{"id":"https://openalex.org/W2086228539","doi":"https://doi.org/10.1109/iecon.2013.6700362","title":"Research on temperature retrieval and fault diagnosis of the cable joint","display_name":"Research on temperature retrieval and fault diagnosis of the cable joint","publication_year":2013,"publication_date":"2013-11-01","ids":{"openalex":"https://openalex.org/W2086228539","doi":"https://doi.org/10.1109/iecon.2013.6700362","mag":"2086228539"},"language":"en","primary_location":{"id":"doi:10.1109/iecon.2013.6700362","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iecon.2013.6700362","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IECON 2013 - 39th Annual Conference of the IEEE Industrial Electronics Society","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5102136418","display_name":"Hui Chang","orcid":null},"institutions":[{"id":"https://openalex.org/I37461747","display_name":"Wuhan University","ror":"https://ror.org/033vjfk17","country_code":"CN","type":"education","lineage":["https://openalex.org/I37461747"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Hui Chang","raw_affiliation_strings":["Wuhan University School of Electrical Engineering, Wuhan, China","Sch. Of Electr. Eng., Wuhan Univ., Wuhan, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Wuhan University School of Electrical Engineering, Wuhan, China","institution_ids":["https://openalex.org/I37461747"]},{"raw_affiliation_string":"Sch. Of Electr. Eng., Wuhan Univ., Wuhan, China","institution_ids":["https://openalex.org/I37461747"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5102095435","display_name":"Tianyuan Tan","orcid":null},"institutions":[{"id":"https://openalex.org/I37461747","display_name":"Wuhan University","ror":"https://ror.org/033vjfk17","country_code":"CN","type":"education","lineage":["https://openalex.org/I37461747"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Tianyuan Tan","raw_affiliation_strings":["Wuhan University School of Electrical Engineering, Wuhan, China","Sch. Of Electr. Eng., Wuhan Univ., Wuhan, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Wuhan University School of Electrical Engineering, Wuhan, China","institution_ids":["https://openalex.org/I37461747"]},{"raw_affiliation_string":"Sch. Of Electr. Eng., Wuhan Univ., Wuhan, China","institution_ids":["https://openalex.org/I37461747"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5074537183","display_name":"Jiangjun Ruan","orcid":"https://orcid.org/0000-0002-1557-7211"},"institutions":[{"id":"https://openalex.org/I37461747","display_name":"Wuhan University","ror":"https://ror.org/033vjfk17","country_code":"CN","type":"education","lineage":["https://openalex.org/I37461747"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"JiangJun Ruan","raw_affiliation_strings":["Wuhan University School of Electrical Engineering, Wuhan, China","Sch. Of Electr. Eng., Wuhan Univ., Wuhan, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Wuhan University School of Electrical Engineering, Wuhan, China","institution_ids":["https://openalex.org/I37461747"]},{"raw_affiliation_string":"Sch. Of Electr. Eng., Wuhan Univ., Wuhan, China","institution_ids":["https://openalex.org/I37461747"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5103190848","display_name":"Yunpeng Gao","orcid":"https://orcid.org/0000-0003-1461-2297"},"institutions":[{"id":"https://openalex.org/I37461747","display_name":"Wuhan University","ror":"https://ror.org/033vjfk17","country_code":"CN","type":"education","lineage":["https://openalex.org/I37461747"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yunpeng Gao","raw_affiliation_strings":["Wuhan University School of Electrical Engineering, Wuhan, China","Sch. Of Electr. Eng., Wuhan Univ., Wuhan, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Wuhan University School of Electrical Engineering, Wuhan, China","institution_ids":["https://openalex.org/I37461747"]},{"raw_affiliation_string":"Sch. Of Electr. Eng., Wuhan Univ., Wuhan, China","institution_ids":["https://openalex.org/I37461747"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5026695455","display_name":"Kaipei Liu","orcid":"https://orcid.org/0000-0001-8890-3623"},"institutions":[{"id":"https://openalex.org/I37461747","display_name":"Wuhan University","ror":"https://ror.org/033vjfk17","country_code":"CN","type":"education","lineage":["https://openalex.org/I37461747"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Kaipei Liu","raw_affiliation_strings":["Wuhan University School of Electrical Engineering, Wuhan, China","Sch. Of Electr. Eng., Wuhan Univ., Wuhan, China"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Wuhan University School of Electrical Engineering, Wuhan, China","institution_ids":["https://openalex.org/I37461747"]},{"raw_affiliation_string":"Sch. Of Electr. Eng., Wuhan Univ., Wuhan, China","institution_ids":["https://openalex.org/I37461747"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I37461747"],"apc_list":null,"apc_paid":null,"fwci":null,"has_fulltext":false,"cited_by_count":16,"citation_normalized_percentile":null,"cited_by_percentile_year":null,"biblio":{"volume":"35","issue":null,"first_page":"7388","last_page":"7393"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10511","display_name":"High voltage insulation and dielectric phenomena","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10511","display_name":"High voltage insulation and dielectric phenomena","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2505","display_name":"Materials Chemistry"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12804","display_name":"Thermal Analysis in Power Transmission","score":0.9994999766349792,"subfield":{"id":"https://openalex.org/subfields/2207","display_name":"Control and Systems Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12737","display_name":"Electrical Fault Detection and Protection","score":0.9973999857902527,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/joint","display_name":"Joint (building)","score":0.8555976748466492},{"id":"https://openalex.org/keywords/conductor","display_name":"Conductor","score":0.8184959292411804},{"id":"https://openalex.org/keywords/temperature-measurement","display_name":"Temperature