{"id":"https://openalex.org/W4415969502","doi":"https://doi.org/10.1109/iecon58223.2025.11221811","title":"Multi-Scale Residual Attention GAN Method for IGBT Switching Transient Data Compression and Reconstruction","display_name":"Multi-Scale Residual Attention GAN Method for IGBT Switching Transient Data Compression and Reconstruction","publication_year":2025,"publication_date":"2025-10-14","ids":{"openalex":"https://openalex.org/W4415969502","doi":"https://doi.org/10.1109/iecon58223.2025.11221811"},"language":null,"primary_location":{"id":"doi:10.1109/iecon58223.2025.11221811","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iecon58223.2025.11221811","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IECON 2025 \u2013 51st Annual Conference of the IEEE Industrial Electronics Society","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5100390591","display_name":"Xiaotian Zhang","orcid":"https://orcid.org/0000-0002-0126-6834"},"institutions":[{"id":"https://openalex.org/I18452120","display_name":"Yantai University","ror":"https://ror.org/01rp41m56","country_code":"CN","type":"education","lineage":["https://openalex.org/I18452120"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Xiaotian Zhang","raw_affiliation_strings":["Yantai Research Insitute Harbin Engineering University,Yantai,China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Yantai Research Insitute Harbin Engineering University,Yantai,China","institution_ids":["https://openalex.org/I18452120"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5040787537","display_name":"Weiye Wang","orcid":"https://orcid.org/0000-0001-6540-1364"},"institutions":[{"id":"https://openalex.org/I18452120","display_name":"Yantai University","ror":"https://ror.org/01rp41m56","country_code":"CN","type":"education","lineage":["https://openalex.org/I18452120"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Weiye Wang","raw_affiliation_strings":["Yantai Research Insitute Harbin Engineering University,Yantai,China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Yantai Research Insitute Harbin Engineering University,Yantai,China","institution_ids":["https://openalex.org/I18452120"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101826745","display_name":"Zechao Liu","orcid":"https://orcid.org/0000-0002-9350-5168"},"institutions":[{"id":"https://openalex.org/I151727225","display_name":"Harbin Engineering University","ror":"https://ror.org/03x80pn82","country_code":"CN","type":"education","lineage":["https://openalex.org/I151727225"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Zechao Liu","raw_affiliation_strings":["Harbin Engineering University,College of Computer Science and Technology,Harbin,China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Harbin Engineering University,College of Computer Science and Technology,Harbin,China","institution_ids":["https://openalex.org/I151727225"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5111772784","display_name":"Sheng Wu","orcid":null},"institutions":[{"id":"https://openalex.org/I18452120","display_name":"Yantai University","ror":"https://ror.org/01rp41m56","country_code":"CN","type":"education","lineage":["https://openalex.org/I18452120"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Sheng Wu","raw_affiliation_strings":["Yantai Research Insitute Harbin Engineering University,Yantai,China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Yantai Research Insitute Harbin Engineering University,Yantai,China","institution_ids":["https://openalex.org/I18452120"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5071468807","display_name":"Chao Gong","orcid":"https://orcid.org/0000-0001-5126-2332"},"institutions":[{"id":"https://openalex.org/I17145004","display_name":"Northwestern Polytechnical University","ror":"https://ror.org/01y0j0j86","country_code":"CN","type":"education","lineage":["https://openalex.org/I17145004"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Chao Gong","raw_affiliation_strings":["Northwestern Polytechnical University,School of Automation,Xi’an,China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Northwestern Polytechnical University,School of Automation,Xi’an,China","institution_ids":["https://openalex.org/I17145004"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5051422628","display_name":"Jos\u00e9 Rodr\u00edguez","orcid":"https://orcid.org/0000-0002-1410-4121"},"institutions":[{"id":"https://openalex.org/I3124150290","display_name":"San