{"id":"https://openalex.org/W2760126286","doi":"https://doi.org/10.1109/iecon.2017.8216154","title":"Application of silicon carbide (SiC) power devices: Opportunities, challenges and potential solutions","display_name":"Application of silicon carbide (SiC) power devices: Opportunities, challenges and potential solutions","publication_year":2017,"publication_date":"2017-10-01","ids":{"openalex":"https://openalex.org/W2760126286","doi":"https://doi.org/10.1109/iecon.2017.8216154","mag":"2760126286"},"language":"en","primary_location":{"id":"doi:10.1109/iecon.2017.8216154","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iecon.2017.8216154","pdf_url":null,"source":{"id":"https://openalex.org/S4363608531","display_name":"IECON 2017 - 43rd Annual Conference of the IEEE Industrial Electronics Society","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IECON 2017 - 43rd Annual Conference of the IEEE Industrial Electronics Society","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5064083114","display_name":"Xibo Yuan","orcid":"https://orcid.org/0000-0002-8249-5857"},"institutions":[{"id":"https://openalex.org/I36234482","display_name":"University of Bristol","ror":"https://ror.org/0524sp257","country_code":"GB","type":"education","lineage":["https://openalex.org/I36234482"]}],"countries":["GB"],"is_corresponding":true,"raw_author_name":"Xibo Yuan","raw_affiliation_strings":["Department of Electrical and Electronic Engineering, The University of Bristol, Bristol, United Kingdom"],"affiliations":[{"raw_affiliation_string":"Department of Electrical and Electronic Engineering, The University of Bristol, Bristol, United Kingdom","institution_ids":["https://openalex.org/I36234482"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":["https://openalex.org/A5064083114"],"corresponding_institution_ids":["https://openalex.org/I36234482"],"apc_list":null,"apc_paid":null,"fwci":10.0249,"has_fulltext":false,"cited_by_count":40,"citation_normalized_percentile":{"value":0.99244087,"is_in_top_1_percent":true,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":94,"max":99},"biblio":{"volume":null,"issue":null,"first_page":"893","last_page":"900"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10361","display_name":"Silicon Carbide Semiconductor Technologies","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10361","display_name":"Silicon Carbide Semiconductor Technologies","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11444","display_name":"Electromagnetic Compatibility and Noise Suppression","score":0.9976000189781189,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10228","display_name":"Multilevel Inverters and Converters","score":0.9973000288009644,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/silicon-carbide","display_name":"Silicon carbide","score":0.8476805686950684},{"id":"https://openalex.org/keywords/emi","display_name":"EMI","score":0.7021671533584595},{"id":"https://openalex.org/keywords/wide-bandgap-semiconductor","display_name":"Wide-bandgap semiconductor","score":0.6018954515457153},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.5558983683586121},{"id":"https://openalex.org/keywords/electromagnetic-interference","display_name":"Electromagnetic interference","score":0.502577543258667},{"id":"https://openalex.org/keywords/power-semiconductor-device","display_name":"Power semiconductor device","score":0.4886632263660431},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.4473051428794861},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.4318106770515442},{"id":"https://openalex.org/keywords/engineering-physics","display_name":"Engineering physics","score":0.42678162455558777},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.4163741171360016},{"id":"https://openalex.org/keywords/exploit","display_name":"Exploit","score":0.41243284940719604},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.3916422426700592},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.378583163022995},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.34517621994018555},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.19143128395080566}],"concepts":[{"id":"https://openalex.org/C2780722187","wikidata":"https://www.wikidata.org/wiki/Q412356","display_name":"Silicon carbide","level":2,"score":0.8476805686950684},{"id":"https://openalex.org/C43461449","wikidata":"https://www.wikidata.org/wiki/Q2495531","display_name":"EMI","level":3,"score":0.7021671533584595},{"id":"https://openalex.org/C189278905","wikidata":"https://www.wikidata.org/wiki/Q2157708","display_name":"Wide-bandgap semiconductor","level":2,"score":0.6018954515457153},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.5558983683586121},{"id":"https://openalex.org/C184892835","wikidata":"https://www.wikidata.org/wiki/Q1474513","display_name":"Electromagnetic interference","level":2,"score":0.502577543258667},{"id":"https://openalex.org/C129014197","wikidata":"https://www.wikidata.org/wiki/Q906544","display_name":"Power semiconductor device","level":3,"score":0.4886632263660431},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.4473051428794861},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.4318106770515442},{"id":"https://openalex.org/C61696701","wikidata":"https://www.wikidata.org/wiki/Q770766","display_name":"Engineering physics","level":1,"score":0.42678162455558777},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.4163741171360016},{"id":"https://openalex.org/C165696696","wikidata":"https://www.wikidata.org/wiki/Q11287","display_name":"Exploit","level":2,"score":0.41243284940719604},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.3916422426700592},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.378583163022995},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.34517621994018555},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.19143128395080566},{"id":"https://openalex.org/C38652104","wikidata":"https://www.wikidata.org/wiki/Q3510521","display_name":"Computer