{"id":"https://openalex.org/W4408281927","doi":"https://doi.org/10.1109/iecon55916.2024.10905884","title":"Analysis of Ground Fault Protection in Low Voltage Distribution TN-S System","display_name":"Analysis of Ground Fault Protection in Low Voltage Distribution TN-S System","publication_year":2024,"publication_date":"2024-11-03","ids":{"openalex":"https://openalex.org/W4408281927","doi":"https://doi.org/10.1109/iecon55916.2024.10905884"},"language":"en","primary_location":{"id":"doi:10.1109/iecon55916.2024.10905884","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iecon55916.2024.10905884","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IECON 2024 - 50th Annual Conference of the IEEE Industrial Electronics Society","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5100318323","display_name":"Wei Li","orcid":"https://orcid.org/0000-0002-9438-9226"},"institutions":[{"id":"https://openalex.org/I4210086402","display_name":"Shenzhen General Institute of Architectural Design and Research (China)","ror":"https://ror.org/00wa5fs40","country_code":"CN","type":"company","lineage":["https://openalex.org/I4210086402"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Wei Li","raw_affiliation_strings":["CITIC General Institute of Architectural Design and Research Co., Ltd,Wuhan,China"],"affiliations":[{"raw_affiliation_string":"CITIC General Institute of Architectural Design and Research Co., Ltd,Wuhan,China","institution_ids":["https://openalex.org/I4210086402"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5054050815","display_name":"Guangxi Li","orcid":"https://orcid.org/0000-0002-2234-9188"},"institutions":[{"id":"https://openalex.org/I4210086402","display_name":"Shenzhen General Institute of Architectural Design and Research (China)","ror":"https://ror.org/00wa5fs40","country_code":"CN","type":"company","lineage":["https://openalex.org/I4210086402"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Guangxi Li","raw_affiliation_strings":["CITIC General Institute of Architectural Design and Research Co., Ltd,Wuhan,China"],"affiliations":[{"raw_affiliation_string":"CITIC General Institute of Architectural Design and Research Co., Ltd,Wuhan,China","institution_ids":["https://openalex.org/I4210086402"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5040576761","display_name":"Weihao Tang","orcid":null},"institutions":[{"id":"https://openalex.org/I4210086402","display_name":"Shenzhen General Institute of Architectural Design and Research (China)","ror":"https://ror.org/00wa5fs40","country_code":"CN","type":"company","lineage":["https://openalex.org/I4210086402"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Weihao Tang","raw_affiliation_strings":["CITIC General Institute of Architectural Design and Research Co., Ltd,Wuhan,China"],"affiliations":[{"raw_affiliation_string":"CITIC General Institute of Architectural Design and Research Co., Ltd,Wuhan,China","institution_ids":["https://openalex.org/I4210086402"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5100646595","display_name":"Weiqi Zhang","orcid":"https://orcid.org/0000-0001-7730-9274"},"institutions":[{"id":"https://openalex.org/I100188998","display_name":"Harbin University of Science and Technology","ror":"https://ror.org/04e6y1282","country_code":"CN","type":"education","lineage":["https://openalex.org/I100188998"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Weiqi Zhang","raw_affiliation_strings":["School of Electrical Engineering and Automation,Harbin,China"],"affiliations":[{"raw_affiliation_string":"School of Electrical Engineering and Automation,Harbin,China","institution_ids":["https://openalex.org/I100188998"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5100318323"],"corresponding_institution_ids":["https://openalex.org/I4210086402"],"apc_list":null,"apc_paid":null,"fwci":0.2225,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":{"value":0.57826381,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":91,"max":95},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"6"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12451","display_name":"Smart Grid and Power Systems","score":0.9187999963760376,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12451","display_name":"Smart Grid and Power Systems","score":0.9187999963760376,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14276","display_name":"Power Systems and Technologies","score":0.9165999889373779,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.5191951990127563},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.4592890441417694},{"id":"https://openalex.org/keywords/residual-current-device","display_name":"Residual-current