Sebasti\u00e1n University","ror":"https://ror.org/04jrwm652","country_code":"CL","type":"education","lineage":["https://openalex.org/I3124150290"]}],"countries":["CL"],"is_corresponding":false,"raw_author_name":"Jose Rodriguez","raw_affiliation_strings":["Universidad San Sebastian,Faculty of Engineering,Santiago,Chile"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Universidad San Sebastian,Faculty of Engineering,Santiago,Chile","institution_ids":["https://openalex.org/I3124150290"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":6,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.28030424,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"6"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10361","display_name":"Silicon Carbide Semiconductor Technologies","score":0.7986999750137329,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10361","display_name":"Silicon Carbide Semiconductor Technologies","score":0.7986999750137329,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.032999999821186066,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10228","display_name":"Multilevel Inverters and Converters","score":0.02160000056028366,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/insulated-gate-bipolar-transistor","display_name":"Insulated-gate bipolar transistor","score":0.7610999941825867},{"id":"https://openalex.org/keywords/discriminator","display_name":"Discriminator","score":0.6955999732017517},{"id":"https://openalex.org/keywords/residual","display_name":"Residual","score":0.5590000152587891},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.5447999835014343},{"id":"https://openalex.org/keywords/data-compression","display_name":"Data compression","score":0.5386999845504761},{"id":"https://openalex.org/keywords/scalability","display_name":"Scalability","score":0.4447000026702881},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.3982999920845032},{"id":"https://openalex.org/keywords/fault-detection-and-isolation","display_name":"Fault detection and isolation","score":0.3776000142097473}],"concepts":[{"id":"https://openalex.org/C28285623","wikidata":"https://www.wikidata.org/wiki/Q176110","display_name":"Insulated-gate bipolar transistor","level":3,"score":0.7610999941825867},{"id":"https://openalex.org/C2779803651","wikidata":"https://www.wikidata.org/wiki/Q5282088","display_name":"Discriminator","level":3,"score":0.6955999732017517},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5903000235557556},{"id":"https://openalex.org/C155512373","wikidata":"https://www.wikidata.org/wiki/Q287450","display_name":"Residual","level":2,"score":0.5590000152587891},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.5447999835014343},{"id":"https://openalex.org/C78548338","wikidata":"https://www.wikidata.org/wiki/Q2493","display_name":"Data compression","level":2,"score":0.5386999845504761},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.4876999855041504},{"id":"https://openalex.org/C48044578","wikidata":"https://www.wikidata.org/wiki/Q727490","display_name":"Scalability","level":2,"score":0.4447000026702881},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.3982999920845032},{"id":"https://openalex.org/C152745839","wikidata":"https://www.wikidata.org/wiki/Q5438153","display_name":"Fault detection and isolation","level":3,"score":0.3776000142097473},{"id":"https://openalex.org/C178911571","wikidata":"https://www.wikidata.org/wiki/Q593143","display_name":"Power electronics","level":3,"score":0.3727000057697296},{"id":"https://openalex.org/C162307627","wikidata":"https://www.wikidata.org/wiki/Q204833","display_name":"Enhanced Data Rates for GSM Evolution","level":2,"score":0.36640000343322754},{"id":"https://openalex.org/C2780799671","wikidata":"https://www.wikidata.org/wiki/Q17087362","display_name":"Transient (computer programming)","level":2,"score":0.36550000309944153},{"id":"https://openalex.org/C180016635","wikidata":"https://www.wikidata.org/wiki/Q2712821","display_name":"Compression (physics)","level":2,"score":0.33149999380111694},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.32109999656677246},{"id":"https://openalex.org/C63540848","wikidata":"https://www.wikidata.org/wiki/Q3140932","display_name":"Fault tolerance","level":2,"score":0.28859999775886536},{"id":"https://openalex.org/C25797200","wikidata":"https://www.wikidata.org/wiki/Q828137","display_name":"Compression