{"id":"https://openalex.org/W2908222215","doi":"https://doi.org/10.1109/iecon.2018.8591237","title":"Wireless Sensor Networks for Hazardous Areas in the Electrical Testing Laboratories","display_name":"Wireless Sensor Networks for Hazardous Areas in the Electrical Testing Laboratories","publication_year":2018,"publication_date":"2018-10-01","ids":{"openalex":"https://openalex.org/W2908222215","doi":"https://doi.org/10.1109/iecon.2018.8591237","mag":"2908222215"},"language":"en","primary_location":{"id":"doi:10.1109/iecon.2018.8591237","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iecon.2018.8591237","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IECON 2018 - 44th Annual Conference of the IEEE Industrial Electronics Society","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5070802986","display_name":"Chi Chung Lee","orcid":"https://orcid.org/0000-0001-9365-9397"},"institutions":[{"id":"https://openalex.org/I8679417","display_name":"Hong Kong Metropolitan University","ror":"https://ror.org/0349bsm71","country_code":"HK","type":"education","lineage":["https://openalex.org/I8679417"]}],"countries":["HK"],"is_corresponding":false,"raw_author_name":"C. C. Lee","raw_affiliation_strings":["School of Science and Technology, The Open University of Hong Kong, Hong Kong, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Science and Technology, The Open University of Hong Kong, Hong Kong, China","institution_ids":["https://openalex.org/I8679417"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5010930907","display_name":"T. L. Yuen","orcid":null},"institutions":[{"id":"https://openalex.org/I8679417","display_name":"Hong Kong Metropolitan University","ror":"https://ror.org/0349bsm71","country_code":"HK","type":"education","lineage":["https://openalex.org/I8679417"]}],"countries":["HK"],"is_corresponding":false,"raw_author_name":"T. L. Yuen","raw_affiliation_strings":["School of Science and Technology, The Open University of Hong Kong, Hong Kong, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Science and Technology, The Open University of Hong Kong, Hong Kong, China","institution_ids":["https://openalex.org/I8679417"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5036703326","display_name":"N. M. Lau","orcid":null},"institutions":[{"id":"https://openalex.org/I8679417","display_name":"Hong Kong Metropolitan University","ror":"https://ror.org/0349bsm71","country_code":"HK","type":"education","lineage":["https://openalex.org/I8679417"]}],"countries":["HK"],"is_corresponding":false,"raw_author_name":"N. M. Lau","raw_affiliation_strings":["School of Science and Technology, The Open University of Hong Kong, Hong Kong, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Science and Technology, The Open University of Hong Kong, Hong Kong, China","institution_ids":["https://openalex.org/I8679417"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5103832175","display_name":"C.K. Lo","orcid":null},"institutions":[{"id":"https://openalex.org/I8679417","display_name":"Hong Kong Metropolitan University","ror":"https://ror.org/0349bsm71","country_code":"HK","type":"education","lineage":["https://openalex.org/I8679417"]}],"countries":["HK"],"is_corresponding":false,"raw_author_name":"C.K. Lo","raw_affiliation_strings":["School of Science and Technology, The Open University of Hong Kong, Hong Kong, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Science and Technology, The Open University of Hong Kong, Hong Kong, China","institution_ids":["https://openalex.org/I8679417"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5047031544","display_name":"K. F. Yau","orcid":null},"institutions":[{"id":"https://openalex.org/I8679417","display_name":"Hong Kong Metropolitan University","ror":"https://ror.org/0349bsm71","country_code":"HK","type":"education","lineage":["https://openalex.org/I8679417"]}],"countries":["HK"],"is_corresponding":false,"raw_author_name":"K. F. Yau","raw_affiliation_strings":["School of Science and Technology, The Open University of Hong Kong, Hong Kong, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Science and Technology, The Open University of Hong Kong, Hong Kong, China","institution_ids":["https://openalex.org/I8679417"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I8679417"],"apc_list":null,"apc_paid":null,"fwci":10.875,"has_fulltext":false,"cited_by_count":3,"citation_normalized_percentile":{"value":1.0,"is_in_top_1_percent":true,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":89,"max":96},"biblio":{"volume":null,"issue":null,"first_page":"4748","last_page":"4753"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T13840","display_name":"Chemical Safety and Risk Management","score":0.8823000192642212,"subfield":{"id":"https://openalex.org/subfields/1504","display_name":"Chemical Health and Safety"},"field":{"id":"https://openalex.org/fields/15","display_name":"Chemical Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T13840","display_name":"Chemical Safety and Risk Management","score":0.8823000192642212,"subfield":{"id":"https://openalex.org/subfields/1504","display_name":"Chemical Health and Safety"},"field":{"id":"https://openalex.org/fields/15","display_name":"Chemical Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11357","display_name":"Risk and Safety Analysis","score":0.866100013256073,"subfield":{"id":"https://openalex.org/subfields/1804","display_name":"Statistics, Probability and Uncertainty"},"field":{"id":"https://openalex.org/fields/18","display_name":"Decision Sciences"},"domain":{"id":"https://openalex.org/domains/2","display_name":"Social Sciences"}},{"id":"https://openalex.org/T12597","display_name":"Fire Detection and Safety Systems","score":0.7753000259399414,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/hazardous-waste","display_name":"Hazardous waste","score":0.7098979949951172},{"id":"https://openalex.org/keywords/wireless","display_name":"Wireless","score":0.6407003998756409},{"id":"https://openalex.org/keywords/wireless-sensor-network","display_name":"Wireless