{"id":"https://openalex.org/W4415968833","doi":"https://doi.org/10.1109/iecon58223.2025.11221842","title":"Stability Margins of Disturbance Observer: Addressing Uncertainty and Time Delay in Line-of-Sight Stabilization Systems","display_name":"Stability Margins of Disturbance Observer: Addressing Uncertainty and Time Delay in Line-of-Sight Stabilization Systems","publication_year":2025,"publication_date":"2025-10-14","ids":{"openalex":"https://openalex.org/W4415968833","doi":"https://doi.org/10.1109/iecon58223.2025.11221842"},"language":null,"primary_location":{"id":"doi:10.1109/iecon58223.2025.11221842","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iecon58223.2025.11221842","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IECON 2025 \u2013 51st Annual Conference of the IEEE Industrial Electronics Society","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5102595314","display_name":"Jiuqiang Deng","orcid":null},"institutions":[{"id":"https://openalex.org/I4210128284","display_name":"Institute of Optics and Electronics, Chinese Academy of Sciences","ror":"https://ror.org/02bn68w95","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210128284"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Jiuqiang Deng","raw_affiliation_strings":["Chinese Academy of Sciences,State Key Laboratory of Optical Field Manipulation Science and Technology,Chengdu,China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Chinese Academy of Sciences,State Key Laboratory of Optical Field Manipulation Science and Technology,Chengdu,China","institution_ids":["https://openalex.org/I4210128284"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5077957539","display_name":"Qianwen Duan","orcid":"https://orcid.org/0000-0003-4342-5044"},"institutions":[{"id":"https://openalex.org/I4210128284","display_name":"Institute of Optics and Electronics, Chinese Academy of Sciences","ror":"https://ror.org/02bn68w95","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210128284"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Qianwen Duan","raw_affiliation_strings":["Chinese Academy of Sciences,State Key Laboratory of Optical Field Manipulation Science and Technology,Chengdu,China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Chinese Academy of Sciences,State Key Laboratory of Optical Field Manipulation Science and Technology,Chengdu,China","institution_ids":["https://openalex.org/I4210128284"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5114227706","display_name":"Yao Mao","orcid":null},"institutions":[{"id":"https://openalex.org/I4210128284","display_name":"Institute of Optics and Electronics, Chinese Academy of Sciences","ror":"https://ror.org/02bn68w95","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210128284"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yao Mao","raw_affiliation_strings":["Chinese Academy of Sciences,State Key Laboratory of Optical Field Manipulation Science and Technology,Chengdu,China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Chinese Academy of Sciences,State Key Laboratory of Optical Field Manipulation Science and Technology,Chengdu,China","institution_ids":["https://openalex.org/I4210128284"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5110024580","display_name":"Qiliang Bao","orcid":"https://orcid.org/0000-0002-7185-720X"},"institutions":[{"id":"https://openalex.org/I4210128284","display_name":"Institute of Optics and Electronics, Chinese Academy of Sciences","ror":"https://ror.org/02bn68w95","country_code":"CN","type":"facility","lineage":["https://openalex.org/I19820366","https://openalex.org/I4210128284"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Qiliang Bao","raw_affiliation_strings":["Chinese Academy of Sciences,State Key Laboratory of Optical Field Manipulation Science and Technology,Chengdu,China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Chinese Academy of Sciences,State Key Laboratory of Optical Field Manipulation Science and Technology,Chengdu,China","institution_ids":["https://openalex.org/I4210128284"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I4210128284"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.44474545,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"8"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10040","display_name":"Adaptive