{"id":"https://openalex.org/W4408282174","doi":"https://doi.org/10.1109/iecon55916.2024.10905622","title":"Compact Cooling Design for SiC Based Solid State Circuit Breaker","display_name":"Compact Cooling Design for SiC Based Solid State Circuit Breaker","publication_year":2024,"publication_date":"2024-11-03","ids":{"openalex":"https://openalex.org/W4408282174","doi":"https://doi.org/10.1109/iecon55916.2024.10905622"},"language":"en","primary_location":{"id":"doi:10.1109/iecon55916.2024.10905622","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iecon55916.2024.10905622","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IECON 2024 - 50th Annual Conference of the IEEE Industrial Electronics Society","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":null,"display_name":"Tiffany Scott","orcid":null},"institutions":[{"id":"https://openalex.org/I4210091029","display_name":"ABB (United States)","ror":"https://ror.org/00cb06v13","country_code":"US","type":"company","lineage":["https://openalex.org/I4210091029","https://openalex.org/I885143765"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Tiffany Scott","raw_affiliation_strings":["ABB Inc ABB US Research Center,Raleigh,USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"ABB Inc ABB US Research Center,Raleigh,USA","institution_ids":["https://openalex.org/I4210091029"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5050483889","display_name":"Govind Chavan","orcid":"https://orcid.org/0000-0002-6665-4053"},"institutions":[{"id":"https://openalex.org/I4210091029","display_name":"ABB (United States)","ror":"https://ror.org/00cb06v13","country_code":"US","type":"company","lineage":["https://openalex.org/I4210091029","https://openalex.org/I885143765"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Govind Chavan","raw_affiliation_strings":["ABB Inc ABB US Research Center,Raleigh,USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"ABB Inc ABB US Research Center,Raleigh,USA","institution_ids":["https://openalex.org/I4210091029"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5022503984","display_name":"Pietro Cairoli","orcid":"https://orcid.org/0000-0002-2557-5594"},"institutions":[{"id":"https://openalex.org/I4210091029","display_name":"ABB (United States)","ror":"https://ror.org/00cb06v13","country_code":"US","type":"company","lineage":["https://openalex.org/I4210091029","https://openalex.org/I885143765"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Pietro Cairoli","raw_affiliation_strings":["ABB Inc ABB US Research Center,Raleigh,USA"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"ABB Inc ABB US Research Center,Raleigh,USA","institution_ids":["https://openalex.org/I4210091029"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.1864,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":{"value":0.50320929,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":91,"max":95},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"6"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10717","display_name":"Aluminum Alloys Composites Properties","score":0.9764999747276306,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10717","display_name":"Aluminum Alloys Composites Properties","score":0.9764999747276306,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10361","display_name":"Silicon Carbide Semiconductor Technologies","score":0.9501000046730042,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/circuit-breaker","display_name":"Circuit breaker","score":0.8857503533363342},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.5160889029502869},{"id":"https://openalex.org/keywords/solid-state","display_name":"Solid-state","score":0.5128867626190186},{"id":"https://openalex.org/keywords/sulfur-hexafluoride-circuit-breaker","display_name":"Sulfur hexafluoride circuit breaker","score":0.49808168411254883},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.49492567777633667},{"id":"https://openalex.org/keywords/nuclear-engineering","display_name":"Nuclear engineering","score":0.3792749047279358},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.355495810508728},{"id":"https://openalex.org/keywords/arc-fault-circuit-interrupter","display_name":"Arc-fault circuit interrupter","score":0.3385271728038788},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.33063623309135437},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.3240056037902832},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2530924081802368},{"id":"https://openalex.org/keywords/engineering-physics","display_name":"Engineering