{"id":"https://openalex.org/W4388720385","doi":"https://doi.org/10.1109/iecon51785.2023.10311880","title":"SoC Based Application of Smart Automatic Online Realtime Partial Discharge Condition Monitoring System for the Power Grid","display_name":"SoC Based Application of Smart Automatic Online Realtime Partial Discharge Condition Monitoring System for the Power Grid","publication_year":2023,"publication_date":"2023-10-16","ids":{"openalex":"https://openalex.org/W4388720385","doi":"https://doi.org/10.1109/iecon51785.2023.10311880"},"language":"en","primary_location":{"id":"doi:10.1109/iecon51785.2023.10311880","is_oa":false,"landing_page_url":"http://dx.doi.org/10.1109/iecon51785.2023.10311880","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IECON 2023- 49th Annual Conference of the IEEE Industrial Electronics Society","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5112269448","display_name":"Min\u2010Shan Lu","orcid":null},"institutions":[{"id":"https://openalex.org/I172675005","display_name":"Nanyang Technological University","ror":"https://ror.org/02e7b5302","country_code":"SG","type":"education","lineage":["https://openalex.org/I172675005"]}],"countries":["SG"],"is_corresponding":false,"raw_author_name":"Minshan Lu","raw_affiliation_strings":["Nanyang Technological University,Department of Electrical and Electronic Engineering,Singapore","Department of Electrical and Electronic Engineering, Nanyang Technological University, Singapore"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Nanyang Technological University,Department of Electrical and Electronic Engineering,Singapore","institution_ids":["https://openalex.org/I172675005"]},{"raw_affiliation_string":"Department of Electrical and Electronic Engineering, Nanyang Technological University, Singapore","institution_ids":["https://openalex.org/I172675005"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5064423286","display_name":"Jinsheng Ji","orcid":"https://orcid.org/0000-0002-5360-919X"},"institutions":[{"id":"https://openalex.org/I172675005","display_name":"Nanyang Technological University","ror":"https://ror.org/02e7b5302","country_code":"SG","type":"education","lineage":["https://openalex.org/I172675005"]}],"countries":["SG"],"is_corresponding":false,"raw_author_name":"Jinsheng Ji","raw_affiliation_strings":["Nanyang Technological University,Department of Electrical and Electronic Engineering,Singapore","Department of Electrical and Electronic Engineering, Nanyang Technological University, Singapore"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Nanyang Technological University,Department of Electrical and Electronic Engineering,Singapore","institution_ids":["https://openalex.org/I172675005"]},{"raw_affiliation_string":"Department of Electrical and Electronic Engineering, Nanyang Technological University, Singapore","institution_ids":["https://openalex.org/I172675005"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5025147842","display_name":"Guanlin Jiang","orcid":"https://orcid.org/0000-0001-5597-3721"},"institutions":[{"id":"https://openalex.org/I172675005","display_name":"Nanyang Technological University","ror":"https://ror.org/02e7b5302","country_code":"SG","type":"education","lineage":["https://openalex.org/I172675005"]}],"countries":["SG"],"is_corresponding":false,"raw_author_name":"Guanlin Jiang","raw_affiliation_strings":["Nanyang Technological University,Department of Electrical and Electronic Engineering,Singapore","Department of Electrical and Electronic Engineering, Nanyang Technological University, Singapore"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Nanyang Technological University,Department of Electrical and Electronic Engineering,Singapore","institution_ids":["https://openalex.org/I172675005"]},{"raw_affiliation_string":"Department of Electrical and Electronic Engineering, Nanyang Technological University, Singapore","institution_ids":["https://openalex.org/I172675005"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5066167604","display_name":"Zhou Shu","orcid":"https://orcid.org/0000-0003-0976-1263"},"institutions":[{"id":"https://openalex.org/I172675005","display_name":"Nanyang Technological University","ror":"https://ror.org/02e7b5302","country_code":"SG","type":"education","lineage":["https://openalex.org/I172675005"]}],"countries":["SG"],"is_corresponding":false,"raw_author_name":"Shu Zhou","raw_affiliation_strings":["Nanyang