{"id":"https://openalex.org/W2570853257","doi":"https://doi.org/10.1109/iecon.2016.7793572","title":"Interturn short fault diagnosis of a PMSM using voltage residual components","display_name":"Interturn short fault diagnosis of a PMSM using voltage residual components","publication_year":2016,"publication_date":"2016-10-01","ids":{"openalex":"https://openalex.org/W2570853257","doi":"https://doi.org/10.1109/iecon.2016.7793572","mag":"2570853257"},"language":"en","primary_location":{"id":"doi:10.1109/iecon.2016.7793572","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iecon.2016.7793572","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IECON 2016 - 42nd Annual Conference of the IEEE Industrial Electronics Society","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5112287252","display_name":"Seokbae Moon","orcid":null},"institutions":[{"id":"https://openalex.org/I123900574","display_name":"Pohang University of Science and Technology","ror":"https://ror.org/04xysgw12","country_code":"KR","type":"education","lineage":["https://openalex.org/I123900574"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Seokbae Moon","raw_affiliation_strings":["Department of Electrical Engineering, POSTECH, Pohang, Korea"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, POSTECH, Pohang, Korea","institution_ids":["https://openalex.org/I123900574"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101040983","display_name":"Hyeyun Jeong","orcid":"https://orcid.org/0000-0002-2383-5911"},"institutions":[{"id":"https://openalex.org/I123900574","display_name":"Pohang University of Science and Technology","ror":"https://ror.org/04xysgw12","country_code":"KR","type":"education","lineage":["https://openalex.org/I123900574"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Hyeyun Jeong","raw_affiliation_strings":["Department of Electrical Engineering, POSTECH, Pohang, Korea"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, POSTECH, Pohang, Korea","institution_ids":["https://openalex.org/I123900574"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5100452155","display_name":"Sang Woo Kim","orcid":"https://orcid.org/0000-0001-6023-1837"},"institutions":[{"id":"https://openalex.org/I123900574","display_name":"Pohang University of Science and Technology","ror":"https://ror.org/04xysgw12","country_code":"KR","type":"education","lineage":["https://openalex.org/I123900574"]}],"countries":["KR"],"is_corresponding":false,"raw_author_name":"Sang Woo Kim","raw_affiliation_strings":["Department of Electrical Engineering, POSTECH, Pohang, Korea"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical Engineering, POSTECH, Pohang, Korea","institution_ids":["https://openalex.org/I123900574"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I123900574"],"apc_list":null,"apc_paid":null,"fwci":1.7615,"has_fulltext":false,"cited_by_count":6,"citation_normalized_percentile":{"value":0.8387113,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":97},"biblio":{"volume":null,"issue":null,"first_page":"1513","last_page":"1517"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10220","display_name":"Machine Fault Diagnosis Techniques","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10220","display_name":"Machine Fault Diagnosis Techniques","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10278","display_name":"Electric Motor Design and Analysis","score":0.9980999827384949,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11222","display_name":"Magnetic Properties and Applications","score":0.9943000078201294,"subfield":{"id":"https://openalex.org/subfields/2504","display_name":"Electronic, Optical and Magnetic Materials"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/residual","display_name":"Residual","score":0.7925349473953247},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.774377167224884},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.49176791310310364},{"id":"https://openalex.org/keywords/control-theory","display_name":"Control theory (sociology)","score":0.44449177384376526},{"id":"https://openalex.org/keywords/synchronous-motor","display_name":"Synchronous motor","score":0.43946918845176697},{"id":"https://openalex.org/keywords/fault-detection-and-isolation","display_name":"Fault detection and isolation","score":0.4210614562034607},{"id":"https://openalex.org/keywords/finite-element-method","display_name":"Finite element method","score":0.42009884119033813},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.38236212730407715},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.28967106342315674},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.20667865872383118},{"id":"https://openalex.org/keywords/geology","display_name":"Geology","score":0.12251922488212585},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.11715719103813171},{"id":"https://openalex.org/keywords/structural-engineering","display_name":"Structural