{"id":"https://openalex.org/W4415968825","doi":"https://doi.org/10.1109/iecon58223.2025.11221388","title":"Equivalent Circuit Parameterization from Electrochemical Impedance Spectroscopy Data for Accurate Battery Degradation Prediction using Convolution Neural Network","display_name":"Equivalent Circuit Parameterization from Electrochemical Impedance Spectroscopy Data for Accurate Battery Degradation Prediction using Convolution Neural Network","publication_year":2025,"publication_date":"2025-10-14","ids":{"openalex":"https://openalex.org/W4415968825","doi":"https://doi.org/10.1109/iecon58223.2025.11221388"},"language":null,"primary_location":{"id":"doi:10.1109/iecon58223.2025.11221388","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iecon58223.2025.11221388","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IECON 2025 \u2013 51st Annual Conference of the IEEE Industrial Electronics Society","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5092009216","display_name":"Latha Anekal","orcid":"https://orcid.org/0009-0003-0860-8774"},"institutions":[{"id":"https://openalex.org/I39470171","display_name":"Ontario Tech University","ror":"https://ror.org/016zre027","country_code":"CA","type":"education","lineage":["https://openalex.org/I39470171"]}],"countries":["CA"],"is_corresponding":false,"raw_author_name":"Latha Anekal","raw_affiliation_strings":["Ontario Tech University,Faculty of Engineering and Applied Science,Dept. of Electrical, Computer and Software Engineering,Oshawa,Canada"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Ontario Tech University,Faculty of Engineering and Applied Science,Dept. of Electrical, Computer and Software Engineering,Oshawa,Canada","institution_ids":["https://openalex.org/I39470171"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5026297643","display_name":"Chandan Chetri","orcid":"https://orcid.org/0000-0001-8506-3657"},"institutions":[{"id":"https://openalex.org/I39470171","display_name":"Ontario Tech University","ror":"https://ror.org/016zre027","country_code":"CA","type":"education","lineage":["https://openalex.org/I39470171"]}],"countries":["CA"],"is_corresponding":false,"raw_author_name":"Chandan Chetri","raw_affiliation_strings":["Ontario Tech University,Faculty of Engineering and Applied Science,Dept. of Electrical, Computer and Software Engineering,Oshawa,Canada"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Ontario Tech University,Faculty of Engineering and Applied Science,Dept. of Electrical, Computer and Software Engineering,Oshawa,Canada","institution_ids":["https://openalex.org/I39470171"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5069214031","display_name":"Meaghan Charest-Finn","orcid":null},"institutions":[{"id":"https://openalex.org/I39470171","display_name":"Ontario Tech University","ror":"https://ror.org/016zre027","country_code":"CA","type":"education","lineage":["https://openalex.org/I39470171"]}],"countries":["CA"],"is_corresponding":false,"raw_author_name":"Meaghan Charest-Finn","raw_affiliation_strings":["Ontario Tech University,Faculty of Engineering and Applied Science,Dept. of Automotive and Mechatronics Engineering,Oshawa,Canada"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Ontario Tech University,Faculty of Engineering and Applied Science,Dept. of Automotive and Mechatronics Engineering,Oshawa,Canada","institution_ids":["https://openalex.org/I39470171"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5020550015","display_name":"Sheldon S. Williamson","orcid":"https://orcid.org/0000-0002-4617-5418"},"institutions":[{"id":"https://openalex.org/I39470171","display_name":"Ontario Tech University","ror":"https://ror.org/016zre027","country_code":"CA","type":"education","lineage":["https://openalex.org/I39470171"]}],"countries":["CA"],"is_corresponding":false,"raw_author_name":"Sheldon Williamson","raw_affiliation_strings":["Ontario Tech University,Faculty of Engineering and Applied Science,Dept. of Electrical, Computer and Software Engineering,Oshawa,Canada"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Ontario Tech University,Faculty of Engineering and Applied Science,Dept. of Electrical, Computer and Software Engineering,Oshawa,Canada","institution_ids":["https://openalex.org/I39470171"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.4985,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":{"value":0.7011045,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":95,"max":98},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"6"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10663","display_name":"Advanced