device","score":0.44008877873420715},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.4320889115333557},{"id":"https://openalex.org/keywords/distribution","display_name":"Distribution (mathematics)","score":0.4224978983402252},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.3565766215324402},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.33981436491012573},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2157609760761261},{"id":"https://openalex.org/keywords/circuit-breaker","display_name":"Circuit breaker","score":0.20110931992530823},{"id":"https://openalex.org/keywords/geology","display_name":"Geology","score":0.1679735779762268},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.14457881450653076},{"id":"https://openalex.org/keywords/seismology","display_name":"Seismology","score":0.07793185114860535}],"concepts":[{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.5191951990127563},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.4592890441417694},{"id":"https://openalex.org/C15116251","wikidata":"https://www.wikidata.org/wiki/Q337716","display_name":"Residual-current device","level":3,"score":0.44008877873420715},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4320889115333557},{"id":"https://openalex.org/C110121322","wikidata":"https://www.wikidata.org/wiki/Q865811","display_name":"Distribution (mathematics)","level":2,"score":0.4224978983402252},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.3565766215324402},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.33981436491012573},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2157609760761261},{"id":"https://openalex.org/C61352017","wikidata":"https://www.wikidata.org/wiki/Q211058","display_name":"Circuit breaker","level":2,"score":0.20110931992530823},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.1679735779762268},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.14457881450653076},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.07793185114860535},{"id":"https://openalex.org/C134306372","wikidata":"https://www.wikidata.org/wiki/Q7754","display_name":"Mathematical analysis","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/iecon55916.2024.10905884","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iecon55916.2024.10905884","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IECON 2024 - 50th Annual Conference of the IEEE Industrial Electronics Society","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/13","score":0.4399999976158142,"display_name":"Climate action"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":13,"referenced_works":["https://openalex.org/W2171835241","https://openalex.org/W2216305900","https://openalex.org/W2795424878","https://openalex.org/W3012190034","https://openalex.org/W3127339886","https://openalex.org/W3131033326","https://openalex.org/W4246216316","https://openalex.org/W4246654708","https://openalex.org/W4247145593","https://openalex.org/W4285106046","https://openalex.org/W4362500851","https://openalex.org/W4394628177","https://openalex.org/W4405633525"],"related_works":["https://openalex.org/W4376453582","https://openalex.org/W3147033875","https://openalex.org/W1568390478","https://openalex.org/W2764722704","https://openalex.org/W318913410","https://openalex.org/W2355543518","https://openalex.org/W2601840227","https://openalex.org/W2131832954","https://openalex.org/W4205240067","https://openalex.org/W2374901194"],"abstract_inverted_index":{"In":[0],"this":[1],"study,":[2],"typical":[3],"cases":[4],"are":[5,58],"combined":[6],"to":[7,16],"analyze":[8],"the":[9,13,18,45],"technical":[10],"requirements":[11],"for":[12,77],"TN-S":[14],"system":[15],"prioritize":[17],"use":[19],"of":[20,30,47],"short-circuit":[21],"overcurrent":[22],"protection":[23,35,39,80],"over":[24],"ground":[25,37],"fault":[26,38,79],"protection.":[27],"The":[28,68],"necessity":[29],"adopting":[31],"residual":[32],"current":[33],"action":[34],"as":[36,42,44],"is":[40],"elucidated,":[41],"well":[43],"importance":[46,76],"auxiliary":[48],"equipotential":[49],"bonding":[50],"in":[51,81],"reducing":[52],"contact":[53],"voltage.":[54],"Various":[55],"protective":[56],"measures":[57],"proposed":[59],"along":[60],"with":[61],"their":[62],"respective":[63],"roles":[64],"and":[65,71,84],"applicable":[66],"conditions.":[67],"analytical":[69],"process":[70],"resulting":[72],"conclusions":[73],"hold":[74],"significant":[75],"grounding":[78],"engineering":[82],"design":[83],"application.":[85]},"counts_by_year":[{"year":2025,"cited_by_count":1}],"updated_date":"2025-12-28T23:10:05.387466","created_date":"2025-10-10T00:00:00"}