{"id":"https://openalex.org/W3214545841","doi":"https://doi.org/10.1109/iecon48115.2021.9589351","title":"A Boost Converter Integrated With DC Circuit Breaker","display_name":"A Boost Converter Integrated With DC Circuit Breaker","publication_year":2021,"publication_date":"2021-10-13","ids":{"openalex":"https://openalex.org/W3214545841","doi":"https://doi.org/10.1109/iecon48115.2021.9589351","mag":"3214545841"},"language":"en","primary_location":{"id":"doi:10.1109/iecon48115.2021.9589351","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iecon48115.2021.9589351","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IECON 2021 \u2013 47th Annual Conference of the IEEE Industrial Electronics Society","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5100373462","display_name":"Yuyang Liu","orcid":"https://orcid.org/0000-0002-7320-1300"},"institutions":[{"id":"https://openalex.org/I17145004","display_name":"Northwestern Polytechnical University","ror":"https://ror.org/01y0j0j86","country_code":"CN","type":"education","lineage":["https://openalex.org/I17145004"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Yuyang Liu","raw_affiliation_strings":["School of Automation, Northwestern Polytechnical University, Xi\u2019an, China","School of Automation, Northwestern Polytechnical University, Xi'an, China"],"affiliations":[{"raw_affiliation_string":"School of Automation, Northwestern Polytechnical University, Xi\u2019an, China","institution_ids":["https://openalex.org/I17145004"]},{"raw_affiliation_string":"School of Automation, Northwestern Polytechnical University, Xi'an, China","institution_ids":["https://openalex.org/I17145004"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100367902","display_name":"Yufeng Wang","orcid":"https://orcid.org/0000-0001-6739-927X"},"institutions":[{"id":"https://openalex.org/I17145004","display_name":"Northwestern Polytechnical University","ror":"https://ror.org/01y0j0j86","country_code":"CN","type":"education","lineage":["https://openalex.org/I17145004"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yufeng Wang","raw_affiliation_strings":["School of Automation, Northwestern Polytechnical University, Xi\u2019an, China","School of Automation, Northwestern Polytechnical University, Xi'an, China"],"affiliations":[{"raw_affiliation_string":"School of Automation, Northwestern Polytechnical University, Xi\u2019an, China","institution_ids":["https://openalex.org/I17145004"]},{"raw_affiliation_string":"School of Automation, Northwestern Polytechnical University, Xi'an, China","institution_ids":["https://openalex.org/I17145004"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100712881","display_name":"Shuai Ding","orcid":"https://orcid.org/0009-0008-5603-0053"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Shuai Ding","raw_affiliation_strings":["Shanghai Institute of Space Power-Sources, Shanghai, China"],"affiliations":[{"raw_affiliation_string":"Shanghai Institute of Space Power-Sources, Shanghai, China","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5048609852","display_name":"Yufei Tao","orcid":"https://orcid.org/0000-0003-3883-5452"},"institutions":[{"id":"https://openalex.org/I17145004","display_name":"Northwestern Polytechnical University","ror":"https://ror.org/01y0j0j86","country_code":"CN","type":"education","lineage":["https://openalex.org/I17145004"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yufei Tao","raw_affiliation_strings":["School of Automation, Northwestern Polytechnical University, Xi\u2019an, China","School of Automation, Northwestern Polytechnical University, Xi'an, China"],"affiliations":[{"raw_affiliation_string":"School of Automation, Northwestern Polytechnical University, Xi\u2019an, China","institution_ids":["https://openalex.org/I17145004"]},{"raw_affiliation_string":"School of Automation, Northwestern Polytechnical University, Xi'an, China","institution_ids":["https://openalex.org/I17145004"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5100690565","display_name":"Weilin Li","orcid":"https://orcid.org/0000-0002-7319-3611"},"institutions":[{"id":"https://openalex.org/I4210105136","display_name":"Yangtze River Delta Physics Research Center (China)","ror":"https://ror.org/01g53qc72","country_code":"CN","type":"company","lineage":["https://openalex.org/I4210105136"]},{"id":"https://openalex.org/I17145004","display_name":"Northwestern Polytechnical University","ror":"https://ror.org/01y0j0j86","country_code":"CN","type":"education","lineage":["https://openalex.org/I17145004"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Weilin Li","raw_affiliation_strings":["School of Automation, Northwestern Polytechnical University, Xi\u2019an, China","Yangtze River Delta Research Institute of NPU, Taicang, China","School of Automation, Northwestern Polytechnical University, Xi'an, China"],"affiliations":[{"raw_affiliation_string":"School of Automation, Northwestern Polytechnical University, Xi\u2019an, China","institution_ids":["https://openalex.org/I17145004"]},{"raw_affiliation_string":"Yangtze River Delta Research Institute of NPU, Taicang, China","institution_ids":["https://openalex.org/I4210105136"]},{"raw_affiliation_string":"School of Automation, Northwestern Polytechnical University, Xi'an, China","institution_ids":["https://openalex.org/I17145004"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":5,"corresponding_author_ids":["https://openalex.org/A5100373462"],"corresponding_institution_ids":["https://openalex.org/I17145004"],"apc_list":null,"apc_paid":null,"fwci":0.3008,"has_fulltext":false,"cited_by_count":4,"citation_normalized_percentile":{"value":0.5733256,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":96},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"6"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11102","display_name":"HVDC Systems and Fault Protection","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11102","display_name":"HVDC Systems and Fault Protection","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10223","display_name":"Microgrid