{"id":"https://openalex.org/W2772420943","doi":"https://doi.org/10.1109/iecon.2017.8216651","title":"Detection of rotor faults via transient analysis of the external magnetic field","display_name":"Detection of rotor faults via transient analysis of the external magnetic field","publication_year":2017,"publication_date":"2017-10-01","ids":{"openalex":"https://openalex.org/W2772420943","doi":"https://doi.org/10.1109/iecon.2017.8216651","mag":"2772420943"},"language":"en","primary_location":{"id":"doi:10.1109/iecon.2017.8216651","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iecon.2017.8216651","pdf_url":null,"source":{"id":"https://openalex.org/S4363608531","display_name":"IECON 2017 - 43rd Annual Conference of the IEEE Industrial Electronics Society","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IECON 2017 - 43rd Annual Conference of the IEEE Industrial Electronics Society","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5066633137","display_name":"Jose A. Antonino\u2010Daviu","orcid":"https://orcid.org/0000-0003-1898-2228"},"institutions":[{"id":"https://openalex.org/I4210135181","display_name":"Instituto Tecnol\u00f3gico de la Energ\u00eda","ror":"https://ror.org/04qd57q23","country_code":"ES","type":"facility","lineage":["https://openalex.org/I4210135181"]}],"countries":["ES"],"is_corresponding":false,"raw_author_name":"Jose Antonino-Daviu","raw_affiliation_strings":["Universitat Polit&#x00E8;cnica de Val&#x00E8;ncia, Instituto Tecnol&#x00F3;gico de la, Energ&#x00ED;a, Camino de Vera s/n, 46022 Valencia, Spain","Departamento de Ingenieria Electrica, Instituto de Ingenier\u00eda Energetica"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Universitat Polit&#x00E8;cnica de Val&#x00E8;ncia, Instituto Tecnol&#x00F3;gico de la, Energ&#x00ED;a, Camino de Vera s/n, 46022 Valencia, Spain","institution_ids":["https://openalex.org/I4210135181"]},{"raw_affiliation_string":"Departamento de Ingenieria Electrica, Instituto de Ingenier\u00eda Energetica","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5087840767","display_name":"Hubert Razik","orcid":"https://orcid.org/0000-0003-0192-4259"},"institutions":[{"id":"https://openalex.org/I100532134","display_name":"Lyon 1 Universit\u00e9","ror":"https://ror.org/029brtt94","country_code":"FR","type":"education","lineage":["https://openalex.org/I100532134","https://openalex.org/I203339264"]},{"id":"https://openalex.org/I1294671590","display_name":"Centre National de la Recherche Scientifique","ror":"https://ror.org/02feahw73","country_code":"FR","type":"government","lineage":["https://openalex.org/I1294671590"]},{"id":"https://openalex.org/I4210145913","display_name":"Laboratoire Amp\u00e8re","ror":"https://ror.org/04xbczw40","country_code":"FR","type":"facility","lineage":["https://openalex.org/I100532134","https://openalex.org/I112936343","https://openalex.org/I1294671590","https://openalex.org/I203339264","https://openalex.org/I203339264","https://openalex.org/I203339264","https://openalex.org/I4210145913","https://openalex.org/I48430043"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"Hubert Razik","raw_affiliation_strings":["Laboratoire Amp&#x00E8;re, UMR, CNRS 5005, Universit&#x00E9; Claude Bernard, Lyon 1, Villeurbanne, F-69622, Cedex, France","Amp\u00e8re, D\u00e9partement M\u00e9thodes pour l'Ing\u00e9nierie des Syst\u00e8mes"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Laboratoire Amp&#x00E8;re, UMR, CNRS 5005, Universit&#x00E9; Claude Bernard, Lyon 1, Villeurbanne, F-69622, Cedex, France","institution_ids":["https://openalex.org/I100532134","https://openalex.org/I1294671590"]},{"raw_affiliation_string":"Amp\u00e8re, D\u00e9partement M\u00e9thodes pour l'Ing\u00e9nierie des Syst\u00e8mes","institution_ids":["https://openalex.org/I4210145913"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5028174118","display_name":"Alfredo Quijano-L\u00f3pez","orcid":"https://orcid.org/0000-0001-7916-8698"},"institutions":[{"id":"https://openalex.org/I4210135181","display_name":"Instituto Tecnol\u00f3gico de la Energ\u00eda","ror":"https://ror.org/04qd57q23","country_code":"ES","type":"facility","lineage":["https://openalex.org/I4210135181"]}],"countries":["ES"],"is_corresponding":false,"raw_author_name":"Alfredo Quijano-Lopez","raw_affiliation_strings":["Universitat Polit&#x00E8;cnica de, Val&#x00E8;ncia, Instituto Tecnol&#x00F3;gico de la, Energ&#x00ED;a, Camino de Vera s/n, 46022 Valencia, Spain","Departamento de Ingenieria Electrica, Instituto de Ingenier\u00eda Energetica"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Universitat Polit&#x00E8;cnica de, Val&#x00E8;ncia, Instituto Tecnol&#x00F3;gico de la, Energ&#x00ED;a, Camino de Vera s/n, 46022 