{"id":"https://openalex.org/W4408282128","doi":"https://doi.org/10.1109/iecon55916.2024.10906047","title":"A Plug-and-Play Sensor System for Machine Fault Diagnosis in Lights-Out Manufacturing","display_name":"A Plug-and-Play Sensor System for Machine Fault Diagnosis in Lights-Out Manufacturing","publication_year":2024,"publication_date":"2024-11-03","ids":{"openalex":"https://openalex.org/W4408282128","doi":"https://doi.org/10.1109/iecon55916.2024.10906047"},"language":"en","primary_location":{"id":"doi:10.1109/iecon55916.2024.10906047","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iecon55916.2024.10906047","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IECON 2024 - 50th Annual Conference of the IEEE Industrial Electronics Society","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5100939951","display_name":"Wanlin Yang","orcid":"https://orcid.org/0000-0001-6048-0868"},"institutions":[{"id":"https://openalex.org/I24943067","display_name":"Fudan University","ror":"https://ror.org/013q1eq08","country_code":"CN","type":"education","lineage":["https://openalex.org/I24943067"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Wanlin Yang","raw_affiliation_strings":["Fudan University,School of Information Science and Technology,Shanghai,China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Fudan University,School of Information Science and Technology,Shanghai,China","institution_ids":["https://openalex.org/I24943067"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5060993812","display_name":"Fan Yang","orcid":"https://orcid.org/0000-0002-8916-8605"},"institutions":[{"id":"https://openalex.org/I4210091347","display_name":"Robert Bosch (China)","ror":"https://ror.org/00cedkn40","country_code":"CN","type":"company","lineage":["https://openalex.org/I4210091347","https://openalex.org/I889804353"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Fan Yang","raw_affiliation_strings":["Bosch (China) Investment Ltd.,Bosch Corporate Research Asia Pacific,Shanghai,China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Bosch (China) Investment Ltd.,Bosch Corporate Research Asia Pacific,Shanghai,China","institution_ids":["https://openalex.org/I4210091347"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5074476492","display_name":"Zhuo Zou","orcid":null},"institutions":[{"id":"https://openalex.org/I24943067","display_name":"Fudan University","ror":"https://ror.org/013q1eq08","country_code":"CN","type":"education","lineage":["https://openalex.org/I24943067"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Zhuo Zou","raw_affiliation_strings":["Fudan University,School of Information Science and Technology,Shanghai,China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Fudan University,School of Information Science and Technology,Shanghai,China","institution_ids":["https://openalex.org/I24943067"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":null,"has_fulltext":false,"cited_by_count":2,"citation_normalized_percentile":null,"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"6"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10876","display_name":"Fault Detection and Control Systems","score":0.9864000082015991,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10876","display_name":"Fault Detection and Control Systems","score":0.9864000082015991,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9704999923706055,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/plug-and-play","display_name":"Plug and play","score":0.5843603610992432},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.5692812204360962},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5626170635223389},{"id":"https://openalex.org/keywords/fault-detection-and-isolation","display_name":"Fault detection and isolation","score":0.522800087928772},{"id":"https://openalex.org/keywords/plug-in","display_name":"Plug-in","score":0.5009465217590332},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.4381791651248932},{"id":"https://openalex.org/keywords/real-time-computing","display_name":"Real-time computing","score":0.3937084674835205},{"id":"https://openalex.org/keywords/automotive-engineering","display_name":"Automotive engineering","score":0.32768070697784424},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2537291646003723},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.20777425169944763},{"id":"https://openalex.org/keywords/operating-system","display_name":"Operating system","score":0.13315778970718384}],"concepts":[{"id":"https://openalex.org/C2780070844","wikidata":"https://www.wikidata.org/wiki/Q857815","display_name":"Plug