{"id":"https://openalex.org/W2556327639","doi":"https://doi.org/10.1109/iecon.2015.7392522","title":"Reliability assessment of fault tolerant permanent magnet AC drives","display_name":"Reliability assessment of fault tolerant permanent magnet AC drives","publication_year":2015,"publication_date":"2015-11-01","ids":{"openalex":"https://openalex.org/W2556327639","doi":"https://doi.org/10.1109/iecon.2015.7392522","mag":"2556327639"},"language":"en","primary_location":{"id":"doi:10.1109/iecon.2015.7392522","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iecon.2015.7392522","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IECON 2015 - 41st Annual Conference of the IEEE Industrial Electronics Society","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5076989158","display_name":"G. El Murr","orcid":null},"institutions":[{"id":"https://openalex.org/I91136226","display_name":"University of Sheffield","ror":"https://ror.org/05krs5044","country_code":"GB","type":"education","lineage":["https://openalex.org/I91136226"]}],"countries":["GB"],"is_corresponding":true,"raw_author_name":"G. El Murr","raw_affiliation_strings":["The University of Sheffield, Sheffield, Sheffield, GB"],"affiliations":[{"raw_affiliation_string":"The University of Sheffield, Sheffield, Sheffield, GB","institution_ids":["https://openalex.org/I91136226"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5057615108","display_name":"Antonio Griffo","orcid":"https://orcid.org/0000-0001-5642-2921"},"institutions":[{"id":"https://openalex.org/I91136226","display_name":"University of Sheffield","ror":"https://ror.org/05krs5044","country_code":"GB","type":"education","lineage":["https://openalex.org/I91136226"]}],"countries":["GB"],"is_corresponding":false,"raw_author_name":"A. Griffo","raw_affiliation_strings":["University of Sheffield, Sheffield, United Kingdom"],"affiliations":[{"raw_affiliation_string":"University of Sheffield, Sheffield, United Kingdom","institution_ids":["https://openalex.org/I91136226"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5100731525","display_name":"Jiabin Wang","orcid":"https://orcid.org/0000-0003-4870-3744"},"institutions":[{"id":"https://openalex.org/I91136226","display_name":"University of Sheffield","ror":"https://ror.org/05krs5044","country_code":"GB","type":"education","lineage":["https://openalex.org/I91136226"]}],"countries":["GB"],"is_corresponding":false,"raw_author_name":"J. Wang","raw_affiliation_strings":["University of Sheffield, Sheffield, United Kingdom"],"affiliations":[{"raw_affiliation_string":"University of Sheffield, Sheffield, United Kingdom","institution_ids":["https://openalex.org/I91136226"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5085159282","display_name":"Z. Q. Zhu","orcid":"https://orcid.org/0000-0001-7175-3307"},"institutions":[{"id":"https://openalex.org/I91136226","display_name":"University of Sheffield","ror":"https://ror.org/05krs5044","country_code":"GB","type":"education","lineage":["https://openalex.org/I91136226"]}],"countries":["GB"],"is_corresponding":false,"raw_author_name":"Z.Q. Zhu","raw_affiliation_strings":["University of Sheffield, Sheffield, United Kingdom"],"affiliations":[{"raw_affiliation_string":"University of Sheffield, Sheffield, United Kingdom","institution_ids":["https://openalex.org/I91136226"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5113695102","display_name":"B.C. Mecrow","orcid":null},"institutions":[{"id":"https://openalex.org/I84884186","display_name":"Newcastle University","ror":"https://ror.org/01kj2bm70","country_code":"GB","type":"education","lineage":["https://openalex.org/I84884186"]}],"countries":["GB"],"is_corresponding":false,"raw_author_name":"B. Mecrow","raw_affiliation_strings":["Newcastle University, Newcastle Upon Tyne, United Kingdom"],"affiliations":[{"raw_affiliation_string":"Newcastle University, Newcastle Upon Tyne, United Kingdom","institution_ids":["https://openalex.org/I84884186"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":5,"corresponding_author_ids":["https://openalex.org/A5076989158"],"corresponding_institution_ids":["https://openalex.org/I91136226"],"apc_list":null,"apc_paid":null,"fwci":0.3946,"has_fulltext":false,"cited_by_count":19,"citation_normalized_percentile":{"value":0.69731266,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":98},"biblio":{"volume":null,"issue":null,"first_page":"002777","last_page":"002782"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10361","display_name":"Silicon Carbide Semiconductor Technologies","score":0.9990000128746033,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10361","display_name":"Silicon Carbide Semiconductor Technologies","score":0.9990000128746033,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10228","display_name":"Multilevel Inverters and Converters","score":0.992900013923645,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10278","display_name":"Electric Motor Design and Analysis","score":0.9864000082015991,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.7457290887832642},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.6784143447875977},{"id":"https://openalex.org/keywords/fault-tolerance","display_name":"Fault tolerance","score":0.645751953125},{"id":"https://openalex.org/keywords/mean-time-between-failures","display_name":"Mean time between failures","score":0.49150145053863525},{"id":"https://openalex.org/keywords/markov-chain","display_name":"Markov chain","score":0.482584148645401},{"id":"https://openalex.org/keywords/network-topology","display_name":"Network topology","score":0.46271225810050964},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.45252081751823425},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.4369380474090576},{"id":"https://openalex.org/keywords/magnet","display_name":"Magnet","score":0.43372780084609985},{"id":"https://openalex.org/keywords/inverter","display_name":"Inverter","score":0.42764508724212646},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.4233006238937378},{"id":"https://openalex.org/keywords/automotive-engineering","display_name":"Automotive