Technological University,Department of Electrical and Electronic Engineering,Singapore","Department of Electrical and Electronic Engineering, Nanyang Technological University, Singapore"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Nanyang Technological University,Department of Electrical and Electronic Engineering,Singapore","institution_ids":["https://openalex.org/I172675005"]},{"raw_affiliation_string":"Department of Electrical and Electronic Engineering, Nanyang Technological University, Singapore","institution_ids":["https://openalex.org/I172675005"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5054942099","display_name":"Hongqun Li","orcid":"https://orcid.org/0000-0002-6793-4364"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Hongqun Li","raw_affiliation_strings":["Grid Digitalisation & Corporate Support, SPPG,SP-NTU Joint Lab,Singapore"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Grid Digitalisation & Corporate Support, SPPG,SP-NTU Joint Lab,Singapore","institution_ids":[]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5016044907","display_name":"Yuanjin Zheng","orcid":"https://orcid.org/0000-0002-5768-367X"},"institutions":[{"id":"https://openalex.org/I172675005","display_name":"Nanyang Technological University","ror":"https://ror.org/02e7b5302","country_code":"SG","type":"education","lineage":["https://openalex.org/I172675005"]}],"countries":["SG"],"is_corresponding":false,"raw_author_name":"Yuanjin Zheng","raw_affiliation_strings":["Nanyang Technological University,Department of Electrical and Electronic Engineering,Singapore","Department of Electrical and Electronic Engineering, Nanyang Technological University, Singapore"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Nanyang Technological University,Department of Electrical and Electronic Engineering,Singapore","institution_ids":["https://openalex.org/I172675005"]},{"raw_affiliation_string":"Department of Electrical and Electronic Engineering, Nanyang Technological University, Singapore","institution_ids":["https://openalex.org/I172675005"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":null,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":null,"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"6"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10511","display_name":"High voltage insulation and dielectric phenomena","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10511","display_name":"High voltage insulation and dielectric phenomena","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11343","display_name":"Power Transformer Diagnostics and Insulation","score":0.988099992275238,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12941","display_name":"Embedded Systems and FPGA Design","score":0.98089998960495,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6483556628227234},{"id":"https://openalex.org/keywords/real-time-computing","display_name":"Real-time computing","score":0.5878062844276428},{"id":"https://openalex.org/keywords/smart-grid","display_name":"Smart grid","score":0.5719902515411377},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.5343014597892761},{"id":"https://openalex.org/keywords/partial-discharge","display_name":"Partial discharge","score":0.5216996073722839},{"id":"https://openalex.org/keywords/grid","display_name":"Grid","score":0.5064715147018433},{"id":"https://openalex.org/keywords/condition-monitoring","display_name":"Condition monitoring","score":0.4963248372077942},{"id":"https://openalex.org/keywords/electric-power-system","display_name":"Electric power system","score":0.4629861116409302},{"id":"https://openalex.org/keywords/alarm","display_name":"ALARM","score":0.41400641202926636},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.38566339015960693},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.23742929100990295},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.12001797556877136}],"concepts":[{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6483556628227234},{"id":"https://openalex.org/C79403827","wikidata":"https://www.wikidata.org/wiki/Q3988","display_name":"Real-time computing","level":1,"score":0.5878062844276428},{"id":"https://openalex.org/C10558101","wikidata":"https://www.wikidata.org/wiki/Q689855","display_name":"Smart grid","level":2,"score":0.5719902515411377},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.5343014597892761},{"id":"https://openalex.org/C130143024","wikidata":"https://www.wikidata.org/wiki/Q1929972","display_name":"Partial