Valencia, Spain","institution_ids":["https://openalex.org/I4210135181"]},{"raw_affiliation_string":"Departamento de Ingenieria Electrica, Instituto de Ingenier\u00eda Energetica","institution_ids":[]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5039686647","display_name":"Vicente Climente-Alarc\u00f3n","orcid":"https://orcid.org/0000-0002-1273-8454"},"institutions":[{"id":"https://openalex.org/I9927081","display_name":"Aalto University","ror":"https://ror.org/020hwjq30","country_code":"FI","type":"education","lineage":["https://openalex.org/I9927081"]}],"countries":["FI"],"is_corresponding":false,"raw_author_name":"Vicente Climente-Alarcon","raw_affiliation_strings":["Aalto University, Department of Electrical, Engineering and Automation, P.O. 13000, Espoo 00076, Finland","Aalto University"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Aalto University, Department of Electrical, Engineering and Automation, P.O. 13000, Espoo 00076, Finland","institution_ids":["https://openalex.org/I9927081"]},{"raw_affiliation_string":"Aalto University","institution_ids":["https://openalex.org/I9927081"]}]}],"institutions":[],"countries_distinct_count":3,"institutions_distinct_count":5,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":7.7896,"has_fulltext":false,"cited_by_count":20,"citation_normalized_percentile":{"value":0.98323099,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":89,"max":99},"biblio":{"volume":null,"issue":null,"first_page":"3815","last_page":"3821"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T12169","display_name":"Non-Destructive Testing Techniques","score":0.9991000294685364,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T12169","display_name":"Non-Destructive Testing Techniques","score":0.9991000294685364,"subfield":{"id":"https://openalex.org/subfields/2210","display_name":"Mechanical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10220","display_name":"Machine Fault Diagnosis Techniques","score":0.9979000091552734,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13891","display_name":"Engineering Diagnostics and Reliability","score":0.9954000115394592,"subfield":{"id":"https://openalex.org/subfields/2211","display_name":"Mechanics of Materials"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/transient-analysis","display_name":"Transient analysis","score":0.6571283340454102},{"id":"https://openalex.org/keywords/transient","display_name":"Transient (computer programming)","score":0.6136829257011414},{"id":"https://openalex.org/keywords/rotor","display_name":"Rotor (electric)","score":0.5088953971862793},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.44679924845695496},{"id":"https://openalex.org/keywords/magnetic-field","display_name":"Magnetic field","score":0.4356110095977783},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.3351202607154846},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.31033769249916077},{"id":"https://openalex.org/keywords/transient-response","display_name":"Transient response","score":0.2449285387992859},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.21217817068099976}],"concepts":[{"id":"https://openalex.org/C2989121073","wikidata":"https://www.wikidata.org/wiki/Q1309019","display_name":"Transient analysis","level":3,"score":0.6571283340454102},{"id":"https://openalex.org/C2780799671","wikidata":"https://www.wikidata.org/wiki/Q17087362","display_name":"Transient (computer programming)","level":2,"score":0.6136829257011414},{"id":"https://openalex.org/C17281054","wikidata":"https://www.wikidata.org/wiki/Q193466","display_name":"Rotor (electric)","level":2,"score":0.5088953971862793},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.44679924845695496},{"id":"https://openalex.org/C115260700","wikidata":"https://www.wikidata.org/wiki/Q11408","display_name":"Magnetic field","level":2,"score":0.4356110095977783},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.3351202607154846},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.31033769249916077},{"id":"https://openalex.org/C85761212","wikidata":"https://www.wikidata.org/wiki/Q1974593","display_name":"Transient response","level":2,"score":0.2449285387992859},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.21217817068099976},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/iecon.2017.8216651","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iecon.2017.8216651","pdf_url":null,"source":{"id":"https://openalex.org/S4363608531","display_name":"IECON 2017 - 43rd Annual Conference of the IEEE Industrial Electronics Society","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IECON 2017 - 43rd Annual Conference of the IEEE Industrial Electronics