{"id":"https://openalex.org/W2906977069","doi":"https://doi.org/10.1109/iecon.2018.8591394","title":"A Fast Average Model-Based Method for IGBT and Current Sensor Fault Diagnosis in Grid- Tied Inverters","display_name":"A Fast Average Model-Based Method for IGBT and Current Sensor Fault Diagnosis in Grid- Tied Inverters","publication_year":2018,"publication_date":"2018-10-01","ids":{"openalex":"https://openalex.org/W2906977069","doi":"https://doi.org/10.1109/iecon.2018.8591394","mag":"2906977069"},"language":"en","primary_location":{"id":"doi:10.1109/iecon.2018.8591394","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iecon.2018.8591394","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IECON 2018 - 44th Annual Conference of the IEEE Industrial Electronics Society","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5060931046","display_name":"Yini Ren","orcid":"https://orcid.org/0000-0002-8757-9283"},"institutions":[{"id":"https://openalex.org/I76130692","display_name":"Zhejiang University","ror":"https://ror.org/00a2xv884","country_code":"CN","type":"education","lineage":["https://openalex.org/I76130692"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yini Ren","raw_affiliation_strings":["College of Electrical Engineering, Zhejiang University, Hangzhou, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"College of Electrical Engineering, Zhejiang University, Hangzhou, China","institution_ids":["https://openalex.org/I76130692"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100619793","display_name":"Zhan Li","orcid":"https://orcid.org/0000-0002-5053-6853"},"institutions":[{"id":"https://openalex.org/I76130692","display_name":"Zhejiang University","ror":"https://ror.org/00a2xv884","country_code":"CN","type":"education","lineage":["https://openalex.org/I76130692"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Zhan Li","raw_affiliation_strings":["College of Electrical Engineering, Zhejiang University, Hangzhou, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"College of Electrical Engineering, Zhejiang University, Hangzhou, China","institution_ids":["https://openalex.org/I76130692"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5055439068","display_name":"Borong Wang","orcid":"https://orcid.org/0000-0003-4271-4995"},"institutions":[{"id":"https://openalex.org/I76130692","display_name":"Zhejiang University","ror":"https://ror.org/00a2xv884","country_code":"CN","type":"education","lineage":["https://openalex.org/I76130692"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Borong Wang","raw_affiliation_strings":["College of Electrical Engineering, Zhejiang University, Hangzhou, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"College of Electrical Engineering, Zhejiang University, Hangzhou, China","institution_ids":["https://openalex.org/I76130692"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5040684949","display_name":"Zhihong Bai","orcid":"https://orcid.org/0000-0002-8560-043X"},"institutions":[{"id":"https://openalex.org/I76130692","display_name":"Zhejiang University","ror":"https://ror.org/00a2xv884","country_code":"CN","type":"education","lineage":["https://openalex.org/I76130692"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Zhihong Bai","raw_affiliation_strings":["College of Electrical Engineering, Zhejiang University, Hangzhou, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"College of Electrical Engineering, Zhejiang University, Hangzhou, China","institution_ids":["https://openalex.org/I76130692"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5037742943","display_name":"Hao Ma","orcid":"https://orcid.org/0000-0002-4714-0233"},"institutions":[{"id":"https://openalex.org/I76130692","display_name":"Zhejiang University","ror":"https://ror.org/00a2xv884","country_code":"CN","type":"education","lineage":["https://openalex.org/I76130692"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Hao Ma","raw_affiliation_strings":["College of Electrical Engineering, Zhejiang University, Hangzhou, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"College of Electrical Engineering, Zhejiang University, Hangzhou, China","institution_ids":["https://openalex.org/I76130692"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I76130692"],"apc_list":null,"apc_paid":null,"fwci":0.3928,"has_fulltext":false,"cited_by_count":7,"citation_normalized_percentile":{"value":0.65384057,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":96},"biblio":{"volume":"45","issue":null,"first_page":"3809","last_page":"3814"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10361","display_name":"Silicon Carbide Semiconductor Technologies","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10361","display_name":"Silicon Carbide Semiconductor Technologies","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10228","display_name":"Multilevel Inverters and Converters","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10468","display_name":"Photovoltaic System Optimization Techniques","score":0.9958999752998352,"subfield":{"id":"https://openalex.org/subfields/2105","display_name":"Renewable Energy, Sustainability and the Environment"},"field":{"id":"https://openalex.org/fields/21","display_name":"Energy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/insulated-gate-bipolar-transistor","display_name":"Insulated-gate bipolar transistor","score":0.8060723543167114},{"id":"https://openalex.org/keywords/robustness","display_name":"Robustness (evolution)","score":0.6896122694015503},{"id":"https://openalex.org/keywords/current-sensor","display_name":"Current sensor","score":0.5823528170585632},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.5320134162902832},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.516038179397583},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.5099571943283081},{"id":"https://openalex.org/keywords/fault-current-limiter","display_name":"Fault current limiter","score":0.5014166831970215},{"id":"https://openalex.org/keywords/voltage-source","display_name":"Voltage source","score":0.4956754446029663},{"id":"https://openalex.org/keywords/inductor","display_name":"Inductor","score":0.48565995693206787},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.4746723175048828},{"id":"https://openalex.org/keywords/grid","display_name":"Grid","score":0.4627860188484192},{"id":"https://openalex.org/keywords/short-circuit","display_name":"Short