discharge","level":3,"score":0.5216996073722839},{"id":"https://openalex.org/C187691185","wikidata":"https://www.wikidata.org/wiki/Q2020720","display_name":"Grid","level":2,"score":0.5064715147018433},{"id":"https://openalex.org/C2775846686","wikidata":"https://www.wikidata.org/wiki/Q643012","display_name":"Condition monitoring","level":2,"score":0.4963248372077942},{"id":"https://openalex.org/C89227174","wikidata":"https://www.wikidata.org/wiki/Q2388981","display_name":"Electric power system","level":3,"score":0.4629861116409302},{"id":"https://openalex.org/C2779119184","wikidata":"https://www.wikidata.org/wiki/Q294350","display_name":"ALARM","level":2,"score":0.41400641202926636},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.38566339015960693},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.23742929100990295},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.12001797556877136},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.0},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/iecon51785.2023.10311880","is_oa":false,"landing_page_url":"http://dx.doi.org/10.1109/iecon51785.2023.10311880","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IECON 2023- 49th Annual Conference of the IEEE Industrial Electronics Society","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[{"id":"https://openalex.org/F4320320709","display_name":"National Research Foundation Singapore","ror":"https://ror.org/03cpyc314"},{"id":"https://openalex.org/F4320320766","display_name":"Nanyang Technological University","ror":"https://ror.org/02e7b5302"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":10,"referenced_works":["https://openalex.org/W1971496393","https://openalex.org/W2090484961","https://openalex.org/W2132984323","https://openalex.org/W2135293599","https://openalex.org/W2976794522","https://openalex.org/W3116454330","https://openalex.org/W3117638440","https://openalex.org/W4251101141","https://openalex.org/W4286282992","https://openalex.org/W4313452775"],"related_works":["https://openalex.org/W2393409683","https://openalex.org/W4282008660","https://openalex.org/W2834849852","https://openalex.org/W2536936696","https://openalex.org/W2955994650","https://openalex.org/W2066632781","https://openalex.org/W2294135824","https://openalex.org/W3155062245","https://openalex.org/W2016042781","https://openalex.org/W1863788251"],"abstract_inverted_index":{"This":[0],"paper":[1],"presents":[2],"a":[3,24,58,84,110,141],"hardware-software":[4],"co-designed":[5],"system":[6,45,78,106,124,139],"for":[7,52,114],"real-time":[8,116,135],"online":[9,136],"monitoring":[10,54,138],"of":[11,27,36,121],"Partial":[12],"Discharge":[13],"(PD)":[14],"in":[15,83,109,154],"the":[16,105,122,155],"Power":[17,156],"Grid":[18],"without":[19],"human":[20],"interaction.":[21],"PD":[22,74,90,117,137],"is":[23,79,96,107,125],"critical":[25],"indicator":[26],"insulation":[28,152],"degradation,":[29],"which":[30],"can":[31],"lead":[32],"to":[33,71,144],"premature":[34],"failure":[35],"components":[37],"and":[38,66,81,130,150],"disrupt":[39],"reliable":[40],"electric":[41],"supply.":[42],"The":[43,77,92,119,133],"proposed":[44,123],"utilizes":[46],"an":[47,62,67],"SoC-based":[48,134],"Edge":[49],"Computing":[50],"Unit":[51],"long-term":[53],"activities.":[55],"It":[56],"incorporates":[57],"wavelet":[59],"denoising":[60],"module,":[61],"auto":[63],"management":[64],"program,":[65],"AI-based":[68],"detection":[69],"model":[70,95],"enable":[72],"automatic":[73],"alarm":[75],"generation.":[76],"tested":[80],"iterated":[82],"controlled":[85],"lab":[86],"environment,":[87],"capturing":[88],"standard":[89],"signals.":[91],"AI":[93],"classification":[94],"trained":[97],"using":[98],"manually":[99],"labeled":[100],"PRPD":[101],"pattern":[102],"datasets.":[103],"Subsequently,":[104],"deployed":[108],"real":[111],"power":[112,146],"grid":[113],"long-term,":[115],"monitoring.":[118],"effectiveness":[120],"demonstrated":[126],"through":[127],"experimental":[128],"setups":[129],"result":[131],"analysis.":[132],"offers":[140],"proactive":[142],"approach":[143],"safeguarding":[145],"equipment":[147],"by":[148],"detecting":[149],"addressing":[151],"degradation":[153],"Grid.":[157]},"counts_by_year":[{"year":2025,"cited_by_count":1}],"updated_date":"2026-07-15T18:14:33.161393","created_date":"2025-10-10T00:00:00"}