{"id":"https://openalex.org/W4415968525","doi":"https://doi.org/10.1109/iecon58223.2025.11221367","title":"A 7nm CMOS Anomaly-Detection Deep-Learning Processor with Embedded A/D Converters and Pseudo-Image Generation for Sensor Fusion","display_name":"A 7nm CMOS Anomaly-Detection Deep-Learning Processor with Embedded A/D Converters and Pseudo-Image Generation for Sensor Fusion","publication_year":2025,"publication_date":"2025-10-14","ids":{"openalex":"https://openalex.org/W4415968525","doi":"https://doi.org/10.1109/iecon58223.2025.11221367"},"language":null,"primary_location":{"id":"doi:10.1109/iecon58223.2025.11221367","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iecon58223.2025.11221367","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IECON 2025 \u2013 51st Annual Conference of the IEEE Industrial Electronics Society","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5036668422","display_name":"T. Oshima","orcid":"https://orcid.org/0000-0002-1069-3221"},"institutions":[{"id":"https://openalex.org/I65143321","display_name":"Hitachi (Japan)","ror":"https://ror.org/02exqgm79","country_code":"JP","type":"company","lineage":["https://openalex.org/I65143321"]}],"countries":["JP"],"is_corresponding":true,"raw_author_name":"Takashi Oshima","raw_affiliation_strings":["Hitachi, Ltd., Research and Development Group,Tokyo,Japan"],"affiliations":[{"raw_affiliation_string":"Hitachi, Ltd., Research and Development Group,Tokyo,Japan","institution_ids":["https://openalex.org/I65143321"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5035369256","display_name":"Keisuke Yamamoto","orcid":"https://orcid.org/0000-0001-8730-598X"},"institutions":[{"id":"https://openalex.org/I65143321","display_name":"Hitachi (Japan)","ror":"https://ror.org/02exqgm79","country_code":"JP","type":"company","lineage":["https://openalex.org/I65143321"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Keisuke Yamamoto","raw_affiliation_strings":["Hitachi, Ltd., Research and Development Group,Tokyo,Japan"],"affiliations":[{"raw_affiliation_string":"Hitachi, Ltd., Research and Development Group,Tokyo,Japan","institution_ids":["https://openalex.org/I65143321"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5048323361","display_name":"Seiji Miura","orcid":"https://orcid.org/0000-0001-7545-2106"},"institutions":[{"id":"https://openalex.org/I65143321","display_name":"Hitachi (Japan)","ror":"https://ror.org/02exqgm79","country_code":"JP","type":"company","lineage":["https://openalex.org/I65143321"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Seiji Miura","raw_affiliation_strings":["Hitachi, Ltd., Research and Development Group,Tokyo,Japan"],"affiliations":[{"raw_affiliation_string":"Hitachi, Ltd., Research and Development Group,Tokyo,Japan","institution_ids":["https://openalex.org/I65143321"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5008995588","display_name":"Keita Yamane","orcid":"https://orcid.org/0009-0004-2382-6670"},"institutions":[{"id":"https://openalex.org/I65143321","display_name":"Hitachi (Japan)","ror":"https://ror.org/02exqgm79","country_code":"JP","type":"company","lineage":["https://openalex.org/I65143321"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Keita Yamane","raw_affiliation_strings":["Hitachi, Ltd., Research and Development Group,Tokyo,Japan"],"affiliations":[{"raw_affiliation_string":"Hitachi, Ltd., Research and Development Group,Tokyo,Japan","institution_ids":["https://openalex.org/I65143321"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5108188581","display_name":"Goichi Ono","orcid":null},"institutions":[{"id":"https://openalex.org/I65143321","display_name":"Hitachi (Japan)","ror":"https://ror.org/02exqgm79","country_code":"JP","type":"company","lineage":["https://openalex.org/I65143321"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Goichi Ono","raw_affiliation_strings":["Hitachi, Ltd., Research and Development Group,Tokyo,Japan"],"affiliations":[{"raw_affiliation_string":"Hitachi, Ltd., Research and Development Group,Tokyo,Japan","institution_ids":["https://openalex.org/I65143321"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":5,"corresponding_author_ids":["https://openalex.org/A5036668422"],"corresponding_institution_ids":["https://openalex.org/I65143321"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.34875476,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"6"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11992","display_name":"CCD and CMOS Imaging Sensors","score":0.6416000127792358,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11992","display_name":"CCD and CMOS Imaging Sensors","score":0.6416000127792358,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12549","display_name":"Image and Object Detection Techniques","score":0.032999999821186066,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11667","display_name":"Advanced Chemical Sensor Technologies","score":0.029899999499320984,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/converters","display_name":"Converters","score":0.7809000015258789},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.7592999935150146},{"id":"https://openalex.org/keywords/chip","display_name":"Chip","score":0.5322999954223633},{"id":"https://openalex.org/keywords/generator","display_name":"Generator (circuit theory)","score":0.4887999892234802},{"id":"https://openalex.org/keywords/process","display_name":"Process (computing)","score":0.4537999927997589},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.4478999972343445},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.43380001187324524},{"id":"https://openalex.org/keywords/image-sensor","display_name":"Image