{"id":"https://openalex.org/W1486961404","doi":"https://doi.org/10.1109/iecon.2014.7048643","title":"A PCA-mRVM fault diagnosis strategy and its application in CHMLIS","display_name":"A PCA-mRVM fault diagnosis strategy and its application in CHMLIS","publication_year":2014,"publication_date":"2014-10-01","ids":{"openalex":"https://openalex.org/W1486961404","doi":"https://doi.org/10.1109/iecon.2014.7048643","mag":"1486961404"},"language":"en","primary_location":{"id":"doi:10.1109/iecon.2014.7048643","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iecon.2014.7048643","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IECON 2014 - 40th Annual Conference of the IEEE Industrial Electronics Society","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5029549421","display_name":"Hao Xu","orcid":"https://orcid.org/0000-0003-3474-0210"},"institutions":[{"id":"https://openalex.org/I96733725","display_name":"Shanghai Maritime University","ror":"https://ror.org/04z7qrj66","country_code":"CN","type":"education","lineage":["https://openalex.org/I96733725"]}],"countries":["CN"],"is_corresponding":true,"raw_author_name":"Xu Hao","raw_affiliation_strings":["Department of Electrical Automation, Shanghai Maritime University, Shanghai, China"],"affiliations":[{"raw_affiliation_string":"Department of Electrical Automation, Shanghai Maritime University, Shanghai, China","institution_ids":["https://openalex.org/I96733725"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5030448202","display_name":"Tianzhen Wang","orcid":"https://orcid.org/0000-0002-7525-8466"},"institutions":[{"id":"https://openalex.org/I96733725","display_name":"Shanghai Maritime University","ror":"https://ror.org/04z7qrj66","country_code":"CN","type":"education","lineage":["https://openalex.org/I96733725"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Wang Tianzhen","raw_affiliation_strings":["Department of Electrical Automation, Shanghai Maritime University, Shanghai, China"],"affiliations":[{"raw_affiliation_string":"Department of Electrical Automation, Shanghai Maritime University, Shanghai, China","institution_ids":["https://openalex.org/I96733725"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5109213150","display_name":"Tianhao Tang","orcid":null},"institutions":[{"id":"https://openalex.org/I96733725","display_name":"Shanghai Maritime University","ror":"https://ror.org/04z7qrj66","country_code":"CN","type":"education","lineage":["https://openalex.org/I96733725"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Tang Tianhao","raw_affiliation_strings":["Department of Electrical Automation, Shanghai Maritime University, Shanghai, China"],"affiliations":[{"raw_affiliation_string":"Department of Electrical Automation, Shanghai Maritime University, Shanghai, China","institution_ids":["https://openalex.org/I96733725"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5035730211","display_name":"Mohamed Benbouzid","orcid":"https://orcid.org/0000-0002-4844-508X"},"institutions":[{"id":"https://openalex.org/I161929037","display_name":"Universit\u00e9 de Bretagne Occidentale","ror":"https://ror.org/01b8h3982","country_code":"FR","type":"education","lineage":["https://openalex.org/I161929037"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"M. E. H. Benbouzid","raw_affiliation_strings":["Institut Universitaire de Technologie de Brest, University of Brest, Brest, France"],"affiliations":[{"raw_affiliation_string":"Institut Universitaire de Technologie de Brest, University of Brest, Brest, France","institution_ids":["https://openalex.org/I161929037"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5029549421"],"corresponding_institution_ids":["https://openalex.org/I96733725"],"apc_list":null,"apc_paid":null,"fwci":0.628,"has_fulltext":false,"cited_by_count":6,"citation_normalized_percentile":{"value":0.71403743,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":96},"biblio":{"volume":"60","issue":null,"first_page":"1124","last_page":"1130"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10228","display_name":"Multilevel Inverters and Converters","score":0.998199999332428,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10228","display_name":"Multilevel Inverters and Converters","score":0.998199999332428,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10361","display_name":"Silicon Carbide Semiconductor Technologies","score":0.9799000024795532,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10220","display_name":"Machine Fault Diagnosis Techniques","score":0.9653000235557556,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.719121515750885},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.604564905166626},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.4739427864551544},{"id":"https://openalex.org/keywords/inverter","display_name":"Inverter","score":0.45799973607063293},{"id":"https://openalex.org/keywords/probabilistic-logic","display_name":"Probabilistic logic","score":0.4517582356929779},{"id":"https://openalex.org/keywords/fault-coverage","display_name":"Fault