{"id":"https://openalex.org/W4415969067","doi":"https://doi.org/10.1109/iecon58223.2025.11221086","title":"Modeling and Suppression of Transient Voltage Interference in Magnetic Field-Based Current Sensors","display_name":"Modeling and Suppression of Transient Voltage Interference in Magnetic Field-Based Current Sensors","publication_year":2025,"publication_date":"2025-10-14","ids":{"openalex":"https://openalex.org/W4415969067","doi":"https://doi.org/10.1109/iecon58223.2025.11221086"},"language":null,"primary_location":{"id":"doi:10.1109/iecon58223.2025.11221086","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iecon58223.2025.11221086","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IECON 2025 \u2013 51st Annual Conference of the IEEE Industrial Electronics Society","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5009289126","display_name":"Changbao Xu","orcid":"https://orcid.org/0000-0003-1128-0063"},"institutions":[{"id":"https://openalex.org/I4210145500","display_name":"Guizhou Electric Power Design and Research Institute","ror":"https://ror.org/055f13495","country_code":"CN","type":"facility","lineage":["https://openalex.org/I4210145500"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Changbao Xu","raw_affiliation_strings":["Guizhou Power Grid Co., Ltd.,Electric Power Research Institute,Guizhou,China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Guizhou Power Grid Co., Ltd.,Electric Power Research Institute,Guizhou,China","institution_ids":["https://openalex.org/I4210145500"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100641887","display_name":"Zhaohui Jiang","orcid":"https://orcid.org/0000-0002-1383-8502"},"institutions":[{"id":"https://openalex.org/I76130692","display_name":"Zhejiang University","ror":"https://ror.org/00a2xv884","country_code":"CN","type":"education","lineage":["https://openalex.org/I76130692"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Zhaohui Jiang","raw_affiliation_strings":["Zhejiang University,College of Electrical Engineering,Hangzhou,China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Zhejiang University,College of Electrical Engineering,Hangzhou,China","institution_ids":["https://openalex.org/I76130692"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5087160244","display_name":"Mingyong Xin","orcid":"https://orcid.org/0000-0002-7521-6362"},"institutions":[{"id":"https://openalex.org/I4210145500","display_name":"Guizhou Electric Power Design and Research Institute","ror":"https://ror.org/055f13495","country_code":"CN","type":"facility","lineage":["https://openalex.org/I4210145500"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Mingyong Xin","raw_affiliation_strings":["Guizhou Power Grid Co., Ltd.,Electric Power Research Institute,Guizhou,China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Guizhou Power Grid Co., Ltd.,Electric Power Research Institute,Guizhou,China","institution_ids":["https://openalex.org/I4210145500"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5105579302","display_name":"Houyi Zhang","orcid":null},"institutions":[{"id":"https://openalex.org/I4210145500","display_name":"Guizhou Electric Power Design and Research Institute","ror":"https://ror.org/055f13495","country_code":"CN","type":"facility","lineage":["https://openalex.org/I4210145500"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Houyi Zhang","raw_affiliation_strings":["Guizhou Power Grid Co., Ltd.,Electric Power Research Institute,Guizhou,China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Guizhou Power Grid Co., Ltd.,Electric Power Research Institute,Guizhou,China","institution_ids":["https://openalex.org/I4210145500"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5116209733","display_name":"Aozu Luan","orcid":null},"institutions":[{"id":"https://openalex.org/I76130692","display_name":"Zhejiang University","ror":"https://ror.org/00a2xv884","country_code":"CN","type":"education","lineage":["https://openalex.org/I76130692"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Aozu Luan","raw_affiliation_strings":["Zhejiang University,College of Electrical Engineering,Hangzhou,China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Zhejiang University,College of Electrical Engineering,Hangzhou,China","institution_ids":["https://openalex.org/I76130692"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5107539821","display_name":"Shuai Shao","orcid":"https://orcid.org/0000-0002-1475-3738"},"institutions":[{"id":"https://openalex.org/I76130692","display_name":"Zhejiang University","ror":"https://ror.org/00a2xv884","country_code":"CN","type":"education","lineage":["https://openalex.org/I76130692"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Shuai