{"id":"https://openalex.org/W2772353193","doi":"https://doi.org/10.1109/iecon.2017.8217088","title":"Curved surface fitting method using a raster-scanning window and its application to stereolithography-based reverse engineering","display_name":"Curved surface fitting method using a raster-scanning window and its application to stereolithography-based reverse engineering","publication_year":2017,"publication_date":"2017-10-01","ids":{"openalex":"https://openalex.org/W2772353193","doi":"https://doi.org/10.1109/iecon.2017.8217088","mag":"2772353193"},"language":"en","primary_location":{"id":"doi:10.1109/iecon.2017.8217088","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iecon.2017.8217088","pdf_url":null,"source":{"id":"https://openalex.org/S4363608531","display_name":"IECON 2017 - 43rd Annual Conference of the IEEE Industrial Electronics Society","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IECON 2017 - 43rd Annual Conference of the IEEE Industrial Electronics Society","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5044265286","display_name":"Fusaomi Nagata","orcid":"https://orcid.org/0000-0001-7738-0548"},"institutions":[{"id":"https://openalex.org/I75522678","display_name":"Sanyo-Onoda City University","ror":"https://ror.org/01xfcjr43","country_code":"JP","type":"education","lineage":["https://openalex.org/I75522678"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Fusaomi Nagata","raw_affiliation_strings":["Department of Mechanical Engineering, Tokyo University of Science, Yamaguchi, Sanyo-Onoda, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Mechanical Engineering, Tokyo University of Science, Yamaguchi, Sanyo-Onoda, Japan","institution_ids":["https://openalex.org/I75522678"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5081728187","display_name":"Norifumi Horie","orcid":null},"institutions":[{"id":"https://openalex.org/I75522678","display_name":"Sanyo-Onoda City University","ror":"https://ror.org/01xfcjr43","country_code":"JP","type":"education","lineage":["https://openalex.org/I75522678"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Norifumi Horie","raw_affiliation_strings":["Department of Mechanical Engineering, Tokyo University of Science, Yamaguchi, Sanyo-Onoda, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Mechanical Engineering, Tokyo University of Science, Yamaguchi, Sanyo-Onoda, Japan","institution_ids":["https://openalex.org/I75522678"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5089877493","display_name":"Hiroaki Ochi","orcid":null},"institutions":[{"id":"https://openalex.org/I75522678","display_name":"Sanyo-Onoda City University","ror":"https://ror.org/01xfcjr43","country_code":"JP","type":"education","lineage":["https://openalex.org/I75522678"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Hiroaki Ochi","raw_affiliation_strings":["Department of Mechanical Engineering, Tokyo University of Science, Yamaguchi, Sanyo-Onoda, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Mechanical Engineering, Tokyo University of Science, Yamaguchi, Sanyo-Onoda, Japan","institution_ids":["https://openalex.org/I75522678"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5111518950","display_name":"Keigo Watanabe","orcid":null},"institutions":[{"id":"https://openalex.org/I75522678","display_name":"Sanyo-Onoda City University","ror":"https://ror.org/01xfcjr43","country_code":"JP","type":"education","lineage":["https://openalex.org/I75522678"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Keigo Watanabe","raw_affiliation_strings":["Department of Mechanical Engineering, Tokyo University of Science, Yamaguchi, Sanyo-Onoda, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Mechanical Engineering, Tokyo University of Science, Yamaguchi, Sanyo-Onoda, Japan","institution_ids":["https://openalex.org/I75522678"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5033966208","display_name":"Maki K. Habib","orcid":"https://orcid.org/0000-0001-8088-8043"},"institutions":[{"id":"https://openalex.org/I75522678","display_name":"Sanyo-Onoda City University","ror":"https://ror.org/01xfcjr43","country_code":"JP","type":"education","lineage":["https://openalex.org/I75522678"]}],"countries":["JP"],"is_corresponding":false,"raw_author_name":"Maki K. Habib","raw_affiliation_strings":["Department of Mechanical Engineering, Tokyo University of Science, Yamaguchi, Sanyo-Onoda, Japan"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Mechanical Engineering, Tokyo University of Science, Yamaguchi, Sanyo-Onoda, Japan","institution_ids":["https://openalex.org/I75522678"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I75522678"],"apc_list":null,"apc_paid":null,"fwci":null,"has_fulltext":false,"cited_by_count":2,"citation_normalized_percentile":null,"cited_by_percentile_year":null,"biblio":{"volume":null,"issue":null,"first_page":"6258","last_page":"6263"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10719","display_name":"3D Shape Modeling and