{"id":"https://openalex.org/W2568184507","doi":"https://doi.org/10.1109/iecon.2016.7792962","title":"Fault severity estimation using nonlinear Kalman filter for induction motors under inter-turn fault","display_name":"Fault severity estimation using nonlinear Kalman filter for induction motors under inter-turn fault","publication_year":2016,"publication_date":"2016-10-01","ids":{"openalex":"https://openalex.org/W2568184507","doi":"https://doi.org/10.1109/iecon.2016.7792962","mag":"2568184507"},"language":"en","primary_location":{"id":"doi:10.1109/iecon.2016.7792962","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iecon.2016.7792962","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IECON 2016 - 42nd Annual Conference of the IEEE Industrial Electronics Society","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5101980586","display_name":"VietHung Nguyen","orcid":"https://orcid.org/0000-0003-2187-0438"},"institutions":[{"id":"https://openalex.org/I172675005","display_name":"Nanyang Technological University","ror":"https://ror.org/02e7b5302","country_code":"SG","type":"education","lineage":["https://openalex.org/I172675005"]}],"countries":["SG"],"is_corresponding":false,"raw_author_name":"Viethung Nguyen","raw_affiliation_strings":["Rolls-Royce@NTU Corporate Lab, c/o School of Electrical and Electronic Engineering, Nanyang Technological University, Singapore"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Rolls-Royce@NTU Corporate Lab, c/o School of Electrical and Electronic Engineering, Nanyang Technological University, Singapore","institution_ids":["https://openalex.org/I172675005"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5083472752","display_name":"Danwei Wang","orcid":"https://orcid.org/0000-0001-9669-4622"},"institutions":[{"id":"https://openalex.org/I172675005","display_name":"Nanyang Technological University","ror":"https://ror.org/02e7b5302","country_code":"SG","type":"education","lineage":["https://openalex.org/I172675005"]}],"countries":["SG"],"is_corresponding":false,"raw_author_name":"Danwei Wang","raw_affiliation_strings":["Rolls-Royce@NTU Corporate Lab, c/o School of Electrical and Electronic Engineering, Nanyang Technological University, Singapore"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Rolls-Royce@NTU Corporate Lab, c/o School of Electrical and Electronic Engineering, Nanyang Technological University, Singapore","institution_ids":["https://openalex.org/I172675005"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5013269645","display_name":"Jeevanand Seshadrinath","orcid":"https://orcid.org/0000-0002-2072-7317"},"institutions":[{"id":"https://openalex.org/I172675005","display_name":"Nanyang Technological University","ror":"https://ror.org/02e7b5302","country_code":"SG","type":"education","lineage":["https://openalex.org/I172675005"]}],"countries":["SG"],"is_corresponding":false,"raw_author_name":"Jeevanand Seshadrinath","raw_affiliation_strings":["Rolls-Royce@NTU Corporate Lab, c/o School of Electrical and Electronic Engineering, Nanyang Technological University, Singapore"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Rolls-Royce@NTU Corporate Lab, c/o School of Electrical and Electronic Engineering, Nanyang Technological University, Singapore","institution_ids":["https://openalex.org/I172675005"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5102765192","display_name":"Sivakumar Nadarajan","orcid":"https://orcid.org/0000-0001-6470-972X"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Sivakumar Nadarajan","raw_affiliation_strings":["Advanced Technology Centre, Rolls-Royce Singapore Pte. Ltd., Singapore"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Advanced Technology Centre, Rolls-Royce Singapore Pte. Ltd., Singapore","institution_ids":[]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5103231934","display_name":"Viswanathan Vaiyapuri","orcid":"https://orcid.org/0000-0003-4669-8718"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Viswanathan Vaiyapuri","raw_affiliation_strings":["Advanced Technology Centre, Rolls-Royce Singapore Pte. Ltd., Singapore"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Advanced Technology Centre, Rolls-Royce Singapore