Shao","raw_affiliation_strings":["Zhejiang University,College of Electrical Engineering,Hangzhou,China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Zhejiang University,College of Electrical Engineering,Hangzhou,China","institution_ids":["https://openalex.org/I76130692"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.39468564,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"6"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12692","display_name":"Magnetic Field Sensors Techniques","score":0.9933000206947327,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12692","display_name":"Magnetic Field Sensors Techniques","score":0.9933000206947327,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11993","display_name":"Atomic and Subatomic Physics Research","score":0.0031999999191612005,"subfield":{"id":"https://openalex.org/subfields/3107","display_name":"Atomic and Molecular Physics, and Optics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12510","display_name":"Magneto-Optical Properties and Applications","score":0.00039999998989515007,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/transient","display_name":"Transient (computer programming)","score":0.722599983215332},{"id":"https://openalex.org/keywords/electromagnetic-shielding","display_name":"Electromagnetic shielding","score":0.6531000137329102},{"id":"https://openalex.org/keywords/electromagnetic-interference","display_name":"Electromagnetic interference","score":0.5313000082969666},{"id":"https://openalex.org/keywords/noise","display_name":"Noise (video)","score":0.5278000235557556},{"id":"https://openalex.org/keywords/equivalent-circuit","display_name":"Equivalent circuit","score":0.49320000410079956},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.4706999957561493},{"id":"https://openalex.org/keywords/attenuation","display_name":"Attenuation","score":0.44350001215934753},{"id":"https://openalex.org/keywords/interference","display_name":"Interference (communication)","score":0.4235999882221222},{"id":"https://openalex.org/keywords/transient-voltage-suppressor","display_name":"Transient voltage suppressor","score":0.4172999858856201}],"concepts":[{"id":"https://openalex.org/C2780799671","wikidata":"https://www.wikidata.org/wiki/Q17087362","display_name":"Transient (computer programming)","level":2,"score":0.722599983215332},{"id":"https://openalex.org/C2265751","wikidata":"https://www.wikidata.org/wiki/Q332007","display_name":"Electromagnetic shielding","level":2,"score":0.6531000137329102},{"id":"https://openalex.org/C184892835","wikidata":"https://www.wikidata.org/wiki/Q1474513","display_name":"Electromagnetic interference","level":2,"score":0.5313000082969666},{"id":"https://openalex.org/C99498987","wikidata":"https://www.wikidata.org/wiki/Q2210247","display_name":"Noise (video)","level":3,"score":0.5278000235557556},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.5235999822616577},{"id":"https://openalex.org/C23572009","wikidata":"https://www.wikidata.org/wiki/Q964981","display_name":"Equivalent circuit","level":3,"score":0.49320000410079956},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.4706999957561493},{"id":"https://openalex.org/C184652730","wikidata":"https://www.wikidata.org/wiki/Q2357982","display_name":"Attenuation","level":2,"score":0.44350001215934753},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.42649999260902405},{"id":"https://openalex.org/C32022120","wikidata":"https://www.wikidata.org/wiki/Q797225","display_name":"Interference (communication)","level":3,"score":0.4235999882221222},{"id":"https://openalex.org/C14915586","wikidata":"https://www.wikidata.org/wiki/Q1653998","display_name":"Transient voltage suppressor","level":3,"score":0.4172999858856201},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.3813000023365021},{"id":"https://openalex.org/C85761212","wikidata":"https://www.wikidata.org/wiki/Q1974593","display_name":"Transient response","level":2,"score":0.3684000074863434},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.36239999532699585},{"id":"https://openalex.org/C33441834","wikidata":"https://www.wikidata.org/wiki/Q693004","display_name":"Transmission line","level":2,"score":0.3562999963760376},{"id":"https://openalex.org/C120398109","wikidata":"https://www.wikidata.org/wiki/Q175751","display_name":"Quantum tunnelling","level":2,"score":0.3465999960899353},{"id":"https://openalex.org/C43461449","wikidata":"https://www.wikidata.org/wiki/Q2495531","display_name":"EMI","level":3,"score":0.3296000063419342},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.3127000033855438},{"id":"https://openalex.org/C2781331714","wikidata":"https://www.wikidata.org/wiki/Q1163768","display_name":"Current