and play","level":2,"score":0.5843603610992432},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.5692812204360962},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5626170635223389},{"id":"https://openalex.org/C152745839","wikidata":"https://www.wikidata.org/wiki/Q5438153","display_name":"Fault detection and isolation","level":3,"score":0.522800087928772},{"id":"https://openalex.org/C4924752","wikidata":"https://www.wikidata.org/wiki/Q184148","display_name":"Plug-in","level":2,"score":0.5009465217590332},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.4381791651248932},{"id":"https://openalex.org/C79403827","wikidata":"https://www.wikidata.org/wiki/Q3988","display_name":"Real-time computing","level":1,"score":0.3937084674835205},{"id":"https://openalex.org/C171146098","wikidata":"https://www.wikidata.org/wiki/Q124192","display_name":"Automotive engineering","level":1,"score":0.32768070697784424},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2537291646003723},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.20777425169944763},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.13315778970718384},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0},{"id":"https://openalex.org/C172707124","wikidata":"https://www.wikidata.org/wiki/Q423488","display_name":"Actuator","level":2,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/iecon55916.2024.10906047","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iecon55916.2024.10906047","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IECON 2024 - 50th Annual Conference of the IEEE Industrial Electronics Society","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":23,"referenced_works":["https://openalex.org/W2964336507","https://openalex.org/W3004207920","https://openalex.org/W3035524453","https://openalex.org/W3040266635","https://openalex.org/W3043229062","https://openalex.org/W3159481202","https://openalex.org/W3201856609","https://openalex.org/W4221108754","https://openalex.org/W4283585094","https://openalex.org/W4285273182","https://openalex.org/W4285496627","https://openalex.org/W4313644197","https://openalex.org/W4320036691","https://openalex.org/W4323322022","https://openalex.org/W4362678565","https://openalex.org/W4382239668","https://openalex.org/W4382602711","https://openalex.org/W6720514713","https://openalex.org/W6736412012","https://openalex.org/W6758101687","https://openalex.org/W6774314701","https://openalex.org/W6778102432","https://openalex.org/W6784225549"],"related_works":["https://openalex.org/W3025520020","https://openalex.org/W2095769150","https://openalex.org/W2279095528","https://openalex.org/W2352394813","https://openalex.org/W2360042170","https://openalex.org/W2368465758","https://openalex.org/W2108894446","https://openalex.org/W4223592178","https://openalex.org/W2799108862","https://openalex.org/W2348276452"],"abstract_inverted_index":{"Early":[0],"awareness":[1],"of":[2,112],"machine":[3,71,76],"faults":[4],"in":[5,21,35,79,97],"lights-out":[6],"manufacturing":[7,100],"allows":[8],"manufacturers":[9],"to":[10,32,74],"prevent":[11],"failures.":[12],"However,":[13],"contemporary":[14],"anomaly":[15,94],"detection":[16,95],"systems":[17],"demand":[18],"significant":[19],"investments":[20],"infrastructure":[22],"and":[23,50,60,91,115],"development.":[24],"This":[25],"paper":[26],"introduces":[27],"a":[28,40,56,61,80,85],"plug-and-play":[29,81],"sensor":[30,43],"system":[31,44],"monitor":[33],"machines":[34],"heavy-duty":[36],"industries.":[37],"We":[38,83],"present":[39],"self-adaptive":[41],"smart":[42],"integrating":[45],"data":[46,72],"acquisition,":[47],"model":[48,108],"training,":[49],"inference":[51],"into":[52],"one":[53],"system.":[54],"Featuring":[55],"pre-trained":[57],"feature":[58],"extractor":[59],"lightweight":[62],"detector":[63],"trained":[64],"on-device":[65],"after":[66],"deployment,":[67],"it":[68],"offers":[69],"autonomous":[70],"analysis":[73],"achieve":[75],"fault":[77],"diagnosis":[78],"manner.":[82],"conduct":[84],"25-day":[86],"experiment":[87],"with":[88],"vibration":[89],"signals":[90],"an":[92,98],"adaptive":[93],"algorithm":[96],"actual":[99],"scenario.":[101],"The":[102],"evaluation":[103],"shows":[104],"that":[105],"the":[106],"proposed":[107],"occupied":[109],"only":[110],"74KB":[111],"disk":[113],"space":[114],"achieved":[116],"93.8%":[117],"accuracy":[118],"without":[119],"expert":[120],"knowledge.":[121]},"counts_by_year":[{"year":2025,"cited_by_count":2}],"updated_date":"2026-07-14T23:27:15.235271","created_date":"2025-10-10T00:00:00"}