Pte. Ltd., Singapore","institution_ids":[]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":3.5229,"has_fulltext":false,"cited_by_count":16,"citation_normalized_percentile":{"value":0.93952928,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":89,"max":98},"biblio":{"volume":null,"issue":null,"first_page":"1488","last_page":"1493"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10220","display_name":"Machine Fault Diagnosis Techniques","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10220","display_name":"Machine Fault Diagnosis Techniques","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10780","display_name":"Reliability and Maintenance Optimization","score":0.9811000227928162,"subfield":{"id":"https://openalex.org/subfields/2213","display_name":"Safety, Risk, Reliability and Quality"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11201","display_name":"Metallurgy and Material Forming","score":0.9659000039100647,"subfield":{"id":"https://openalex.org/subfields/2211","display_name":"Mechanics of Materials"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/kalman-filter","display_name":"Kalman filter","score":0.7406824231147766},{"id":"https://openalex.org/keywords/control-theory","display_name":"Control theory (sociology)","score":0.7325277328491211},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.6911244988441467},{"id":"https://openalex.org/keywords/extended-kalman-filter","display_name":"Extended Kalman filter","score":0.5939334034919739},{"id":"https://openalex.org/keywords/stator","display_name":"Stator","score":0.587302029132843},{"id":"https://openalex.org/keywords/constraint","display_name":"Constraint (computer-aided design)","score":0.5558567047119141},{"id":"https://openalex.org/keywords/nonlinear-system","display_name":"Nonlinear system","score":0.533919632434845},{"id":"https://openalex.org/keywords/fault-detection-and-isolation","display_name":"Fault detection and isolation","score":0.49429941177368164},{"id":"https://openalex.org/keywords/process","display_name":"Process (computing)","score":0.4293642044067383},{"id":"https://openalex.org/keywords/stuck-at-fault","display_name":"Stuck-at fault","score":0.4290945529937744},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.4252355098724365},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.4142456650733948},{"id":"https://openalex.org/keywords/filter","display_name":"Filter (signal processing)","score":0.4114459156990051},{"id":"https://openalex.org/keywords/actuator","display_name":"Actuator","score":0.1132919192314148},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.07998937368392944}],"concepts":[{"id":"https://openalex.org/C157286648","wikidata":"https://www.wikidata.org/wiki/Q846780","display_name":"Kalman filter","level":2,"score":0.7406824231147766},{"id":"https://openalex.org/C47446073","wikidata":"https://www.wikidata.org/wiki/Q5165890","display_name":"Control theory (sociology)","level":3,"score":0.7325277328491211},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.6911244988441467},{"id":"https://openalex.org/C206833254","wikidata":"https://www.wikidata.org/wiki/Q5421817","display_name":"Extended Kalman filter","level":3,"score":0.5939334034919739},{"id":"https://openalex.org/C2776529397","wikidata":"https://www.wikidata.org/wiki/Q190312","display_name":"Stator","level":2,"score":0.587302029132843},{"id":"https://openalex.org/C2776036281","wikidata":"https://www.wikidata.org/wiki/Q48769818","display_name":"Constraint (computer-aided design)","level":2,"score":0.5558567047119141},{"id":"https://openalex.org/C158622935","wikidata":"https://www.wikidata.org/wiki/Q660848","display_name":"Nonlinear system","level":2,"score":0.533919632434845},{"id":"https://openalex.org/C152745839","wikidata":"https://www.wikidata.org/wiki/Q5438153","display_name":"Fault detection and isolation","level":3,"score":0.49429941177368164},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.4293642044067383},{"id":"https://openalex.org/C13625343","wikidata":"https://www.wikidata.org/wiki/Q7627418","display_name":"Stuck-at fault","level":4,"score":0.4290945529937744},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.4252355098724365},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4142456650733948},{"id":"https://openalex.org/C106131492","wikidata":"https://www.wikidata.org/wiki/Q3072260","display_name":"Filter (signal processing)","level":2,"score":0.4114459156990051},{"id":"https://openalex.org/C172707124","wikidata":"https://www.wikidata.org/wiki/Q423488","display_name":"Actuator","level":2,"score":0.1132919192314148},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.07998937368392944},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.0},{"id":"https://openalex.org/C78519656","wikidata":"https://www.wikidata.org/wiki/Q101333","display_name":"Mechanical engineering","level":1,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C2775924081","wikidata":"https://www.wikidata.org/wiki/Q55608371","display_name":"Control (management)","level":2,"score":0.0},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/iecon.2016.7792962","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iecon.2016.7792962","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IECON 2016 - 42nd Annual Conference of the IEEE Industrial Electronics Society","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[{"id":"https://openalex.org/F4320320709","display_name":"National Research Foundation Singapore","ror":"https://ror.org/03cpyc314"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":22,"referenced_works":["https://openalex.org/W1505867803","https://openalex.org/W2026753505","https://openalex.org/W2030598869","https://openalex.org/W2056373822","https://openalex.org/W2098113420","https://openalex.org/W2113477641","https://openalex.org/W2128098100","https://openalex.org/W2134844385","https://openalex.org/W2137047456","https://openalex.org/W2154202924","https://openalex.org/W2156919804","https://openalex.org/W2156997882","https://openalex.org/W2173731758","https://openalex.org/W2176629505","https://openalex.org/W2180015593","https://openalex.org/W2275520905","https://openalex.org/W2488793338","https://openalex.org/W3137988654","https://openalex.org/W4233898916","https://openalex.org/W4299870079","https://openalex.org/W6694927133","https://openalex.org/W6792381815"],"related_works":["https://openalex.org/W623794290","https://openalex.org/W2089114113","https://openalex.org/W2372255233","https://openalex.org/W2103062922","https://openalex.org/W2162299404","https://openalex.org/W2118844790","https://openalex.org/W2169757786","https://openalex.org/W2164489324","https://openalex.org/W4285494435","https://openalex.org/W855434851"],"abstract_inverted_index":{"Fault":[0],"severity":[1,30,46],"estimation":[2,47,64,111],"is":[3,31,73,102],"an":[4,76,95],"important":[5],"part":[6],"in":[7],"condition-based":[8],"maintenance,":[9],"by":[10,33],"which":[11],"a":[12,84,105],"right":[13],"time":[14],"and":[15,40],"suitable":[16],"maintenance":[17],"policy":[18],"can":[19],"be":[20],"planned.":[21],"For":[22],"stator":[23],"winding":[24],"inter-turn":[25],"short":[26],"circuit":[27],"fault,":[28],"its":[29,122],"represented":[32],"two":[34],"parameters,":[35],"percentage":[36,69],"of":[37,48,57,65,70,112],"shorted":[38,71],"turns":[39],"fault":[41,50,59,114],"loop":[42],"resistance.":[43],"Research":[44],"on":[45,54,98],"this":[49,81],"has":[51],"been":[52],"focused":[53],"late":[55],"stage":[56],"the":[58,63,118],"development":[60],"process,":[61],"when":[62],"only":[66],"one":[67],"parameter,":[68],"turns,":[72],"required.":[74],"As":[75],"attempt":[77],"to":[78,86],"overcome":[79],"this,":[80],"paper":[82],"proposes":[83],"method":[85],"estimate":[87],"both":[88,113],"parameters":[89,115],"employing":[90],"nonlinear":[91],"Kalman":[92],"filter":[93],"using":[94],"equality":[96],"constraint":[97,101],"them.":[99],"The":[100,110],"derived":[103],"from":[104,121],"sequence":[106],"component":[107],"model":[108],"analysis.":[109],"helps":[116],"track":[117],"degradation":[119],"process":[120],"incipient":[123],"stage.":[124]},"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2024,"cited_by_count":2},{"year":2023,"cited_by_count":1},{"year":2022,"cited_by_count":2},{"year":2021,"cited_by_count":1},{"year":2020,"cited_by_count":1},{"year":2019,"cited_by_count":2},{"year":2018,"cited_by_count":1},{"year":2017,"cited_by_count":5}],"updated_date":"2026-07-29T14:22:42.915294","created_date":"2025-10-10T00:00:00"}