{"id":"https://openalex.org/W4388736819","doi":"https://doi.org/10.1109/iecon51785.2023.10311681","title":"A Variable Y-Capacitor Based Active EMI Filter with Low Cost and High Insertion Loss","display_name":"A Variable Y-Capacitor Based Active EMI Filter with Low Cost and High Insertion Loss","publication_year":2023,"publication_date":"2023-10-16","ids":{"openalex":"https://openalex.org/W4388736819","doi":"https://doi.org/10.1109/iecon51785.2023.10311681"},"language":"en","primary_location":{"id":"doi:10.1109/iecon51785.2023.10311681","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iecon51785.2023.10311681","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IECON 2023- 49th Annual Conference of the IEEE Industrial Electronics Society","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5019064751","display_name":"Hong Li","orcid":"https://orcid.org/0000-0002-8117-8980"},"institutions":[{"id":"https://openalex.org/I21193070","display_name":"Beijing Jiaotong University","ror":"https://ror.org/01yj56c84","country_code":"CN","type":"education","lineage":["https://openalex.org/I21193070"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Hong Li","raw_affiliation_strings":["School of Electrical Engineering, Beijing Jiaotong University,Beijing,China,100044"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Electrical Engineering, Beijing Jiaotong University,Beijing,China,100044","institution_ids":["https://openalex.org/I21193070"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5111075599","display_name":"Daozhen He","orcid":null},"institutions":[{"id":"https://openalex.org/I21193070","display_name":"Beijing Jiaotong University","ror":"https://ror.org/01yj56c84","country_code":"CN","type":"education","lineage":["https://openalex.org/I21193070"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Daozhen He","raw_affiliation_strings":["School of Electrical Engineering, Beijing Jiaotong University,Beijing,China,100044"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Electrical Engineering, Beijing Jiaotong University,Beijing,China,100044","institution_ids":["https://openalex.org/I21193070"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5100640778","display_name":"Siyi Wang","orcid":"https://orcid.org/0000-0003-0304-9398"},"institutions":[{"id":"https://openalex.org/I21193070","display_name":"Beijing Jiaotong University","ror":"https://ror.org/01yj56c84","country_code":"CN","type":"education","lineage":["https://openalex.org/I21193070"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Siyi Wang","raw_affiliation_strings":["School of Electrical Engineering, Beijing Jiaotong University,Beijing,China,100044"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Electrical Engineering, Beijing Jiaotong University,Beijing,China,100044","institution_ids":["https://openalex.org/I21193070"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I21193070"],"apc_list":null,"apc_paid":null,"fwci":2.0861,"has_fulltext":false,"cited_by_count":4,"citation_normalized_percentile":{"value":0.87473402,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":98},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"6"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11444","display_name":"Electromagnetic Compatibility and Noise Suppression","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11444","display_name":"Electromagnetic Compatibility and Noise Suppression","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11224","display_name":"Electromagnetic wave absorption materials","score":0.9894999861717224,"subfield":{"id":"https://openalex.org/subfields/2504","display_name":"Electronic, Optical and Magnetic Materials"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11383","display_name":"Advanced Antenna and Metasurface Technologies","score":0.98580002784729,"subfield":{"id":"https://openalex.org/subfields/2202","display_name":"Aerospace Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/emi","display_name":"EMI","score":0.906737744808197},{"id":"https://openalex.org/keywords/electromagnetic-interference","display_name":"Electromagnetic interference","score":0.8017607927322388},{"id":"https://openalex.org/keywords/converters","display_name":"Converters","score":0.757718026638031},{"id":"https://openalex.org/keywords/capacitor","display_name":"Capacitor","score":0.6883039474487305},{"id":"https://openalex.org/keywords/insertion-loss","display_name":"Insertion loss","score":0.552244246006012},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.5256299376487732},{"id":"https://openalex.org/keywords/conducted-electromagnetic-interference","display_name":"Conducted electromagnetic interference","score":0.49854183197021484},{"id":"https://openalex.org/keywords/filter","display_name":"Filter (signal processing)","score":0.4721417725086212},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.47002506256103516},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.46409645676612854},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.45983168482780457},{"id":"https://openalex.org/keywords/topology","display_name":"Topology (electrical circuits)","score":0.4573812186717987},{"id":"https://openalex.org/keywords/power-density","display_name":"Power density","score":0.42089223861694336},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.38816970586776733},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2543014883995056},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.22147232294082642}],"concepts":[{"id":"https://openalex.org/C43461449","wikidata":"https://www.wikidata.org/wiki/Q2495531","display_name":"EMI","level":3,"score":0.906737744808197},{"id":"https://openalex.org/C184892835","wikidata":"https://www.wikidata.org/wiki/Q1474513","display_name":"Electromagnetic