{"id":"https://openalex.org/W2995420648","doi":"https://doi.org/10.1109/iecon.2019.8927539","title":"Capacitor Monitoring for Full-Bridge Submodule Based Modular Multilevel Converters","display_name":"Capacitor Monitoring for Full-Bridge Submodule Based Modular Multilevel Converters","publication_year":2019,"publication_date":"2019-10-01","ids":{"openalex":"https://openalex.org/W2995420648","doi":"https://doi.org/10.1109/iecon.2019.8927539","mag":"2995420648"},"language":"en","primary_location":{"id":"doi:10.1109/iecon.2019.8927539","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iecon.2019.8927539","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IECON 2019 - 45th Annual Conference of the IEEE Industrial Electronics Society","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5112492352","display_name":"Chengwei Yin","orcid":null},"institutions":[{"id":"https://openalex.org/I76569877","display_name":"Southeast University","ror":"https://ror.org/04ct4d772","country_code":"CN","type":"education","lineage":["https://openalex.org/I76569877"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Chengwei Yin","raw_affiliation_strings":["Southeast University,Department of Electrical Engineering,Nanjing,China,210096","Department of Electrical Engineering, Southeast University, Nanjing, China"],"affiliations":[{"raw_affiliation_string":"Southeast University,Department of Electrical Engineering,Nanjing,China,210096","institution_ids":["https://openalex.org/I76569877"]},{"raw_affiliation_string":"Department of Electrical Engineering, Southeast University, Nanjing, China","institution_ids":["https://openalex.org/I76569877"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5055654426","display_name":"Fujin Deng","orcid":"https://orcid.org/0000-0002-9832-004X"},"institutions":[{"id":"https://openalex.org/I76569877","display_name":"Southeast University","ror":"https://ror.org/04ct4d772","country_code":"CN","type":"education","lineage":["https://openalex.org/I76569877"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Fujin Deng","raw_affiliation_strings":["Southeast University,Department of Electrical Engineering,Nanjing,China,210096","Department of Electrical Engineering, Southeast University, Nanjing, China"],"affiliations":[{"raw_affiliation_string":"Southeast University,Department of Electrical Engineering,Nanjing,China,210096","institution_ids":["https://openalex.org/I76569877"]},{"raw_affiliation_string":"Department of Electrical Engineering, Southeast University, Nanjing, China","institution_ids":["https://openalex.org/I76569877"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5064407249","display_name":"Qiang Yu","orcid":"https://orcid.org/0000-0003-1267-5323"},"institutions":[{"id":"https://openalex.org/I76569877","display_name":"Southeast University","ror":"https://ror.org/04ct4d772","country_code":"CN","type":"education","lineage":["https://openalex.org/I76569877"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Qiang Yu","raw_affiliation_strings":["Southeast University,Department of Electrical Engineering,Nanjing,China,210096","Department of Electrical Engineering, Southeast University, Nanjing, China"],"affiliations":[{"raw_affiliation_string":"Southeast University,Department of Electrical Engineering,Nanjing,China,210096","institution_ids":["https://openalex.org/I76569877"]},{"raw_affiliation_string":"Department of Electrical Engineering, Southeast University, Nanjing, China","institution_ids":["https://openalex.org/I76569877"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5043869490","display_name":"Yongqing Lv","orcid":"https://orcid.org/0009-0006-3748-9761"},"institutions":[{"id":"https://openalex.org/I76569877","display_name":"Southeast University","ror":"https://ror.org/04ct4d772","country_code":"CN","type":"education","lineage":["https://openalex.org/I76569877"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yongqing Lv","raw_affiliation_strings":["Southeast University,Department of Electrical Engineering,Nanjing,China,210096","Department of Electrical Engineering, Southeast University, Nanjing, China"],"affiliations":[{"raw_affiliation_string":"Southeast University,Department of Electrical Engineering,Nanjing,China,210096","institution_ids":["https://openalex.org/I76569877"]},{"raw_affiliation_string":"Department of Electrical Engineering, Southeast University, Nanjing, China","institution_ids":["https://openalex.org/I76569877"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5020751880","display_name":"Qian Heng","orcid":"https://orcid.org/0000-0002-6091-7940"},"institutions":[{"id":"https://openalex.org/I76569877","display_name":"Southeast