coverage","score":0.41406357288360596},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.3711949586868286},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.3390655219554901},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.33835890889167786},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.3230173587799072},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.2984277009963989},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.1868385374546051}],"concepts":[{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.719121515750885},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.604564905166626},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.4739427864551544},{"id":"https://openalex.org/C11190779","wikidata":"https://www.wikidata.org/wiki/Q664575","display_name":"Inverter","level":3,"score":0.45799973607063293},{"id":"https://openalex.org/C49937458","wikidata":"https://www.wikidata.org/wiki/Q2599292","display_name":"Probabilistic logic","level":2,"score":0.4517582356929779},{"id":"https://openalex.org/C126953365","wikidata":"https://www.wikidata.org/wiki/Q5438152","display_name":"Fault coverage","level":3,"score":0.41406357288360596},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.3711949586868286},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.3390655219554901},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.33835890889167786},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.3230173587799072},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.2984277009963989},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.1868385374546051},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/iecon.2014.7048643","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iecon.2014.7048643","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IECON 2014 - 40th Annual Conference of the IEEE Industrial Electronics Society","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":16,"referenced_works":["https://openalex.org/W1998793384","https://openalex.org/W2000767513","https://openalex.org/W2026288475","https://openalex.org/W2036148187","https://openalex.org/W2040592137","https://openalex.org/W2056717195","https://openalex.org/W2080361276","https://openalex.org/W2093244782","https://openalex.org/W2094898778","https://openalex.org/W2095196047","https://openalex.org/W2111755292","https://openalex.org/W2130028576","https://openalex.org/W2159388303","https://openalex.org/W2166361453","https://openalex.org/W2386703705","https://openalex.org/W6710574711"],"related_works":["https://openalex.org/W2367891013","https://openalex.org/W2007108787","https://openalex.org/W2084837496","https://openalex.org/W2103570580","https://openalex.org/W2373210218","https://openalex.org/W3147659851","https://openalex.org/W3119861251","https://openalex.org/W3019679473","https://openalex.org/W2315503980","https://openalex.org/W2383699822"],"abstract_inverted_index":{"The":[0,23,131],"multi-level":[1],"inverter":[2,60],"system":[3,17],"is":[4,28,78,92,99,116,188,194],"becoming":[5],"a":[6,56,62],"very":[7],"promising":[8],"candidate":[9],"to":[10,42,101,118],"replace":[11],"the":[12,44,47,52,86,95,103,111,125,162,166,185],"conventional":[13],"two-level":[14],"inverter,":[15],"but":[16,145],"reliability":[18,26],"remains":[19],"an":[20],"open":[21],"issue.":[22],"most":[24],"common":[25],"problem":[27],"that":[29,161,184],"power":[30],"switch":[31],"transistors":[32],"have":[33,159,181],"open-circuit":[34],"or":[35],"short-circuit":[36],"faults":[37],"during":[38],"operation.":[39],"In":[40,83,175],"order":[41],"improve":[43],"accuracy":[45],"of":[46,89,107,128,157,179],"fault":[48,64,109,172],"diagnosis":[49,65,143,168,173],"and":[50,72,105,141],"accelerate":[51],"operation":[53],"speed":[54],"in":[55,80,190],"cascaded":[57],"H-bridge":[58],"multilevel":[59],"system,":[61],"novel":[63],"strategy":[66,133,187],"based":[67],"on":[68],"principle":[69],"component":[70],"analysis":[71],"multiclass":[73],"relevance":[74],"vector":[75],"machine":[76],"(PCA-mRVM)":[77],"presented":[79],"this":[81,84],"paper.":[82],"strategy,":[85],"output":[87],"voltage":[88],"CHMLIS,":[90],"which":[91,123,193],"preprocessed":[93],"through":[94,110],"fast":[96],"Fourier":[97],"transform,":[98],"used":[100],"identify":[102],"type":[104],"location":[106],"occurring":[108],"mRVM":[112],"model.":[113,130],"Then":[114],"PCA":[115],"utilized":[117],"reduce":[119],"input":[120],"sample's":[121],"dimension,":[122],"decrease":[124],"training":[126],"time":[127],"diagnostic":[129],"PCA-mRVM":[132,163,186],"could":[134,164],"not":[135],"only":[136],"achieve":[137,165],"higher":[138],"model":[139],"sparsity":[140],"shorter":[142],"time,":[144],"also":[146],"provide":[147],"probabilistic":[148],"outputs":[149],"for":[150],"every":[151],"class":[152],"membership.":[153],"Hardware":[154],"experimental":[155],"results":[156,178],"simple-fault":[158],"shown":[160],"best":[167],"performance":[169],"than":[170,196],"traditional":[171],"methods.":[174,198],"addition,":[176],"simulation":[177],"complicated-fault":[180],"further":[182],"validated":[183],"useful":[189],"multi-fault":[191],"diagnosis,":[192],"better":[195],"other":[197]},"counts_by_year":[{"year":2021,"cited_by_count":1},{"year":2020,"cited_by_count":1},{"year":2019,"cited_by_count":1},{"year":2017,"cited_by_count":2},{"year":2015,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}