{"id":"https://openalex.org/W2908218695","doi":"https://doi.org/10.1109/iecon.2018.8591095","title":"Machine Condition Prediction Based on Long Short Term Memory and Particle Filtering","display_name":"Machine Condition Prediction Based on Long Short Term Memory and Particle Filtering","publication_year":2018,"publication_date":"2018-10-01","ids":{"openalex":"https://openalex.org/W2908218695","doi":"https://doi.org/10.1109/iecon.2018.8591095","mag":"2908218695"},"language":"en","primary_location":{"id":"doi:10.1109/iecon.2018.8591095","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iecon.2018.8591095","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IECON 2018 - 44th Annual Conference of the IEEE Industrial Electronics Society","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5077784565","display_name":"Guangxing Niu","orcid":"https://orcid.org/0000-0002-1589-7055"},"institutions":[{"id":"https://openalex.org/I155781252","display_name":"University of South Carolina","ror":"https://ror.org/02b6qw903","country_code":"US","type":"education","lineage":["https://openalex.org/I155781252"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"Guangxing Niu","raw_affiliation_strings":["Department of electrical engineering, University of South Carolina, Columbia, USA"],"affiliations":[{"raw_affiliation_string":"Department of electrical engineering, University of South Carolina, Columbia, USA","institution_ids":["https://openalex.org/I155781252"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101890868","display_name":"Shijie Tang","orcid":"https://orcid.org/0000-0002-3954-9944"},"institutions":[{"id":"https://openalex.org/I155781252","display_name":"University of South Carolina","ror":"https://ror.org/02b6qw903","country_code":"US","type":"education","lineage":["https://openalex.org/I155781252"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Shijie Tang","raw_affiliation_strings":["Department of electrical engineering, University of South Carolina, Columbia, USA"],"affiliations":[{"raw_affiliation_string":"Department of electrical engineering, University of South Carolina, Columbia, USA","institution_ids":["https://openalex.org/I155781252"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5100392843","display_name":"Bin Zhang","orcid":"https://orcid.org/0000-0002-4879-0211"},"institutions":[{"id":"https://openalex.org/I155781252","display_name":"University of South Carolina","ror":"https://ror.org/02b6qw903","country_code":"US","type":"education","lineage":["https://openalex.org/I155781252"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Bin Zhang","raw_affiliation_strings":["Department of electrical engineering, University of South Carolina, Columbia, USA"],"affiliations":[{"raw_affiliation_string":"Department of electrical engineering, University of South Carolina, Columbia, USA","institution_ids":["https://openalex.org/I155781252"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5077784565"],"corresponding_institution_ids":["https://openalex.org/I155781252"],"apc_list":null,"apc_paid":null,"fwci":0.7357,"has_fulltext":false,"cited_by_count":4,"citation_normalized_percentile":{"value":0.73792236,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":95},"biblio":{"volume":null,"issue":null,"first_page":"5942","last_page":"5947"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10220","display_name":"Machine Fault Diagnosis Techniques","score":0.9954000115394592,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10220","display_name":"Machine Fault Diagnosis Techniques","score":0.9954000115394592,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10876","display_name":"Fault Detection and Control Systems","score":0.9853000044822693,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9786999821662903,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/term","display_name":"Term (time)","score":0.7815553545951843},{"id":"https://openalex.org/keywords/particle-filter","display_name":"Particle filter","score":0.6687678694725037},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6259486675262451},{"id":"https://openalex.org/keywords/long-short-term-memory","display_name":"Long short term memory","score":0.4836055338382721},{"id":"https://openalex.org/keywords/particle","display_name":"Particle (ecology)","score":0.41058364510536194},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.3614569902420044},{"id":"https://openalex.org/keywords/kalman-filter","display_name":"Kalman filter","score":0.171542227268219},{"id":"https://openalex.org/keywords/artificial-neural-network","display_name":"Artificial neural network","score":0.11846882104873657},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.10564437508583069},{"id":"https://openalex.org/keywords/geology","display_name":"Geology","score":0.07753756642341614},{"id":"https://openalex.org/keywords/recurrent-neural-network","display_name":"Recurrent neural network","score":0.06112325191497803}],"concepts":[{"id":"https://openalex.org/C61797465","wikidata":"https://www.wikidata.org/wiki/Q1188986","display_name":"Term (time)","level":2,"score":0.7815553545951843},{"id":"https://openalex.org/C52421305","wikidata":"https://www.wikidata.org/wiki/Q1151499","display_name":"Particle filter","level":3,"score":0.6687678694725037},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6259486675262451},{"id":"https://openalex.org/C133488467","wikidata":"https://www.wikidata.org/wiki/Q6673524","display_name":"Long