{"id":"https://openalex.org/W1997824830","doi":"https://doi.org/10.1109/iecon.2012.6389349","title":"Lifetime prediction of IGBT in a STATCOM using modified-graphical rainflow counting algorithm","display_name":"Lifetime prediction of IGBT in a STATCOM using modified-graphical rainflow counting algorithm","publication_year":2012,"publication_date":"2012-10-01","ids":{"openalex":"https://openalex.org/W1997824830","doi":"https://doi.org/10.1109/iecon.2012.6389349","mag":"1997824830"},"language":"en","primary_location":{"id":"doi:10.1109/iecon.2012.6389349","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iecon.2012.6389349","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IECON 2012 - 38th Annual Conference on IEEE Industrial Electronics Society","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":true,"oa_status":"green","oa_url":"https://www.osti.gov/servlets/purl/1093756","any_repository_has_fulltext":true},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5076441136","display_name":"Lakshmi GopiReddy","orcid":null},"institutions":[{"id":"https://openalex.org/I75027704","display_name":"University of Tennessee at Knoxville","ror":"https://ror.org/020f3ap87","country_code":"US","type":"education","lineage":["https://openalex.org/I75027704"]}],"countries":["US"],"is_corresponding":true,"raw_author_name":"Lakshmi GopiReddy","raw_affiliation_strings":["Electrical Engineering and Computer Science Department, The University of Tennessee, Knoxville, TN, USA","Electrical Engineering and Computer Science Department, The University of Tennessee, Knoxville, USA"],"affiliations":[{"raw_affiliation_string":"Electrical Engineering and Computer Science Department, The University of Tennessee, Knoxville, TN, USA","institution_ids":["https://openalex.org/I75027704"]},{"raw_affiliation_string":"Electrical Engineering and Computer Science Department, The University of Tennessee, Knoxville, USA","institution_ids":["https://openalex.org/I75027704"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5014930285","display_name":"Leon M. Tolbert","orcid":"https://orcid.org/0000-0002-7285-609X"},"institutions":[{"id":"https://openalex.org/I75027704","display_name":"University of Tennessee at Knoxville","ror":"https://ror.org/020f3ap87","country_code":"US","type":"education","lineage":["https://openalex.org/I75027704"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Leon M. Tolbert","raw_affiliation_strings":["Electrical Engineering and Computer Science Department, The University of Tennessee, Knoxville, TN, USA","Electrical Engineering and Computer Science Department, The University of Tennessee, Knoxville, USA"],"affiliations":[{"raw_affiliation_string":"Electrical Engineering and Computer Science Department, The University of Tennessee, Knoxville, TN, USA","institution_ids":["https://openalex.org/I75027704"]},{"raw_affiliation_string":"Electrical Engineering and Computer Science Department, The University of Tennessee, Knoxville, USA","institution_ids":["https://openalex.org/I75027704"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5000404906","display_name":"Burak Ozpineci","orcid":"https://orcid.org/0000-0002-1672-3348"},"institutions":[{"id":"https://openalex.org/I1289243028","display_name":"Oak Ridge National Laboratory","ror":"https://ror.org/01qz5mb56","country_code":"US","type":"facility","lineage":["https://openalex.org/I1289243028","https://openalex.org/I1330989302","https://openalex.org/I39565521","https://openalex.org/I4210159294"]}],"countries":["US"],"is_corresponding":false,"raw_author_name":"Burak Ozpineci","raw_affiliation_strings":["Power Electronics and Electric Machinery Group, Oak Ridge National Laboratory, Oak Ridge, TN, USA","Power Electronics and Electric Machinery Group, Oak Ridge National Laboratory, TN, USA"],"affiliations":[{"raw_affiliation_string":"Power Electronics and Electric Machinery Group, Oak Ridge National Laboratory, Oak Ridge, TN, USA","institution_ids":["https://openalex.org/I1289243028"]},{"raw_affiliation_string":"Power Electronics and Electric Machinery Group, Oak Ridge National Laboratory, TN, USA","institution_ids":["https://openalex.org/I1289243028"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":3,"corresponding_author_ids":["https://openalex.org/A5076441136"],"corresponding_institution_ids":["https://openalex.org/I75027704"],"apc_list":null,"apc_paid":null,"fwci":1.9972,"has_fulltext":true,"cited_by_count":17,"citation_normalized_percentile":{"value":0.87087264,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":98},"biblio":{"volume":null,"issue":null,"first_page":"3425","last_page":"3430"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10361","display_name":"Silicon Carbide Semiconductor Technologies","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10361","display_name":"Silicon Carbide Semiconductor Technologies","score":0.9995999932289124,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T12495","display_name":"Electrostatic Discharge in Electronics","score":0.9940999746322632,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11444","display_name":"Electromagnetic Compatibility and Noise Suppression","score":0.9934999942779541,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.7581311464309692},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6231334209442139},{"id":"https://openalex.org/keywords/point","display_name":"Point (geometry)","score":0.456494003534317},{"id":"https://openalex.org/keywords/mathematics","display_name":"Mathematics","score":0.2118951678276062}],"concepts":[{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.7581311464309692},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6231334209442139},{"id":"https://openalex.org/C28719098","wikidata":"https://www.wikidata.org/wiki/Q44946","display_name":"Point (geometry)","level":2,"score":0.456494003534317},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.2118951678276062},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/iecon.2012.6389349","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iecon.2012.6389349","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IECON 2012 - 38th Annual Conference on IEEE Industrial Electronics Society","raw_type":"proceedings-article"},{"id":"pmh:oai:osti.gov:1093756","is_oa":true,"landing_page_url":"https://www.osti.gov/biblio/1093756","pdf_url":"https://www.osti.gov/servlets/purl/1093756","source":{"id":"https://openalex.org/S4306402487","display_name":"OSTI OAI (U.S. Department of Energy Office of Scientific and Technical Information)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I139351228","host_organization_name":"Office of Scientific and Technical Information","host_organization_lineage":["https://openalex.org/I139351228"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":null}],"best_oa_location":{"id":"pmh:oai:osti.gov:1093756","is_oa":true,"landing_page_url":"https://www.osti.gov/biblio/1093756","pdf_url":"https://www.osti.gov/servlets/purl/1093756","source":{"id":"https://openalex.org/S4306402487","display_name":"OSTI OAI (U.S. Department of Energy Office of Scientific and Technical Information)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I139351228","host_organization_name":"Office of Scientific and Technical Information","host_organization_lineage":["https://openalex.org/I139351228"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":null,"raw_type":null},"sustainable_development_goals":[],"awards":[],"funders":[{"id":"https://openalex.org/F4320306076","display_name":"National Science Foundation","ror":"https://ror.org/021nxhr62"},{"id":"https://openalex.org/F4320306084","display_name":"U.S. Department of Energy","ror":"https://ror.org/01bj3aw27"},{"id":"https://openalex.org/F4320338287","display_name":"Oak Ridge National Laboratory","ror":"https://ror.org/01qz5mb56"}],"has_content":{"grobid_xml":true,"pdf":true},"content_urls":{"pdf":"https://content.openalex.org/works/W1997824830.pdf","grobid_xml":"https://content.openalex.org/works/W1997824830.grobid-xml"},"referenced_works_count":22,"referenced_works":["https://openalex.org/W402337948","https://openalex.org/W1559509074","https://openalex.org/W2002071358","https://openalex.org/W2008278324","https://openalex.org/W2012475895","https://openalex.org/W2014176667","https://openalex.org/W2027804695","https://openalex.org/W2042801611","https://openalex.org/W2064914650","https://openalex.org/W2097114046","https://openalex.org/W2108776657","https://openalex.org/W2109220097","https://openalex.org/W2109487844","https://openalex.org/W2117029960","https://openalex.org/W2120817769","https://openalex.org/W2123174016","https://openalex.org/W2157909183","https://openalex.org/W2170532550","https://openalex.org/W3010319276","https://openalex.org/W3151178879","https://openalex.org/W4285719527","https://openalex.org/W6633492549"],"related_works":["https://openalex.org/W4391375266","https://openalex.org/W2748952813","https://openalex.org/W2051487156","https://openalex.org/W2073681303","https://openalex.org/W2390279801","https://openalex.org/W2358668433","https://openalex.org/W4396701345","https://openalex.org/W2376932109","https://openalex.org/W2001405890","https://openalex.org/W4396696052"],"abstract_inverted_index":{"Rainflow":[0,29],"algorithms":[1,114],"are":[2],"one":[3],"of":[4,38,46,50,83,110,122,144,151,159],"the":[5,22,44,47,58,62,81,108,111,117,136,149,160,168],"best":[6],"counting":[7],"methods":[8],"used":[9],"in":[10,76,120,147],"fatigue":[11],"and":[12,74,127,130],"failure":[13],"analysis":[14],"[17].":[15],"There":[16],"have":[17],"been":[18],"many":[19],"approaches":[20],"to":[21,79,141,172],"rainflow":[23,51,85,89,113,137],"algorithm,":[24,52],"some":[25],"proposing":[26],"modifications.":[27],"Graphical":[28],"Method":[30],"(GRM)":[31],"was":[32],"proposed":[33,118],"recently":[34],"with":[35],"a":[36,152],"claim":[37],"faster":[39],"execution":[40,123],"times":[41],"[10].":[42],"However,":[43],"steps":[45],"graphical":[48,70,84],"method":[49,71],"when":[53],"implemented,":[54],"do":[55],"not":[56],"generate":[57],"same":[59],"output":[60],"as":[61],"four-point":[63,93],"or":[64],"ASTM":[65],"standard":[66],"algorithm.":[67,86],"A":[68,87,105],"modified":[69],"is":[72,102,133,139,170],"presented":[73],"discussed":[75],"this":[77],"paper":[78],"overcome":[80],"shortcomings":[82],"fast":[88],"algorithm":[90,94,138],"based":[91],"on":[92],"but":[95],"considering":[96],"point":[97],"comparison":[98,101,106],"than":[99],"range":[100],"also":[103],"presented.":[104,134],"between":[107],"performances":[109],"common":[112],"[6-10],":[115],"including":[116],"methods,":[119],"terms":[121],"time,":[124],"memory":[125],"used,":[126],"efficiency,":[128],"complexity,":[129],"load":[131,165],"sequences":[132],"Finally,":[135],"applied":[140],"temperature":[142],"data":[143,164],"an":[145],"IGBT":[146],"assessing":[148],"lifetime":[150,169],"STATCOM":[153],"operating":[154],"for":[155],"power":[156],"factor":[157],"correction":[158],"load.":[161],"From":[162],"5-minute":[163],"profiles":[166],"available,":[167],"estimated":[171],"be":[173],"at":[174],"3.4":[175],"years.":[176]},"counts_by_year":[{"year":2024,"cited_by_count":2},{"year":2023,"cited_by_count":2},{"year":2022,"cited_by_count":1},{"year":2021,"cited_by_count":1},{"year":2019,"cited_by_count":1},{"year":2017,"cited_by_count":2},{"year":2015,"cited_by_count":4},{"year":2014,"cited_by_count":3},{"year":2013,"cited_by_count":1}],"updated_date":"2026-04-05T17:49:38.594831","created_date":"2025-10-10T00:00:00"}