source","level":3,"score":0.3061000108718872},{"id":"https://openalex.org/C761482","wikidata":"https://www.wikidata.org/wiki/Q118093","display_name":"Transmission (telecommunications)","level":2,"score":0.30390000343322754},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.2996000051498413},{"id":"https://openalex.org/C117958382","wikidata":"https://www.wikidata.org/wiki/Q58347","display_name":"Magnetoresistance","level":3,"score":0.29919999837875366},{"id":"https://openalex.org/C58289394","wikidata":"https://www.wikidata.org/wiki/Q465115","display_name":"Varistor","level":3,"score":0.2978000044822693},{"id":"https://openalex.org/C178911571","wikidata":"https://www.wikidata.org/wiki/Q593143","display_name":"Power electronics","level":3,"score":0.2969000041484833},{"id":"https://openalex.org/C88182573","wikidata":"https://www.wikidata.org/wiki/Q1139740","display_name":"High voltage","level":3,"score":0.29249998927116394},{"id":"https://openalex.org/C140311924","wikidata":"https://www.wikidata.org/wiki/Q200928","display_name":"Electric power transmission","level":2,"score":0.2867000102996826},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.2858000099658966},{"id":"https://openalex.org/C46205389","wikidata":"https://www.wikidata.org/wiki/Q1270401","display_name":"Electronic circuit simulation","level":3,"score":0.28529998660087585},{"id":"https://openalex.org/C138331895","wikidata":"https://www.wikidata.org/wiki/Q11650","display_name":"Electronics","level":2,"score":0.27639999985694885},{"id":"https://openalex.org/C148043351","wikidata":"https://www.wikidata.org/wiki/Q4456944","display_name":"Current (fluid)","level":2,"score":0.2703000009059906},{"id":"https://openalex.org/C190560348","wikidata":"https://www.wikidata.org/wiki/Q3245116","display_name":"Circuit design","level":2,"score":0.2615000009536743}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/iecon58223.2025.11221086","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iecon58223.2025.11221086","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IECON 2025 \u2013 51st Annual Conference of the IEEE Industrial Electronics Society","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[{"id":"https://openalex.org/F4320323192","display_name":"China Southern Power Grid","ror":"https://ror.org/03hkh9419"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":8,"referenced_works":["https://openalex.org/W2127394451","https://openalex.org/W2419520792","https://openalex.org/W3205016666","https://openalex.org/W3214206326","https://openalex.org/W4382119121","https://openalex.org/W4386966536","https://openalex.org/W4390604744","https://openalex.org/W4407304266"],"related_works":[],"abstract_inverted_index":{"Magnetic":[0],"field-based":[1],"current":[2,122],"sensors":[3,28,43],"have":[4],"been":[5],"widely":[6],"employed":[7],"in":[8],"power":[9,12],"electronics":[10],"and":[11,22,37,72],"systems":[13],"due":[14],"to":[15,46,78,94,110],"their":[16,55],"non-invasive":[17],"measurement":[18],"capability,":[19],"high":[20,23],"bandwidth,":[21],"precision.":[24],"Typical":[25],"examples":[26],"include":[27],"based":[29],"on":[30],"the":[31,61,104,121,133,148],"Hall":[32],"effect,":[33],"tunneling":[34],"magnetoresistance":[35],"(TMR),":[36],"diamond":[38],"quantum":[39],"effects.":[40],"However,":[41],"these":[42],"are":[44],"prone":[45],"transient":[47,65,96],"voltage":[48,66,97],"interference,":[49],"which":[50],"induces":[51],"switching":[52,144],"spikes":[53,145],"at":[54],"output":[56],"terminals.":[57],"This":[58],"study":[59],"investigates":[60],"generation":[62],"mechanism":[63],"of":[64,120],"interference":[67,140],"through":[68],"comprehensive":[69],"circuit":[70,76,101,118],"analysis":[71],"establishes":[73],"an":[74],"equivalent":[75,100,117],"model":[77,102,119],"characterize":[79],"noise":[80,113],"transmission":[81],"pathways.":[82],"To":[83],"address":[84],"this":[85],"issue,":[86],"a":[87],"novel":[88],"comb-shaped":[89,105,125],"shielding":[90,106,126,135],"structure":[91],"is":[92,108,127],"proposed":[93,134],"suppress":[95],"coupling.":[98],"The":[99,116],"incorporating":[103],"configuration":[107],"developed":[109],"analyze":[111],"its":[112],"attenuation":[114],"performance.":[115],"sensor":[123],"with":[124],"constructed.":[128],"Experimental":[129],"results":[130],"demonstrate":[131],"that":[132],"architecture":[136],"achieves":[137],"over":[138],"95%":[139],"attenuation,":[141],"effectively":[142],"eliminating":[143],"while":[146],"preserving":[147],"sensor's":[149],"intrinsic":[150],"characteristics.":[151]},"counts_by_year":[],"updated_date":"2026-07-29T14:22:42.915294","created_date":"2025-11-06T00:00:00"}