{"id":"https://openalex.org/W2774729213","doi":"https://doi.org/10.1109/iecon.2017.8216772","title":"Active thermal loading control of the modular multilevel converter by a multi-objective optimization method","display_name":"Active thermal loading control of the modular multilevel converter by a multi-objective optimization method","publication_year":2017,"publication_date":"2017-10-01","ids":{"openalex":"https://openalex.org/W2774729213","doi":"https://doi.org/10.1109/iecon.2017.8216772","mag":"2774729213"},"language":"en","primary_location":{"id":"doi:10.1109/iecon.2017.8216772","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iecon.2017.8216772","pdf_url":null,"source":{"id":"https://openalex.org/S4363608531","display_name":"IECON 2017 - 43rd Annual Conference of the IEEE Industrial Electronics Society","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IECON 2017 - 43rd Annual Conference of the IEEE Industrial Electronics Society","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5029467504","display_name":"Qichen Yang","orcid":"https://orcid.org/0000-0001-7366-7314"},"institutions":[{"id":"https://openalex.org/I130701444","display_name":"Georgia Institute of Technology","ror":"https://ror.org/01zkghx44","country_code":"US","type":"education","lineage":["https://openalex.org/I130701444"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Qichen Yang","raw_affiliation_strings":["School of Electrical and Computer Engineering, Georgia Institute of Technology, Atlanta, Georgia"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Electrical and Computer Engineering, Georgia Institute of Technology, Atlanta, Georgia","institution_ids":["https://openalex.org/I130701444"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5045396089","display_name":"Maryam Saeedifard","orcid":"https://orcid.org/0000-0001-8859-7339"},"institutions":[{"id":"https://openalex.org/I130701444","display_name":"Georgia Institute of Technology","ror":"https://ror.org/01zkghx44","country_code":"US","type":"education","lineage":["https://openalex.org/I130701444"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Maryam Saeedifard","raw_affiliation_strings":["School of Electrical and Computer Engineering, Georgia Institute of Technology, Atlanta, Georgia"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"School of Electrical and Computer Engineering, Georgia Institute of Technology, Atlanta, Georgia","institution_ids":["https://openalex.org/I130701444"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I130701444"],"apc_list":null,"apc_paid":null,"fwci":2.1109,"has_fulltext":false,"cited_by_count":9,"citation_normalized_percentile":{"value":0.86261124,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":91,"max":96},"biblio":{"volume":null,"issue":null,"first_page":"4482","last_page":"4487"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11102","display_name":"HVDC Systems and Fault Protection","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11102","display_name":"HVDC Systems and Fault Protection","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10361","display_name":"Silicon Carbide Semiconductor Technologies","score":0.9384999871253967,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12491","display_name":"Superconductivity in MgB2 and Alloys","score":0.9345999956130981,"subfield":{"id":"https://openalex.org/subfields/3104","display_name":"Condensed Matter Physics"},"field":{"id":"https://openalex.org/fields/31","display_name":"Physics and Astronomy"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/modular-design","display_name":"Modular design","score":0.6740542650222778},{"id":"https://openalex.org/keywords/capacitor","display_name":"Capacitor","score":0.6540653109550476},{"id":"https://openalex.org/keywords/power-semiconductor-device","display_name":"Power semiconductor device","score":0.6097463369369507},{"id":"https://openalex.org/keywords/semiconductor-device","display_name":"Semiconductor device","score":0.5984735488891602},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.5593321323394775},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.5009565353393555},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.4953566789627075},{"id":"https://openalex.org/keywords/control-theory","display_name":"Control theory (sociology)","score":0.48186978697776794},{"id":"https://openalex.org/keywords/semiconductor","display_name":"Semiconductor","score":0.465422123670578},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.4378054440021515},{"id":"https://openalex.org/keywords/topology","display_name":"Topology (electrical circuits)","score":0.415710985660553},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.41085463762283325},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.3748190999031067},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.3300544023513794},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.2209080457687378},{"id":"https://openalex.org/keywords/control","display_name":"Control (management)","score":0.11139649152755737},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.093462735414505}],"concepts":[{"id":"https://openalex.org/C101468663","wikidata":"https://www.wikidata.org/wiki/Q1620158","display_name":"Modular design","level":2,"score":0.6740542650222778},{"id":"https://openalex.org/C52192207","wikidata":"https://www.wikidata.org/wiki/Q5322","display_name":"Capacitor","level":3,"score":0.6540653109550476},{"id":"https://openalex.org/C129014197","wikidata":"https://www.wikidata.org/wiki/Q906544","display_name":"Power