{"id":"https://openalex.org/W2773916518","doi":"https://doi.org/10.1109/iecon.2017.8216600","title":"Design of real-time SIFT feature extraction","display_name":"Design of real-time SIFT feature extraction","publication_year":2017,"publication_date":"2017-10-01","ids":{"openalex":"https://openalex.org/W2773916518","doi":"https://doi.org/10.1109/iecon.2017.8216600","mag":"2773916518"},"language":"en","primary_location":{"id":"doi:10.1109/iecon.2017.8216600","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iecon.2017.8216600","pdf_url":null,"source":{"id":"https://openalex.org/S4363608531","display_name":"IECON 2017 - 43rd Annual Conference of the IEEE Industrial Electronics Society","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IECON 2017 - 43rd Annual Conference of the IEEE Industrial Electronics Society","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5100387945","display_name":"Ruiqi Wang","orcid":"https://orcid.org/0000-0003-3430-5411"},"institutions":[{"id":"https://openalex.org/I848706","display_name":"Sungkyunkwan University","ror":"https://ror.org/04q78tk20","country_code":"KR","type":"education","lineage":["https://openalex.org/I848706"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Ruiqi Wang","raw_affiliation_strings":["Department of Electronics, Electrical and Computer Engineering, SungKyunkwan University, Suwon, Republic of Korea"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electronics, Electrical and Computer Engineering, SungKyunkwan University, Suwon, Republic of Korea","institution_ids":["https://openalex.org/I848706"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5024137527","display_name":"Jae Wook Jeon","orcid":"https://orcid.org/0000-0003-0037-112X"},"institutions":[{"id":"https://openalex.org/I848706","display_name":"Sungkyunkwan University","ror":"https://ror.org/04q78tk20","country_code":"KR","type":"education","lineage":["https://openalex.org/I848706"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Jae Wook Jeon","raw_affiliation_strings":["Department of Electronics, Electrical and Computer Engineering, SungKyunkwan University, Suwon, Republic of Korea"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electronics, Electrical and Computer Engineering, SungKyunkwan University, Suwon, Republic of Korea","institution_ids":["https://openalex.org/I848706"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I848706"],"apc_list":null,"apc_paid":null,"fwci":0.0796,"has_fulltext":false,"cited_by_count":4,"citation_normalized_percentile":{"value":0.40423612,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":94},"biblio":{"volume":"6","issue":null,"first_page":"3545","last_page":"3549"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10627","display_name":"Advanced Image and Video Retrieval Techniques","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10627","display_name":"Advanced Image and Video Retrieval Techniques","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10191","display_name":"Robotics and Sensor-Based Localization","score":0.9991999864578247,"subfield":{"id":"https://openalex.org/subfields/2202","display_name":"Aerospace Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10531","display_name":"Advanced Vision and Imaging","score":0.9977999925613403,"subfield":{"id":"https://openalex.org/subfields/1707","display_name":"Computer Vision and Pattern Recognition"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/scale-invariant-feature-transform","display_name":"Scale-invariant feature transform","score":0.9135751128196716},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.7717124819755554},{"id":"https://openalex.org/keywords/field-programmable-gate-array","display_name":"Field-programmable gate array","score":0.7187756299972534},{"id":"https://openalex.org/keywords/pixel","display_name":"Pixel","score":0.5471822023391724},{"id":"https://openalex.org/keywords/feature-extraction","display_name":"Feature extraction","score":0.5447876453399658},{"id":"https://openalex.org/keywords/interpolation","display_name":"Interpolation (computer graphics)","score":0.5320006012916565},{"id":"https://openalex.org/keywords/software","display_name":"Software","score":0.5260369777679443},{"id":"https://openalex.org/keywords/scale-space","display_name":"Scale space","score":0.4790162444114685},{"id":"https://openalex.org/keywords/feature","display_name":"Feature (linguistics)","score":0.46971362829208374},{"id":"https://openalex.org/keywords/key","display_name":"Key (lock)","score":0.4645654261112213},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.45693886280059814},{"id":"https://openalex.org/keywords/computer-vision","display_name":"Computer vision","score":0.3893272578716278},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.3423129916191101},{"id":"https://openalex.org/keywords/image-processing","display_name":"Image processing","score":0.273946613073349},{"id":"https://openalex.org/keywords/image","display_name":"Image (mathematics)","score":0.15486949682235718}],"concepts":[{"id":"https://openalex.org/C61265191","wikidata":"https://www.wikidata.org/wiki/Q767770","display_name":"Scale-invariant feature transform","level":3,"score":0.9135751128196716},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7717124819755554},{"id":"https://openalex.org/C42935608","wikidata":"https://www.wikidata.org/wiki/Q190411","display_name":"Field-programmable gate array","level":2,"score":0.7187756299972534},{"id":"https://openalex.org/C160633673","wikidata":"https://www.wikidata.org/wiki/Q355198","display_name":"Pixel","level":2,"score":0.5471822023391724},{"id":"https://openalex.org/C52622490","wikidata":"https://www.wikidata.org/wiki/Q1026626","display_name":"Feature