Analysis","score":0.9993000030517578,"subfield":{"id":"https://openalex.org/subfields/2206","display_name":"Computational Mechanics"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10719","display_name":"3D Shape Modeling and Analysis","score":0.9993000030517578,"subfield":{"id":"https://openalex.org/subfields/2206","display_name":"Computational Mechanics"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14339","display_name":"Image Processing and 3D Reconstruction","score":0.9990000128746033,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10638","display_name":"Optical measurement and interference techniques","score":0.9983999729156494,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/reverse-engineering","display_name":"Reverse engineering","score":0.8248847126960754},{"id":"https://openalex.org/keywords/stereolithography","display_name":"Stereolithography","score":0.8242695927619934},{"id":"https://openalex.org/keywords/point-cloud","display_name":"Point cloud","score":0.7618074417114258},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6252387762069702},{"id":"https://openalex.org/keywords/raster-graphics","display_name":"Raster graphics","score":0.6187642216682434},{"id":"https://openalex.org/keywords/noise","display_name":"Noise (video)","score":0.5552762746810913},{"id":"https://openalex.org/keywords/process","display_name":"Process (computing)","score":0.4628234803676605},{"id":"https://openalex.org/keywords/raster-data","display_name":"Raster data","score":0.46277889609336853},{"id":"https://openalex.org/keywords/machining","display_name":"Machining","score":0.45597657561302185},{"id":"https://openalex.org/keywords/triangle-mesh","display_name":"Triangle mesh","score":0.4552002549171448},{"id":"https://openalex.org/keywords/surface","display_name":"Surface (topology)","score":0.43795472383499146},{"id":"https://openalex.org/keywords/representation","display_name":"Representation (politics)","score":0.43595266342163086},{"id":"https://openalex.org/keywords/window","display_name":"Window (computing)","score":0.43545228242874146},{"id":"https://openalex.org/keywords/raster-scan","display_name":"Raster scan","score":0.4313521385192871},{"id":"https://openalex.org/keywords/point","display_name":"Point (geometry)","score":0.42319101095199585},{"id":"https://openalex.org/keywords/computer-graphics","display_name":"Computer graphics (images)","score":0.4221547245979309},{"id":"https://openalex.org/keywords/object","display_name":"Object (grammar)","score":0.41990578174591064},{"id":"https://openalex.org/keywords/computer-vision","display_name":"Computer vision","score":0.3628602921962738},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.35904958844184875},{"id":"https://openalex.org/keywords/geometry","display_name":"Geometry","score":0.19611996412277222},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.14807090163230896},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.1210043728351593},{"id":"https://openalex.org/keywords/polygon-mesh","display_name":"Polygon mesh","score":0.10854572057723999},{"id":"https://openalex.org/keywords/mechanical-engineering","display_name":"Mechanical engineering","score":0.10852468013763428}],"concepts":[{"id":"https://openalex.org/C207850805","wikidata":"https://www.wikidata.org/wiki/Q269608","display_name":"Reverse engineering","level":2,"score":0.8248847126960754},{"id":"https://openalex.org/C2779154291","wikidata":"https://www.wikidata.org/wiki/Q1022471","display_name":"Stereolithography","level":2,"score":0.8242695927619934},{"id":"https://openalex.org/C131979681","wikidata":"https://www.wikidata.org/wiki/Q1899648","display_name":"Point cloud","level":2,"score":0.7618074417114258},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6252387762069702},{"id":"https://openalex.org/C181844469","wikidata":"https://www.wikidata.org/wiki/Q182270","display_name":"Raster graphics","level":2,"score":0.6187642216682434},{"id":"https://openalex.org/C99498987","wikidata":"https://www.wikidata.org/wiki/Q2210247","display_name":"Noise (video)","level":3,"score":0.5552762746810913},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.4628234803676605},{"id":"https://openalex.org/C2692088","wikidata":"https://www.wikidata.org/wiki/Q182270","display_name":"Raster data","level":3,"score":0.46277889609336853},{"id":"https://openalex.org/C523214423","wikidata":"https://www.wikidata.org/wiki/Q192047","display_name":"Machining","level":2,"score":0.45597657561302185},{"id":"https://openalex.org/C194401833","wikidata":"https://www.wikidata.org/wiki/Q3456889","display_name":"Triangle mesh","level":3,"score":0.4552002549171448},{"id":"https://openalex.org/C2776799497","wikidata":"https://www.wikidata.org/wiki/Q484298","display_name":"Surface (topology)","level":2,"score":0.43795472383499146},{"id":"https://openalex.org/C2776359362","wikidata":"https://www.wikidata.org/wiki/Q2145286","display_name":"Representation (politics)","level":3,"score":0.43595266342163086},{"id":"https://openalex.org/C2778751112","wikidata":"https://www.wikidata.org/wiki/Q835016","display_name":"Window (computing)","level":2,"score":0.43545228242874146},{"id":"https://openalex.org/C145406643","wikidata":"https://www.wikidata.org/wiki/Q2641959","display_name":"Raster scan","level":2,"score":0.4313521385192871},{"id":"https://openalex.org/C28719098","wikidata":"https://www.wikidata.org/wiki/Q44946","display_name":"Point (geometry)","level":2,"score":0.42319101095199585},{"id":"https://openalex.org/C121684516","wikidata":"https://www.wikidata.org/wiki/Q7600677","display_name":"Computer graphics (images)","level":1,"score":0.4221547245979309},{"id":"https://openalex.org/C2781238097","wikidata":"https://www.wikidata.org/wiki/Q175026","display_name":"Object (grammar)","level":2,"score":0.41990578174591064},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.3628602921962738},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.35904958844184875},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.19611996412277222},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.14807090163230896},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.1210043728351593},{"id":"https://openalex.org/C31487907","wikidata":"https://www.wikidata.org/wiki/Q1154597","display_name":"Polygon mesh","level":2,"score":0.10854572057723999},{"id":"https://openalex.org/C78519656","wikidata":"https://www.wikidata.org/wiki/Q101333","display_name":"Mechanical engineering","level":1,"score":0.10852468013763428},{"id":"https://openalex.org/C199539241","wikidata":"https://www.wikidata.org/wiki/Q7748","display_name":"Law","level":1,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0},{"id":"https://openalex.org/C94625758","wikidata":"https://www.wikidata.org/wiki/Q7163","display_name":"Politics","level":2,"score":0.0},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C17744445","wikidata":"https://www.wikidata.org/wiki/Q36442","display_name":"Political science","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/iecon.2017.8217088","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iecon.2017.8217088","pdf_url":null,"source":{"id":"https://openalex.org/S4363608531","display_name":"IECON 2017 - 43rd Annual Conference of the IEEE Industrial Electronics Society","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IECON 2017 - 43rd Annual Conference of the IEEE Industrial Electronics Society","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/11","score":0.550000011920929,"display_name":"Sustainable cities and communities"}],"awards":[],"funders":[{"id":"https://openalex.org/F4320334764","display_name":"Japan Society for the Promotion of Science","ror":"https://ror.org/00hhkn466"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":8,"referenced_works":["https://openalex.org/W1985315721","https://openalex.org/W2016548190","https://openalex.org/W2044397339","https://openalex.org/W2066868982","https://openalex.org/W2084210703","https://openalex.org/W2249013538","https://openalex.org/W2348834323","https://openalex.org/W2521817678"],"related_works":["https://openalex.org/W3086315669","https://openalex.org/W2142721422","https://openalex.org/W1511465068","https://openalex.org/W4220746295","https://openalex.org/W2525140781","https://openalex.org/W4234240483","https://openalex.org/W3213542826","https://openalex.org/W3125868308","https://openalex.org/W2518435831","https://openalex.org/W1964756385"],"abstract_inverted_index":{"In":[0],"this":[1,61],"paper,":[2],"a":[3,9,47,66,70,82],"curved":[4],"surface":[5,72],"fitting":[6],"method":[7,34],"using":[8,86],"raster-scanning":[10],"window":[11],"is":[12,51],"proposed":[13,52,106],"to":[14,37,53,63,113],"smooth":[15,114],"the":[16,25,29,93,105,128,133],"original":[17,26,44,90,134],"organized":[18],"point":[19],"cloud":[20],"data":[21,80,123],"(PCD)":[22],"and":[23,60,102,124],"extract":[24],"features":[27],"in":[28,92,132],"presence":[30,94],"of":[31,69,81,95,104,127],"noise.":[32],"The":[33,74,100],"allows":[35,76],"PCD":[36,91],"be":[38],"smoothed":[39,58],"while":[40],"keeping":[41],"its":[42],"own":[43],"features.":[45],"Then,":[46],"Stereolithography":[48],"(STL)":[49],"generator":[50],"produce":[54],"triangulated":[55],"patches":[56],"from":[57,89],"PCD,":[59,115],"helps":[62],"deal":[64],"with":[65],"triangular":[67],"representation":[68],"3D":[71,78],"geometry.":[73],"process":[75],"reconstructing":[77],"digital":[79],"real":[83],"object":[84,129],"described":[85,131],"STL":[87],"format":[88],"noise":[96],"for":[97],"reverse":[98],"engineering.":[99],"effectiveness":[101],"usefulness":[103],"techniques":[107],"are":[108],"demonstrated":[109],"through":[110],"actual":[111],"experiments":[112],"reconstruct":[116],"STL,":[117],"generate":[118],"cutter":[119],"location":[120],"source":[121],"(CLS)":[122],"perform":[125],"machining":[126],"model":[130],"PCD.":[135]},"counts_by_year":[{"year":2019,"cited_by_count":1},{"year":2018,"cited_by_count":1}],"updated_date":"2026-07-14T23:27:15.235271","created_date":"2025-10-10T00:00:00"}