{"id":"https://openalex.org/W2075631996","doi":"https://doi.org/10.1109/ieem.2011.6118175","title":"Multi up-gradation software reliability growth model with faults of different severity","display_name":"Multi up-gradation software reliability growth model with faults of different severity","publication_year":2011,"publication_date":"2011-12-01","ids":{"openalex":"https://openalex.org/W2075631996","doi":"https://doi.org/10.1109/ieem.2011.6118175","mag":"2075631996"},"language":"en","primary_location":{"id":"doi:10.1109/ieem.2011.6118175","is_oa":false,"landing_page_url":"https://doi.org/10.1109/ieem.2011.6118175","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2011 IEEE International Conference on Industrial Engineering and Engineering Management","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5078020978","display_name":"A. H. S. Garmabaki","orcid":"https://orcid.org/0000-0003-2976-5229"},"institutions":[{"id":"https://openalex.org/I110525433","display_name":"Islamic Azad University, Tehran","ror":"https://ror.org/01kzn7k21","country_code":"IR","type":"education","lineage":["https://openalex.org/I110525433"]}],"countries":["IR"],"is_corresponding":true,"raw_author_name":"Amir H.S. Garmabaki","raw_affiliation_strings":["Department of Mathematics, Islamic Azad University, Nur, Iran","Department of Mathematics, Islamic Azad University, Nur Branch, Iran"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Mathematics, Islamic Azad University, Nur, Iran","institution_ids":["https://openalex.org/I110525433"]},{"raw_affiliation_string":"Department of Mathematics, Islamic Azad University, Nur Branch, Iran","institution_ids":["https://openalex.org/I110525433"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5041713395","display_name":"Anu G. Aggarwal","orcid":"https://orcid.org/0000-0001-5448-9540"},"institutions":[{"id":"https://openalex.org/I110166357","display_name":"University of Delhi","ror":"https://ror.org/04gzb2213","country_code":"IN","type":"education","lineage":["https://openalex.org/I110166357"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"Anu G. Aggarwal","raw_affiliation_strings":["Department of Operational Research, University of Delhi, New Delhi, India","Department of Operational Research, University of Delhi, 110007, India"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Operational Research, University of Delhi, New Delhi, India","institution_ids":["https://openalex.org/I110166357"]},{"raw_affiliation_string":"Department of Operational Research, University of Delhi, 110007, India","institution_ids":["https://openalex.org/I110166357"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5013827274","display_name":"P. K. Kapur","orcid":"https://orcid.org/0000-0001-8006-5952"},"institutions":[{"id":"https://openalex.org/I110166357","display_name":"University of Delhi","ror":"https://ror.org/04gzb2213","country_code":"IN","type":"education","lineage":["https://openalex.org/I110166357"]}],"countries":["IN"],"is_corresponding":false,"raw_author_name":"P.K. Kapur","raw_affiliation_strings":["Department of Operational Research, University of Delhi, New Delhi, India","Department of Operational Research, University of Delhi, 110007, India"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Operational Research, University of Delhi, New Delhi, India","institution_ids":["https://openalex.org/I110166357"]},{"raw_affiliation_string":"Department of Operational Research, University of Delhi, 110007, India","institution_ids":["https://openalex.org/I110166357"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5078020978"],"corresponding_institution_ids":["https://openalex.org/I110525433"],"apc_list":null,"apc_paid":null,"fwci":1.2143,"has_fulltext":false,"cited_by_count":25,"citation_normalized_percentile":{"value":0.81378026,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":98},"biblio":{"volume":null,"issue":null,"first_page":"1539","last_page":"1543"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12423","display_name":"Software Reliability and Analysis Research","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12423","display_name":"Software Reliability and Analysis Research","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1712","display_name":"Software"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10780","display_name":"Reliability and Maintenance Optimization","score":0.9951000213623047,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10260","display_name":"Software Engineering Research","score":0.9851999878883362,"subfield":{"id":"https://openalex.org/subfields/1710","display_name":"Information Systems"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/gradation","display_name":"Gradation","score":0.9515520334243774},{"id":"https://openalex.org/keywords/competitor-analysis","display_name":"Competitor analysis","score":0.5982642769813538},{"id":"https://openalex.org/keywords/software","display_name":"Software","score":0.5956972241401672},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5605580806732178},{"id":"https://openalex.org/keywords/software-quality","display_name":"Software quality","score":0.5211598873138428},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.44701093435287476},{"id":"https://openalex.org/keywords/software-fault-tolerance","display_name":"Software fault tolerance","score":0.4441395401954651},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.4304865598678589},{"id":"https://openalex.org/keywords/software-development","display_name":"Software development","score":0.4175001382827759},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.4141841232776642},{"id":"https://openalex.org/keywords/software-engineering","display_name":"Software