engineering","score":0.11082956194877625},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.09141388535499573},{"id":"https://openalex.org/keywords/seismology","display_name":"Seismology","score":0.09091535210609436},{"id":"https://openalex.org/keywords/actuator","display_name":"Actuator","score":0.07585498690605164}],"concepts":[{"id":"https://openalex.org/C155512373","wikidata":"https://www.wikidata.org/wiki/Q287450","display_name":"Residual","level":2,"score":0.7925349473953247},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.774377167224884},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.49176791310310364},{"id":"https://openalex.org/C47446073","wikidata":"https://www.wikidata.org/wiki/Q5165890","display_name":"Control theory (sociology)","level":3,"score":0.44449177384376526},{"id":"https://openalex.org/C71376005","wikidata":"https://www.wikidata.org/wiki/Q845675","display_name":"Synchronous motor","level":2,"score":0.43946918845176697},{"id":"https://openalex.org/C152745839","wikidata":"https://www.wikidata.org/wiki/Q5438153","display_name":"Fault detection and isolation","level":3,"score":0.4210614562034607},{"id":"https://openalex.org/C135628077","wikidata":"https://www.wikidata.org/wiki/Q220184","display_name":"Finite element method","level":2,"score":0.42009884119033813},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.38236212730407715},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.28967106342315674},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.20667865872383118},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.12251922488212585},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.11715719103813171},{"id":"https://openalex.org/C66938386","wikidata":"https://www.wikidata.org/wiki/Q633538","display_name":"Structural engineering","level":1,"score":0.11082956194877625},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.09141388535499573},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.09091535210609436},{"id":"https://openalex.org/C172707124","wikidata":"https://www.wikidata.org/wiki/Q423488","display_name":"Actuator","level":2,"score":0.07585498690605164},{"id":"https://openalex.org/C2775924081","wikidata":"https://www.wikidata.org/wiki/Q55608371","display_name":"Control (management)","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/iecon.2016.7793572","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iecon.2016.7793572","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IECON 2016 - 42nd Annual Conference of the IEEE Industrial Electronics Society","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":18,"referenced_works":["https://openalex.org/W1593571949","https://openalex.org/W1971697850","https://openalex.org/W2007413254","https://openalex.org/W2026550072","https://openalex.org/W2029680000","https://openalex.org/W2033802545","https://openalex.org/W2043241963","https://openalex.org/W2127136782","https://openalex.org/W2130995959","https://openalex.org/W2136389802","https://openalex.org/W2145223406","https://openalex.org/W2168038179","https://openalex.org/W2169582464","https://openalex.org/W2171233586","https://openalex.org/W2175810311","https://openalex.org/W2488793338","https://openalex.org/W4245594408","https://openalex.org/W6643367639"],"related_works":["https://openalex.org/W2560215812","https://openalex.org/W2949601986","https://openalex.org/W2788972299","https://openalex.org/W2498789492","https://openalex.org/W2521347458","https://openalex.org/W2729981612","https://openalex.org/W4385301753","https://openalex.org/W2171501125","https://openalex.org/W2770006443","https://openalex.org/W2617234683"],"abstract_inverted_index":{"This":[0],"paper":[1],"proposes":[2],"a":[3,8,34,42,52,67,76,82,93,97],"fault":[4,22,48,62,71,83,112],"diagnosis":[5,43],"method":[6,55,107],"for":[7],"permanent":[9],"magnet":[10],"synchronous":[11],"machine":[12],"(PMSM)":[13],"with":[14,56],"an":[15],"interturn":[16,46,69],"short":[17,21,47,70],"fault.":[18,36],"The":[19],"Interturn":[20],"degrades":[23],"motor's":[24],"performance":[25],"and":[26,73],"may":[27],"lead":[28],"to":[29],"additional":[30],"faults":[31],"such":[32],"as":[33],"demagnetization":[35],"In":[37],"this":[38],"paper,":[39],"we":[40],"suggest":[41],"of":[44],"the":[45,87,105],"in":[49,110],"PMSM":[50],"using":[51],"Least":[53],"Square":[54],"voltage":[57],"residual":[58],"components.":[59],"A":[60],"rearranged":[61,88],"model":[63,72],"is":[64,96],"based":[65,85],"on":[66,75,86],"conventional":[68],"focused":[74],"faulty":[77],"winding.":[78],"We":[79],"also":[80],"propose":[81],"index":[84],"model.":[89],"Simulation":[90],"results":[91],"from":[92],"Maxwell,":[94],"which":[95],"finite":[98],"element":[99],"analysis":[100],"(FEA)":[101],"tool,":[102],"demonstrate":[103],"that":[104],"proposed":[106],"works":[108],"well":[109],"various":[111],"conditions.":[113]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2022,"cited_by_count":1},{"year":2019,"cited_by_count":2},{"year":2018,"cited_by_count":1},{"year":2017,"cited_by_count":1}],"updated_date":"2026-07-29T14:22:42.915294","created_date":"2025-10-10T00:00:00"}