University","ror":"https://ror.org/04ct4d772","country_code":"CN","type":"education","lineage":["https://openalex.org/I76569877"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Qian Heng","raw_affiliation_strings":["Southeast University,Department of Electrical Engineering,Nanjing,China,210096","Department of Electrical Engineering, Southeast University, Nanjing, China"],"affiliations":[{"raw_affiliation_string":"Southeast University,Department of Electrical Engineering,Nanjing,China,210096","institution_ids":["https://openalex.org/I76569877"]},{"raw_affiliation_string":"Department of Electrical Engineering, Southeast University, Nanjing, China","institution_ids":["https://openalex.org/I76569877"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5061332500","display_name":"Qingsong Wang","orcid":"https://orcid.org/0000-0002-0066-9973"},"institutions":[{"id":"https://openalex.org/I76569877","display_name":"Southeast University","ror":"https://ror.org/04ct4d772","country_code":"CN","type":"education","lineage":["https://openalex.org/I76569877"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Qingsong Wang","raw_affiliation_strings":["Southeast University,Department of Electrical Engineering,Nanjing,China,210096","Department of Electrical Engineering, Southeast University, Nanjing, China"],"affiliations":[{"raw_affiliation_string":"Southeast University,Department of Electrical Engineering,Nanjing,China,210096","institution_ids":["https://openalex.org/I76569877"]},{"raw_affiliation_string":"Department of Electrical Engineering, Southeast University, Nanjing, China","institution_ids":["https://openalex.org/I76569877"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":6,"corresponding_author_ids":["https://openalex.org/A5112492352"],"corresponding_institution_ids":["https://openalex.org/I76569877"],"apc_list":null,"apc_paid":null,"fwci":0.7268,"has_fulltext":false,"cited_by_count":9,"citation_normalized_percentile":{"value":0.72934213,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":99},"biblio":{"volume":null,"issue":null,"first_page":"3781","last_page":"3786"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11102","display_name":"HVDC Systems and Fault Protection","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11102","display_name":"HVDC Systems and Fault Protection","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14502","display_name":"High-Voltage Power Transmission Systems","score":0.9682999849319458,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10361","display_name":"Silicon Carbide Semiconductor Technologies","score":0.9128000140190125,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/modular-design","display_name":"Modular design","score":0.8655813932418823},{"id":"https://openalex.org/keywords/capacitance","display_name":"Capacitance","score":0.8456319570541382},{"id":"https://openalex.org/keywords/converters","display_name":"Converters","score":0.8124632835388184},{"id":"https://openalex.org/keywords/capacitor","display_name":"Capacitor","score":0.7556204199790955},{"id":"https://openalex.org/keywords/bridge","display_name":"Bridge (graph theory)","score":0.6741925477981567},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.653340756893158},{"id":"https://openalex.org/keywords/flexibility","display_name":"Flexibility (engineering)","score":0.6254534721374512},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.5750436782836914},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5533075332641602},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.38448619842529297},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.3452156186103821},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.3334839344024658},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.1444319188594818},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.08954179286956787},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.07687270641326904},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.06345716118812561}],"concepts":[{"id":"https://openalex.org/C101468663","wikidata":"https://www.wikidata.org/wiki/Q1620158","display_name":"Modular design","level":2,"score":0.8655813932418823},{"id":"https://openalex.org/C30066665","wikidata":"https://www.wikidata.org/wiki/Q164399","display_name":"Capacitance","level":3,"score":0.8456319570541382},{"id":"https://openalex.org/C2778422915","wikidata":"https://www.wikidata.org/wiki/Q10302051","display_name":"Converters","level":3,"score":0.8124632835388184},{"id":"https://openalex.org/C52192207","wikidata":"https://www.wikidata.org/wiki/Q5322","display_name":"Capacitor","level":3,"score":0.7556204199790955},{"id":"https://openalex.org/C100776233","wikidata":"https://www.wikidata.org/wiki/Q2532492","display_name":"Bridge (graph theory)","level":2,"score":0.6741925477981567},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.653340756893158},{"id":"https://openalex.org/C2780598303","wikidata":"https://www.wikidata.org/wiki/Q65921492","display_name":"Flexibility (engineering)","level":2,"score":0.6254534721374512},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.5750436782836914},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5533075332641602},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.38448619842529297},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.3452156186103821},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.3334839344024658},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.1444319188594818},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.08954179286956787},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.07687270641326904},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.06345716118812561},{"id":"https://openalex.org/C71924100","wikidata":"https://www.wikidata.org/wiki/Q11190","display_name":"Medicine","level":0,"score":0.0},{"id":"https://openalex.org/C126322002","wikidata":"https://www.wikidata.org/wiki/Q11180","display_name":"Internal medicine","level":1,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C17525397","wikidata":"https://www.wikidata.org/wiki/Q176140","display_name":"Electrode","level":2,"score":0.0},{"id":"https://openalex.org/C105795698","wikidata":"https://www.wikidata.org/wiki/Q12483","display_name":"Statistics","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/iecon.2019.8927539","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iecon.2019.8927539","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IECON 2019 - 45th Annual Conference of the IEEE Industrial Electronics Society","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Affordable and clean energy","score":0.7200000286102295,"id":"https://metadata.un.org/sdg/7"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":24,"referenced_works":["https://openalex.org/W1533204364","https://openalex.org/W2011975264","https://openalex.org/W2015547686","https://openalex.org/W2037239418","https://openalex.org/W2053515824","https://openalex.org/W2055905802","https://openalex.org/W2056370486","https://openalex.org/W2086647021","https://openalex.org/W2123746471","https://openalex.org/W2136509165","https://openalex.org/W2154211756","https://openalex.org/W2160311820","https://openalex.org/W2170998309","https://openalex.org/W2178160054","https://openalex.org/W2316904322","https://openalex.org/W2317349697","https://openalex.org/W2328229040","https://openalex.org/W2349076781","https://openalex.org/W2423473464","https://openalex.org/W2773108478","https://openalex.org/W2884720115","https://openalex.org/W2971574196","https://openalex.org/W6631675364","https://openalex.org/W6654474240"],"related_works":["https://openalex.org/W631083485","https://openalex.org/W2080773395","https://openalex.org/W3212531278","https://openalex.org/W2161636646","https://openalex.org/W2099626417","https://openalex.org/W1994228036","https://openalex.org/W2019514496","https://openalex.org/W2085450379","https://openalex.org/W3129126528","https://openalex.org/W2354552488"],"abstract_inverted_index":{"Modular":[0],"Multilevel":[1],"Converter":[2],"(MMC)":[3],"is":[4,22,48],"widely":[5],"used":[6],"in":[7,16,42,75],"flexible":[8],"DC":[9],"transmission":[10],"systems":[11],"for":[12,29,64],"its":[13],"great":[14,50],"performance":[15],"flexibility,":[17],"stability":[18],"and":[19],"availability.":[20],"Reliability":[21],"one":[23],"of":[24,33,37,45,49,103],"the":[25,30,46,53,65,73,87,94,101,104],"most":[26],"important":[27],"challenges":[28],"MMC":[31,47],"consisting":[32],"a":[34,60,80],"large":[35],"number":[36],"submodules":[38],"(SMs).":[39],"The":[40,83,97],"capacitance":[41,61,74],"each":[43,76],"SM":[44,67,78],"importance":[51],"to":[52],"MMC's":[54],"normal":[55],"operation.":[56],"This":[57],"paper":[58],"proposes":[59],"monitoring":[62],"method":[63],"full-bridge":[66,77],"based":[68],"MMCs,":[69],"which":[70],"can":[71],"estimate":[72],"with":[79,86,93],"simple":[81],"algorithm.":[82],"simulation":[84],"studies":[85],"professional":[88],"tool":[89],"PSCAD/EMTDC":[90],"are":[91],"conducted":[92],"proposed":[95,105],"method.":[96,106],"study":[98],"results":[99],"show":[100],"effectiveness":[102]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2025,"cited_by_count":1},{"year":2024,"cited_by_count":1},{"year":2022,"cited_by_count":3},{"year":2021,"cited_by_count":1},{"year":2020,"cited_by_count":2}],"updated_date":"2026-04-02T15:55:50.835912","created_date":"2025-10-10T00:00:00"}