Control of Nonlinear Systems","score":0.4860999882221222,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10040","display_name":"Adaptive Control of Nonlinear Systems","score":0.4860999882221222,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10046","display_name":"Stability and Control of Uncertain Systems","score":0.271699994802475,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10876","display_name":"Fault Detection and Control Systems","score":0.05920000001788139,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/disturbance","display_name":"Disturbance (geology)","score":0.7908999919891357},{"id":"https://openalex.org/keywords/stability","display_name":"Stability (learning theory)","score":0.7699999809265137},{"id":"https://openalex.org/keywords/control-theory","display_name":"Control theory (sociology)","score":0.7688999772071838},{"id":"https://openalex.org/keywords/nyquist-stability-criterion","display_name":"Nyquist stability criterion","score":0.6754000186920166},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.5928000211715698},{"id":"https://openalex.org/keywords/metric","display_name":"Metric (unit)","score":0.5710999965667725},{"id":"https://openalex.org/keywords/small-gain-theorem","display_name":"Small-gain theorem","score":0.45260000228881836},{"id":"https://openalex.org/keywords/domain","display_name":"Domain (mathematical analysis)","score":0.4074000120162964},{"id":"https://openalex.org/keywords/frequency-domain","display_name":"Frequency domain","score":0.4058000147342682}],"concepts":[{"id":"https://openalex.org/C2777601987","wikidata":"https://www.wikidata.org/wiki/Q5283581","display_name":"Disturbance (geology)","level":2,"score":0.7908999919891357},{"id":"https://openalex.org/C112972136","wikidata":"https://www.wikidata.org/wiki/Q7595718","display_name":"Stability (learning theory)","level":2,"score":0.7699999809265137},{"id":"https://openalex.org/C47446073","wikidata":"https://www.wikidata.org/wiki/Q5165890","display_name":"Control theory (sociology)","level":3,"score":0.7688999772071838},{"id":"https://openalex.org/C7630364","wikidata":"https://www.wikidata.org/wiki/Q1756793","display_name":"Nyquist stability criterion","level":3,"score":0.6754000186920166},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.5928000211715698},{"id":"https://openalex.org/C176217482","wikidata":"https://www.wikidata.org/wiki/Q860554","display_name":"Metric (unit)","level":2,"score":0.5710999965667725},{"id":"https://openalex.org/C27385263","wikidata":"https://www.wikidata.org/wiki/Q4165677","display_name":"Small-gain theorem","level":3,"score":0.45260000228881836},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.44339999556541443},{"id":"https://openalex.org/C36503486","wikidata":"https://www.wikidata.org/wiki/Q11235244","display_name":"Domain (mathematical analysis)","level":2,"score":0.4074000120162964},{"id":"https://openalex.org/C19118579","wikidata":"https://www.wikidata.org/wiki/Q786423","display_name":"Frequency domain","level":2,"score":0.4058000147342682},{"id":"https://openalex.org/C103824480","wikidata":"https://www.wikidata.org/wiki/Q185889","display_name":"Time domain","level":2,"score":0.38429999351501465},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.357699990272522},{"id":"https://openalex.org/C2778925954","wikidata":"https://www.wikidata.org/wiki/Q16883749","display_name":"Stability criterion","level":3,"score":0.34700000286102295},{"id":"https://openalex.org/C65521940","wikidata":"https://www.wikidata.org/wiki/Q5121443","display_name":"Circle criterion","level":4,"score":0.3434000015258789},{"id":"https://openalex.org/C177803969","wikidata":"https://www.wikidata.org/wiki/Q29205","display_name":"Uncertainty analysis","level":2,"score":0.3393000066280365},{"id":"https://openalex.org/C207821765","wikidata":"https://www.wikidata.org/wiki/Q405372","display_name":"Instability","level":2,"score":0.33410000801086426},{"id":"https://openalex.org/C2780898871","wikidata":"https://www.wikidata.org/wiki/Q860554","display_name":"Performance