Battery Technologies Research","score":0.9891999959945679,"subfield":{"id":"https://openalex.org/subfields/2203","display_name":"Automotive Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10663","display_name":"Advanced Battery Technologies Research","score":0.9891999959945679,"subfield":{"id":"https://openalex.org/subfields/2203","display_name":"Automotive Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10018","display_name":"Advancements in Battery Materials","score":0.002099999925121665,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10281","display_name":"Advanced Battery Materials and Technologies","score":0.0010999999940395355,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/interpretability","display_name":"Interpretability","score":0.7750999927520752},{"id":"https://openalex.org/keywords/equivalent-circuit","display_name":"Equivalent circuit","score":0.6873000264167786},{"id":"https://openalex.org/keywords/dielectric-spectroscopy","display_name":"Dielectric spectroscopy","score":0.5893999934196472},{"id":"https://openalex.org/keywords/robustness","display_name":"Robustness (evolution)","score":0.5651000142097473},{"id":"https://openalex.org/keywords/convolutional-neural-network","display_name":"Convolutional neural network","score":0.5260999798774719},{"id":"https://openalex.org/keywords/nyquist-plot","display_name":"Nyquist plot","score":0.5065000057220459},{"id":"https://openalex.org/keywords/electrical-impedance","display_name":"Electrical impedance","score":0.49959999322891235},{"id":"https://openalex.org/keywords/artificial-neural-network","display_name":"Artificial neural network","score":0.45879998803138733}],"concepts":[{"id":"https://openalex.org/C2781067378","wikidata":"https://www.wikidata.org/wiki/Q17027399","display_name":"Interpretability","level":2,"score":0.7750999927520752},{"id":"https://openalex.org/C23572009","wikidata":"https://www.wikidata.org/wiki/Q964981","display_name":"Equivalent circuit","level":3,"score":0.6873000264167786},{"id":"https://openalex.org/C7040849","wikidata":"https://www.wikidata.org/wiki/Q899580","display_name":"Dielectric spectroscopy","level":4,"score":0.5893999934196472},{"id":"https://openalex.org/C63479239","wikidata":"https://www.wikidata.org/wiki/Q7353546","display_name":"Robustness (evolution)","level":3,"score":0.5651000142097473},{"id":"https://openalex.org/C81363708","wikidata":"https://www.wikidata.org/wiki/Q17084460","display_name":"Convolutional neural network","level":2,"score":0.5260999798774719},{"id":"https://openalex.org/C195762429","wikidata":"https://www.wikidata.org/wiki/Q1756793","display_name":"Nyquist plot","level":5,"score":0.5065000057220459},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5005000233650208},{"id":"https://openalex.org/C17829176","wikidata":"https://www.wikidata.org/wiki/Q179043","display_name":"Electrical impedance","level":2,"score":0.49959999322891235},{"id":"https://openalex.org/C50644808","wikidata":"https://www.wikidata.org/wiki/Q192776","display_name":"Artificial neural network","level":2,"score":0.45879998803138733},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.4316999912261963},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.43140000104904175},{"id":"https://openalex.org/C45347329","wikidata":"https://www.wikidata.org/wiki/Q5166604","display_name":"Convolution (computer science)","level":3,"score":0.4189000129699707},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.3953999876976013},{"id":"https://openalex.org/C153180895","wikidata":"https://www.wikidata.org/wiki/Q7148389","display_name":"Pattern recognition (psychology)","level":2,"score":0.3926999866962433},{"id":"https://openalex.org/C2776582896","wikidata":"https://www.wikidata.org/wiki/Q5368536","display_name":"State of charge","level":4,"score":0.37139999866485596},{"id":"https://openalex.org/C555008776","wikidata":"https://www.wikidata.org/wiki/Q267298","display_name":"Battery (electricity)","level":3,"score":0.337799996137619},{"id":"https://openalex.org/C186060115","wikidata":"https://www.wikidata.org/wiki/Q30336093","display_name":"Biological system","level":1,"score":0.33390000462532043},{"id":"https://openalex.org/C2779679103","wikidata":"https://www.wikidata.org/wiki/Q5251805","display_name":"Degradation (telecommunications)","level":2,"score":0.32420000433921814},{"id":"https://openalex.org/C16910744","wikidata":"https://www.wikidata.org/wiki/Q7705759","display_name":"Test