measurement","score":0.6148837208747864},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.6041824817657471},{"id":"https://openalex.org/keywords/line","display_name":"Line (geometry)","score":0.4483706057071686},{"id":"https://openalex.org/keywords/structural-engineering","display_name":"Structural engineering","score":0.441177099943161},{"id":"https://openalex.org/keywords/steady-state","display_name":"Steady state (chemistry)","score":0.4291744530200958},{"id":"https://openalex.org/keywords/electrical-conductor","display_name":"Electrical conductor","score":0.4235718846321106},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.36297228932380676},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.36058250069618225},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.35961776971817017},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.35009127855300903},{"id":"https://openalex.org/keywords/mechanical-engineering","display_name":"Mechanical engineering","score":0.324262797832489},{"id":"https://openalex.org/keywords/geology","display_name":"Geology","score":0.17307204008102417},{"id":"https://openalex.org/keywords/composite-material","display_name":"Composite material","score":0.16794532537460327},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.13944017887115479},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.1017269492149353},{"id":"https://openalex.org/keywords/geometry","display_name":"Geometry","score":0.07047098875045776}],"concepts":[{"id":"https://openalex.org/C18555067","wikidata":"https://www.wikidata.org/wiki/Q8375051","display_name":"Joint (building)","level":2,"score":0.8555976748466492},{"id":"https://openalex.org/C34800285","wikidata":"https://www.wikidata.org/wiki/Q5159395","display_name":"Conductor","level":2,"score":0.8184959292411804},{"id":"https://openalex.org/C72293138","wikidata":"https://www.wikidata.org/wiki/Q909741","display_name":"Temperature measurement","level":2,"score":0.6148837208747864},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.6041824817657471},{"id":"https://openalex.org/C198352243","wikidata":"https://www.wikidata.org/wiki/Q37105","display_name":"Line (geometry)","level":2,"score":0.4483706057071686},{"id":"https://openalex.org/C66938386","wikidata":"https://www.wikidata.org/wiki/Q633538","display_name":"Structural engineering","level":1,"score":0.441177099943161},{"id":"https://openalex.org/C8171440","wikidata":"https://www.wikidata.org/wiki/Q903414","display_name":"Steady state (chemistry)","level":2,"score":0.4291744530200958},{"id":"https://openalex.org/C202374169","wikidata":"https://www.wikidata.org/wiki/Q124291","display_name":"Electrical conductor","level":2,"score":0.4235718846321106},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.36297228932380676},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.36058250069618225},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.35961776971817017},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.35009127855300903},{"id":"https://openalex.org/C78519656","wikidata":"https://www.wikidata.org/wiki/Q101333","display_name":"Mechanical engineering","level":1,"score":0.324262797832489},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.17307204008102417},{"id":"https://openalex.org/C159985019","wikidata":"https://www.wikidata.org/wiki/Q181790","display_name":"Composite material","level":1,"score":0.16794532537460327},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.13944017887115479},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.1017269492149353},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.07047098875045776},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.0},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0},{"id":"https://openalex.org/C147789679","wikidata":"https://www.wikidata.org/wiki/Q11372","display_name":"Physical chemistry","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/iecon.2013.6700362","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iecon.2013.6700362","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IECON 2013 - 39th Annual Conference of the IEEE Industrial Electronics Society","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":9,"referenced_works":["https://openalex.org/W1967261906","https://openalex.org/W1986439952","https://openalex.org/W2097980262","https://openalex.org/W2100671969","https://openalex.org/W2110149042","https://openalex.org/W2362861737","https://openalex.org/W2377946118","https://openalex.org/W2379626490","https://openalex.org/W2389534201"],"related_works":["https://openalex.org/W2154897855","https://openalex.org/W2773988189","https://openalex.org/W2249187501","https://openalex.org/W2393055178","https://openalex.org/W2187298936","https://openalex.org/W4248332891","https://openalex.org/W3120082514","https://openalex.org/W4241030107","https://openalex.org/W4232801483","https://openalex.org/W4232959502"],"abstract_inverted_index":{"The":[0],"cable":[1,11,17,38,42,75],"joint":[2,18,76],"faults":[3],"account":[4],"for":[5],"a":[6,32],"large":[7],"percentage":[8],"in":[9],"the":[10,13,16,25,41,51,58,64,67,74],"accidents,":[12],"temperature":[14,34,53,65,77],"of":[15,37,66],"is":[19],"an":[20],"important":[21],"parameter":[22],"that":[23],"reflects":[24],"cable's":[26],"running":[27],"state.":[28],"This":[29],"paper":[30],"proposes":[31],"conductor":[33],"retrieval":[35],"algorithm":[36],"joint.":[39],"With":[40],"skin":[43],"and":[44,80],"metal":[45],"sheath":[46],"temperature,":[47],"this":[48],"method":[49,61],"uses":[50],"steady-state":[52],"rise":[54],"coefficient":[55],"obtained":[56],"by":[57],"least":[59],"square":[60],"to":[62,73],"reverse":[63],"conductor.":[68],"It":[69],"can":[70],"be":[71],"applied":[72],"on-line":[78],"monitoring":[79],"fault":[81],"diagnosis.":[82]},"counts_by_year":[{"year":2025,"cited_by_count":2},{"year":2024,"cited_by_count":7},{"year":2023,"cited_by_count":2},{"year":2022,"cited_by_count":1},{"year":2020,"cited_by_count":1},{"year":2019,"cited_by_count":1},{"year":2017,"cited_by_count":2}],"updated_date":"2026-07-14T23:27:15.235271","created_date":"2025-10-10T00:00:00"}