{"id":"https://openalex.org/W2551489531","doi":"https://doi.org/10.1109/iecon.2014.7049287","title":"Development of medium voltage solid-state fault isolation devices for ultra-fast protection of distribution systems","display_name":"Development of medium voltage solid-state fault isolation devices for ultra-fast protection of distribution systems","publication_year":2014,"publication_date":"2014-10-01","ids":{"openalex":"https://openalex.org/W2551489531","doi":"https://doi.org/10.1109/iecon.2014.7049287","mag":"2551489531"},"language":"en","primary_location":{"id":"doi:10.1109/iecon.2014.7049287","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iecon.2014.7049287","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IECON 2014 - 40th Annual Conference of the IEEE Industrial Electronics Society","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5101696654","display_name":"Chang Peng","orcid":"https://orcid.org/0000-0002-0791-1320"},"institutions":[{"id":"https://openalex.org/I103163165","display_name":"Florida State University","ror":"https://ror.org/05g3dte14","country_code":"US","type":"education","lineage":["https://openalex.org/I103163165"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Chang Peng","raw_affiliation_strings":["FREEDM Systems Center, Florida State University"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"FREEDM Systems Center, Florida State University","institution_ids":["https://openalex.org/I103163165"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101405958","display_name":"Xiaoqing Song","orcid":"https://orcid.org/0000-0001-9983-5769"},"institutions":[{"id":"https://openalex.org/I103163165","display_name":"Florida State University","ror":"https://ror.org/05g3dte14","country_code":"US","type":"education","lineage":["https://openalex.org/I103163165"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Xiaoqing Song","raw_affiliation_strings":["FREEDM Systems Center, Florida State University"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"FREEDM Systems Center, Florida State University","institution_ids":["https://openalex.org/I103163165"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5102026594","display_name":"Mohammad Ali Rezaei","orcid":"https://orcid.org/0000-0003-3075-157X"},"institutions":[{"id":"https://openalex.org/I103163165","display_name":"Florida State University","ror":"https://ror.org/05g3dte14","country_code":"US","type":"education","lineage":["https://openalex.org/I103163165"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Mohammad Ali Rezaei","raw_affiliation_strings":["FREEDM Systems Center, Florida State University"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"FREEDM Systems Center, Florida State University","institution_ids":["https://openalex.org/I103163165"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5101516359","display_name":"Xing Huang","orcid":"https://orcid.org/0000-0003-4383-9159"},"institutions":[{"id":"https://openalex.org/I103163165","display_name":"Florida State University","ror":"https://ror.org/05g3dte14","country_code":"US","type":"education","lineage":["https://openalex.org/I103163165"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Xing Huang","raw_affiliation_strings":["FREEDM Systems Center, Florida State University"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"FREEDM Systems Center, Florida State University","institution_ids":["https://openalex.org/I103163165"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5069647545","display_name":"Chris Widener","orcid":null},"institutions":[{"id":"https://openalex.org/I103163165","display_name":"Florida State University","ror":"https://ror.org/05g3dte14","country_code":"US","type":"education","lineage":["https://openalex.org/I103163165"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Chris Widener","raw_affiliation_strings":["FREEDM Systems Center, Florida State University"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"FREEDM Systems Center, Florida State University","institution_ids":["https://openalex.org/I103163165"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5011191579","display_name":"Alex Q. Huang","orcid":"https://orcid.org/0000-0003-3427-0335"},"institutions":[{"id":"https://openalex.org/I103163165","display_name":"Florida State University","ror":"https://ror.org/05g3dte14","country_code":"US","type":"education","lineage":["https://openalex.org/I103163165"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Alex Q. Huang","raw_affiliation_strings":["FREEDM Systems Center, Florida State University"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"FREEDM Systems Center, Florida State University","institution_ids":["https://openalex.org/I103163165"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5059419774","display_name":"Michael Steurer","orcid":"https://orcid.org/0000-0002-0618-2023"},"institutions":[{"id":"https://openalex.org/I103163165","display_name":"Florida State University","ror":"https://ror.org/05g3dte14","country_code":"US","type":"education","lineage":["https://openalex.org/I103163165"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Michael Steurer","raw_affiliation_strings":["FREEDM Systems Center, Florida State University"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"FREEDM Systems Center, Florida State University","institution_ids":["https://openalex.org/I103163165"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I103163165"],"apc_list":null,"apc_paid":null,"fwci":5.7492,"has_fulltext":false,"cited_by_count":50,"citation_normalized_percentile":{"value":0.96617945,"is_in_top_1_percent":false,"is_in_top_10_percent":true},"cited_by_percentile_year":{"min":90,"max":99},"biblio":{"volume":null,"issue":null,"first_page":"5169","last_page":"5176"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11102","display_name":"HVDC Systems and Fault Protection","score":0.9991000294685364,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11102","display_name":"HVDC Systems and Fault Protection","score":0.9991000294685364,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10361","display_name":"Silicon Carbide Semiconductor Technologies","score":0.9990000128746033,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T13183","display_name":"Islanding Detection in Power Systems","score":0.9957000017166138,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/silicon-carbide","display_name":"Silicon carbide","score":0.7465596199035645},{"id":"https://openalex.org/keywords/blocking","display_name":"Blocking (statistics)","score":0.6501807570457458},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.6339876055717468},{"id":"https://openalex.org/keywords/high-voltage","display_name":"High voltage","score":0.5670536756515503},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.5534984469413757},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.5382608771324158},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.4648607671260834},{"id":"https://openalex.org/keywords/power-electronics","display_name":"Power electronics","score":0.45216241478919983},{"id":"https://openalex.org/keywords/low-voltage","display_name":"Low voltage","score":0.4319906234741211},{"id":"https://openalex.org/keywords/silicon","display_name":"Silicon","score":0.4281710684299469},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.3438637852668762},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.3282942771911621},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.28852349519729614},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2732343375682831}],"concepts":[{"id":"https://openalex.org/C2780722187","wikidata":"https://www.wikidata.org/wiki/Q412356","display_name":"Silicon carbide","level":2,"score":0.7465596199035645},{"id":"https://openalex.org/C144745244","wikidata":"https://www.wikidata.org/wiki/Q4927286","display_name":"Blocking (statistics)","level":2,"score":0.6501807570457458},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.6339876055717468},{"id":"https://openalex.org/C88182573","wikidata":"https://www.wikidata.org/wiki/Q1139740","display_name":"High voltage","level":3,"score":0.5670536756515503},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.5534984469413757},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.5382608771324158},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.4648607671260834},{"id":"https://openalex.org/C178911571","wikidata":"https://www.wikidata.org/wiki/Q593143","display_name":"Power electronics","level":3,"score":0.45216241478919983},{"id":"https://openalex.org/C128624480","wikidata":"https://www.wikidata.org/wiki/Q1504817","display_name":"Low voltage","level":3,"score":0.4319906234741211},{"id":"https://openalex.org/C544956773","wikidata":"https://www.wikidata.org/wiki/Q670","display_name":"Silicon","level":2,"score":0.4281710684299469},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.3438637852668762},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.3282942771911621},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.28852349519729614},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2732343375682831},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0},{"id":"https://openalex.org/C31258907","wikidata":"https://www.wikidata.org/wiki/Q1301371","display_name":"Computer network","level":1,"score":0.0},{"id":"https://openalex.org/C191897082","wikidata":"https://www.wikidata.org/wiki/Q11467","display_name":"Metallurgy","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/iecon.2014.7049287","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iecon.2014.7049287","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IECON 2014 - 40th Annual Conference of the IEEE Industrial Electronics Society","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Affordable and clean energy","score":0.7099999785423279,"id":"https://metadata.un.org/sdg/7"}],"awards":[],"funders":[{"id":"https://openalex.org/F4320306076","display_name":"National Science Foundation","ror":"https://ror.org/021nxhr62"}],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":28,"referenced_works":["https://openalex.org/W1504452818","https://openalex.org/W1555906078","https://openalex.org/W1564283846","https://openalex.org/W1783118142","https://openalex.org/W1966751624","https://openalex.org/W1976980804","https://openalex.org/W2004715253","https://openalex.org/W2018786000","https://openalex.org/W2020753074","https://openalex.org/W2030762058","https://openalex.org/W2034628329","https://openalex.org/W2046869381","https://openalex.org/W2064014748","https://openalex.org/W2068334467","https://openalex.org/W2089796964","https://openalex.org/W2097633124","https://openalex.org/W2111073973","https://openalex.org/W2112830969","https://openalex.org/W2124393930","https://openalex.org/W2134629828","https://openalex.org/W2140425646","https://openalex.org/W2149041158","https://openalex.org/W2156882954","https://openalex.org/W2336441134","https://openalex.org/W2921733795","https://openalex.org/W3152010412","https://openalex.org/W4245919541","https://openalex.org/W6633399749"],"related_works":["https://openalex.org/W2096829611","https://openalex.org/W2377360010","https://openalex.org/W1924563063","https://openalex.org/W2345908246","https://openalex.org/W2995900424","https://openalex.org/W2114887477","https://openalex.org/W4230456147","https://openalex.org/W2066236908","https://openalex.org/W139141024","https://openalex.org/W2551489531"],"abstract_inverted_index":{"Three":[0],"generations":[1],"of":[2,92,98],"medium":[3],"voltage":[4,42,70,102],"fault":[5],"isolation":[6],"devices":[7,59,104],"(FID)":[8],"for":[9],"a":[10],"power":[11],"electronics":[12],"based":[13],"distribution":[14,41],"system,":[15],"the":[16,25,47,50,69,73,86,90,96,108],"FREEDM":[17],"System,":[18],"are":[19,33,60,80],"reported":[20],"in":[21,46,85],"this":[22],"paper.":[23],"In":[24],"Gen-I":[26],"FID,":[27],"three":[28],"6.5":[29],"kV":[30,39,54],"silicon":[31],"IGBTs":[32],"series":[34],"connected":[35],"to":[36,105],"achieve":[37],"15":[38,53],"class":[40],"blocking":[43,100],"capability.":[44],"Whereas":[45],"Gen-II":[48],"and":[49,95],"Gen-III":[51,87],"FIDs,":[52],"Silicon":[55],"Carbide":[56],"(SiC)":[57],"ETO":[58],"used.":[61],"Since":[62],"one":[63],"single":[64],"such":[65],"device":[66],"can":[67],"meet":[68],"withstand":[71],"requirement,":[72],"operation":[74,109],"losses":[75],"as":[76,78],"well":[77],"dimensions":[79],"significantly":[81],"reduced.":[82],"Future":[83],"improvements":[84],"FID":[88],"include":[89],"use":[91],"hybrid":[93],"schemes":[94],"development":[97],"symmetrical":[99],"high":[101],"SiC":[103],"further":[106],"minimize":[107],"losses.":[110]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2025,"cited_by_count":2},{"year":2024,"cited_by_count":2},{"year":2023,"cited_by_count":1},{"year":2022,"cited_by_count":3},{"year":2021,"cited_by_count":3},{"year":2020,"cited_by_count":3},{"year":2019,"cited_by_count":3},{"year":2018,"cited_by_count":5},{"year":2017,"cited_by_count":5},{"year":2016,"cited_by_count":11},{"year":2015,"cited_by_count":11}],"updated_date":"2026-06-26T08:34:08.712188","created_date":"2025-10-10T00:00:00"}