{"id":"https://openalex.org/W4408282189","doi":"https://doi.org/10.1109/iecon55916.2024.10905567","title":"A Method for SiC-Mosfet Junction Temperature Estimation in Traction Inverters","display_name":"A Method for SiC-Mosfet Junction Temperature Estimation in Traction Inverters","publication_year":2024,"publication_date":"2024-11-03","ids":{"openalex":"https://openalex.org/W4408282189","doi":"https://doi.org/10.1109/iecon55916.2024.10905567"},"language":"en","primary_location":{"id":"doi:10.1109/iecon55916.2024.10905567","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iecon55916.2024.10905567","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IECON 2024 - 50th Annual Conference of the IEEE Industrial Electronics Society","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5115820926","display_name":"Leonardo Rafael Willers","orcid":null},"institutions":[{"id":"https://openalex.org/I33501960","display_name":"Universidade Federal de Santa Maria","ror":"https://ror.org/01b78mz79","country_code":"BR","type":"education","lineage":["https://openalex.org/I33501960"]}],"countries":["BR"],"is_corresponding":false,"raw_author_name":"Leonardo Rafael Willers","raw_affiliation_strings":["Federal University of Santa Maria - UFSM,Power Electronics and Control Research Group,Brazil"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Federal University of Santa Maria - UFSM,Power Electronics and Control Research Group,Brazil","institution_ids":["https://openalex.org/I33501960"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5068624486","display_name":"Eduardo Cattani Silva","orcid":null},"institutions":[{"id":"https://openalex.org/I33501960","display_name":"Universidade Federal de Santa Maria","ror":"https://ror.org/01b78mz79","country_code":"BR","type":"education","lineage":["https://openalex.org/I33501960"]}],"countries":["BR"],"is_corresponding":false,"raw_author_name":"Eduardo Cattani Silva","raw_affiliation_strings":["Federal University of Santa Maria - UFSM,Power Electronics and Control Research Group,Brazil"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Federal University of Santa Maria - UFSM,Power Electronics and Control Research Group,Brazil","institution_ids":["https://openalex.org/I33501960"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5036390829","display_name":"Paulo H. A. S. e Silva","orcid":null},"institutions":[{"id":"https://openalex.org/I33501960","display_name":"Universidade Federal de Santa Maria","ror":"https://ror.org/01b78mz79","country_code":"BR","type":"education","lineage":["https://openalex.org/I33501960"]}],"countries":["BR"],"is_corresponding":false,"raw_author_name":"Paulo Henrique Alves Silva e Silva","raw_affiliation_strings":["Federal University of Santa Maria - UFSM,Power Electronics and Control Research Group,Brazil"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Federal University of Santa Maria - UFSM,Power Electronics and Control Research Group,Brazil","institution_ids":["https://openalex.org/I33501960"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5038008926","display_name":"Lucas Rossato Rocha","orcid":"https://orcid.org/0000-0002-1806-1827"},"institutions":[{"id":"https://openalex.org/I33501960","display_name":"Universidade Federal de Santa Maria","ror":"https://ror.org/01b78mz79","country_code":"BR","type":"education","lineage":["https://openalex.org/I33501960"]}],"countries":["BR"],"is_corresponding":false,"raw_author_name":"Lucas Rossato Rocha","raw_affiliation_strings":["Federal University of Santa Maria - UFSM,Power Electronics and Control Research Group,Brazil"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Federal University of Santa Maria - UFSM,Power Electronics and Control Research Group,Brazil","institution_ids":["https://openalex.org/I33501960"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5044087291","display_name":"Rodrigo Padilha Vieira","orcid":"https://orcid.org/0000-0002-0558-133X"},"institutions":[{"id":"https://openalex.org/I33501960","display_name":"Universidade Federal de Santa Maria","ror":"https://ror.org/01b78mz79","country_code":"BR","type":"education","lineage":["https://openalex.org/I33501960"]}],"countries":["BR"],"is_corresponding":false,"raw_author_name":"Rodrigo Padilha Vieira","raw_affiliation_strings":["Federal University of Santa Maria - UFSM,Power Electronics and Control Research Group,Brazil"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Federal University of Santa Maria - UFSM,Power Electronics and Control Research Group,Brazil","institution_ids":["https://openalex.org/I33501960"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":5,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":0.3729,"has_fulltext":false,"cited_by_count":2,"citation_normalized_percentile":{"value":0.57901241,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":98,"max":99},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"6"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12898","display_name":"Induction Heating and Inverter Technology","score":0.9976999759674072,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12898","display_name":"Induction Heating and Inverter Technology","score":0.9976999759674072,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10361","display_name":"Silicon Carbide Semiconductor Technologies","score":0.9965999722480774,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13093","display_name":"Electric Power Systems and Control","score":0.993399977684021,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/junction-temperature","display_name":"Junction temperature","score":0.744857907295227},{"id":"https://openalex.org/keywords/mosfet","display_name":"MOSFET","score":0.7428666353225708},{"id":"https://openalex.org/keywords/temperature-measurement","display_name":"Temperature measurement","score":0.5493139028549194},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.5425354838371277},{"id":"https://openalex.org/keywords/traction","display_name":"Traction (geology)","score":0.5394571423530579},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.466635525226593},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.40132686495780945},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.3669913411140442},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.35652589797973633},{"id":"https://openalex.org/keywords/automotive-engineering","display_name":"Automotive engineering","score":0.33805495500564575},{"id":"https://openalex.org/keywords/mechanical-engineering","display_name":"Mechanical engineering","score":0.2744506597518921},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.23883527517318726},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2278318703174591},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.21734854578971863},{"id":"https://openalex.org/keywords/transistor","display_name":"Transistor","score":0.15745073556900024},{"id":"https://openalex.org/keywords/thermal","display_name":"Thermal","score":0.13181981444358826},{"id":"https://openalex.org/keywords/thermodynamics","display_name":"Thermodynamics","score":0.08985656499862671}],"concepts":[{"id":"https://openalex.org/C167781694","wikidata":"https://www.wikidata.org/wiki/Q6311800","display_name":"Junction temperature","level":3,"score":0.744857907295227},{"id":"https://openalex.org/C2778413303","wikidata":"https://www.wikidata.org/wiki/Q210793","display_name":"MOSFET","level":4,"score":0.7428666353225708},{"id":"https://openalex.org/C72293138","wikidata":"https://www.wikidata.org/wiki/Q909741","display_name":"Temperature measurement","level":2,"score":0.5493139028549194},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.5425354838371277},{"id":"https://openalex.org/C38834483","wikidata":"https://www.wikidata.org/wiki/Q17000223","display_name":"Traction (geology)","level":2,"score":0.5394571423530579},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.466635525226593},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.40132686495780945},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.3669913411140442},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.35652589797973633},{"id":"https://openalex.org/C171146098","wikidata":"https://www.wikidata.org/wiki/Q124192","display_name":"Automotive engineering","level":1,"score":0.33805495500564575},{"id":"https://openalex.org/C78519656","wikidata":"https://www.wikidata.org/wiki/Q101333","display_name":"Mechanical engineering","level":1,"score":0.2744506597518921},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.23883527517318726},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2278318703174591},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.21734854578971863},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.15745073556900024},{"id":"https://openalex.org/C204530211","wikidata":"https://www.wikidata.org/wiki/Q752823","display_name":"Thermal","level":2,"score":0.13181981444358826},{"id":"https://openalex.org/C97355855","wikidata":"https://www.wikidata.org/wiki/Q11473","display_name":"Thermodynamics","level":1,"score":0.08985656499862671}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/iecon55916.2024.10905567","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iecon55916.2024.10905567","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IECON 2024 - 50th Annual Conference of the IEEE Industrial Electronics Society","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7","score":0.7599999904632568}],"awards":[],"funders":[{"id":"https://openalex.org/F4320323356","display_name":"Funda\u00e7\u00e3o de Desenvolvimento da Pesquisa","ror":"https://ror.org/0176yjw32"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":13,"referenced_works":["https://openalex.org/W1493727323","https://openalex.org/W2003039071","https://openalex.org/W2097261878","https://openalex.org/W2105252367","https://openalex.org/W2142025594","https://openalex.org/W2588587965","https://openalex.org/W2734777782","https://openalex.org/W2892115290","https://openalex.org/W2911688936","https://openalex.org/W2996278503","https://openalex.org/W3090394360","https://openalex.org/W4310895596","https://openalex.org/W4387158442"],"related_works":["https://openalex.org/W2037263397","https://openalex.org/W4254725936","https://openalex.org/W2349658810","https://openalex.org/W1988811145","https://openalex.org/W2566964934","https://openalex.org/W2134234574","https://openalex.org/W2590129836","https://openalex.org/W2057590747","https://openalex.org/W2047721661","https://openalex.org/W1919739387"],"abstract_inverted_index":{"This":[0,21],"paper":[1],"presents":[2],"an":[3],"approach":[4],"to":[5,30,57,72],"estimating":[6],"the":[7,25,59,84,87,105],"junction":[8,61],"temperature":[9,41,91],"of":[10,86,113],"SiC":[11],"MOSFETs":[12],"in":[13,89,116],"three-phase":[14],"inverters,":[15],"crucial":[16],"for":[17,107],"electric":[18],"vehicle":[19],"applications.":[20],"study":[22],"carries":[23],"out":[24],"conversion":[26],"process":[27],"from":[28],"Foster":[29],"Cauer":[31],"thermal":[32,75],"networks,":[33],"which":[34],"enables":[35],"a":[36],"space-state":[37],"representation":[38],"with":[39,98],"intermediate":[40],"states,":[42],"such":[43],"as:":[44],"internal":[45],"module":[46,48],"and":[47,69,110],"case":[49],"temperatures.":[50],"A":[51],"Luenberger-type":[52],"state":[53],"observer":[54,88],"is":[55],"used":[56],"estimate":[58],"switch":[60],"temperature.":[62],"The":[63,102],"proposed":[64],"method":[65],"demonstrates":[66],"enhanced":[67],"robustness":[68],"accuracy":[70],"compared":[71],"conventional":[73],"open-loop":[74],"models.":[76],"Simulation":[77],"results,":[78],"validated":[79],"through":[80],"PSIM":[81],"software,":[82],"illustrate":[83],"effectiveness":[85],"maintaining":[90],"estimates":[92],"within":[93],"safe":[94],"operational":[95],"limits":[96],"even":[97],"incorrect":[99],"initial":[100],"states.":[101],"findings":[103],"underscore":[104],"potential":[106],"improved":[108],"reliability":[109],"lifespan":[111],"prediction":[112],"semiconductor":[114],"devices":[115],"harsh":[117],"operating":[118],"conditions.":[119]},"counts_by_year":[{"year":2026,"cited_by_count":2}],"updated_date":"2026-06-11T09:08:48.828518","created_date":"2025-10-10T00:00:00"}