{"id":"https://openalex.org/W2553706633","doi":"https://doi.org/10.1109/iecon.2015.7392121","title":"Multi-model diagnostics for various machining conditions: A similarity-based approach","display_name":"Multi-model diagnostics for various machining conditions: A similarity-based approach","publication_year":2015,"publication_date":"2015-11-01","ids":{"openalex":"https://openalex.org/W2553706633","doi":"https://doi.org/10.1109/iecon.2015.7392121","mag":"2553706633"},"language":"en","primary_location":{"id":"doi:10.1109/iecon.2015.7392121","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iecon.2015.7392121","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IECON 2015 - 41st Annual Conference of the IEEE Industrial Electronics Society","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5046744761","display_name":"Omid Geramifard","orcid":null},"institutions":[{"id":"https://openalex.org/I4210091207","display_name":"Singapore Institute of Manufacturing Technology","ror":"https://ror.org/00f44np30","country_code":"SG","type":"facility","lineage":["https://openalex.org/I115228651","https://openalex.org/I4210091207","https://openalex.org/I91275662"]}],"countries":["SG"],"is_corresponding":true,"raw_author_name":"Omid Geramifard","raw_affiliation_strings":["Singapore Institute of Manufacturing Technology, Singapore"],"affiliations":[{"raw_affiliation_string":"Singapore Institute of Manufacturing Technology, Singapore","institution_ids":["https://openalex.org/I4210091207"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5113546508","display_name":"Tung Le","orcid":null},"institutions":[{"id":"https://openalex.org/I4210091207","display_name":"Singapore Institute of Manufacturing Technology","ror":"https://ror.org/00f44np30","country_code":"SG","type":"facility","lineage":["https://openalex.org/I115228651","https://openalex.org/I4210091207","https://openalex.org/I91275662"]}],"countries":["SG"],"is_corresponding":false,"raw_author_name":"Le Tung","raw_affiliation_strings":["Singapore Institute of Manufacturing Technology, Singapore"],"affiliations":[{"raw_affiliation_string":"Singapore Institute of Manufacturing Technology, Singapore","institution_ids":["https://openalex.org/I4210091207"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":["https://openalex.org/A5046744761"],"corresponding_institution_ids":["https://openalex.org/I4210091207"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":{"value":0.3471617,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":94},"biblio":{"volume":"28","issue":null,"first_page":"000333","last_page":"000338"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10220","display_name":"Machine Fault Diagnosis Techniques","score":0.9965999722480774,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10220","display_name":"Machine Fault Diagnosis Techniques","score":0.9965999722480774,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10876","display_name":"Fault Detection and Control Systems","score":0.9902999997138977,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11512","display_name":"Anomaly Detection Techniques and Applications","score":0.9793000221252441,"subfield":{"id":"https://openalex.org/subfields/1702","display_name":"Artificial Intelligence"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/machining","display_name":"Machining","score":0.7892465591430664},{"id":"https://openalex.org/keywords/similarity","display_name":"Similarity (geometry)","score":0.7635220289230347},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.659855842590332},{"id":"https://openalex.org/keywords/hidden-markov-model","display_name":"Hidden Markov model","score":0.6208113431930542},{"id":"https://openalex.org/keywords/tool-wear","display_name":"Tool wear","score":0.5379842519760132},{"id":"https://openalex.org/keywords/data-mining","display_name":"Data mining","score":0.5031978487968445},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.4288880527019501},{"id":"https://openalex.org/keywords/data-modeling","display_name":"Data modeling","score":0.4285928010940552},{"id":"https://openalex.org/keywords/function","display_name":"Function (biology)","score":0.4110051393508911},{"id":"https://openalex.org/keywords/machine-learning","display_name":"Machine learning","score":0.39772412180900574},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.25165021419525146},{"id":"https://openalex.org/keywords/mechanical-engineering","display_name":"Mechanical engineering","score":0.11342757940292358}],"concepts":[{"id":"https://openalex.org/C523214423","wikidata":"https://www.wikidata.org/wiki/Q192047","display_name":"Machining","level":2,"score":0.7892465591430664},{"id":"https://openalex.org/C103278499","wikidata":"https://www.wikidata.org/wiki/Q254465","display_name":"Similarity (geometry)","level":3,"score":0.7635220289230347},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.659855842590332},{"id":"https://openalex.org/C23224414","wikidata":"https://www.wikidata.org/wiki/Q176769","display_name":"Hidden Markov model","level":2,"score":0.6208113431930542},{"id":"https://openalex.org/C2776450708","wikidata":"https://www.wikidata.org/wiki/Q6008734","display_name":"Tool wear","level":3,"score":0.5379842519760132},{"id":"https://openalex.org/C124101348","wikidata":"https://www.wikidata.org/wiki/Q172491","display_name":"Data mining","level":1,"score":0.5031978487968445},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.4288880527019501},{"id":"https://openalex.org/C67186912","wikidata":"https://www.wikidata.org/wiki/Q367664","display_name":"Data modeling","level":2,"score":0.4285928010940552},{"id":"https://openalex.org/C14036430","wikidata":"https://www.wikidata.org/wiki/Q3736076","display_name":"Function (biology)","level":2,"score":0.4110051393508911},{"id":"https://openalex.org/C119857082","wikidata":"https://www.wikidata.org/wiki/Q2539","display_name":"Machine learning","level":1,"score":0.39772412180900574},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.25165021419525146},{"id":"https://openalex.org/C78519656","wikidata":"https://www.wikidata.org/wiki/Q101333","display_name":"Mechanical engineering","level":1,"score":0.11342757940292358},{"id":"https://openalex.org/C86803240","wikidata":"https://www.wikidata.org/wiki/Q420","display_name":"Biology","level":0,"score":0.0},{"id":"https://openalex.org/C115961682","wikidata":"https://www.wikidata.org/wiki/Q860623","display_name":"Image (mathematics)","level":2,"score":0.0},{"id":"https://openalex.org/C78458016","wikidata":"https://www.wikidata.org/wiki/Q840400","display_name":"Evolutionary biology","level":1,"score":0.0},{"id":"https://openalex.org/C77088390","wikidata":"https://www.wikidata.org/wiki/Q8513","display_name":"Database","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/iecon.2015.7392121","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iecon.2015.7392121","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IECON 2015 - 41st Annual Conference of the IEEE Industrial Electronics Society","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":23,"referenced_works":["https://openalex.org/W20678686","https://openalex.org/W1524534559","https://openalex.org/W1965785976","https://openalex.org/W1967640926","https://openalex.org/W1989020770","https://openalex.org/W1992113394","https://openalex.org/W1998735544","https://openalex.org/W2031898921","https://openalex.org/W2046290467","https://openalex.org/W2094939857","https://openalex.org/W2106567460","https://openalex.org/W2117720586","https://openalex.org/W2121783740","https://openalex.org/W2125838338","https://openalex.org/W2139730649","https://openalex.org/W2141692554","https://openalex.org/W2150214940","https://openalex.org/W2168529323","https://openalex.org/W2501634593","https://openalex.org/W2510502605","https://openalex.org/W6631239035","https://openalex.org/W6647780975","https://openalex.org/W6725643723"],"related_works":["https://openalex.org/W2053269318","https://openalex.org/W2364370872","https://openalex.org/W2097963413","https://openalex.org/W2025614924","https://openalex.org/W2294335174","https://openalex.org/W3145575561","https://openalex.org/W2001275470","https://openalex.org/W2073996508","https://openalex.org/W2549972263","https://openalex.org/W4319073490"],"abstract_inverted_index":{"In":[0],"this":[1],"paper,":[2],"a":[3,9,60,74,99],"similarity-based":[4],"multi-model":[5,50],"approach":[6,30,51],"based":[7],"on":[8,59],"pre-existing":[10],"physically":[11],"segmented":[12],"hidden":[13],"Markov":[14],"model":[15,57,84,102],"with":[16,54,65],"continuous":[17],"output":[18],"(PSHMCO)":[19],"is":[20,52,107],"proposed":[21,29,49],"for":[22],"diagnostics":[23],"and":[24,79],"tool":[25,61],"wear":[26,62],"monitoring.":[27],"The":[28,48,69],"helps":[31],"to":[32,77,96],"improve":[33,91],"the":[34,40,81,92],"estimation":[35],"accuracy":[36],"in":[37],"cases":[38],"that":[39,72],"machinery":[41],"system":[42],"undertakes":[43],"different":[44],"operating":[45],"(machining)":[46],"conditions.":[47,68],"compared":[53,95],"its":[55],"single":[56,100],"variant":[58],"monitoring":[63],"dataset":[64],"various":[66],"machining":[67],"results":[70],"indicate":[71],"using":[73],"similarity":[75],"function":[76],"identify":[78],"apply":[80],"most":[82],"similar":[83],"out":[85],"of":[86],"multiple":[87],"models":[88],"can":[89],"significantly":[90],"prediction":[93],"performance":[94],"blindly":[97],"utilizing":[98],"general":[101],"while":[103],"adequate":[104],"training":[105],"data":[106],"available.":[108]},"counts_by_year":[{"year":2022,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}