sensor","score":0.42260000109672546}],"concepts":[{"id":"https://openalex.org/C2778422915","wikidata":"https://www.wikidata.org/wiki/Q10302051","display_name":"Converters","level":3,"score":0.7809000015258789},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.7592999935150146},{"id":"https://openalex.org/C165005293","wikidata":"https://www.wikidata.org/wiki/Q1074500","display_name":"Chip","level":2,"score":0.5322999954223633},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5315999984741211},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.5164999961853027},{"id":"https://openalex.org/C2780992000","wikidata":"https://www.wikidata.org/wiki/Q17016113","display_name":"Generator (circuit theory)","level":3,"score":0.4887999892234802},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.4537999927997589},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.4478999972343445},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.43380001187324524},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.4284000098705292},{"id":"https://openalex.org/C76935873","wikidata":"https://www.wikidata.org/wiki/Q209121","display_name":"Image sensor","level":2,"score":0.42260000109672546},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.4016999900341034},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.39660000801086426},{"id":"https://openalex.org/C530198007","wikidata":"https://www.wikidata.org/wiki/Q80831","display_name":"Integrated circuit","level":2,"score":0.3361000120639801},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.31540000438690186},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.3131999969482422},{"id":"https://openalex.org/C161611012","wikidata":"https://www.wikidata.org/wiki/Q106370","display_name":"Digital signal processor","level":3,"score":0.30869999527931213},{"id":"https://openalex.org/C33954974","wikidata":"https://www.wikidata.org/wiki/Q486494","display_name":"Sensor fusion","level":2,"score":0.29249998927116394},{"id":"https://openalex.org/C158525013","wikidata":"https://www.wikidata.org/wiki/Q2593739","display_name":"Fusion","level":2,"score":0.2867000102996826},{"id":"https://openalex.org/C118021083","wikidata":"https://www.wikidata.org/wiki/Q610398","display_name":"System on a chip","level":2,"score":0.2842000126838684},{"id":"https://openalex.org/C204323151","wikidata":"https://www.wikidata.org/wiki/Q905424","display_name":"Range (aeronautics)","level":2,"score":0.2822999954223633},{"id":"https://openalex.org/C52192207","wikidata":"https://www.wikidata.org/wiki/Q5322","display_name":"Capacitor","level":3,"score":0.2694000005722046},{"id":"https://openalex.org/C84462506","wikidata":"https://www.wikidata.org/wiki/Q173142","display_name":"Digital signal processing","level":2,"score":0.2549000084400177},{"id":"https://openalex.org/C131017901","wikidata":"https://www.wikidata.org/wiki/Q170451","display_name":"Logic gate","level":2,"score":0.2515000104904175}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/iecon58223.2025.11221367","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iecon58223.2025.11221367","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IECON 2025 \u2013 51st Annual Conference of the IEEE Industrial Electronics Society","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":19,"referenced_works":["https://openalex.org/W2921226899","https://openalex.org/W2921610057","https://openalex.org/W2966841637","https://openalex.org/W3015461743","https://openalex.org/W3048543522","https://openalex.org/W3094502228","https://openalex.org/W3133715175","https://openalex.org/W3133725905","https://openalex.org/W3186641898","https://openalex.org/W3205706264","https://openalex.org/W4360606495","https://openalex.org/W4360606511","https://openalex.org/W4364304235","https://openalex.org/W4385192501","https://openalex.org/W4385223332","https://openalex.org/W4392745761","https://openalex.org/W4401880242","https://openalex.org/W4401880253","https://openalex.org/W4401880618"],"related_works":[],"abstract_inverted_index":{"An":[0],"all-in-one":[1],"anomaly-detection":[2,81],"processor":[3,14,82],"for":[4,32],"an":[5],"extensive":[6],"range":[7],"of":[8,25,69,78,93,102],"industrial":[9,88],"applications":[10],"is":[11,83,98],"presented.":[12],"This":[13],"uniquely":[15],"integrates":[16],"A/D":[17,74,107],"converters":[18,108],"as":[19],"a":[20,23,29,36,66,110],"multiple-sensor":[21],"interface,":[22],"generator":[24],"pseudo":[26],"images":[27,47],"and":[28,105],"DNN":[30],"accelerator":[31],"image":[33],"recognition":[34],"on":[35],"single":[37],"7nm":[38],"CMOS":[39,112],"chip.":[40],"The":[41,76],"chip":[42],"can":[43],"process":[44],"not":[45],"only":[46,60],"but":[48],"also":[49],"any":[50],"sensor":[51],"signals":[52],"with":[53,59,85,109],"enhanced":[54],"sensor-fusion":[55],"capability.":[56],"It":[57],"operates":[58],"150mW":[61],"power":[62],"at":[63],"100MHz":[64],"under":[65],"supply":[67],"voltage":[68],"0.75V,":[70],"including":[71],"the":[72,91,94,99],"16-channel":[73],"converters.":[75],"effectiveness":[77],"this":[79,97],"single-chip":[80],"proved":[84],"two":[86],"actual":[87],"applications.":[89],"To":[90],"best":[92],"authors\u2019":[95],"knowledge,":[96],"first":[100],"integration":[101],"digital":[103],"AI":[104],"high-performance":[106],"FinFET":[111],"technology.":[113]},"counts_by_year":[],"updated_date":"2026-03-07T16:01:11.037858","created_date":"2025-11-06T00:00:00"}