engineering","score":0.3422979712486267},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.24447399377822876},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.14566361904144287},{"id":"https://openalex.org/keywords/operating-system","display_name":"Operating system","score":0.1051630973815918},{"id":"https://openalex.org/keywords/business","display_name":"Business","score":0.06527179479598999}],"concepts":[{"id":"https://openalex.org/C29314403","wikidata":"https://www.wikidata.org/wiki/Q15637103","display_name":"Gradation","level":2,"score":0.9515520334243774},{"id":"https://openalex.org/C127576917","wikidata":"https://www.wikidata.org/wiki/Q624630","display_name":"Competitor analysis","level":2,"score":0.5982642769813538},{"id":"https://openalex.org/C2777904410","wikidata":"https://www.wikidata.org/wiki/Q7397","display_name":"Software","level":2,"score":0.5956972241401672},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5605580806732178},{"id":"https://openalex.org/C117447612","wikidata":"https://www.wikidata.org/wiki/Q1412670","display_name":"Software quality","level":4,"score":0.5211598873138428},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.44701093435287476},{"id":"https://openalex.org/C50712370","wikidata":"https://www.wikidata.org/wiki/Q4269346","display_name":"Software fault tolerance","level":3,"score":0.4441395401954651},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.4304865598678589},{"id":"https://openalex.org/C529173508","wikidata":"https://www.wikidata.org/wiki/Q638608","display_name":"Software development","level":3,"score":0.4175001382827759},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.4141841232776642},{"id":"https://openalex.org/C115903868","wikidata":"https://www.wikidata.org/wiki/Q80993","display_name":"Software engineering","level":1,"score":0.3422979712486267},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.24447399377822876},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.14566361904144287},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.1051630973815918},{"id":"https://openalex.org/C144133560","wikidata":"https://www.wikidata.org/wiki/Q4830453","display_name":"Business","level":0,"score":0.06527179479598999},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C162853370","wikidata":"https://www.wikidata.org/wiki/Q39809","display_name":"Marketing","level":1,"score":0.0},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/ieem.2011.6118175","is_oa":false,"landing_page_url":"https://doi.org/10.1109/ieem.2011.6118175","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2011 IEEE International Conference on Industrial Engineering and Engineering Management","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/9","display_name":"Industry, innovation and infrastructure","score":0.5899999737739563}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":14,"referenced_works":["https://openalex.org/W130666128","https://openalex.org/W375820185","https://openalex.org/W1554758995","https://openalex.org/W1980539682","https://openalex.org/W1980595883","https://openalex.org/W1997244461","https://openalex.org/W2018136058","https://openalex.org/W2054316961","https://openalex.org/W2088220210","https://openalex.org/W2170105447","https://openalex.org/W2332678043","https://openalex.org/W2535701809","https://openalex.org/W2795507930","https://openalex.org/W4293256909"],"related_works":["https://openalex.org/W3008501339","https://openalex.org/W2203140588","https://openalex.org/W3016851930","https://openalex.org/W2212955619","https://openalex.org/W3124296310","https://openalex.org/W1911878188","https://openalex.org/W2141411717","https://openalex.org/W3145773044","https://openalex.org/W2149450576","https://openalex.org/W2155445882"],"abstract_inverted_index":{"In":[0,114],"today's":[1],"environment":[2],"of":[3,61,66,124],"global":[4],"competition":[5],"where":[6],"each":[7],"company":[8,19],"is":[9,82,133],"trying":[10],"to":[11,21,30,70,102],"prove":[12],"itself":[13,49],"better":[14],"than":[15],"its":[16],"competitors,":[17],"software":[18,29,67,81,127,140],"have":[20],"continually":[22],"do":[23],"up-gradation":[24,37],"or":[25,43,74],"add-ons":[26],"in":[27,32,64,79,89,145],"their":[28,112],"survive":[31],"the":[33,51,56,59,76,80,146],"market.":[34],"Each":[35],"succeeding":[36],"offers":[38],"some":[39,44],"innovative":[40],"performance":[41],"enhancement":[42],"new":[45,72,119,122,149],"functionality":[46],"etc":[47],"distinguishing":[48],"from":[50],"past":[52],"release.":[53],"But":[54],"at":[55],"same":[57],"time":[58,103],"amount":[60],"risk":[62],"involved":[63],"up-gradation/add-ons":[65],"with":[68,100,148],"regard":[69],"introducing":[71],"faults":[73,88],"increasing":[75],"fault":[77,98],"number":[78],"also":[83],"formidable.":[84],"This":[85],"model":[86,120,131],"categorizes":[87],"two":[90],"types:":[91],"Type-1":[92],"and":[93,109,121],"Type-2":[94],"(simple":[95],"fault,":[96],"hard":[97],"namely)":[99],"respect":[101],"which":[104,141],"they":[105],"take":[106],"for":[107,139],"isolation":[108],"removal":[110],"after":[111],"observation.":[113],"this":[115],"paper,":[116],"we":[117],"propose":[118],"concept":[123],"multi":[125],"release":[126],"development":[128],"environment.":[129],"The":[130],"developed":[132],"validated":[134],"on":[135],"real":[136],"data":[137],"sets":[138],"has":[142],"been":[143],"released":[144],"market":[147],"features.":[150]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2025,"cited_by_count":2},{"year":2022,"cited_by_count":2},{"year":2021,"cited_by_count":5},{"year":2019,"cited_by_count":2},{"year":2018,"cited_by_count":1},{"year":2017,"cited_by_count":2},{"year":2016,"cited_by_count":2},{"year":2015,"cited_by_count":5},{"year":2014,"cited_by_count":3}],"updated_date":"2026-04-25T08:17:42.794288","created_date":"2025-10-10T00:00:00"}