{"id":"https://openalex.org/W2996283059","doi":"https://doi.org/10.1109/iecon.2019.8927824","title":"Smart Control System on Electrical Safety in Testing Laboratories","display_name":"Smart Control System on Electrical Safety in Testing Laboratories","publication_year":2019,"publication_date":"2019-10-01","ids":{"openalex":"https://openalex.org/W2996283059","doi":"https://doi.org/10.1109/iecon.2019.8927824","mag":"2996283059"},"language":"en","primary_location":{"id":"doi:10.1109/iecon.2019.8927824","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iecon.2019.8927824","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IECON 2019 - 45th Annual Conference of the IEEE Industrial Electronics Society","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5070802986","display_name":"Chi Chung Lee","orcid":"https://orcid.org/0000-0001-9365-9397"},"institutions":[{"id":"https://openalex.org/I8679417","display_name":"Hong Kong Metropolitan University","ror":"https://ror.org/0349bsm71","country_code":"HK","type":"education","lineage":["https://openalex.org/I8679417"]}],"countries":["HK"],"is_corresponding":true,"raw_author_name":"C. C. Lee","raw_affiliation_strings":["School of Science and Technology, The Open University of Hong Kong, Hong Kong, China"],"affiliations":[{"raw_affiliation_string":"School of Science and Technology, The Open University of Hong Kong, Hong Kong, China","institution_ids":["https://openalex.org/I8679417"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5003992489","display_name":"Kok-Cheong Wong","orcid":"https://orcid.org/0000-0002-6356-1564"},"institutions":[{"id":"https://openalex.org/I8679417","display_name":"Hong Kong Metropolitan University","ror":"https://ror.org/0349bsm71","country_code":"HK","type":"education","lineage":["https://openalex.org/I8679417"]}],"countries":["HK"],"is_corresponding":false,"raw_author_name":"K. K. Wong","raw_affiliation_strings":["School of Science and Technology, The Open University of Hong Kong, Hong Kong, China"],"affiliations":[{"raw_affiliation_string":"School of Science and Technology, The Open University of Hong Kong, Hong Kong, China","institution_ids":["https://openalex.org/I8679417"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5024507977","display_name":"Wushan Cheng","orcid":null},"institutions":[{"id":"https://openalex.org/I8679417","display_name":"Hong Kong Metropolitan University","ror":"https://ror.org/0349bsm71","country_code":"HK","type":"education","lineage":["https://openalex.org/I8679417"]}],"countries":["HK"],"is_corresponding":false,"raw_author_name":"W. C. Cheng","raw_affiliation_strings":["School of Science and Technology, The Open University of Hong Kong, Hong Kong, China"],"affiliations":[{"raw_affiliation_string":"School of Science and Technology, The Open University of Hong Kong, Hong Kong, China","institution_ids":["https://openalex.org/I8679417"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5070589082","display_name":"S. P. Li","orcid":null},"institutions":[{"id":"https://openalex.org/I8679417","display_name":"Hong Kong Metropolitan University","ror":"https://ror.org/0349bsm71","country_code":"HK","type":"education","lineage":["https://openalex.org/I8679417"]}],"countries":["HK"],"is_corresponding":false,"raw_author_name":"S. P. Li","raw_affiliation_strings":["School of Science and Technology, The Open University of Hong Kong, Hong Kong, China"],"affiliations":[{"raw_affiliation_string":"School of Science and Technology, The Open University of Hong Kong, Hong Kong, China","institution_ids":["https://openalex.org/I8679417"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5005804799","display_name":"H. C. Li","orcid":null},"institutions":[{"id":"https://openalex.org/I8679417","display_name":"Hong Kong Metropolitan University","ror":"https://ror.org/0349bsm71","country_code":"HK","type":"education","lineage":["https://openalex.org/I8679417"]}],"countries":["HK"],"is_corresponding":false,"raw_author_name":"H. C. Li","raw_affiliation_strings":["School of Science and Technology, The Open University of Hong Kong, Hong Kong, China"],"affiliations":[{"raw_affiliation_string":"School of Science and Technology, The Open University of Hong Kong, Hong Kong, China","institution_ids":["https://openalex.org/I8679417"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":5,"corresponding_author_ids":["https://openalex.org/A5070802986"],"corresponding_institution_ids":["https://openalex.org/I8679417"],"apc_list":null,"apc_paid":null,"fwci":0.4346,"has_fulltext":false,"cited_by_count":3,"citation_normalized_percentile":{"value":0.66148674,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":95},"biblio":{"volume":null,"issue":null,"first_page":"3031","last_page":"3036"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12597","display_name":"Fire Detection and Safety Systems","score":0.8345999717712402,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12597","display_name":"Fire Detection and Safety Systems","score":0.8345999717712402,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13344","display_name":"Industrial Automation and Control