{"id":"https://openalex.org/W4415968838","doi":"https://doi.org/10.1109/iecon58223.2025.11221523","title":"AC Voltage Optimization Method for Bipolar TBL-HMMC HVDC Systems under DC Fault Protection","display_name":"AC Voltage Optimization Method for Bipolar TBL-HMMC HVDC Systems under DC Fault Protection","publication_year":2025,"publication_date":"2025-10-14","ids":{"openalex":"https://openalex.org/W4415968838","doi":"https://doi.org/10.1109/iecon58223.2025.11221523"},"language":null,"primary_location":{"id":"doi:10.1109/iecon58223.2025.11221523","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iecon58223.2025.11221523","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IECON 2025 \u2013 51st Annual Conference of the IEEE Industrial Electronics Society","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5027987314","display_name":"Ming Yang","orcid":"https://orcid.org/0000-0001-5057-9274"},"institutions":[{"id":"https://openalex.org/I76569877","display_name":"Southeast University","ror":"https://ror.org/04ct4d772","country_code":"CN","type":"education","lineage":["https://openalex.org/I76569877"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Mingzhen Yang","raw_affiliation_strings":["Southeast University,Department of Electrical Engineering,Nanjing,China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Southeast University,Department of Electrical Engineering,Nanjing,China","institution_ids":["https://openalex.org/I76569877"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5011739066","display_name":"Fujin Deng","orcid":null},"institutions":[{"id":"https://openalex.org/I76569877","display_name":"Southeast University","ror":"https://ror.org/04ct4d772","country_code":"CN","type":"education","lineage":["https://openalex.org/I76569877"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Fujin Deng","raw_affiliation_strings":["Southeast University,Department of Electrical Engineering,Nanjing,China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Southeast University,Department of Electrical Engineering,Nanjing,China","institution_ids":["https://openalex.org/I76569877"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5025588570","display_name":"Zijian Zhu","orcid":"https://orcid.org/0000-0001-8343-4936"},"institutions":[{"id":"https://openalex.org/I76569877","display_name":"Southeast University","ror":"https://ror.org/04ct4d772","country_code":"CN","type":"education","lineage":["https://openalex.org/I76569877"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Zijian Zhu","raw_affiliation_strings":["Southeast University,Department of Electrical Engineering,Nanjing,China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Southeast University,Department of Electrical Engineering,Nanjing,China","institution_ids":["https://openalex.org/I76569877"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5087705787","display_name":"Huailong Li","orcid":"https://orcid.org/0009-0007-7135-3371"},"institutions":[{"id":"https://openalex.org/I76569877","display_name":"Southeast University","ror":"https://ror.org/04ct4d772","country_code":"CN","type":"education","lineage":["https://openalex.org/I76569877"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Huailong Li","raw_affiliation_strings":["Southeast University,Department of Electrical Engineering,Nanjing,China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Southeast University,Department of Electrical Engineering,Nanjing,China","institution_ids":["https://openalex.org/I76569877"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I76569877"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.27203032,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"6"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11102","display_name":"HVDC Systems and Fault Protection","score":0.9516000151634216,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11102","display_name":"HVDC Systems and Fault Protection","score":0.9516000151634216,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10228","display_name":"Multilevel Inverters and Converters","score":0.012500000186264515,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10223","display_name":"Microgrid Control and Optimization","score":0.011599999852478504,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/voltage-sag","display_name":"Voltage sag","score":0.6862999796867371},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.6532999873161316},{"id":"https://openalex.org/keywords/thyristor","display_name":"Thyristor","score":0.5795999765396118},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.5789999961853027},{"id":"https://openalex.org/keywords/transient-voltage-suppressor","display_name":"Transient voltage suppressor","score":0.5248000025749207},{"id":"https://openalex.org/keywords/transient","display_name":"Transient (computer