{"id":"https://openalex.org/W4310969898","doi":"https://doi.org/10.1109/iecon49645.2022.9968436","title":"GA-based Parameter Optimization of Image Processing for Contamination Inspection of Nonwoven Fabrics","display_name":"GA-based Parameter Optimization of Image Processing for Contamination Inspection of Nonwoven Fabrics","publication_year":2022,"publication_date":"2022-10-17","ids":{"openalex":"https://openalex.org/W4310969898","doi":"https://doi.org/10.1109/iecon49645.2022.9968436"},"language":"en","primary_location":{"id":"doi:10.1109/iecon49645.2022.9968436","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iecon49645.2022.9968436","pdf_url":null,"source":{"id":"https://openalex.org/S4363607717","display_name":"IECON 2022 \u2013 48th Annual Conference of the IEEE Industrial Electronics Society","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IECON 2022 \u2013 48th Annual Conference of the IEEE Industrial Electronics Society","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5051003947","display_name":"Nobuhiko Kumazawa","orcid":null},"institutions":[{"id":"https://openalex.org/I42405503","display_name":"Gifu University","ror":"https://ror.org/024exxj48","country_code":"JP","type":"education","lineage":["https://openalex.org/I42405503"]}],"countries":["JP"],"is_corresponding":true,"raw_author_name":"Nobuhiko Kumazawa","raw_affiliation_strings":["Gifu University,Department of Mechanical Engineering,Gifu,Japan"],"affiliations":[{"raw_affiliation_string":"Gifu University,Department of Mechanical Engineering,Gifu,Japan","institution_ids":["https://openalex.org/I42405503"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5027259505","display_name":"Sota Miyazaki","orcid":null},"institutions":[{"id":"https://openalex.org/I42405503","display_name":"Gifu University","ror":"https://ror.org/024exxj48","country_code":"JP","type":"education","lineage":["https://openalex.org/I42405503"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Sota Miyazaki","raw_affiliation_strings":["Gifu University,Department of Mechanical Engineering,Gifu,Japan"],"affiliations":[{"raw_affiliation_string":"Gifu University,Department of Mechanical Engineering,Gifu,Japan","institution_ids":["https://openalex.org/I42405503"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5041478361","display_name":"Yoshiyuki Hatta","orcid":"https://orcid.org/0000-0001-7077-5264"},"institutions":[{"id":"https://openalex.org/I42405503","display_name":"Gifu University","ror":"https://ror.org/024exxj48","country_code":"JP","type":"education","lineage":["https://openalex.org/I42405503"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Yoshiyuki Hatta","raw_affiliation_strings":["Gifu University,Intelligent Production Technology R & D Center For Aerospace,Gifu,Japan"],"affiliations":[{"raw_affiliation_string":"Gifu University,Intelligent Production Technology R & D Center For Aerospace,Gifu,Japan","institution_ids":["https://openalex.org/I42405503"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5079056394","display_name":"Junya Sato","orcid":"https://orcid.org/0000-0003-3829-0405"},"institutions":[{"id":"https://openalex.org/I42405503","display_name":"Gifu University","ror":"https://ror.org/024exxj48","country_code":"JP","type":"education","lineage":["https://openalex.org/I42405503"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Junya Sato","raw_affiliation_strings":["Gifu University,Department of Mechanical Engineering,Gifu,Japan"],"affiliations":[{"raw_affiliation_string":"Gifu University,Department of Mechanical Engineering,Gifu,Japan","institution_ids":["https://openalex.org/I42405503"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5047042841","display_name":"Kazuaki Ito","orcid":"https://orcid.org/0000-0002-8977-3709"},"institutions":[{"id":"https://openalex.org/I42405503","display_name":"Gifu University","ror":"https://ror.org/024exxj48","country_code":"JP","type":"education","lineage":["https://openalex.org/I42405503"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Kazuaki Ito","raw_affiliation_strings":["Gifu University,Department of Mechanical Engineering,Gifu,Japan"],"affiliations":[{"raw_affiliation_string":"Gifu University,Department of Mechanical Engineering,Gifu,Japan","institution_ids":["https://openalex.org/I42405503"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5075330189","display_name":"Yukio