engineering","score":0.40338805317878723},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.20342332124710083},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.18050876259803772},{"id":"https://openalex.org/keywords/failure-rate","display_name":"Failure rate","score":0.15306416153907776},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.10623574256896973}],"concepts":[{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.7457290887832642},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.6784143447875977},{"id":"https://openalex.org/C63540848","wikidata":"https://www.wikidata.org/wiki/Q3140932","display_name":"Fault tolerance","level":2,"score":0.645751953125},{"id":"https://openalex.org/C44154001","wikidata":"https://www.wikidata.org/wiki/Q754940","display_name":"Mean time between failures","level":3,"score":0.49150145053863525},{"id":"https://openalex.org/C98763669","wikidata":"https://www.wikidata.org/wiki/Q176645","display_name":"Markov chain","level":2,"score":0.482584148645401},{"id":"https://openalex.org/C199845137","wikidata":"https://www.wikidata.org/wiki/Q145490","display_name":"Network topology","level":2,"score":0.46271225810050964},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.45252081751823425},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.4369380474090576},{"id":"https://openalex.org/C16389437","wikidata":"https://www.wikidata.org/wiki/Q11421","display_name":"Magnet","level":2,"score":0.43372780084609985},{"id":"https://openalex.org/C11190779","wikidata":"https://www.wikidata.org/wiki/Q664575","display_name":"Inverter","level":3,"score":0.42764508724212646},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.4233006238937378},{"id":"https://openalex.org/C171146098","wikidata":"https://www.wikidata.org/wiki/Q124192","display_name":"Automotive engineering","level":1,"score":0.40338805317878723},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.20342332124710083},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.18050876259803772},{"id":"https://openalex.org/C163164238","wikidata":"https://www.wikidata.org/wiki/Q2737027","display_name":"Failure rate","level":2,"score":0.15306416153907776},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.10623574256896973},{"id":"https://openalex.org/C119857082","wikidata":"https://www.wikidata.org/wiki/Q2539","display_name":"Machine learning","level":1,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/iecon.2015.7392522","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iecon.2015.7392522","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IECON 2015 - 41st Annual Conference of the IEEE Industrial Electronics Society","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":32,"referenced_works":["https://openalex.org/W199907787","https://openalex.org/W1552247602","https://openalex.org/W1561793927","https://openalex.org/W1976149175","https://openalex.org/W1978050119","https://openalex.org/W1980579086","https://openalex.org/W1996263915","https://openalex.org/W2029959080","https://openalex.org/W2039940841","https://openalex.org/W2049245504","https://openalex.org/W2061275616","https://openalex.org/W2075179107","https://openalex.org/W2084154781","https://openalex.org/W2101487263","https://openalex.org/W2108744642","https://openalex.org/W2114649131","https://openalex.org/W2119983711","https://openalex.org/W2125838338","https://openalex.org/W2129992400","https://openalex.org/W2131789431","https://openalex.org/W2132033583","https://openalex.org/W2133201266","https://openalex.org/W2148223322","https://openalex.org/W2150763729","https://openalex.org/W2153428002","https://openalex.org/W2158945446","https://openalex.org/W2161661719","https://openalex.org/W2533173097","https://openalex.org/W4237335638","https://openalex.org/W4253756742","https://openalex.org/W6608112222","https://openalex.org/W6632926158"],"related_works":["https://openalex.org/W1983353130","https://openalex.org/W168429299","https://openalex.org/W1513192318","https://openalex.org/W2064185557","https://openalex.org/W2081804767","https://openalex.org/W2114661492","https://openalex.org/W2059606485","https://openalex.org/W4251879367","https://openalex.org/W2564310820","https://openalex.org/W2980083569"],"abstract_inverted_index":{"Reliability":[0],"of":[1,5,36,53,55,76,92],"electric":[2,39],"drives":[3],"is":[4,71],"paramount":[6],"importance":[7],"for":[8,29],"safety":[9],"critical":[10],"applications":[11],"in":[12,46],"transportation,":[13],"medical":[14],"and":[15,23,89],"military":[16],"industries.":[17],"While":[18],"numerous":[19],"fault":[20,37,57],"tolerant":[21,38,58],"machine":[22],"inverter":[24],"topologies":[25],"have":[26],"been":[27,44],"developed":[28],"improving":[30],"drive":[31,40,62,79],"reliability,":[32],"comprehensive":[33],"reliability":[34],"evaluation":[35],"systems":[41,63],"has":[42],"not":[43],"reported":[45],"literature.":[47],"This":[48],"paper":[49],"performs":[50],"quantitative":[51],"assessment":[52],"mean-time-to-failure":[54,75],"representative":[56],"permanent":[59],"magnet":[60],"AC":[61],"by":[64,84],"employing":[65,85],"Markov":[66],"chain":[67],"modelling":[68],"technique.":[69],"It":[70],"shown":[72],"that":[73],"the":[74],"a":[77],"fault-tolerant":[78],"can":[80],"be":[81],"significantly":[82],"increased":[83],"health":[86],"monitoring/maintenance":[87],"check":[88],"prompt":[90],"repair/replacement":[91],"faulty":[93],"components.":[94]},"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2024,"cited_by_count":4},{"year":2023,"cited_by_count":4},{"year":2022,"cited_by_count":3},{"year":2021,"cited_by_count":2},{"year":2019,"cited_by_count":3},{"year":2018,"cited_by_count":1},{"year":2017,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}