ratio","level":3,"score":0.27410000562667847},{"id":"https://openalex.org/C138331895","wikidata":"https://www.wikidata.org/wiki/Q11650","display_name":"Electronics","level":2,"score":0.26989999413490295},{"id":"https://openalex.org/C79403827","wikidata":"https://www.wikidata.org/wiki/Q3988","display_name":"Real-time computing","level":1,"score":0.26840001344680786},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.2671999931335449},{"id":"https://openalex.org/C138236772","wikidata":"https://www.wikidata.org/wiki/Q25098575","display_name":"Edge device","level":3,"score":0.2667999863624573},{"id":"https://openalex.org/C2779843651","wikidata":"https://www.wikidata.org/wiki/Q7390335","display_name":"SIGNAL (programming language)","level":2,"score":0.265500009059906},{"id":"https://openalex.org/C2775846686","wikidata":"https://www.wikidata.org/wiki/Q643012","display_name":"Condition monitoring","level":2,"score":0.26010000705718994},{"id":"https://openalex.org/C47432892","wikidata":"https://www.wikidata.org/wiki/Q831390","display_name":"Wavelet","level":2,"score":0.2502000033855438}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/iecon58223.2025.11221811","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iecon58223.2025.11221811","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IECON 2025 \u2013 51st Annual Conference of the IEEE Industrial Electronics Society","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":11,"referenced_works":["https://openalex.org/W2162827174","https://openalex.org/W2752782242","https://openalex.org/W2800455917","https://openalex.org/W2963149687","https://openalex.org/W2963706632","https://openalex.org/W2964125366","https://openalex.org/W3134449109","https://openalex.org/W4312879513","https://openalex.org/W4385245566","https://openalex.org/W4392543886","https://openalex.org/W4402666405"],"related_works":[],"abstract_inverted_index":{"Insulated":[0],"Gate":[1],"Bipolar":[2],"Transistors":[3],"(IGBTs)":[4],"play":[5],"a":[6,76,95,103,172],"vital":[7],"role":[8],"in":[9,36,58],"power":[10,176],"electronics,":[11],"producing":[12],"large":[13],"volumes":[14],"of":[15],"time-series":[16],"data":[17,28,88,118,132,156,166],"critical":[18],"for":[19,86,158,168,175],"fault":[20,68,151],"detection":[21,152],"and":[22,33,38,48,66,90,102,131,153,179],"system":[23],"health":[24],"monitoring.":[25,161],"The":[26,92],"sheer":[27],"size":[29],"challenges":[30],"efficient":[31,155],"storage":[32],"transmission,":[34],"especially":[35],"IoT":[37],"edge":[39],"computing":[40],"scenarios.":[41],"Conventional":[42],"compression":[43,89,137],"techniques,":[44],"like":[45],"wavelet":[46],"transforms":[47],"PCA,":[49],"often":[50],"struggle":[51],"to":[52,62,107],"retain":[53],"the":[54,116],"complex,":[55],"non-linear":[56],"patterns":[57],"IGBT":[59,87,122,169],"signals,":[60],"leading":[61],"reduced":[63],"reconstruction":[64,129],"quality":[65],"impaired":[67],"diagnosis.":[69],"To":[70],"overcome":[71],"these":[72],"issues,":[73],"we":[74],"introduce":[75],"novel":[77],"Multi-Scale":[78],"Residual":[79],"Attention":[80],"Generative":[81],"Adversarial":[82],"Network":[83],"(MRA-GAN)":[84],"tailored":[85],"reconstruction.":[91],"model":[93],"features":[94],"generator":[96],"with":[97],"multi-scale":[98],"convolutions,":[99],"residual":[100],"connections,":[101],"spatiotemporal":[104],"attention":[105],"mechanism":[106],"effectively":[108],"capture":[109],"diverse":[110],"signal":[111],"characteristics.":[112],"A":[113],"discriminator":[114],"ensures":[115],"reconstructed":[117],"closely":[119],"mimics":[120],"real":[121],"signals":[123],"through":[124],"adversarial":[125],"training.":[126],"By":[127],"balancing":[128],"accuracy":[130],"realism,":[133],"MRA-GAN":[134],"achieves":[135],"high":[136],"ratios":[138],"while":[139],"preserving":[140],"fault-related":[141],"features.":[142],"Evaluations":[143],"show":[144],"it":[145],"outperforms":[146],"traditional":[147],"methods,":[148],"supporting":[149],"precise":[150],"enabling":[154],"handling":[157],"real-time":[159],"industrial":[160],"This":[162],"approach":[163],"significantly":[164],"enhances":[165],"processing":[167],"applications,":[170],"offering":[171],"scalable":[173],"solution":[174],"electronics":[177],"diagnostics":[178],"resource-constrained":[180],"environments.":[181]},"counts_by_year":[],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-11-06T00:00:00"}