sensor network","score":0.6262243986129761},{"id":"https://openalex.org/keywords/certification","display_name":"Certification","score":0.5759222507476807},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.48657524585723877},{"id":"https://openalex.org/keywords/wireless-network","display_name":"Wireless network","score":0.4638960361480713},{"id":"https://openalex.org/keywords/wireless-site-survey","display_name":"Wireless site survey","score":0.42504018545150757},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.3867351710796356},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.33146604895591736},{"id":"https://openalex.org/keywords/computer-security","display_name":"Computer security","score":0.32184267044067383},{"id":"https://openalex.org/keywords/key-distribution-in-wireless-sensor-networks","display_name":"Key distribution in wireless sensor networks","score":0.31456172466278076},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.3093850612640381},{"id":"https://openalex.org/keywords/computer-network","display_name":"Computer network","score":0.20326918363571167}],"concepts":[{"id":"https://openalex.org/C22507642","wikidata":"https://www.wikidata.org/wiki/Q1069369","display_name":"Hazardous waste","level":2,"score":0.7098979949951172},{"id":"https://openalex.org/C555944384","wikidata":"https://www.wikidata.org/wiki/Q249","display_name":"Wireless","level":2,"score":0.6407003998756409},{"id":"https://openalex.org/C24590314","wikidata":"https://www.wikidata.org/wiki/Q336038","display_name":"Wireless sensor network","level":2,"score":0.6262243986129761},{"id":"https://openalex.org/C46304622","wikidata":"https://www.wikidata.org/wiki/Q374814","display_name":"Certification","level":2,"score":0.5759222507476807},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.48657524585723877},{"id":"https://openalex.org/C108037233","wikidata":"https://www.wikidata.org/wiki/Q11375","display_name":"Wireless network","level":3,"score":0.4638960361480713},{"id":"https://openalex.org/C13021490","wikidata":"https://www.wikidata.org/wiki/Q8026901","display_name":"Wireless site survey","level":5,"score":0.42504018545150757},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.3867351710796356},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.33146604895591736},{"id":"https://openalex.org/C38652104","wikidata":"https://www.wikidata.org/wiki/Q3510521","display_name":"Computer security","level":1,"score":0.32184267044067383},{"id":"https://openalex.org/C41971633","wikidata":"https://www.wikidata.org/wiki/Q6398155","display_name":"Key distribution in wireless sensor networks","level":4,"score":0.31456172466278076},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.3093850612640381},{"id":"https://openalex.org/C31258907","wikidata":"https://www.wikidata.org/wiki/Q1301371","display_name":"Computer network","level":1,"score":0.20326918363571167},{"id":"https://openalex.org/C199539241","wikidata":"https://www.wikidata.org/wiki/Q7748","display_name":"Law","level":1,"score":0.0},{"id":"https://openalex.org/C17744445","wikidata":"https://www.wikidata.org/wiki/Q36442","display_name":"Political science","level":0,"score":0.0},{"id":"https://openalex.org/C548081761","wikidata":"https://www.wikidata.org/wiki/Q180388","display_name":"Waste management","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/iecon.2018.8591237","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iecon.2018.8591237","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IECON 2018 - 44th Annual Conference of the IEEE Industrial Electronics Society","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":7,"referenced_works":["https://openalex.org/W1678537530","https://openalex.org/W2070667037","https://openalex.org/W2135592671","https://openalex.org/W2594256673","https://openalex.org/W4247967326","https://openalex.org/W4250601676","https://openalex.org/W6637449722"],"related_works":["https://openalex.org/W2110930589","https://openalex.org/W141357499","https://openalex.org/W155968509","https://openalex.org/W2186645216","https://openalex.org/W197658719","https://openalex.org/W2354504666","https://openalex.org/W2022075295","https://openalex.org/W3016073996","https://openalex.org/W1603066983","https://openalex.org/W2073628368"],"abstract_inverted_index":{"Electrical":[0],"testing":[1,24,66,75,129],"laboratory":[2,25],"is":[3,42],"full":[4],"of":[5,32,46,58,117],"hidden":[6],"hazards.":[7,112],"Although":[8],"there":[9],"are":[10],"various":[11,62,90],"safety":[12,48],"policies":[13,49],"required":[14,43],"by":[15],"legislation":[16],"or":[17],"international":[18],"standards,":[19],"the":[20,30,47,55,74,81,109,118,126],"accidents":[21],"in":[22,61,73,125],"electrical":[23,63,128],"happened":[26],"frequently.":[27],"To":[28],"eliminate":[29],"probability":[31],"these":[33],"hazards":[34],"and":[35,39,50,64,76,92,102,115],"accidents,":[36],"an":[37],"automatic":[38,101],"comprehensive":[40],"system":[41,106],"on":[44,80],"top":[45],"guidance.":[51],"In":[52],"this":[53],"paper,":[54],"current":[56],"status":[57],"hazardous":[59],"areas":[60],"electronic":[65],"laboratories":[67],"was":[68,95],"analyzed":[69],"via":[70],"a":[71,84,99],"survey":[72],"certification":[77],"industry.":[78],"Based":[79],"analytical":[82],"results,":[83],"wireless":[85,93,104,120],"sensor":[86,105,121],"network":[87,122],"combined":[88],"with":[89],"detectors":[91],"technology":[94],"built":[96],"to":[97,108],"construct":[98],"targeted,":[100],"convenience":[103],"according":[107],"known":[110],"potential":[111],"The":[113],"effectiveness":[114],"efficiency":[116],"proposed":[119],"were":[123],"evaluated":[124],"real":[127],"laboratory.":[130]},"counts_by_year":[{"year":2021,"cited_by_count":1},{"year":2019,"cited_by_count":2}],"updated_date":"2026-07-29T14:22:42.915294","created_date":"2025-10-10T00:00:00"}