{"id":"https://openalex.org/W2771307509","doi":"https://doi.org/10.1109/iecon.2017.8217198","title":"A soft measurement of small out-line transistor in surface mount technology","display_name":"A soft measurement of small out-line transistor in surface mount technology","publication_year":2017,"publication_date":"2017-10-01","ids":{"openalex":"https://openalex.org/W2771307509","doi":"https://doi.org/10.1109/iecon.2017.8217198","mag":"2771307509"},"language":"en","primary_location":{"id":"doi:10.1109/iecon.2017.8217198","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iecon.2017.8217198","pdf_url":null,"source":{"id":"https://openalex.org/S4363608531","display_name":"IECON 2017 - 43rd Annual Conference of the IEEE Industrial Electronics Society","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IECON 2017 - 43rd Annual Conference of the IEEE Industrial Electronics Society","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5086775306","display_name":"Chao Xu","orcid":"https://orcid.org/0000-0002-5099-0060"},"institutions":[{"id":"https://openalex.org/I204983213","display_name":"Harbin Institute of Technology","ror":"https://ror.org/01yqg2h08","country_code":"CN","type":"education","lineage":["https://openalex.org/I204983213"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Chao Xu","raw_affiliation_strings":["Research Institute of Intelligent, Control and System Harbin Institute of Technology Harbin, Heilongjiang, China"],"affiliations":[{"raw_affiliation_string":"Research Institute of Intelligent, Control and System Harbin Institute of Technology Harbin, Heilongjiang, China","institution_ids":["https://openalex.org/I204983213"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101183846","display_name":"Lifei Bai","orcid":null},"institutions":[{"id":"https://openalex.org/I204983213","display_name":"Harbin Institute of Technology","ror":"https://ror.org/01yqg2h08","country_code":"CN","type":"education","lineage":["https://openalex.org/I204983213"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Lifei Bai","raw_affiliation_strings":["Research Institute of Intelligent, Control and System Harbin Institute of Technology Harbin, Heilongjiang, China"],"affiliations":[{"raw_affiliation_string":"Research Institute of Intelligent, Control and System Harbin Institute of Technology Harbin, Heilongjiang, China","institution_ids":["https://openalex.org/I204983213"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100361525","display_name":"Zhihao Zhang","orcid":"https://orcid.org/0000-0001-7814-6913"},"institutions":[{"id":"https://openalex.org/I204983213","display_name":"Harbin Institute of Technology","ror":"https://ror.org/01yqg2h08","country_code":"CN","type":"education","lineage":["https://openalex.org/I204983213"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Zhihao Zhang","raw_affiliation_strings":["Research Institute of Intelligent, Control and System Harbin Institute of Technology Harbin, Heilongjiang, China"],"affiliations":[{"raw_affiliation_string":"Research Institute of Intelligent, Control and System Harbin Institute of Technology Harbin, Heilongjiang, China","institution_ids":["https://openalex.org/I204983213"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5024687098","display_name":"Boxuan Han","orcid":null},"institutions":[{"id":"https://openalex.org/I204983213","display_name":"Harbin Institute of Technology","ror":"https://ror.org/01yqg2h08","country_code":"CN","type":"education","lineage":["https://openalex.org/I204983213"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Boxuan Han","raw_affiliation_strings":["Research Institute of Intelligent, Control and System Harbin Institute of Technology Harbin, Heilongjiang, China"],"affiliations":[{"raw_affiliation_string":"Research Institute of Intelligent, Control and System Harbin Institute of Technology Harbin, Heilongjiang, China","institution_ids":["https://openalex.org/I204983213"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5086775306"],"corresponding_institution_ids":["https://openalex.org/I204983213"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.19386637,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"6855","last_page":"6858"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12111","display_name":"Industrial Vision Systems and Defect Detection","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/2209","display_name":"Industrial and Manufacturing Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12549","display_name":"Image and Object Detection Techniques","score":0.9994000196456909,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13114","display_name":"Image Processing Techniques and Applications","score":0.9990000128746033,"subfield":{"id":"https://openalex.org/subfields/2214","display_name":"Media Technology"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/hough-transform","display_name":"Hough transform","score":0.7567722797393799},{"id":"https://openalex.org/keywords/computer-vision","display_name":"Computer vision","score":0.720908522605896},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.6937398910522461},{"id":"https://openalex.org/keywords/surface-mount-technology","display_name":"Surface-mount technology","score":0.6617105007171631},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6118447780609131},{"id":"https://openalex.org/keywords/mount","display_name":"Mount","score":0.6052233576774597},{"id":"https://openalex.org/keywords/chip","display_name":"Chip","score":0.5069432258605957},{"id":"https://openalex.org/keywords/machine-vision","display_name":"Machine vision","score":0.4983983039855957},{"id":"https://openalex.org/keywords/orientation","display_name":"Orientation (vector space)","score":0.48873353004455566},{"id":"https://openalex.org/keywords/line","display_name":"Line (geometry)","score":0.48698362708091736},{"id":"https://openalex.org/keywords/position","display_name":"Position (finance)","score":0.4345988631248474},{"id":"https://openalex.org/keywords/image","display_name":"Image (mathematics)","score":0.3276911973953247},{"id":"https://openalex.org/keywords/printed-circuit-board","display_name":"Printed circuit board","score":0.22509491443634033},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.1472017765045166},{"id":"https://openalex.org/keywords/telecommunications","display_name":"Telecommunications","score":0.08828660845756531},{"id":"https://openalex.org/keywords/geometry","display_name":"Geometry","score":0.073601633310318}],"concepts":[{"id":"https://openalex.org/C200518788","wikidata":"https://www.wikidata.org/wiki/Q195076","display_name":"Hough transform","level":3,"score":0.7567722797393799},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.720908522605896},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.6937398910522461},{"id":"https://openalex.org/C2776584680","wikidata":"https://www.wikidata.org/wiki/Q191042","display_name":"Surface-mount technology","level":3,"score":0.6617105007171631},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6118447780609131},{"id":"https://openalex.org/C2778091609","wikidata":"https://www.wikidata.org/wiki/Q14713","display_name":"Mount","level":2,"score":0.6052233576774597},{"id":"https://openalex.org/C165005293","wikidata":"https://www.wikidata.org/wiki/Q1074500","display_name":"Chip","level":2,"score":0.5069432258605957},{"id":"https://openalex.org/C5339829","wikidata":"https://www.wikidata.org/wiki/Q1425977","display_name":"Machine vision","level":2,"score":0.4983983039855957},{"id":"https://openalex.org/C16345878","wikidata":"https://www.wikidata.org/wiki/Q107472979","display_name":"Orientation (vector space)","level":2,"score":0.48873353004455566},{"id":"https://openalex.org/C198352243","wikidata":"https://www.wikidata.org/wiki/Q37105","display_name":"Line (geometry)","level":2,"score":0.48698362708091736},{"id":"https://openalex.org/C198082294","wikidata":"https://www.wikidata.org/wiki/Q3399648","display_name":"Position (finance)","level":2,"score":0.4345988631248474},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.3276911973953247},{"id":"https://openalex.org/C120793396","wikidata":"https://www.wikidata.org/wiki/Q173350","display_name":"Printed circuit board","level":2,"score":0.22509491443634033},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.1472017765045166},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.08828660845756531},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.073601633310318},{"id":"https://openalex.org/C162324750","wikidata":"https://www.wikidata.org/wiki/Q8134","display_name":"Economics","level":0,"score":0.0},{"id":"https://openalex.org/C10138342","wikidata":"https://www.wikidata.org/wiki/Q43015","display_name":"Finance","level":1,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/iecon.2017.8217198","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iecon.2017.8217198","pdf_url":null,"source":{"id":"https://openalex.org/S4363608531","display_name":"IECON 2017 - 43rd Annual Conference of the IEEE Industrial Electronics Society","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IECON 2017 - 43rd Annual Conference of the IEEE Industrial Electronics Society","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Industry, innovation and infrastructure","id":"https://metadata.un.org/sdg/9","score":0.5}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":17,"referenced_works":["https://openalex.org/W1543080867","https://openalex.org/W1661932126","https://openalex.org/W1974597681","https://openalex.org/W1988508829","https://openalex.org/W2037781808","https://openalex.org/W2099947656","https://openalex.org/W2104241941","https://openalex.org/W2109888465","https://openalex.org/W2122170889","https://openalex.org/W2133059825","https://openalex.org/W2144722600","https://openalex.org/W2161160262","https://openalex.org/W2290894673","https://openalex.org/W2567678992","https://openalex.org/W6632670870","https://openalex.org/W6678211821","https://openalex.org/W6696767700"],"related_works":["https://openalex.org/W4390763661","https://openalex.org/W2391780702","https://openalex.org/W2356532375","https://openalex.org/W2348949422","https://openalex.org/W1535746573","https://openalex.org/W2052588958","https://openalex.org/W2405754725","https://openalex.org/W2745017041","https://openalex.org/W2113425440","https://openalex.org/W4296160109"],"abstract_inverted_index":{"The":[0],"role":[1],"of":[2,66,72,102,115,132,138],"machine":[3],"vision":[4],"detection":[5],"technology":[6,15],"as":[7,126],"the":[8,12,60,64,70,85,91,100,103,112,116,120,130,146],"core":[9],"component":[10],"in":[11,29,63,140],"surface":[13,147],"mount":[14,137,148],"devices":[16],"(SMDs)":[17],"cannot":[18],"be":[19,124],"denied.":[20],"Single":[21],"in-line":[22,49],"package":[23,50],"chip":[24],"is":[25,57,76,82,96],"an":[26,42],"important":[27],"type":[28],"IC":[30],"chips":[31,51,104],"and":[32,53,69,109],"its":[33],"leads":[34,105,117],"forms":[35],"varies":[36],"a":[37,136],"lot.":[38],"This":[39],"paper":[40],"proposes":[41],"efficient":[43],"method":[44],"to":[45,89,98,110],"soft":[46],"measure":[47],"single":[48],"position":[52],"orientation.":[54],"Chip":[55],"image":[56,75,80,88],"taken":[58,144],"by":[59,135],"industrial":[61],"camera":[62],"form":[65],"gray":[67],"level":[68],"region":[71],"interest":[73],"(ROI)":[74],"selected.":[77],"In":[78],"contour":[79],"which":[81],"extracted":[83],"from":[84,145],"binary":[86],"ROI":[87],"get":[90],"precision":[92],"position,":[93],"Hough":[94],"transform":[95],"used":[97],"locate":[99],"ranges":[101],"on":[106],"both":[107],"sides":[108],"calculate":[111],"accurate":[113],"positions":[114],"corners.":[118],"Then":[119],"other":[121],"parameters":[122],"can":[123],"calculated":[125],"well.":[127],"We":[128],"test":[129],"performance":[131],"our":[133],"approach":[134],"images":[139],"different":[141],"light":[142],"conditions":[143],"system.":[149]},"counts_by_year":[],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}