{"id":"https://openalex.org/W4415970343","doi":"https://doi.org/10.1109/iecon58223.2025.11221333","title":"Impacts of Cyber-Physical Attacks in SST-GFMI-Based Microgrid","display_name":"Impacts of Cyber-Physical Attacks in SST-GFMI-Based Microgrid","publication_year":2025,"publication_date":"2025-10-14","ids":{"openalex":"https://openalex.org/W4415970343","doi":"https://doi.org/10.1109/iecon58223.2025.11221333"},"language":null,"primary_location":{"id":"doi:10.1109/iecon58223.2025.11221333","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iecon58223.2025.11221333","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IECON 2025 \u2013 51st Annual Conference of the IEEE Industrial Electronics Society","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5095782608","display_name":"Debotrinya Sur","orcid":"https://orcid.org/0009-0004-0236-8359"},"institutions":[{"id":"https://openalex.org/I39422238","display_name":"University of Illinois Chicago","ror":"https://ror.org/02mpq6x41","country_code":"US","type":"education","lineage":["https://openalex.org/I39422238"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"Debotrinya Sur","raw_affiliation_strings":["University of Illinois Chicago,Department of Electrical and Computer Engineering,Chicago,USA"],"affiliations":[{"raw_affiliation_string":"University of Illinois Chicago,Department of Electrical and Computer Engineering,Chicago,USA","institution_ids":["https://openalex.org/I39422238"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5065548114","display_name":"Uzair Asif","orcid":null},"institutions":[{"id":"https://openalex.org/I39422238","display_name":"University of Illinois Chicago","ror":"https://ror.org/02mpq6x41","country_code":"US","type":"education","lineage":["https://openalex.org/I39422238"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Uzair Asif","raw_affiliation_strings":["University of Illinois Chicago,Department of Electrical and Computer Engineering,Chicago,USA"],"affiliations":[{"raw_affiliation_string":"University of Illinois Chicago,Department of Electrical and Computer Engineering,Chicago,USA","institution_ids":["https://openalex.org/I39422238"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5116570110","display_name":"Harsha Vardhan Reddy Modugu","orcid":null},"institutions":[{"id":"https://openalex.org/I39422238","display_name":"University of Illinois Chicago","ror":"https://ror.org/02mpq6x41","country_code":"US","type":"education","lineage":["https://openalex.org/I39422238"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Harsha V. R. Modugu","raw_affiliation_strings":["University of Illinois Chicago,Department of Electrical and Computer Engineering,Chicago,USA"],"affiliations":[{"raw_affiliation_string":"University of Illinois Chicago,Department of Electrical and Computer Engineering,Chicago,USA","institution_ids":["https://openalex.org/I39422238"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5062334301","display_name":"Luiz Fernando Marquez Arruda","orcid":"https://orcid.org/0000-0002-9159-2245"},"institutions":[{"id":"https://openalex.org/I39422238","display_name":"University of Illinois Chicago","ror":"https://ror.org/02mpq6x41","country_code":"US","type":"education","lineage":["https://openalex.org/I39422238"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Luiz F. M. Arruda","raw_affiliation_strings":["University of Illinois Chicago,Department of Electrical and Computer Engineering,Chicago,USA"],"affiliations":[{"raw_affiliation_string":"University of Illinois Chicago,Department of Electrical and Computer Engineering,Chicago,USA","institution_ids":["https://openalex.org/I39422238"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5056702823","display_name":"Sudip K. Mazumder","orcid":"https://orcid.org/0000-0002-6157-9373"},"institutions":[{"id":"https://openalex.org/I39422238","display_name":"University of Illinois Chicago","ror":"https://ror.org/02mpq6x41","country_code":"US","type":"education","lineage":["https://openalex.org/I39422238"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Sudip K. Mazumder","raw_affiliation_strings":["University of Illinois Chicago,Department of Electrical and Computer Engineering,Chicago,USA"],"affiliations":[{"raw_affiliation_string":"University of Illinois Chicago,Department of Electrical and Computer Engineering,Chicago,USA","institution_ids":["https://openalex.org/I39422238"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5029630831","display_name":"Mohammad B. Shadmand","orcid":"https://orcid.org/0000-0002-3950-8640"},"institutions":[{"id":"https://openalex.org/I39422238","display_name":"University of Illinois Chicago","ror":"https://ror.org/02mpq6x41","country_code":"US","type":"education","lineage":["https://openalex.org/I39422238"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Mohammad Shadmand","raw_affiliation_strings":["University of Illinois Chicago,Department of Electrical and Computer Engineering,Chicago,USA"],"affiliations":[{"raw_affiliation_string":"University of Illinois Chicago,Department of Electrical and Computer