Systems","score":0.7371000051498413,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14225","display_name":"Advanced Sensor and Control Systems","score":0.7361999750137329,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/internet-of-things","display_name":"Internet of Things","score":0.5984547138214111},{"id":"https://openalex.org/keywords/hazardous-waste","display_name":"Hazardous waste","score":0.5129232406616211},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.47705593705177307},{"id":"https://openalex.org/keywords/product-testing","display_name":"Product testing","score":0.4767935276031494},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.4649921953678131},{"id":"https://openalex.org/keywords/control","display_name":"Control (management)","score":0.43679237365722656},{"id":"https://openalex.org/keywords/system-testing","display_name":"System testing","score":0.4274410605430603},{"id":"https://openalex.org/keywords/electrical-equipment","display_name":"Electrical equipment","score":0.4244404137134552},{"id":"https://openalex.org/keywords/automotive-engineering","display_name":"Automotive engineering","score":0.3783498704433441},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.3379572033882141},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.3245777487754822},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.30006474256515503},{"id":"https://openalex.org/keywords/software-engineering","display_name":"Software engineering","score":0.07373484969139099}],"concepts":[{"id":"https://openalex.org/C81860439","wikidata":"https://www.wikidata.org/wiki/Q251212","display_name":"Internet of Things","level":2,"score":0.5984547138214111},{"id":"https://openalex.org/C22507642","wikidata":"https://www.wikidata.org/wiki/Q1069369","display_name":"Hazardous waste","level":2,"score":0.5129232406616211},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.47705593705177307},{"id":"https://openalex.org/C526771534","wikidata":"https://www.wikidata.org/wiki/Q7247798","display_name":"Product testing","level":2,"score":0.4767935276031494},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4649921953678131},{"id":"https://openalex.org/C2775924081","wikidata":"https://www.wikidata.org/wiki/Q55608371","display_name":"Control (management)","level":2,"score":0.43679237365722656},{"id":"https://openalex.org/C7166840","wikidata":"https://www.wikidata.org/wiki/Q1199682","display_name":"System testing","level":2,"score":0.4274410605430603},{"id":"https://openalex.org/C162175671","wikidata":"https://www.wikidata.org/wiki/Q3749263","display_name":"Electrical equipment","level":2,"score":0.4244404137134552},{"id":"https://openalex.org/C171146098","wikidata":"https://www.wikidata.org/wiki/Q124192","display_name":"Automotive engineering","level":1,"score":0.3783498704433441},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.3379572033882141},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.3245777487754822},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.30006474256515503},{"id":"https://openalex.org/C115903868","wikidata":"https://www.wikidata.org/wiki/Q80993","display_name":"Software engineering","level":1,"score":0.07373484969139099},{"id":"https://openalex.org/C548081761","wikidata":"https://www.wikidata.org/wiki/Q180388","display_name":"Waste management","level":1,"score":0.0},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.0},{"id":"https://openalex.org/C21547014","wikidata":"https://www.wikidata.org/wiki/Q1423657","display_name":"Operations management","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/iecon.2019.8927824","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iecon.2019.8927824","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IECON 2019 - 45th Annual Conference of the IEEE Industrial Electronics Society","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":1,"referenced_works":["https://openalex.org/W2908222215"],"related_works":["https://openalex.org/W1503780849","https://openalex.org/W164591511","https://openalex.org/W2968920050","https://openalex.org/W1983610689","https://openalex.org/W2066326953","https://openalex.org/W4313506560","https://openalex.org/W2052233302","https://openalex.org/W4226211933","https://openalex.org/W2374789807","https://openalex.org/W1974893167"],"abstract_inverted_index":{"In":[0],"this":[1],"paper,":[2],"we":[3],"demonstrated":[4],"the":[5,8,14,24,41,44,53],"application":[6],"of":[7,36,43,46,52],"monitoring":[9],"and":[10,30],"control":[11],"system":[12],"on":[13],"unceremonious":[15],"electrical":[16,54],"testing":[17,25,55],"equipment":[18,56],"which":[19],"is":[20,63],"unintentionally":[21],"designed":[22],"for":[23],"laboratories.":[26],"The":[27,49],"operating":[28],"temperature":[29],"current":[31],"would":[32,57],"be":[33,58],"under":[34,65],"surveillance":[35],"our":[37],"design":[38],"product":[39],"using":[40],"concept":[42],"Internet":[45],"Things":[47],"(IoT).":[48],"power":[50],"supply":[51],"cut":[59],"off":[60],"when":[61],"it":[62],"operated":[64],"any":[66],"hazardous":[67],"condition.":[68]},"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2022,"cited_by_count":1},{"year":2021,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}