Otsuka","orcid":"https://orcid.org/0000-0001-7016-3110"},"institutions":[{"id":"https://openalex.org/I114030911","display_name":"Otsuka (Japan)","ror":"https://ror.org/013k5y296","country_code":"JP","type":"company","lineage":["https://openalex.org/I114030911"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Yukio Otsuka","raw_affiliation_strings":["Otsuka Corporation,Hashima,Japan"],"affiliations":[{"raw_affiliation_string":"Otsuka Corporation,Hashima,Japan","institution_ids":["https://openalex.org/I114030911"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5010291078","display_name":"Ryota Kitagawa","orcid":null},"institutions":[{"id":"https://openalex.org/I114030911","display_name":"Otsuka (Japan)","ror":"https://ror.org/013k5y296","country_code":"JP","type":"company","lineage":["https://openalex.org/I114030911"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Ryota Kitagawa","raw_affiliation_strings":["Otsuka Corporation,Hashima,Japan"],"affiliations":[{"raw_affiliation_string":"Otsuka Corporation,Hashima,Japan","institution_ids":["https://openalex.org/I114030911"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5102400031","display_name":"Kenji Iwata","orcid":null},"institutions":[{"id":"https://openalex.org/I114030911","display_name":"Otsuka (Japan)","ror":"https://ror.org/013k5y296","country_code":"JP","type":"company","lineage":["https://openalex.org/I114030911"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Kenji Iwata","raw_affiliation_strings":["Otsuka Corporation,Hashima,Japan"],"affiliations":[{"raw_affiliation_string":"Otsuka Corporation,Hashima,Japan","institution_ids":["https://openalex.org/I114030911"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5050714330","display_name":"Hidekazu Hirayu","orcid":null},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Hidekazu Hirayu","raw_affiliation_strings":["Gifu Prefectural Industrial Technology Center,Seki,Japan"],"affiliations":[{"raw_affiliation_string":"Gifu Prefectural Industrial Technology Center,Seki,Japan","institution_ids":[]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":9,"corresponding_author_ids":["https://openalex.org/A5051003947"],"corresponding_institution_ids":["https://openalex.org/I42405503"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.19149672,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"54","issue":null,"first_page":"1","last_page":"6"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9987999796867371,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9987999796867371,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11595","display_name":"Textile materials and evaluations","score":0.9638000130653381,"subfield":{"id":"https://openalex.org/subfields/2507","display_name":"Polymers and Plastics"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13049","display_name":"Surface Roughness and Optical Measurements","score":0.9503999948501587,"subfield":{"id":"https://openalex.org/subfields/2206","display_name":"Computational Mechanics"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/image-processing","display_name":"Image processing","score":0.7284080982208252},{"id":"https://openalex.org/keywords/automation","display_name":"Automation","score":0.6983280181884766},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5988197326660156},{"id":"https://openalex.org/keywords/genetic-algorithm","display_name":"Genetic algorithm","score":0.5961020588874817},{"id":"https://openalex.org/keywords/contamination","display_name":"Contamination","score":0.5681977272033691},{"id":"https://openalex.org/keywords/set","display_name":"Set (abstract data type)","score":0.5410311222076416},{"id":"https://openalex.org/keywords/image","display_name":"Image (mathematics)","score":0.5277621746063232},{"id":"https://openalex.org/keywords/image-segmentation","display_name":"Image segmentation","score":0.4418381154537201},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.42194512486457825},{"id":"https://openalex.org/keywords/digital-image-processing","display_name":"Digital image processing","score":0.41540780663490295},{"id":"https://openalex.org/keywords/computer-vision","display_name":"Computer vision","score":0.3646659851074219},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2797197699546814},{"id":"https://openalex.org/keywords/mechanical-engineering","display_name":"Mechanical