interference","level":2,"score":0.8017607927322388},{"id":"https://openalex.org/C2778422915","wikidata":"https://www.wikidata.org/wiki/Q10302051","display_name":"Converters","level":3,"score":0.757718026638031},{"id":"https://openalex.org/C52192207","wikidata":"https://www.wikidata.org/wiki/Q5322","display_name":"Capacitor","level":3,"score":0.6883039474487305},{"id":"https://openalex.org/C90327742","wikidata":"https://www.wikidata.org/wiki/Q947396","display_name":"Insertion loss","level":2,"score":0.552244246006012},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.5256299376487732},{"id":"https://openalex.org/C147584655","wikidata":"https://www.wikidata.org/wiki/Q1474513","display_name":"Conducted electromagnetic interference","level":4,"score":0.49854183197021484},{"id":"https://openalex.org/C106131492","wikidata":"https://www.wikidata.org/wiki/Q3072260","display_name":"Filter (signal processing)","level":2,"score":0.4721417725086212},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.47002506256103516},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.46409645676612854},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.45983168482780457},{"id":"https://openalex.org/C184720557","wikidata":"https://www.wikidata.org/wiki/Q7825049","display_name":"Topology (electrical circuits)","level":2,"score":0.4573812186717987},{"id":"https://openalex.org/C21881925","wikidata":"https://www.wikidata.org/wiki/Q3503313","display_name":"Power density","level":3,"score":0.42089223861694336},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.38816970586776733},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2543014883995056},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.22147232294082642},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/iecon51785.2023.10311681","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iecon51785.2023.10311681","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IECON 2023- 49th Annual Conference of the IEEE Industrial Electronics Society","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":12,"referenced_works":["https://openalex.org/W2041970053","https://openalex.org/W2130117251","https://openalex.org/W2160795993","https://openalex.org/W2588198775","https://openalex.org/W2766520057","https://openalex.org/W2921672795","https://openalex.org/W2955279751","https://openalex.org/W2971409531","https://openalex.org/W2989347382","https://openalex.org/W2990180713","https://openalex.org/W4220887064","https://openalex.org/W4362501268"],"related_works":["https://openalex.org/W76001227","https://openalex.org/W2587678315","https://openalex.org/W2356938400","https://openalex.org/W3042884505","https://openalex.org/W1921091955","https://openalex.org/W2899511982","https://openalex.org/W1538473616","https://openalex.org/W2001606899","https://openalex.org/W2542938167","https://openalex.org/W2112284075"],"abstract_inverted_index":{"With":[0],"the":[1,12,24,38,48,72,99,106,132,140,144,152,163,175,179,183,201,205],"increase":[2],"of":[3,9,42,101,143,166,200,207],"switching":[4],"frequency":[5],"and":[6,14,31,56,66,79,96,126,135,154,168,186,210],"power":[7,10,43,202],"density":[8,40],"converters,":[11],"cost":[13,81,134,180,209],"difficulty":[15],"for":[16,197],"reducing":[17],"electromagnetic":[18],"interference":[19],"(EMI)":[20],"are":[21,29,34],"increased.":[22],"Since":[23],"passive":[25],"EMI":[26,50,198],"filters":[27,51],"(PEFs)":[28],"bulky":[30],"heavy,":[32],"they":[33],"difficult":[35],"to":[36,60,130],"meet":[37],"high-power":[39,211],"requirements":[41,206],"converters.":[44],"In":[45],"recent":[46],"years,":[47],"active":[49],"(AEFs)":[52],"have":[53,71],"attracted":[54],"more":[55,57],"attention":[58],"due":[59],"their":[61],"advantages":[62],"on":[63,74],"small":[64],"size":[65],"high":[67,80,136,170],"integration.":[68],"However,":[69],"AEFs":[70,91],"disadvantages":[73],"poor":[75],"high-frequency":[76],"suppression":[77],"effect":[78,88,165],"in":[82,98,119,149],"real":[83],"applications.":[84],"The":[85],"limited":[86],"filtering":[87,164],"means":[89],"that":[90,158],"often":[92],"cannot":[93],"operate":[94],"independently":[95],"exist":[97],"form":[100],"compensating":[102],"PEFs.":[103],"To":[104],"solve":[105],"above":[107],"problem,":[108],"a":[109,124,194],"variable":[110],"Y-capacitor":[111],"based":[112],"AEF":[113,185],"(VYC-AEF)":[114],"topology":[115],"is":[116,147,188],"firstly":[117],"proposed":[118,145],"this":[120,191],"paper":[121,192],"by":[122],"using":[123],"voltage":[125],"current":[127],"dual-sampling":[128],"structure,":[129],"realize":[131],"low":[133,208],"insertion":[137,171],"loss.":[138],"Further,":[139],"design":[141],"method":[142],"VYC-AEF":[146,159],"provided":[148],"detail.":[150],"Following,":[151],"simulation":[153],"experimental":[155],"results":[156],"prove":[157],"can":[160],"greatly":[161],"improve":[162],"Y-capacitor,":[167],"has":[169],"loss":[172],"compared":[173],"with":[174,182,204],"existing":[176,184],"AEF.":[177],"Finally,":[178],"comparison":[181],"PEF":[187],"given.":[189],"Therefore,":[190],"provides":[193],"new":[195],"choice":[196],"suppressing":[199],"converters":[203],"density.":[212]},"counts_by_year":[{"year":2026,"cited_by_count":2},{"year":2025,"cited_by_count":1},{"year":2024,"cited_by_count":1}],"updated_date":"2026-08-12T21:12:35.861297","created_date":"2025-10-10T00:00:00"}