programming)","score":0.5149000287055969},{"id":"https://openalex.org/keywords/transient-recovery-voltage","display_name":"Transient recovery voltage","score":0.5144000053405762}],"concepts":[{"id":"https://openalex.org/C2781134633","wikidata":"https://www.wikidata.org/wiki/Q14945479","display_name":"Voltage sag","level":4,"score":0.6862999796867371},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.6532999873161316},{"id":"https://openalex.org/C121922863","wikidata":"https://www.wikidata.org/wiki/Q180805","display_name":"Thyristor","level":3,"score":0.5795999765396118},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.5789999961853027},{"id":"https://openalex.org/C14915586","wikidata":"https://www.wikidata.org/wiki/Q1653998","display_name":"Transient voltage suppressor","level":3,"score":0.5248000025749207},{"id":"https://openalex.org/C2780799671","wikidata":"https://www.wikidata.org/wiki/Q17087362","display_name":"Transient (computer programming)","level":2,"score":0.5149000287055969},{"id":"https://openalex.org/C72047438","wikidata":"https://www.wikidata.org/wiki/Q779785","display_name":"Transient recovery voltage","level":5,"score":0.5144000053405762},{"id":"https://openalex.org/C47446073","wikidata":"https://www.wikidata.org/wiki/Q5165890","display_name":"Control theory (sociology)","level":3,"score":0.4975000023841858},{"id":"https://openalex.org/C89227174","wikidata":"https://www.wikidata.org/wiki/Q2388981","display_name":"Electric power system","level":3,"score":0.4083999991416931},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.40459999442100525},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.38609999418258667},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.3749000132083893},{"id":"https://openalex.org/C108755667","wikidata":"https://www.wikidata.org/wiki/Q1930258","display_name":"AC power","level":3,"score":0.3156999945640564},{"id":"https://openalex.org/C152745839","wikidata":"https://www.wikidata.org/wiki/Q5438153","display_name":"Fault detection and isolation","level":3,"score":0.2888000011444092},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.2782000005245209},{"id":"https://openalex.org/C144745244","wikidata":"https://www.wikidata.org/wiki/Q4927286","display_name":"Blocking (statistics)","level":2,"score":0.2605000138282776},{"id":"https://openalex.org/C129187525","wikidata":"https://www.wikidata.org/wiki/Q10858078","display_name":"Fault current limiter","level":4,"score":0.2583000063896179}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/iecon58223.2025.11221523","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iecon58223.2025.11221523","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IECON 2025 \u2013 51st Annual Conference of the IEEE Industrial Electronics Society","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[{"id":"https://openalex.org/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https://ror.org/01h0zpd94"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":12,"referenced_works":["https://openalex.org/W2344550066","https://openalex.org/W2906299029","https://openalex.org/W2937779185","https://openalex.org/W3128074514","https://openalex.org/W3196349026","https://openalex.org/W3208041336","https://openalex.org/W4362653220","https://openalex.org/W4386362986","https://openalex.org/W4392024470","https://openalex.org/W4400877834","https://openalex.org/W4401387398","https://openalex.org/W4402350743"],"related_works":[],"abstract_inverted_index":{"In":[0,22,69],"the":[1,14,25,43,65,79,98,110,113,124,127],"bipolar":[2,114],"HVDC":[3],"system":[4],"based":[5],"on":[6,13],"TBL-HMMC,":[7],"a":[8,58],"voltage":[9,47,59,67,76,87,129],"sag":[10,48],"can":[11,82],"occur":[12],"AC":[15,85],"side":[16,86],"during":[17],"DC":[18,26,117],"short-circuit":[19,27,118],"fault":[20,28,35,99,119],"clearing.":[21],"this":[23],"article,":[24],"clearing":[29,100,120],"process":[30],"for":[31,46],"TBL-HMMC":[32,73,115],"and":[33,53,56,121],"its":[34],"equivalent":[36],"circuit":[37],"are":[38,106],"presented.":[39],"This":[40],"paper":[41],"analyzes":[42],"underlying":[44],"reasons":[45],"resulting":[49],"from":[50],"thyristor":[51],"triggering":[52],"submodule":[54],"blocking":[55],"proposes":[57],"optimization":[60,77,130],"control":[61,131],"strategy":[62],"to":[63,91,108,122],"suppress":[64,84],"transient":[66],"sag.":[68],"addition,":[70],"compared":[71],"with":[72],"without":[74,95],"proposed":[75,80,128],"control,":[78],"approach":[81],"effectively":[83],"sags":[88],"in":[89],"order":[90],"improve":[92],"power":[93],"quality,":[94],"adversely":[96],"affecting":[97],"process.":[101],"Simulation":[102],"studies":[103],"using":[104],"PSCAD":[105],"conducted":[107],"investigate":[109],"operation":[111],"of":[112,126],"under":[116],"verify":[123],"effectiveness":[125],"method.":[132]},"counts_by_year":[],"updated_date":"2026-06-26T08:34:08.712188","created_date":"2025-11-06T00:00:00"}