form":[107],"function.":[111],"However,":[112],"estimate":[114],"efficiently":[118],"using":[120],"simulation":[121],"method.":[122]},"counts_by_year":[],"updated_date":"2025-12-01T00:03:43.161839","created_date":"2025-10-10T00:00:00"}