security","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C191897082","wikidata":"https://www.wikidata.org/wiki/Q11467","display_name":"Metallurgy","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":3,"locations":[{"id":"doi:10.1109/iecon.2017.8216154","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iecon.2017.8216154","pdf_url":null,"source":{"id":"https://openalex.org/S4363608531","display_name":"IECON 2017 - 43rd Annual Conference of the IEEE Industrial Electronics Society","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":null,"host_organization_name":null,"host_organization_lineage":[],"host_organization_lineage_names":[],"type":"conference"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IECON 2017 - 43rd Annual Conference of the IEEE Industrial Electronics Society","raw_type":"proceedings-article"},{"id":"pmh:oai:research-information.bris.ac.uk:openaire_cris_publications/697795a5-c5bd-4c93-b094-77e7128e8c43","is_oa":false,"landing_page_url":"https://research-information.bris.ac.uk/en/publications/697795a5-c5bd-4c93-b094-77e7128e8c43","pdf_url":null,"source":{"id":"https://openalex.org/S4306400895","display_name":"Bristol Research (University of Bristol)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I36234482","host_organization_name":"University of Bristol","host_organization_lineage":["https://openalex.org/I36234482"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"Yuan, X 2017, Application of Silicon Carbide (SiC) Power Devices : Opportunities, Challenges and Potential Solutions. in 2017 43rd Annual Conference of the IEEE Industrial Electronics Society (IECON 2017). Institute of Electrical and Electronics Engineers (IEEE).","raw_type":"contributionToPeriodical"},{"id":"pmh:oai:research-information.bris.ac.uk:publications/697795a5-c5bd-4c93-b094-77e7128e8c43","is_oa":false,"landing_page_url":"https://research-information.bris.ac.uk/en/publications/application-of-silicon-carbide-sic-power-devices(697795a5-c5bd-4c93-b094-77e7128e8c43).html","pdf_url":null,"source":{"id":"https://openalex.org/S4306400895","display_name":"Bristol Research (University of Bristol)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I36234482","host_organization_name":"University of Bristol","host_organization_lineage":["https://openalex.org/I36234482"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"Yuan, X 2017, Application of Silicon Carbide (SiC) Power Devices : Opportunities, Challenges and Potential Solutions. in 2017 43rd Annual Conference of the IEEE Industrial Electronics Society (IECON 2017). Institute of Electrical and Electronics Engineers (IEEE).","raw_type":"contributionToPeriodical"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https://metadata.un.org/sdg/7","score":0.4000000059604645,"display_name":"Affordable and clean energy"}],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":18,"referenced_works":["https://openalex.org/W1529382425","https://openalex.org/W1911344251","https://openalex.org/W1964578877","https://openalex.org/W1978174941","https://openalex.org/W1998370272","https://openalex.org/W2000305556","https://openalex.org/W2029699094","https://openalex.org/W2030610778","https://openalex.org/W2095947529","https://openalex.org/W2099524704","https://openalex.org/W2108102437","https://openalex.org/W2320044021","https://openalex.org/W2331092066","https://openalex.org/W2568824384","https://openalex.org/W2588937652","https://openalex.org/W2616485679","https://openalex.org/W2770395904","https://openalex.org/W6658175799"],"related_works":["https://openalex.org/W76001227","https://openalex.org/W2349537384","https://openalex.org/W1986241886","https://openalex.org/W2041511579","https://openalex.org/W3120066331","https://openalex.org/W2549052135","https://openalex.org/W4385545073","https://openalex.org/W1921091955","https://openalex.org/W2163032211","https://openalex.org/W2587678315"],"abstract_inverted_index":{"Wide-bandgap":[0],"(WBG)":[1],"power":[2],"devices":[3,7,27,76,91],"such":[4],"as":[5],"SiC":[6,75],"can":[8,44],"operate":[9],"at":[10],"higher":[11,14,17],"switching":[12,39],"speed,":[13],"voltage":[15],"and":[16,41,54,69,77],"temperature.":[18],"While":[19],"the":[20,37,61,67,72,86],"opportunities":[21,68],"in":[22,71],"performance":[23],"improvement":[24],"with":[25],"WBG":[26],"are":[28,31],"clear,":[29],"there":[30],"significant":[32],"design":[33],"challenges.":[34],"For":[35],"example,":[36],"fast":[38],"speed":[40],"high":[42],"dv/dt":[43],"cause":[45],"increased":[46],"level":[47],"of":[48,60,74,89],"electro-magnetic":[49],"interference":[50],"(EMI),":[51],"current":[52],"overshoot":[53],"cross-talk":[55],"effect":[56],"through":[57],"parasitic":[58],"elements":[59],"circuit.":[62],"This":[63],"paper":[64],"will":[65],"review":[66],"challenges":[70],"application":[73],"present":[78],"several":[79],"potential":[80],"solutions":[81],"aiming":[82],"to":[83],"fully":[84],"exploit":[85],"supervisor":[87],"characteristics":[88],"these":[90],"while":[92],"attenuating":[93],"their":[94],"side-effects.":[95]},"counts_by_year":[{"year":2025,"cited_by_count":7},{"year":2024,"cited_by_count":5},{"year":2023,"cited_by_count":3},{"year":2022,"cited_by_count":4},{"year":2021,"cited_by_count":2},{"year":2020,"cited_by_count":9},{"year":2019,"cited_by_count":7},{"year":2018,"cited_by_count":3}],"updated_date":"2026-04-04T16:13:02.066488","created_date":"2025-10-10T00:00:00"}