data","level":2,"score":0.288100004196167},{"id":"https://openalex.org/C11210021","wikidata":"https://www.wikidata.org/wiki/Q1520713","display_name":"Linearization","level":3,"score":0.27619999647140503},{"id":"https://openalex.org/C107908354","wikidata":"https://www.wikidata.org/wiki/Q4781456","display_name":"Applicability domain","level":3,"score":0.26919999718666077},{"id":"https://openalex.org/C99498987","wikidata":"https://www.wikidata.org/wiki/Q2210247","display_name":"Noise (video)","level":3,"score":0.26739999651908875},{"id":"https://openalex.org/C2776214188","wikidata":"https://www.wikidata.org/wiki/Q408386","display_name":"Inference","level":2,"score":0.26660001277923584},{"id":"https://openalex.org/C104122410","wikidata":"https://www.wikidata.org/wiki/Q1416406","display_name":"Network model","level":2,"score":0.26109999418258667},{"id":"https://openalex.org/C72279823","wikidata":"https://www.wikidata.org/wiki/Q1139726","display_name":"Impulse response","level":2,"score":0.25850000977516174},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2574999928474426}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/iecon58223.2025.11221388","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iecon58223.2025.11221388","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IECON 2025 \u2013 51st Annual Conference of the IEEE Industrial Electronics Society","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":37,"referenced_works":["https://openalex.org/W1497911874","https://openalex.org/W2089758017","https://openalex.org/W2529594500","https://openalex.org/W2792524465","https://openalex.org/W2979546022","https://openalex.org/W2996189182","https://openalex.org/W3167644726","https://openalex.org/W3198677506","https://openalex.org/W3207838049","https://openalex.org/W3212567342","https://openalex.org/W3213509842","https://openalex.org/W4200603035","https://openalex.org/W4210271766","https://openalex.org/W4213429775","https://openalex.org/W4224256683","https://openalex.org/W4224675642","https://openalex.org/W4229456496","https://openalex.org/W4280553674","https://openalex.org/W4283802302","https://openalex.org/W4294376330","https://openalex.org/W4297836376","https://openalex.org/W4307899064","https://openalex.org/W4309288263","https://openalex.org/W4312220571","https://openalex.org/W4319843517","https://openalex.org/W4320008294","https://openalex.org/W4323357160","https://openalex.org/W4366773864","https://openalex.org/W4387835510","https://openalex.org/W4389120439","https://openalex.org/W4390463254","https://openalex.org/W4391241771","https://openalex.org/W4392610907","https://openalex.org/W4392986359","https://openalex.org/W4405995279","https://openalex.org/W4407304468","https://openalex.org/W4407316938"],"related_works":[],"abstract_inverted_index":{"This":[0],"paper":[1],"presents":[2],"a":[3,64,104],"deep":[4],"learning-based":[5],"framework":[6],"for":[7],"the":[8,110,125,130],"automated":[9],"extraction":[10],"and":[11,44,57,86,99,127],"classification":[12,105],"of":[13,107,121,129],"equivalent":[14],"circuit":[15],"models":[16],"(ECMs)":[17],"from":[18,84],"electrochemical":[19],"impedance":[20,50],"spectroscopy":[21],"(EIS)":[22],"data,":[23],"aiming":[24],"to":[25,72],"enhance":[26],"lithium-ion":[27],"battery":[28,37],"(LIB)":[29],"diagnostics.":[30],"EIS":[31,74],"provides":[32],"detailed":[33],"insights":[34],"into":[35,76],"internal":[36],"mechanisms,":[38],"such":[39],"as":[40],"charge":[41],"transfer,":[42],"diffusion,":[43],"double-layer":[45],"capacitance,":[46],"by":[47],"analyzing":[48],"frequency-dependent":[49],"responses.":[51],"Traditional":[52],"interpretation":[53],"methods":[54],"are":[55],"labour-intensive":[56],"limited":[58],"in":[59],"scalability.":[60],"To":[61],"address":[62],"this,":[63],"one-dimensional":[65],"convolutional":[66,94],"neural":[67],"network":[68],"(1D-CNN)":[69],"is":[70],"employed":[71],"classify":[73],"spectra":[75],"four":[77],"distinct":[78],"ECM":[79],"classes":[80],"using":[81],"features":[82],"derived":[83],"real":[85],"synthetic":[87],"datasets.":[88],"The":[89,113],"model":[90],"architecture":[91],"incorporates":[92],"hierarchical":[93],"layers,":[95],"dropout,":[96],"batch":[97],"normalization,":[98],"global":[100],"average":[101],"pooling,":[102],"achieving":[103],"accuracy":[106],"95.65%":[108],"on":[109],"test":[111],"set.":[112],"predictions":[114],"align":[115],"closely":[116],"with":[117],"Nyquist":[118],"plot":[119],"characteristics":[120],"each":[122],"ECM,":[123],"validating":[124],"interpretability":[126],"robustness":[128],"model.":[131]},"counts_by_year":[{"year":2026,"cited_by_count":1}],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-11-06T00:00:00"}