Engineering,Chicago,USA","institution_ids":["https://openalex.org/I39422238"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":6,"corresponding_author_ids":["https://openalex.org/A5095782608"],"corresponding_institution_ids":["https://openalex.org/I39422238"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.40901207,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"8"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10917","display_name":"Smart Grid Security and Resilience","score":0.7770000100135803,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10917","display_name":"Smart Grid Security and Resilience","score":0.7770000100135803,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10223","display_name":"Microgrid Control and Optimization","score":0.12080000340938568,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11102","display_name":"HVDC Systems and Fault Protection","score":0.021800000220537186,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/microgrid","display_name":"Microgrid","score":0.6439999938011169},{"id":"https://openalex.org/keywords/blackout","display_name":"Blackout","score":0.5759000182151794},{"id":"https://openalex.org/keywords/electric-power-system","display_name":"Electric power system","score":0.544700026512146},{"id":"https://openalex.org/keywords/transformer","display_name":"Transformer","score":0.48420000076293945},{"id":"https://openalex.org/keywords/tripping","display_name":"Tripping","score":0.462799996137619},{"id":"https://openalex.org/keywords/power-system-protection","display_name":"Power-system protection","score":0.42239999771118164},{"id":"https://openalex.org/keywords/flexibility","display_name":"Flexibility (engineering)","score":0.41760000586509705},{"id":"https://openalex.org/keywords/circuit-breaker","display_name":"Circuit breaker","score":0.3698999881744385},{"id":"https://openalex.org/keywords/iec-61850","display_name":"IEC 61850","score":0.3596999943256378}],"concepts":[{"id":"https://openalex.org/C2776784348","wikidata":"https://www.wikidata.org/wiki/Q5762595","display_name":"Microgrid","level":3,"score":0.6439999938011169},{"id":"https://openalex.org/C2777693866","wikidata":"https://www.wikidata.org/wiki/Q359099","display_name":"Blackout","level":4,"score":0.5759000182151794},{"id":"https://openalex.org/C89227174","wikidata":"https://www.wikidata.org/wiki/Q2388981","display_name":"Electric power system","level":3,"score":0.544700026512146},{"id":"https://openalex.org/C66322947","wikidata":"https://www.wikidata.org/wiki/Q11658","display_name":"Transformer","level":3,"score":0.48420000076293945},{"id":"https://openalex.org/C2779733308","wikidata":"https://www.wikidata.org/wiki/Q17146464","display_name":"Tripping","level":3,"score":0.462799996137619},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.44749999046325684},{"id":"https://openalex.org/C38361682","wikidata":"https://www.wikidata.org/wiki/Q1756067","display_name":"Power-system protection","level":4,"score":0.42239999771118164},{"id":"https://openalex.org/C2780598303","wikidata":"https://www.wikidata.org/wiki/Q65921492","display_name":"Flexibility (engineering)","level":2,"score":0.41760000586509705},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.41749998927116394},{"id":"https://openalex.org/C38652104","wikidata":"https://www.wikidata.org/wiki/Q3510521","display_name":"Computer security","level":1,"score":0.39590001106262207},{"id":"https://openalex.org/C61352017","wikidata":"https://www.wikidata.org/wiki/Q211058","display_name":"Circuit breaker","level":2,"score":0.3698999881744385},{"id":"https://openalex.org/C2778907243","wikidata":"https://www.wikidata.org/wiki/Q168160","display_name":"IEC 61850","level":3,"score":0.3596999943256378},{"id":"https://openalex.org/C2778562939","wikidata":"https://www.wikidata.org/wiki/Q1298791","display_name":"Synchronization (alternating current)","level":3,"score":0.35260000824928284},{"id":"https://openalex.org/C158251709","wikidata":"https://www.wikidata.org/wiki/Q354025","display_name":"Intrusion","level":2,"score":0.3449000120162964},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.3409999907016754},{"id":"https://openalex.org/C25915539","wikidata":"https://www.wikidata.org/wiki/Q220786","display_name":"Automatic frequency control","level":2,"score":0.3312999904155731},{"id":"https://openalex.org/C2781233147","wikidata":"https://www.wikidata.org/wiki/Q3229617","display_name":"Governor","level":2,"score":0.32690000534057617},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.3206999897956848},{"id":"https://openalex.org/C131584629","wikidata":"https://www.wikidata.org/wiki/Q4308705","display_name":"Coupling (piping)","level":2,"score":0.3131999969482422},{"id":"https://openalex.org/C99498987","wikidata":"https://www.wikidata.org/wiki/Q2210247","display_name":"Noise (video)","level":3,"score":0.3046000003814697},{"id":"https://openalex.org/C2775924081","wikidata":"https://www.wikidata.org/wiki/Q55608371","display_name":"Control (management)","level":2,"score":0.2872999906539917},{"id":"https://openalex.org/C110407247","wikidata":"https://www.wikidata.org/wiki/Q122508","display_name":"Inertia","level":2,"score":0.28360000252723694},{"id":"https://openalex.org/C35525427","wikidata":"https://www.wikidata.org/wiki/Q745881","display_name":"Intrusion detection system","level":2,"score":0.2818000018596649},{"id":"https://openalex.org/C2412688","wikidata":"https://www.wikidata.org/wiki/Q503732","display_name":"Protective relay","level":4,"score":0.2782999873161316},{"id":"https://openalex.org/C2779079576","wikidata":"https://www.wikidata.org/wiki/Q17092823","display_name":"Jamming","level":2,"score":0.27160000801086426},{"id":"https://openalex.org/C527821871","wikidata":"https://www.wikidata.org/wiki/Q228502","display_name":"Access control","level":2,"score":0.2705000042915344},{"id":"https://openalex.org/C2779585090","wikidata":"https://www.wikidata.org/wiki/Q3457762","display_name":"Resilience (materials science)","level":2,"score":0.26339998841285706},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.2603999972343445},{"id":"https://openalex.org/C56685638","wikidata":"https://www.wikidata.org/wiki/Q2300474","display_name":"Power control","level":3,"score":0.25859999656677246},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.2533999979496002}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/iecon58223.2025.11221333","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iecon58223.2025.11221333","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IECON 2025 \u2013 51st Annual Conference of the IEEE Industrial Electronics Society","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[{"id":"https://openalex.org/F4320306076","display_name":"National Science Foundation","ror":"https://ror.org/021nxhr62"},{"id":"https://openalex.org/F4320306084","display_name":"U.S. Department of Energy","ror":"https://ror.org/01bj3aw27"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":19,"referenced_works":["https://openalex.org/W3118234630","https://openalex.org/W3119530021","https://openalex.org/W3194625017","https://openalex.org/W3206033293","https://openalex.org/W4205571244","https://openalex.org/W4212901717","https://openalex.org/W4320497599","https://openalex.org/W4368232948","https://openalex.org/W4383751650","https://openalex.org/W4386362892","https://openalex.org/W4394966909","https://openalex.org/W4400811400","https://openalex.org/W4401117567","https://openalex.org/W4403391234","https://openalex.org/W4405429569","https://openalex.org/W4406322324","https://openalex.org/W4406331660","https://openalex.org/W4407303793","https://openalex.org/W4408281247"],"related_works":[],"abstract_inverted_index":{"The":[0,23,92,167],"integration":[1],"of":[2,37,50,62,71,84,140,161,172],"solid-state":[3],"transformers":[4],"(SSTs)":[5],"with":[6,67],"grid-forming":[7],"inverters":[8],"(GFMIs)":[9],"improves":[10],"flexibility":[11],"and":[12,28,81,102,129,138,150,181],"control":[13,98,188],"in":[14,34,121,154,177],"modern":[15],"microgrids":[16,180],"while":[17],"simultaneously":[18],"introducing":[19],"new":[20],"cyber-physical":[21],"vulnerabilities.":[22],"strong":[24],"coupling":[25,146],"between":[26,147],"SSTs":[27],"GFMIs":[29,152],"creates":[30],"dynamics":[31],"that":[32,115],"result":[33,120],"the":[35,41,60,68,72,135,145,148,151,159,162,170,183],"diffusion":[36],"localized":[38],"cyberattacks":[39],"throughout":[40],"microgrid.":[42],"This":[43],"paper":[44],"provides":[45],"a":[46,74,108],"comprehensive":[47],"impact":[48],"analysis":[49],"four":[51],"representative":[52],"cyberattack":[53],"scenarios:":[54],"side-channel":[55],"noise":[56],"intrusion":[57],"(SNI)":[58],"compromising":[59],"integrity":[61],"SST":[63,149],"measurement":[64],"feedback,":[65],"tampering":[66],"voltage-regulation":[69],"loop":[70],"SST,":[73],"virtual":[75],"governor":[76],"frequency-restoration":[77],"attack":[78],"on":[79,107],"GFMI,":[80],"cascaded":[82],"tripping":[83],"breakers":[85],"simulating":[86],"insider":[87],"access":[88],"to":[89,134],"protection":[90,100],"coordination.":[91],"attacks":[93,118],"are":[94,103],"targeted":[95],"towards":[96],"specific":[97],"or":[99],"layers":[101],"evaluated":[104],"through":[105],"simulations":[106],"modified":[109],"IEEE":[110],"14-bus":[111],"system.":[112,166],"Results":[113],"demonstrate":[114],"even":[116,156],"brief":[117],"can":[119],"prolonged":[122],"instability,":[123],"including":[124],"frequency":[125],"deviations,":[126],"power":[127,141,178],"oscillations,":[128],"voltage":[130],"regulation":[131],"failures,":[132],"due":[133],"low":[136],"inertia":[137],"damping":[139],"electronic-based":[142],"systems.":[143],"Furthermore,":[144],"results":[153],"aftereffects":[155],"well":[157],"beyond":[158],"removal":[160],"attack,":[163],"degrading":[164],"overall":[165],"findings":[168],"underscore":[169],"importance":[171],"recognizing":[173],"control-layer":[174],"cyber":[175],"threats":[176],"electronic-dominated":[179],"motivate":[182],"need":[184],"for":[185],"more":[186],"resilient":[187],"architectures.":[189]},"counts_by_year":[],"updated_date":"2026-04-09T08:11:56.329763","created_date":"2025-11-06T00:00:00"}