engineering","score":0.08840230107307434},{"id":"https://openalex.org/keywords/machine-learning","display_name":"Machine learning","score":0.08789166808128357}],"concepts":[{"id":"https://openalex.org/C9417928","wikidata":"https://www.wikidata.org/wiki/Q1070689","display_name":"Image processing","level":3,"score":0.7284080982208252},{"id":"https://openalex.org/C115901376","wikidata":"https://www.wikidata.org/wiki/Q184199","display_name":"Automation","level":2,"score":0.6983280181884766},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5988197326660156},{"id":"https://openalex.org/C8880873","wikidata":"https://www.wikidata.org/wiki/Q187787","display_name":"Genetic algorithm","level":2,"score":0.5961020588874817},{"id":"https://openalex.org/C112570922","wikidata":"https://www.wikidata.org/wiki/Q60528603","display_name":"Contamination","level":2,"score":0.5681977272033691},{"id":"https://openalex.org/C177264268","wikidata":"https://www.wikidata.org/wiki/Q1514741","display_name":"Set (abstract data type)","level":2,"score":0.5410311222076416},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.5277621746063232},{"id":"https://openalex.org/C124504099","wikidata":"https://www.wikidata.org/wiki/Q56933","display_name":"Image segmentation","level":3,"score":0.4418381154537201},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.42194512486457825},{"id":"https://openalex.org/C104317675","wikidata":"https://www.wikidata.org/wiki/Q1070689","display_name":"Digital image processing","level":4,"score":0.41540780663490295},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.3646659851074219},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2797197699546814},{"id":"https://openalex.org/C78519656","wikidata":"https://www.wikidata.org/wiki/Q101333","display_name":"Mechanical engineering","level":1,"score":0.08840230107307434},{"id":"https://openalex.org/C119857082","wikidata":"https://www.wikidata.org/wiki/Q2539","display_name":"Machine learning","level":1,"score":0.08789166808128357},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0},{"id":"https://openalex.org/C18903297","wikidata":"https://www.wikidata.org/wiki/Q7150","display_name":"Ecology","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/iecon49645.2022.9968436","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iecon49645.2022.9968436","pdf_url":null,"source":{"id":"https://openalex.org/S4363607717","display_name":"IECON 2022 \u2013 48th Annual Conference of the IEEE Industrial Electronics Society","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IECON 2022 \u2013 48th Annual Conference of the IEEE Industrial Electronics Society","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":8,"referenced_works":["https://openalex.org/W1532839958","https://openalex.org/W2010078766","https://openalex.org/W2112600914","https://openalex.org/W2123873447","https://openalex.org/W2125764602","https://openalex.org/W2152150600","https://openalex.org/W2916106717","https://openalex.org/W6682679816"],"related_works":["https://openalex.org/W2941415828","https://openalex.org/W2081985452","https://openalex.org/W1504972346","https://openalex.org/W4386504616","https://openalex.org/W2561491196","https://openalex.org/W1593730969","https://openalex.org/W2356087891","https://openalex.org/W2358437414","https://openalex.org/W2775496002","https://openalex.org/W2959195936"],"abstract_inverted_index":{"The":[0,57,81],"paper":[1,82],"proposes":[2],"the":[3,16,36,40,62,72,78,84,87,91],"parameter":[4],"optimization":[5],"of":[6,12,18,86],"image":[7,22,29],"processing":[8,23],"for":[9,39,61],"contamination":[10,19],"inspection":[11,20],"nonwoven":[13],"fabrics.":[14],"Currently,":[15],"automation":[17],"using":[21],"systems":[24],"is":[25,32,44],"being":[26],"considered.":[27],"In":[28],"processing,":[30],"it":[31,43,48],"important":[33],"to":[34,46],"set":[35],"optimal":[37,63],"parameters":[38,64],"processing.":[41],"However,":[42],"necessary":[45],"search":[47,73],"from":[49],"many":[50],"combinations":[51],"because":[52],"there":[53],"are":[54],"some":[55],"parameters.":[56],"proposed":[58,88],"method":[59,89],"searches":[60],"based":[65],"on":[66],"a":[67],"genetic":[68],"algorithm.":[69],"It":[70],"reduces":[71],"time":[74],"in":[75],"comparison":[76],"with":[77,90],"conventional":[79],"method.":[80],"indicates":[83],"effectiveness":[85],"experimental":[92],"results.":[93]},"counts_by_year":[],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}