Society","raw_type":"proceedings-article"},{"id":"pmh:oai:HAL:hal-01899870v1","is_oa":false,"landing_page_url":"https://hal.science/hal-01899870","pdf_url":null,"source":{"id":"https://openalex.org/S4306402512","display_name":"HAL (Le Centre pour la Communication Scientifique Directe)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I1294671590","host_organization_name":"Centre National de la Recherche Scientifique","host_organization_lineage":["https://openalex.org/I1294671590"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"43rd IEEE IECON, Oct 2017, P\u00e9kin, China. &#x27E8;10.1109/IECON.2017.8216651&#x27E9;","raw_type":"info:eu-repo/semantics/conferenceObject"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":26,"referenced_works":["https://openalex.org/W1508381292","https://openalex.org/W1891180627","https://openalex.org/W1911151745","https://openalex.org/W1997281893","https://openalex.org/W2002245955","https://openalex.org/W2016195206","https://openalex.org/W2067451583","https://openalex.org/W2078492899","https://openalex.org/W2094623746","https://openalex.org/W2113071270","https://openalex.org/W2113562731","https://openalex.org/W2114888935","https://openalex.org/W2115755118","https://openalex.org/W2121552484","https://openalex.org/W2135738926","https://openalex.org/W2138461713","https://openalex.org/W2150319225","https://openalex.org/W2155976579","https://openalex.org/W2173731758","https://openalex.org/W2189210810","https://openalex.org/W2314736604","https://openalex.org/W2314783213","https://openalex.org/W2588582452","https://openalex.org/W2596706891","https://openalex.org/W2764021907","https://openalex.org/W4242954345"],"related_works":["https://openalex.org/W2748952813","https://openalex.org/W2758798772","https://openalex.org/W2081338125","https://openalex.org/W2537731695","https://openalex.org/W2001630809","https://openalex.org/W4239924455","https://openalex.org/W4244925124","https://openalex.org/W2377879397","https://openalex.org/W1577327694","https://openalex.org/W2887517211"],"abstract_inverted_index":{"Electric":[0],"motors":[1],"condition":[2],"monitoring":[3],"is":[4,8,14],"an":[5],"area":[6],"that":[7,25,35,56,107],"living":[9],"a":[10,15,149,208],"continuous":[11],"dynamism.":[12],"There":[13],"strong":[16],"effort":[17],"in":[18,139,212],"the":[19,37,40,62,88,119,126,133,136,140,143,157,167,175,188,200,215],"search":[20],"of":[21,32,39,64,121,128,135,142,156,169,177,203],"new,":[22],"reliable":[23],"techniques":[24,55,69],"are":[26,52,104,196,218],"able":[27],"to":[28,84,110,152,186,206],"detect":[29],"different":[30],"types":[31],"failures":[33],"and":[34,48,198],"overcome":[36,153],"drawbacks":[38],"currently":[41],"available":[42],"methods.":[43],"In":[44],"this":[45,93,204],"regard,":[46],"vibration":[47],"current":[49,100],"data":[50],"analysis":[51,134,168,176],"well":[53],"known":[54],"have":[57,163],"shown":[58],"satisfactory":[59],"results":[60,195],"for":[61,87],"detection":[63],"certain":[65,105],"failures.":[66],"However,":[67,160],"these":[68],"do":[70],"not":[71,219],"avoid":[72],"some":[73,154],"problems,":[74],"such":[75,117],"as":[76,118,148,184],"their":[77],"occasional":[78],"false":[79,112],"indications,":[80,116],"which":[81],"can":[82,108],"lead":[83,109],"catastrophic":[85],"consequences":[86],"involved":[89],"industries.":[90],"For":[91],"instance,":[92],"happens":[94],"when":[95,190],"diagnosing":[96],"rotor":[97,192],"faults":[98],"via":[99],"analysis,":[101],"where":[102,214],"there":[103],"situations":[106],"either":[111],"positives":[113],"or":[114,125],"negative":[115],"presence":[120],"oscillating":[122],"load":[123],"torques":[124],"existence":[127],"non-adjacent":[129],"bar":[130],"breakages.":[131],"Recently,":[132],"magnetic":[137,179],"field":[138],"vicinity":[141],"motor":[144],"has":[145],"been":[146,164],"proposed":[147],"promising":[150,197],"tool":[151],"problems":[155],"classical":[158,216],"approaches.":[159],"few":[161],"works":[162],"focused":[165],"on":[166],"steady-state":[170],"signals.":[171],"This":[172],"paper":[173],"explores":[174],"external":[178],"fields":[180],"during":[181],"transient":[182],"operation":[183],"way":[185],"enhance":[187],"reliability":[189],"detecting":[191],"faults.":[193],"The":[194],"show":[199],"high":[201],"potential":[202],"technique":[205],"become":[207],"complementary":[209],"information":[210],"source":[211],"cases":[213],"tools":[217],"conclusive.":[220]},"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2024,"cited_by_count":1},{"year":2023,"cited_by_count":1},{"year":2022,"cited_by_count":1},{"year":2021,"cited_by_count":3},{"year":2020,"cited_by_count":3},{"year":2019,"cited_by_count":8},{"year":2018,"cited_by_count":2}],"updated_date":"2026-08-05T07:39:15.569665","created_date":"2025-10-10T00:00:00"}