short term memory","level":4,"score":0.4836055338382721},{"id":"https://openalex.org/C2778517922","wikidata":"https://www.wikidata.org/wiki/Q7140482","display_name":"Particle (ecology)","level":2,"score":0.41058364510536194},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.3614569902420044},{"id":"https://openalex.org/C157286648","wikidata":"https://www.wikidata.org/wiki/Q846780","display_name":"Kalman filter","level":2,"score":0.171542227268219},{"id":"https://openalex.org/C50644808","wikidata":"https://www.wikidata.org/wiki/Q192776","display_name":"Artificial neural network","level":2,"score":0.11846882104873657},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.10564437508583069},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.07753756642341614},{"id":"https://openalex.org/C147168706","wikidata":"https://www.wikidata.org/wiki/Q1457734","display_name":"Recurrent neural network","level":3,"score":0.06112325191497803},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C111368507","wikidata":"https://www.wikidata.org/wiki/Q43518","display_name":"Oceanography","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/iecon.2018.8591095","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iecon.2018.8591095","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IECON 2018 - 44th Annual Conference of the IEEE Industrial Electronics Society","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Industry, innovation and infrastructure","id":"https://metadata.un.org/sdg/9","score":0.5400000214576721}],"awards":[],"funders":[{"id":"https://openalex.org/F4320310846","display_name":"University of South Carolina","ror":"https://ror.org/02b6qw903"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":31,"referenced_works":["https://openalex.org/W1540327028","https://openalex.org/W1561171833","https://openalex.org/W1802825888","https://openalex.org/W1822975400","https://openalex.org/W1833774285","https://openalex.org/W1978654022","https://openalex.org/W1982275278","https://openalex.org/W2004353783","https://openalex.org/W2014685668","https://openalex.org/W2033800551","https://openalex.org/W2037325790","https://openalex.org/W2045186954","https://openalex.org/W2064675550","https://openalex.org/W2090487421","https://openalex.org/W2098729161","https://openalex.org/W2106290330","https://openalex.org/W2125038043","https://openalex.org/W2126450366","https://openalex.org/W2134788745","https://openalex.org/W2136774956","https://openalex.org/W2141173017","https://openalex.org/W2153378539","https://openalex.org/W2489292218","https://openalex.org/W2513477101","https://openalex.org/W2564947831","https://openalex.org/W2573601984","https://openalex.org/W2610930014","https://openalex.org/W2963078493","https://openalex.org/W2964084166","https://openalex.org/W6654422401","https://openalex.org/W6678662110"],"related_works":["https://openalex.org/W2015530857","https://openalex.org/W2556064263","https://openalex.org/W1991846142","https://openalex.org/W1583020711","https://openalex.org/W42295635","https://openalex.org/W1589286931","https://openalex.org/W1973996291","https://openalex.org/W1521151968","https://openalex.org/W2347749309","https://openalex.org/W2384389541"],"abstract_inverted_index":{"Machine":[0],"condition":[1,56,79,96,168],"prediction":[2,57],"plays":[3],"an":[4],"important":[5,53],"role":[6],"in":[7,55,63,114],"industries.":[8],"In":[9,92],"condition-based":[10],"maintenance,":[11],"measurements":[12],"are":[13,98,148],"used":[14,31,99],"to":[15,32,59,100,120,134,150],"detect,":[16],"identify,":[17],"and":[18,22,38,46,68,88],"predict":[19,122,166],"the":[20,35,41,115,123,126,136,152,155,162],"onset":[21],"evolution":[23,124],"of":[24,43,117,125,143,154],"potential":[25],"faults.":[26],"The":[27,158],"information":[28],"is":[29,107,132],"then":[30,108],"optimally":[33],"schedule":[34],"maintenance":[36],"activities":[37],"logistics.":[39],"With":[40],"development":[42],"machine":[44,77,95,127,167],"learning":[45,50],"big":[47],"data,":[48],"deep":[49],"algorithms":[51],"become":[52],"tools":[54],"due":[58],"their":[60],"excellent":[61],"capabilities":[62],"data":[64,97],"processing,":[65],"feature":[66],"extraction,":[67],"modeling.":[69],"This":[70],"paper":[71],"presents":[72],"a":[73,102,111,144],"novel":[74],"approach":[75,119,164],"for":[76],"health":[78],"prognosis":[80],"based":[81],"on":[82],"Long":[83],"Short":[84],"Term":[85],"Memory":[86],"(LSTM)":[87],"Particle":[89,130],"Filtering":[90],"(PF).":[91],"this":[93],"work,":[94],"train":[101],"LSTM":[103],"model":[104,113],"offline,":[105],"which":[106],"employed":[109],"as":[110],"prognostic":[112],"framework":[116],"Bayesian":[118],"online":[121],"fault":[128],"state.":[129],"filtering":[131],"utilized":[133],"calculate":[135],"posterior":[137],"probability":[138],"density":[139],"function.":[140],"Case":[141],"studies":[142],"cracked":[145],"carrier":[146],"plate":[147],"presented":[149],"verify":[151],"effectiveness":[153],"proposed":[156,163],"approach.":[157],"results":[159],"demonstrate":[160],"that":[161],"can":[165],"more":[169],"accurately.":[170]},"counts_by_year":[{"year":2021,"cited_by_count":2},{"year":2020,"cited_by_count":1},{"year":2019,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}