metric","level":2,"score":0.319599986076355},{"id":"https://openalex.org/C137209882","wikidata":"https://www.wikidata.org/wiki/Q1403517","display_name":"Measurement uncertainty","level":2,"score":0.31949999928474426},{"id":"https://openalex.org/C61797465","wikidata":"https://www.wikidata.org/wiki/Q1188986","display_name":"Term (time)","level":2,"score":0.31299999356269836},{"id":"https://openalex.org/C143170015","wikidata":"https://www.wikidata.org/wiki/Q17007850","display_name":"Stability conditions","level":3,"score":0.3052000105381012},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.30379998683929443},{"id":"https://openalex.org/C288623","wikidata":"https://www.wikidata.org/wiki/Q679800","display_name":"Nyquist\u2013Shannon sampling theorem","level":2,"score":0.298799991607666},{"id":"https://openalex.org/C152124472","wikidata":"https://www.wikidata.org/wiki/Q1204361","display_name":"Redundancy (engineering)","level":2,"score":0.2833000123500824},{"id":"https://openalex.org/C126255220","wikidata":"https://www.wikidata.org/wiki/Q141495","display_name":"Mathematical optimization","level":1,"score":0.26989999413490295},{"id":"https://openalex.org/C133731056","wikidata":"https://www.wikidata.org/wiki/Q4917288","display_name":"Control engineering","level":1,"score":0.2574999928474426},{"id":"https://openalex.org/C774472","wikidata":"https://www.wikidata.org/wiki/Q6760393","display_name":"Margin (machine learning)","level":2,"score":0.25690001249313354},{"id":"https://openalex.org/C2985318062","wikidata":"https://www.wikidata.org/wiki/Q1756677","display_name":"Stability theorem","level":3,"score":0.25429999828338623}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/iecon58223.2025.11221842","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iecon58223.2025.11221842","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IECON 2025 \u2013 51st Annual Conference of the IEEE Industrial Electronics Society","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[{"id":"https://openalex.org/F4320321133","display_name":"Chinese Academy of Sciences","ror":"https://ror.org/034t30j35"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":14,"referenced_works":["https://openalex.org/W1990593935","https://openalex.org/W2004470537","https://openalex.org/W2069794835","https://openalex.org/W2230652337","https://openalex.org/W2728092904","https://openalex.org/W2791709924","https://openalex.org/W2893560492","https://openalex.org/W2900652320","https://openalex.org/W3027383835","https://openalex.org/W3094534037","https://openalex.org/W3177305637","https://openalex.org/W3193556422","https://openalex.org/W3213862473","https://openalex.org/W4391692224"],"related_works":[],"abstract_inverted_index":{"Uncertainty":[0],"and":[1,17,78,85],"time":[2,86],"delay":[3],"are":[4],"common":[5],"occurrences":[6],"in":[7,110],"practical":[8],"engineering":[9,111],"applications,":[10],"inevitably":[11],"imposing":[12],"constraints":[13],"on":[14],"the":[15,37,42,50,55,64,93,104],"stability":[16,28,38,51,67,77],"reliability":[18],"of":[19,49,107],"disturbance":[20,65,100],"observers":[21],"(DOs).":[22],"This":[23],"paper":[24],"presents":[25],"a":[26,46,72],"Nyquist-based":[27],"criterion":[29],"method":[30],"for":[31,63,75],"DOs.":[32],"Theoretical":[33],"analysis":[34],"demonstrates":[35],"that":[36],"domain":[39,52],"defined":[40],"by":[41,54],"small-gain":[43],"theorem":[44],"is":[45,69],"proper":[47],"subset":[48],"determined":[53],"Nyquist":[56],"criterion.":[57],"Additionally,":[58],"an":[59],"experimental":[60],"measurement":[61],"approach":[62],"rejection":[66],"margins":[68],"proposed,":[70],"providing":[71],"quantitative":[73],"metric":[74],"DO":[76,108],"effectively":[79],"guiding":[80],"parameter":[81],"tuning":[82],"under":[83],"uncertainty":[84],"delay.":[87],"The":[88],"proposed":[89],"methods":[90],"significantly":[91],"mitigate":[92],"potential":[94],"instability":[95],"risks":[96],"associated":[97],"with":[98],"closed-loop":[99],"rejection,":[101],"thereby":[102],"ensuring":[103],"operational":[105],"safety":[106],"systems":[109],"environments.":[112]},"counts_by_year":[],"updated_date":"2026-07-29T14:22:42.915294","created_date":"2025-11-06T00:00:00"}