physics","score":0.23774006962776184},{"id":"https://openalex.org/keywords/short-circuit","display_name":"Short circuit","score":0.16783925890922546},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.12299448251724243}],"concepts":[{"id":"https://openalex.org/C61352017","wikidata":"https://www.wikidata.org/wiki/Q211058","display_name":"Circuit breaker","level":2,"score":0.8857503533363342},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.5160889029502869},{"id":"https://openalex.org/C107814960","wikidata":"https://www.wikidata.org/wiki/Q611957","display_name":"Solid-state","level":2,"score":0.5128867626190186},{"id":"https://openalex.org/C173093282","wikidata":"https://www.wikidata.org/wiki/Q1228904","display_name":"Sulfur hexafluoride circuit breaker","level":5,"score":0.49808168411254883},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.49492567777633667},{"id":"https://openalex.org/C116915560","wikidata":"https://www.wikidata.org/wiki/Q83504","display_name":"Nuclear engineering","level":1,"score":0.3792749047279358},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.355495810508728},{"id":"https://openalex.org/C157069517","wikidata":"https://www.wikidata.org/wiki/Q132172","display_name":"Arc-fault circuit interrupter","level":4,"score":0.3385271728038788},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.33063623309135437},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.3240056037902832},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2530924081802368},{"id":"https://openalex.org/C61696701","wikidata":"https://www.wikidata.org/wiki/Q770766","display_name":"Engineering physics","level":1,"score":0.23774006962776184},{"id":"https://openalex.org/C68583231","wikidata":"https://www.wikidata.org/wiki/Q206907","display_name":"Short circuit","level":3,"score":0.16783925890922546},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.12299448251724243}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/iecon55916.2024.10905622","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iecon55916.2024.10905622","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IECON 2024 - 50th Annual Conference of the IEEE Industrial Electronics Society","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7","score":0.7699999809265137}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":11,"referenced_works":["https://openalex.org/W2558283485","https://openalex.org/W2976490525","https://openalex.org/W2997643066","https://openalex.org/W3036507074","https://openalex.org/W4310475763","https://openalex.org/W4378843149","https://openalex.org/W4385258998","https://openalex.org/W4386453736","https://openalex.org/W4390416714","https://openalex.org/W4390417058","https://openalex.org/W4396576603"],"related_works":["https://openalex.org/W2187530475","https://openalex.org/W2914054235","https://openalex.org/W2577354822","https://openalex.org/W2380044501","https://openalex.org/W2611318122","https://openalex.org/W2011161546","https://openalex.org/W2169529353","https://openalex.org/W2592066628","https://openalex.org/W2164183860","https://openalex.org/W2350644057"],"abstract_inverted_index":{"Solid-state":[0],"circuit":[1,10],"breakers":[2],"(SSCBs)":[3],"provide":[4],"several":[5],"advantages":[6],"over":[7],"conventional":[8],"mechanical":[9],"breakers.":[11],"These":[12],"include":[13],"precise":[14],"DC":[15],"grid":[16],"integration,":[17],"current":[18],"control,":[19],"remote":[20],"operation,":[21],"and":[22,37,48],"customizable":[23],"protection":[24],"settings.":[25],"Additionally,":[26],"with":[27],"silicon":[28],"carbide":[29],"(SiC)":[30],"MOSFET":[31],"power":[32,50,54],"modules,":[33,55],"faster":[34],"response":[35],"time":[36],"compact":[38,43],"size":[39,44],"are":[40],"targeted.":[41],"With":[42],"being":[45],"a":[46,65,101],"target,":[47],"quadratic":[49],"losses":[51],"of":[52,86],"SiC":[53,73],"thermal":[56,69],"management":[57],"solutions":[58],"must":[59],"be":[60],"considered.":[61],"This":[62],"paper":[63],"describes":[64],"first":[66],"approach":[67],"to":[68,99],"simulation":[70],"for":[71,95],"predicting":[72],"module":[74],"junction":[75,103],"temperature":[76,83,104],"in":[77],"SSCBs.":[78],"Additional":[79],"simulations":[80],"predict":[81],"the":[82],"build-up":[84],"inside":[85],"an":[87],"enclosure.":[88],"An":[89],"iterative":[90],"process":[91],"is":[92],"laid":[93],"out":[94],"heat":[96],"sink":[97],"optimization":[98],"maintain":[100],"safe":[102],"under":[105],"steady-state":[106],"conditions.":[107]},"counts_by_year":[{"year":2025,"cited_by_count":1}],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-03-11T00:00:00"}