{"id":"https://openalex.org/W3211864455","doi":"https://doi.org/10.1109/iecon48115.2021.9589245","title":"Data-driven Quality Estimation for Production Processes with Lot-level Quality Control","display_name":"Data-driven Quality Estimation for Production Processes with Lot-level Quality Control","publication_year":2021,"publication_date":"2021-10-13","ids":{"openalex":"https://openalex.org/W3211864455","doi":"https://doi.org/10.1109/iecon48115.2021.9589245","mag":"3211864455"},"language":"en","primary_location":{"id":"doi:10.1109/iecon48115.2021.9589245","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iecon48115.2021.9589245","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IECON 2021 \u2013 47th Annual Conference of the IEEE Industrial Electronics Society","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5089890313","display_name":"Naveen John Punnoose","orcid":"https://orcid.org/0000-0001-8428-903X"},"institutions":[{"id":"https://openalex.org/I165932596","display_name":"National University of Singapore","ror":"https://ror.org/01tgyzw49","country_code":"SG","type":"education","lineage":["https://openalex.org/I165932596"]}],"countries":["SG"],"is_corresponding":true,"raw_author_name":"Naveen John Punnoose","raw_affiliation_strings":["National University of Singapore, Singapore"],"affiliations":[{"raw_affiliation_string":"National University of Singapore, Singapore","institution_ids":["https://openalex.org/I165932596"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5053670340","display_name":"Prahlad Vadakkepat","orcid":"https://orcid.org/0000-0003-2649-9893"},"institutions":[{"id":"https://openalex.org/I165932596","display_name":"National University of Singapore","ror":"https://ror.org/01tgyzw49","country_code":"SG","type":"education","lineage":["https://openalex.org/I165932596"]}],"countries":["SG"],"is_corresponding":false,"raw_author_name":"Prahlad Vadakkepat","raw_affiliation_strings":["National University of Singapore, Singapore"],"affiliations":[{"raw_affiliation_string":"National University of Singapore, Singapore","institution_ids":["https://openalex.org/I165932596"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5076313390","display_name":"A.P. Loh","orcid":"https://orcid.org/0000-0002-6851-0133"},"institutions":[{"id":"https://openalex.org/I165932596","display_name":"National University of Singapore","ror":"https://ror.org/01tgyzw49","country_code":"SG","type":"education","lineage":["https://openalex.org/I165932596"]}],"countries":["SG"],"is_corresponding":false,"raw_author_name":"Ai-Poh Loh","raw_affiliation_strings":["National University of Singapore, Singapore"],"affiliations":[{"raw_affiliation_string":"National University of Singapore, Singapore","institution_ids":["https://openalex.org/I165932596"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5020614337","display_name":"Edward Kien Yee Yap","orcid":null},"institutions":[{"id":"https://openalex.org/I115228651","display_name":"Agency for Science, Technology and Research","ror":"https://ror.org/036wvzt09","country_code":"SG","type":"government","lineage":["https://openalex.org/I115228651"]}],"countries":["SG"],"is_corresponding":false,"raw_author_name":"Edward Kien Yee Yap","raw_affiliation_strings":["Singapore Institute for Manufacturing Technology Agency for Science, Technology and Research (A*STAR), Singapore"],"affiliations":[{"raw_affiliation_string":"Singapore Institute for Manufacturing Technology Agency for Science, Technology and Research (A*STAR), Singapore","institution_ids":["https://openalex.org/I115228651"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5089890313"],"corresponding_institution_ids":["https://openalex.org/I165932596"],"apc_list":null,"apc_paid":null,"fwci":0.593,"has_fulltext":false,"cited_by_count":4,"citation_normalized_percentile":{"value":0.74272562,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":96},"biblio":{"volume":"15","issue":null,"first_page":"1","last_page":"6"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11159","display_name":"Manufacturing Process and Optimization","score":0.996399998664856,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11159","display_name":"Manufacturing Process and Optimization","score":0.996399998664856,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11443","display_name":"Advanced Statistical Process Monitoring","score":0.9915000200271606,"subfield":{"id":"https://openalex.org/subfields/1804","display_name":"Statistics, Probability and Uncertainty"},"field":{"id":"https://openalex.org/fields/18","display_name":"Decision Sciences"},"domain":{"id":"https://openalex.org/domains/2","display_name":"Social Sciences"}},{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9782999753952026,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/quality","display_name":"Quality (philosophy)","score":0.7499668598175049},{"id":"https://openalex.org/keywords/production","display_name":"Production (economics)","score":0.7010853290557861},{"id":"https://openalex.org/keywords/control","display_name":"Control (management)","score":0.6413376927375793},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5840876698493958},{"id":"https://openalex.org/keywords/estimation","display_name":"Estimation","score":0.5733473896980286},{"id":"https://openalex.org/keywords/process-engineering","display_name":"Process engineering","score":0.4473256766796112},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.13652411103248596},{"id":"https://openalex.org/keywords/systems-engineering","display_name":"Systems engineering","score":0.12575426697731018},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.1255093514919281}],"concepts":[{"id":"https://openalex.org/C2779530757","wikidata":"https://www.wikidata.org/wiki/Q1207505","display_name":"Quality (philosophy)","level":2,"score":0.7499668598175049},{"id":"https://openalex.org/C2778348673","wikidata":"https://www.wikidata.org/wiki/Q739302","display_name":"Production (economics)","level":2,"score":0.7010853290557861},{"id":"https://openalex.org/C2775924081","wikidata":"https://www.wikidata.org/wiki/Q55608371","display_name":"Control (management)","level":2,"score":0.6413376927375793},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5840876698493958},{"id":"https://openalex.org/C96250715","wikidata":"https://www.wikidata.org/wiki/Q965330","display_name":"Estimation","level":2,"score":0.5733473896980286},{"id":"https://openalex.org/C21880701","wikidata":"https://www.wikidata.org/wiki/Q2144042","display_name":"Process engineering","level":1,"score":0.4473256766796112},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.13652411103248596},{"id":"https://openalex.org/C201995342","wikidata":"https://www.wikidata.org/wiki/Q682496","display_name":"Systems engineering","level":1,"score":0.12575426697731018},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.1255093514919281},{"id":"https://openalex.org/C139719470","wikidata":"https://www.wikidata.org/wiki/Q39680","display_name":"Macroeconomics","level":1,"score":0.0},{"id":"https://openalex.org/C162324750","wikidata":"https://www.wikidata.org/wiki/Q8134","display_name":"Economics","level":0,"score":0.0},{"id":"https://openalex.org/C111472728","wikidata":"https://www.wikidata.org/wiki/Q9471","display_name":"Epistemology","level":1,"score":0.0},{"id":"https://openalex.org/C138885662","wikidata":"https://www.wikidata.org/wiki/Q5891","display_name":"Philosophy","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/iecon48115.2021.9589245","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iecon48115.2021.9589245","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IECON 2021 \u2013 47th Annual Conference of the IEEE Industrial Electronics Society","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.6100000143051147,"id":"https://metadata.un.org/sdg/9","display_name":"Industry, innovation and infrastructure"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":23,"referenced_works":["https://openalex.org/W140867740","https://openalex.org/W1542589770","https://openalex.org/W2061207866","https://openalex.org/W2095705004","https://openalex.org/W2118978333","https://openalex.org/W2119328379","https://openalex.org/W2119821739","https://openalex.org/W2122111042","https://openalex.org/W2178035602","https://openalex.org/W2594332903","https://openalex.org/W2618530766","https://openalex.org/W2739770319","https://openalex.org/W2771605104","https://openalex.org/W2782812883","https://openalex.org/W2883308961","https://openalex.org/W2888477829","https://openalex.org/W2899362345","https://openalex.org/W3102041842","https://openalex.org/W3106178873","https://openalex.org/W4239510810","https://openalex.org/W4300494200","https://openalex.org/W6605731719","https://openalex.org/W6674330103"],"related_works":["https://openalex.org/W1967965601","https://openalex.org/W2384667405","https://openalex.org/W2389266787","https://openalex.org/W2570544837","https://openalex.org/W2363885542","https://openalex.org/W2387206255","https://openalex.org/W2355570285","https://openalex.org/W2364958354","https://openalex.org/W2352797113","https://openalex.org/W2372137583"],"abstract_inverted_index":{"In":[0,67],"high":[1],"volume":[2],"production":[3,37],"processes":[4],"such":[5],"as":[6],"injection":[7,136],"molding,":[8],"inline":[9],"inspection":[10],"of":[11,61,97],"parts":[12,31,63],"is":[13,76,131],"generally":[14],"not":[15,40],"feasible":[16],"due":[17],"to":[18,82,103,123],"additional":[19],"sensor":[20,90],"requirements":[21],"that":[22,78],"incur":[23],"costs.":[24],"Production":[25],"facilities":[26],"often":[27],"inspect":[28],"for":[29,41,107],"defective":[30],"at":[32,86],"the":[33,52,59,100,125,143],"lot-level":[34,87,167,174],"after":[35],"multiple":[36],"runs":[38],"and":[39,138,153,175],"each":[42,108],"run.":[43,109],"Individual":[44],"lots":[45],"are":[46],"accepted":[47],"or":[48],"rejected":[49],"based":[50],"on":[51],"manufacturer\u2019s":[53],"acceptable":[54],"quality":[55,84,177],"levels":[56],"determined":[57],"by":[58],"number":[60],"faulty":[62],"in":[64,142],"a":[65,70,95,114,119],"lot.":[66],"this":[68],"paper,":[69],"Lot-level":[71],"Convolutional":[72],"Neural":[73],"Network":[74],"(L-CNN)":[75],"proposed":[77],"implements":[79],"two":[80],"variants":[81],"improve":[83],"estimation":[85],"using":[88,133],"run-level":[89,176],"data.":[91],"Layer-wise":[92],"L-CNN":[93,112,146,171],"uses":[94],"separation":[96],"layers":[98],"within":[99],"model":[101,130],"architecture":[102,117],"extract":[104],"relevant":[105],"features":[106],"Custom":[110],"loss":[111,121,170],"utilizes":[113],"standard":[115],"CNN":[116],"with":[118,157,163],"custom":[120,169],"function":[122],"handle":[124],"data\u2019s":[126],"multi-input-single-output":[127],"structure.":[128],"The":[129],"evaluated":[132],"data":[134],"from":[135],"molding":[137],"wafer":[139],"testing":[140],"applications":[141],"semiconductor":[144],"industry.":[145],"achieves":[147],"better":[148],"F":[149],"<inf":[150],"xmlns:mml=\"http://www.w3.org/1998/Math/MathML\"":[151],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">1</inf>":[152],"G-Mean":[154],"scores":[155],"compared":[156],"existing":[158],"benchmarks.":[159],"Even":[160],"though":[161],"trained":[162],"partial":[164],"information":[165],"(i.e.,":[166],"quality),":[168],"provides":[172],"both":[173],"predictions.":[178]},"counts_by_year":[{"year":2024,"cited_by_count":1},{"year":2023,"cited_by_count":2},{"year":2022,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}