Control and Optimization","score":0.9908000230789185,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10361","display_name":"Silicon Carbide Semiconductor Technologies","score":0.9778000116348267,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/circuit-breaker","display_name":"Circuit breaker","score":0.916766881942749},{"id":"https://openalex.org/keywords/recloser","display_name":"Recloser","score":0.6317050457000732},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.5725663900375366},{"id":"https://openalex.org/keywords/arc-fault-circuit-interrupter","display_name":"Arc-fault circuit interrupter","score":0.5643057823181152},{"id":"https://openalex.org/keywords/topology","display_name":"Topology (electrical circuits)","score":0.5185847282409668},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.46948084235191345},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.46237868070602417},{"id":"https://openalex.org/keywords/residual-current-device","display_name":"Residual-current device","score":0.4548644423484802},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.4284267723560333},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.42611169815063477},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.4116242229938507},{"id":"https://openalex.org/keywords/short-circuit","display_name":"Short circuit","score":0.20963254570960999},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.10028976202011108},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.0727148950099945}],"concepts":[{"id":"https://openalex.org/C61352017","wikidata":"https://www.wikidata.org/wiki/Q211058","display_name":"Circuit breaker","level":2,"score":0.916766881942749},{"id":"https://openalex.org/C31712484","wikidata":"https://www.wikidata.org/wiki/Q618740","display_name":"Recloser","level":3,"score":0.6317050457000732},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.5725663900375366},{"id":"https://openalex.org/C157069517","wikidata":"https://www.wikidata.org/wiki/Q132172","display_name":"Arc-fault circuit interrupter","level":4,"score":0.5643057823181152},{"id":"https://openalex.org/C184720557","wikidata":"https://www.wikidata.org/wiki/Q7825049","display_name":"Topology (electrical circuits)","level":2,"score":0.5185847282409668},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.46948084235191345},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.46237868070602417},{"id":"https://openalex.org/C15116251","wikidata":"https://www.wikidata.org/wiki/Q337716","display_name":"Residual-current device","level":3,"score":0.4548644423484802},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.4284267723560333},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.42611169815063477},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4116242229938507},{"id":"https://openalex.org/C68583231","wikidata":"https://www.wikidata.org/wiki/Q206907","display_name":"Short circuit","level":3,"score":0.20963254570960999},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.10028976202011108},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0727148950099945},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/iecon48115.2021.9589351","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iecon48115.2021.9589351","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IECON 2021 \u2013 47th Annual Conference of the IEEE Industrial Electronics Society","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[{"id":"https://openalex.org/F4320330944","display_name":"Nature","ror":null}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":8,"referenced_works":["https://openalex.org/W1911296725","https://openalex.org/W2038149860","https://openalex.org/W2085610745","https://openalex.org/W2160345097","https://openalex.org/W2570590247","https://openalex.org/W2887072540","https://openalex.org/W2973585988","https://openalex.org/W3037289018"],"related_works":["https://openalex.org/W2352337740","https://openalex.org/W2128585342","https://openalex.org/W2389512741","https://openalex.org/W2380044501","https://openalex.org/W2385770137","https://openalex.org/W2081736596","https://openalex.org/W766263941","https://openalex.org/W250321534","https://openalex.org/W2460914904","https://openalex.org/W2386710286"],"abstract_inverted_index":{"The":[0],"fault":[1,105,141,158],"protection":[2],"of":[3,11,39,47,59,68,75,82,85,115,121,128,146,154],"DC":[4,12,14,24,40,48],"microgrids":[5],"restricts":[6],"the":[7,33,37,43,57,66,73,83,111,116,119,125,129,135,140,144,152],"popularization":[8],"and":[9,45,71,78,95,104,113,139,157],"development":[10,58],"grids.":[13],"circuit":[15,25,49,60,69,76,96],"breaker":[16,26,50,70,77,97],"is":[17,27,51,80,98,132,149],"an":[18,53],"effective":[19],"solution":[20],"to":[21,35,64,100],"this":[22,88],"problem.":[23],"usually":[28],"connected":[29],"in":[30],"series":[31],"with":[32],"converter":[34,79,94],"realize":[36,72,101],"function":[38],"protection.":[41],"But":[42],"volume":[44],"weight":[46,114],"also":[52],"important":[54],"factor":[55],"restricting":[56],"breaker.":[61],"Therefore,":[62],"how":[63],"simplify":[65],"structure":[67],"integration":[74],"one":[81],"focuses":[84],"research.":[86],"In":[87],"paper,":[89],"a":[90],"topology":[91,109,131],"integrating":[92],"boost":[93],"proposed,":[99],"power":[102,155],"conversion":[103,156],"current":[106],"isolation.":[107],"This":[108],"reduces":[110],"size":[112],"device":[117],"through":[118],"reuse":[120],"passive":[122],"components.":[123],"Firstly,":[124],"working":[126,137],"principle":[127],"proposed":[130],"analyzed,":[133],"including":[134],"steady":[136],"state":[138],"state.":[142],"Then,":[143],"process":[145],"parameter":[147],"selection":[148],"derived.":[150],"Finally,":[151],"functions":[153],"isolation":[159],"are":[160],"verified":[161],"by":[162],"MATLAB":[163],"simulation.":[164]},"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2023,"cited_by_count":2},{"year":2022,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}