{"id":"https://openalex.org/W4310969891","doi":"https://doi.org/10.1109/iecon49645.2022.9968635","title":"In-Circuit Debugger for Wireless Real-Time Monitoring and Diagnosis of FPGA Applications","display_name":"In-Circuit Debugger for Wireless Real-Time Monitoring and Diagnosis of FPGA Applications","publication_year":2022,"publication_date":"2022-10-17","ids":{"openalex":"https://openalex.org/W4310969891","doi":"https://doi.org/10.1109/iecon49645.2022.9968635"},"language":"en","primary_location":{"id":"doi:10.1109/iecon49645.2022.9968635","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iecon49645.2022.9968635","pdf_url":null,"source":{"id":"https://openalex.org/S4363607717","display_name":"IECON 2022 \u2013 48th Annual Conference of the IEEE Industrial Electronics Society","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IECON 2022 \u2013 48th Annual Conference of the IEEE Industrial Electronics Society","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5052529197","display_name":"Veit Wiese","orcid":null},"institutions":[{"id":"https://openalex.org/I206895457","display_name":"University of Siegen","ror":"https://ror.org/02azyry73","country_code":"DE","type":"education","lineage":["https://openalex.org/I206895457"]}],"countries":["DE"],"is_corresponding":true,"raw_author_name":"Veit Wiese","raw_affiliation_strings":["University of Siegen"],"affiliations":[{"raw_affiliation_string":"University of Siegen","institution_ids":["https://openalex.org/I206895457"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101899149","display_name":"Michael Schmidt","orcid":"https://orcid.org/0009-0002-3292-0349"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Michael Schmidt","raw_affiliation_strings":["Eskitec GmbH i.G"],"affiliations":[{"raw_affiliation_string":"Eskitec GmbH i.G","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5059553736","display_name":"Darshak Sheladiya","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Darshak Sheladiya","raw_affiliation_strings":["Eskitec GmbH i.G"],"affiliations":[{"raw_affiliation_string":"Eskitec GmbH i.G","institution_ids":[]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5084195691","display_name":"Roman Obermaisser","orcid":null},"institutions":[{"id":"https://openalex.org/I206895457","display_name":"University of Siegen","ror":"https://ror.org/02azyry73","country_code":"DE","type":"education","lineage":["https://openalex.org/I206895457"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Roman Obermaisser","raw_affiliation_strings":["University of Siegen"],"affiliations":[{"raw_affiliation_string":"University of Siegen","institution_ids":["https://openalex.org/I206895457"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5052529197"],"corresponding_institution_ids":["https://openalex.org/I206895457"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.14155713,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"28","issue":null,"first_page":"1","last_page":"6"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12122","display_name":"Physical Unclonable Functions (PUFs) and Hardware Security","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/debugger","display_name":"Debugger","score":0.8721199035644531},{"id":"https://openalex.org/keywords/field-programmable-gate-array","display_name":"Field-programmable gate array","score":0.7966951727867126},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6857096552848816},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.5571230053901672},{"id":"https://openalex.org/keywords/wireless","display_name":"Wireless","score":0.5378929972648621},{"id":"https://openalex.org/keywords/debugging","display_name":"Debugging","score":0.39725247025489807},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.3545125126838684},{"id":"https://openalex.org/keywords/real-time-computing","display_name":"Real-time computing","score":0.32866472005844116},{"id":"https://openalex.org/keywords/operating-system","display_name":"Operating system","score":0.2009691596031189}],"concepts":[{"id":"https://openalex.org/C2778485113","wikidata":"https://www.wikidata.org/wiki/Q193231","display_name":"Debugger","level":3,"score":0.8721199035644531},{"id":"https://openalex.org/C42935608","wikidata":"https://www.wikidata.org/wiki/Q190411","display_name":"Field-programmable gate array","level":2,"score":0.7966951727867126},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6857096552848816},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.5571230053901672},{"id":"https://openalex.org/C555944384","wikidata":"https://www.wikidata.org/wiki/Q249","display_name":"Wireless","level":2,"score":0.5378929972648621},{"id":"https://openalex.org/C168065819","wikidata":"https://www.wikidata.org/wiki/Q845566","display_name":"Debugging","level":2,"score":0.39725247025489807},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.3545125126838684},{"id":"https://openalex.org/C79403827","wikidata":"https://www.wikidata.org/wiki/Q3988","display_name":"Real-time computing","level":1,"score":0.32866472005844116},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.2009691596031189}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/iecon49645.2022.9968635","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iecon49645.2022.9968635","pdf_url":null,"source":{"id":"https://openalex.org/S4363607717","display_name":"IECON 2022 \u2013 48th Annual Conference of the IEEE Industrial Electronics Society","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IECON 2022 \u2013 48th Annual Conference of the IEEE Industrial Electronics Society","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Industry, innovation and infrastructure","id":"https://metadata.un.org/sdg/9","score":0.5199999809265137}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":11,"referenced_works":["https://openalex.org/W1989770778","https://openalex.org/W1997014887","https://openalex.org/W2016571982","https://openalex.org/W2110447181","https://openalex.org/W2119677575","https://openalex.org/W2137913189","https://openalex.org/W2366302051","https://openalex.org/W2406933358","https://openalex.org/W2566671010","https://openalex.org/W6676669610","https://openalex.org/W6730959537"],"related_works":["https://openalex.org/W2800641345","https://openalex.org/W2886673879","https://openalex.org/W564953056","https://openalex.org/W2061184006","https://openalex.org/W2381239448","https://openalex.org/W4236910510","https://openalex.org/W2092932442","https://openalex.org/W1751798423","https://openalex.org/W2543963479","https://openalex.org/W1917216709"],"abstract_inverted_index":{"As":[0],"the":[1,13,22,43,56,68],"level":[2],"of":[3,21,58,77,86,100,123],"System-on-Chip":[4],"(SoC)":[5],"based":[6],"embedded":[7],"systems":[8],"complexity":[9],"continues":[10],"to":[11,27,35,51,66],"enlarge,":[12],"post-silicon":[14],"validation":[15,70],"stage":[16],"contributes":[17],"a":[18,49,59,106],"major":[19],"part":[20],"entire":[23],"development":[24],"cost.":[25],"Due":[26],"precipitous":[28],"design":[29,40,44],"complexity,":[30],"it":[31,114],"is":[32,92],"nearly":[33],"unattainable":[34],"detect":[36],"and":[37,75,83,98,111],"fix":[38],"all":[39],"errors":[41],"during":[42],"phase.":[45],"This":[46,103],"paper":[47,104],"presents":[48],"solution":[50],"resolve":[52],"this":[53],"problem":[54],"with":[55],"help":[57],"novel":[60,107],"In-Circuit":[61],"Debugger":[62],"(ICD),":[63],"which":[64],"aims":[65],"enhance":[67],"post-production":[69],"process":[71],"by":[72],"enabling":[73],"observation":[74],"control":[76],"internal":[78],"signals,":[79],"such":[80],"as":[81],"input":[82],"output":[84],"signals":[85],"safety":[87],"critical":[88],"systems.":[89],"The":[90],"ICD":[91,124],"an":[93],"efficient":[94],"technique":[95,110],"for":[96],"monitoring":[97],"verification":[99],"on-chip":[101],"IP-cores.":[102],"proposes":[105],"system":[108],"debugging":[109],"explains":[112],"how":[113],"differs":[115],"from":[116],"existing":[117],"techniques.":[118],"Moreover,":[119],"various":[120],"use":[121],"cases":[122],"are":[125],"also":[126],"discussed":[127],"in":[128],"detail.":[129]},"counts_by_year":[],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}