extraction","level":2,"score":0.5447876453399658},{"id":"https://openalex.org/C137800194","wikidata":"https://www.wikidata.org/wiki/Q11713455","display_name":"Interpolation (computer graphics)","level":3,"score":0.5320006012916565},{"id":"https://openalex.org/C2777904410","wikidata":"https://www.wikidata.org/wiki/Q7397","display_name":"Software","level":2,"score":0.5260369777679443},{"id":"https://openalex.org/C99102927","wikidata":"https://www.wikidata.org/wiki/Q3058184","display_name":"Scale space","level":4,"score":0.4790162444114685},{"id":"https://openalex.org/C2776401178","wikidata":"https://www.wikidata.org/wiki/Q12050496","display_name":"Feature (linguistics)","level":2,"score":0.46971362829208374},{"id":"https://openalex.org/C26517878","wikidata":"https://www.wikidata.org/wiki/Q228039","display_name":"Key (lock)","level":2,"score":0.4645654261112213},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.45693886280059814},{"id":"https://openalex.org/C31972630","wikidata":"https://www.wikidata.org/wiki/Q844240","display_name":"Computer vision","level":1,"score":0.3893272578716278},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.3423129916191101},{"id":"https://openalex.org/C9417928","wikidata":"https://www.wikidata.org/wiki/Q1070689","display_name":"Image processing","level":3,"score":0.273946613073349},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.15486949682235718},{"id":"https://openalex.org/C138885662","wikidata":"https://www.wikidata.org/wiki/Q5891","display_name":"Philosophy","level":0,"score":0.0},{"id":"https://openalex.org/C41895202","wikidata":"https://www.wikidata.org/wiki/Q8162","display_name":"Linguistics","level":1,"score":0.0},{"id":"https://openalex.org/C38652104","wikidata":"https://www.wikidata.org/wiki/Q3510521","display_name":"Computer security","level":1,"score":0.0},{"id":"https://openalex.org/C199360897","wikidata":"https://www.wikidata.org/wiki/Q9143","display_name":"Programming language","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/iecon.2017.8216600","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iecon.2017.8216600","pdf_url":null,"source":{"id":"https://openalex.org/S4363608531","display_name":"IECON 2017 - 43rd Annual Conference of the IEEE Industrial Electronics Society","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IECON 2017 - 43rd Annual Conference of the IEEE Industrial Electronics Society","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.5199999809265137,"display_name":"Decent work and economic growth","id":"https://metadata.un.org/sdg/8"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":11,"referenced_works":["https://openalex.org/W1677409904","https://openalex.org/W1804970632","https://openalex.org/W2048643691","https://openalex.org/W2095705527","https://openalex.org/W2096680898","https://openalex.org/W2184212744","https://openalex.org/W2303128970","https://openalex.org/W2323686382","https://openalex.org/W2563986440","https://openalex.org/W6637400245","https://openalex.org/W6698130112"],"related_works":["https://openalex.org/W2368057377","https://openalex.org/W2325533458","https://openalex.org/W2049930962","https://openalex.org/W2996452473","https://openalex.org/W2065368760","https://openalex.org/W2942941948","https://openalex.org/W2365880032","https://openalex.org/W76963175","https://openalex.org/W2386289240","https://openalex.org/W2382003324"],"abstract_inverted_index":{"A":[0],"real-time":[1,44],"hardware":[2,25,56],"architecture":[3,26,158],"based":[4,159],"on":[5,160],"scale-invariant":[6],"feature":[7,11,32],"transform":[8],"algorithm":[9,64,150],"(SIFT)":[10],"extraction":[12],"with":[13,50,79,147,165],"parallel":[14,24],"technology":[15],"has":[16,65,75],"been":[17,66],"introduced":[18],"in":[19,69,127,132,152],"this":[20,155],"paper.":[21],"The":[22],"proposed":[23,99],"could":[27],"be":[28,123],"able":[29],"to":[30,77,100],"extract":[31],"via":[33],"a":[34,137,143],"Field-Programmable":[35],"Gate":[36],"Array":[37],"(FPGA)":[38],"chip":[39],"efficiently,":[40],"which":[41],"provided":[42],"the":[43,47,61,70,85,89,102,114,128,133,148,153,170],"performance":[45,162],"and":[46,59,94,168,172],"similar":[48,164],"accuracy":[49],"software":[51,166],"implementation.":[52],"In":[53],"terms":[54],"of":[55,83,157],"resource":[57],"consumption":[58],"speed,":[60],"original":[62,115],"SIFT":[63,149],"significantly":[67],"optimized":[68],"following":[71],"aspects:":[72],"1)":[73],"Down-sampling":[74],"used":[76],"replace":[78],"up-sampling":[80],"for":[81,120],"purpose":[82],"saving":[84],"interpolation":[86],"calculation.":[87],"Besides,":[88],"flexible":[90],"Gaussian":[91],"blur":[92],"value":[93],"self-circulation":[95],"scale":[96,135],"space":[97],"are":[98],"simplify":[101],"key":[103,109,116,125,144],"point":[104,110,117],"detection":[105,111,118],"operation.":[106],"2)":[107],"Optimized":[108],"method":[112],"replaces":[113],"methods":[119,167],"there":[121],"won't":[122],"other":[124],"points":[126],"neighbor":[129],"8":[130],"pixels":[131],"same":[134],"if":[136],"certain":[138],"pixel":[139],"were":[140],"defined":[141],"as":[142],"point.":[145],"Compared":[146],"implemented":[151],"software,":[154],"kind":[156],"FPGA":[161],"is":[163],"realizes":[169],"efficient":[171],"real-time.":[173]},"counts_by_year":[{"year":2024,"cited_by_count":1},{"year":2023,"cited_by_count":1},{"year":2021,"cited_by_count":1},{"year":2019,"cited_by_count":1}],"updated_date":"2026-07-29T14:22:42.915294","created_date":"2025-10-10T00:00:00"}