semiconductor device","level":3,"score":0.6097463369369507},{"id":"https://openalex.org/C79635011","wikidata":"https://www.wikidata.org/wiki/Q175805","display_name":"Semiconductor device","level":3,"score":0.5984735488891602},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.5593321323394775},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.5009565353393555},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.4953566789627075},{"id":"https://openalex.org/C47446073","wikidata":"https://www.wikidata.org/wiki/Q5165890","display_name":"Control theory (sociology)","level":3,"score":0.48186978697776794},{"id":"https://openalex.org/C108225325","wikidata":"https://www.wikidata.org/wiki/Q11456","display_name":"Semiconductor","level":2,"score":0.465422123670578},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.4378054440021515},{"id":"https://openalex.org/C184720557","wikidata":"https://www.wikidata.org/wiki/Q7825049","display_name":"Topology (electrical circuits)","level":2,"score":0.415710985660553},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.41085463762283325},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.3748190999031067},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.3300544023513794},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.2209080457687378},{"id":"https://openalex.org/C2775924081","wikidata":"https://www.wikidata.org/wiki/Q55608371","display_name":"Control (management)","level":2,"score":0.11139649152755737},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.093462735414505},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C2779227376","wikidata":"https://www.wikidata.org/wiki/Q6505497","display_name":"Layer (electronics)","level":2,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C159985019","wikidata":"https://www.wikidata.org/wiki/Q181790","display_name":"Composite material","level":1,"score":0.0},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/iecon.2017.8216772","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iecon.2017.8216772","pdf_url":null,"source":{"id":"https://openalex.org/S4363608531","display_name":"IECON 2017 - 43rd Annual Conference of the IEEE Industrial Electronics Society","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IECON 2017 - 43rd Annual Conference of the IEEE Industrial Electronics Society","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/7","score":0.5799999833106995,"display_name":"Affordable and clean energy"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":17,"referenced_works":["https://openalex.org/W1580252905","https://openalex.org/W2007826844","https://openalex.org/W2021871997","https://openalex.org/W2027145618","https://openalex.org/W2037239418","https://openalex.org/W2056370486","https://openalex.org/W2057957478","https://openalex.org/W2062852897","https://openalex.org/W2111134324","https://openalex.org/W2139885352","https://openalex.org/W2150763729","https://openalex.org/W2165542296","https://openalex.org/W2182278419","https://openalex.org/W2230698191","https://openalex.org/W2316904322","https://openalex.org/W2547364813","https://openalex.org/W6685827281"],"related_works":["https://openalex.org/W2092751749","https://openalex.org/W2804684724","https://openalex.org/W1561862401","https://openalex.org/W1925242245","https://openalex.org/W2245119942","https://openalex.org/W4240234223","https://openalex.org/W626773769","https://openalex.org/W3140594124","https://openalex.org/W2279113928","https://openalex.org/W4393397591"],"abstract_inverted_index":{"The":[0],"modular":[1],"multilevel":[2],"converter":[3,10],"(MMC)":[4],"has":[5],"become":[6],"the":[7,24,32,37,49,57,65,69,76,92,97,101,105,110,129],"most":[8],"attractive":[9],"topology":[11],"for":[12,48,114],"medium/high-power":[13],"applications.":[14],"However,":[15],"uneven":[16],"power":[17,60,94,98],"loss":[18,61,95,99],"distribution":[19],"and":[20,34,62,85,96,120,126,136],"thermal":[21,44,66,107],"loading":[22,45,67],"among":[23],"semiconductor":[25,59,70,102],"devices":[26,71,103],"of":[27,36,68,100,128],"each":[28,73],"submodule":[29],"(SM)":[30],"compromise":[31],"reliability":[33],"lifetime":[35],"converter.":[38],"In":[39,75],"this":[40],"paper,":[41],"an":[42],"active":[43],"control":[46],"method":[47,131],"MMC":[50],"is":[51,83],"proposed":[52,77,130],"to":[53,87],"simultaneously":[54],"(i)":[55],"minimize":[56],"total":[58,93],"(ii)":[63],"balance":[64],"within":[72],"submodule.":[74],"method,":[78],"a":[79,89],"multi-objective":[80],"optimization":[81],"problem":[82],"formulated":[84],"solved":[86],"establish":[88],"trade-off":[90],"between":[91],"with":[104],"highest":[106],"loading.":[108],"Subsequently,":[109],"Pareto":[111],"optimal":[112],"solutions":[113],"circulating":[115],"currents,":[116],"output":[117],"common-mode":[118],"voltage,":[119],"capacitor":[121],"voltages":[122],"are":[123,132],"explored.":[124],"Performance":[125],"effectiveness":[127],"verified":[133],"by":[134],"simulation":[135],"experimental":[137],"studies.":[138]},"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2022,"cited_by_count":2},{"year":2021,"cited_by_count":2},{"year":2019,"cited_by_count":2},{"year":2018,"cited_by_count":2}],"updated_date":"2026-06-26T08:34:08.712188","created_date":"2025-10-10T00:00:00"}