circuit","score":0.41513848304748535},{"id":"https://openalex.org/keywords/control-theory","display_name":"Control theory (sociology)","score":0.3828597664833069},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.35767728090286255},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.27774477005004883},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.1875980794429779},{"id":"https://openalex.org/keywords/electric-power-system","display_name":"Electric power system","score":0.10390028357505798},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.09228271245956421}],"concepts":[{"id":"https://openalex.org/C28285623","wikidata":"https://www.wikidata.org/wiki/Q176110","display_name":"Insulated-gate bipolar transistor","level":3,"score":0.8060723543167114},{"id":"https://openalex.org/C63479239","wikidata":"https://www.wikidata.org/wiki/Q7353546","display_name":"Robustness (evolution)","level":3,"score":0.6896122694015503},{"id":"https://openalex.org/C55000061","wikidata":"https://www.wikidata.org/wiki/Q24894777","display_name":"Current sensor","level":3,"score":0.5823528170585632},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.5320134162902832},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.516038179397583},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.5099571943283081},{"id":"https://openalex.org/C129187525","wikidata":"https://www.wikidata.org/wiki/Q10858078","display_name":"Fault current limiter","level":4,"score":0.5014166831970215},{"id":"https://openalex.org/C144655898","wikidata":"https://www.wikidata.org/wiki/Q1161128","display_name":"Voltage source","level":3,"score":0.4956754446029663},{"id":"https://openalex.org/C144534570","wikidata":"https://www.wikidata.org/wiki/Q5325","display_name":"Inductor","level":3,"score":0.48565995693206787},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.4746723175048828},{"id":"https://openalex.org/C187691185","wikidata":"https://www.wikidata.org/wiki/Q2020720","display_name":"Grid","level":2,"score":0.4627860188484192},{"id":"https://openalex.org/C68583231","wikidata":"https://www.wikidata.org/wiki/Q206907","display_name":"Short circuit","level":3,"score":0.41513848304748535},{"id":"https://openalex.org/C47446073","wikidata":"https://www.wikidata.org/wiki/Q5165890","display_name":"Control theory (sociology)","level":3,"score":0.3828597664833069},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.35767728090286255},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.27774477005004883},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.1875980794429779},{"id":"https://openalex.org/C89227174","wikidata":"https://www.wikidata.org/wiki/Q2388981","display_name":"Electric power system","level":3,"score":0.10390028357505798},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.09228271245956421},{"id":"https://openalex.org/C2775924081","wikidata":"https://www.wikidata.org/wiki/Q55608371","display_name":"Control (management)","level":2,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.0},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.0},{"id":"https://openalex.org/C104317684","wikidata":"https://www.wikidata.org/wiki/Q7187","display_name":"Gene","level":2,"score":0.0},{"id":"https://openalex.org/C55493867","wikidata":"https://www.wikidata.org/wiki/Q7094","display_name":"Biochemistry","level":1,"score":0.0},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/iecon.2018.8591394","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iecon.2018.8591394","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IECON 2018 - 44th Annual Conference of the IEEE Industrial Electronics Society","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":17,"referenced_works":["https://openalex.org/W1970849593","https://openalex.org/W1984786788","https://openalex.org/W2015455045","https://openalex.org/W2038419241","https://openalex.org/W2060912452","https://openalex.org/W2071760299","https://openalex.org/W2084816725","https://openalex.org/W2105714345","https://openalex.org/W2134695802","https://openalex.org/W2142351866","https://openalex.org/W2150763729","https://openalex.org/W2315109789","https://openalex.org/W2465871042","https://openalex.org/W2473515968","https://openalex.org/W2531437605","https://openalex.org/W2626377653","https://openalex.org/W2770358545"],"related_works":["https://openalex.org/W2387542117","https://openalex.org/W2141322760","https://openalex.org/W2914116022","https://openalex.org/W4380551772","https://openalex.org/W2909285633","https://openalex.org/W2362061239","https://openalex.org/W2375043136","https://openalex.org/W2393419321","https://openalex.org/W2801023610","https://openalex.org/W4389401084"],"abstract_inverted_index":{"This":[0],"paper":[1],"presents":[2],"an":[3],"average":[4],"model-based":[5],"diagnosis":[6,23,48,69,91],"method":[7,44],"for":[8,55],"current":[9,30,57],"sensor":[10,58],"fault":[11,15,68],"and":[12,33,60],"IGBT":[13,61],"open-circuit":[14],"in":[16,96],"grid-tied":[17],"three-phase":[18],"voltage-source":[19],"inverters":[20],"(VSIs).":[21],"The":[22,42,67],"algorithm":[24],"is":[25,82],"based":[26],"on":[27],"observed":[28],"inductor":[29],"sum":[31],"deviation":[32],"bridge":[34],"arm":[35],"line":[36],"voltage":[37],"residuals":[38],"with":[39],"adaptive":[40],"thresholds.":[41,98],"proposed":[43],"can":[45,71],"guarantee":[46],"fast":[47,74],"speed":[49,70],"as":[50,52,73,75],"well":[51],"strong":[53],"robustness":[54],"both":[56],"faults":[59],"faults,":[62],"without":[63],"extra":[64],"hardware":[65],"circuits.":[66],"be":[72],"one":[76],"switching":[77],"period.":[78],"No":[79],"tuning":[80],"effort":[81],"needed":[83],"under":[84],"different":[85],"operating":[86],"conditions":[87],"since":[88],"all":[89],"the":[90,97,106],"calculation":[92],"errors":[93],"are":[94,101],"covered":[95],"Finally,":[99],"experiments":[100],"carried":[102],"out":[103],"to":[104],"prove":[105],"effectiveness.":[107]},"counts_by_year":[{"year":2024,"cited_by_count":1},{"year":2023,"cited_by_count":1},{"year":2022,"cited_by_count":2},{"year":2021,"cited_by_count":1},{"year":2019,"cited_by_count":2}],"updated_date":"2026-06-26T08:34:08.712188","created_date":"2025-10-10T00:00:00"}