{"id":"https://openalex.org/W2059305098","doi":"https://doi.org/10.1109/iecon.2012.6388788","title":"Experimental verification of energy efficiency enhancement in power electronics at partial load","display_name":"Experimental verification of energy efficiency enhancement in power electronics at partial load","publication_year":2012,"publication_date":"2012-10-01","ids":{"openalex":"https://openalex.org/W2059305098","doi":"https://doi.org/10.1109/iecon.2012.6388788","mag":"2059305098"},"language":"en","primary_location":{"id":"doi:10.1109/iecon.2012.6388788","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iecon.2012.6388788","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IECON 2012 - 38th Annual Conference on IEEE Industrial Electronics Society","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5061433932","display_name":"Klaus Muehlbauer","orcid":null},"institutions":[{"id":"https://openalex.org/I40527276","display_name":"Universit\u00e4t der Bundeswehr M\u00fcnchen","ror":"https://ror.org/05kkv3f82","country_code":"DE","type":"education","lineage":["https://openalex.org/I1315109972","https://openalex.org/I40527276","https://openalex.org/I4387152969"]}],"countries":["DE"],"is_corresponding":true,"raw_author_name":"Klaus Muehlbauer","raw_affiliation_strings":["Institute of Electrical Drives and Actuators, Universitaet der Bundeswehr Muenchen, Germany"],"affiliations":[{"raw_affiliation_string":"Institute of Electrical Drives and Actuators, Universitaet der Bundeswehr Muenchen, Germany","institution_ids":["https://openalex.org/I40527276"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5013155565","display_name":"Dieter Gerling","orcid":"https://orcid.org/0000-0002-1831-154X"},"institutions":[{"id":"https://openalex.org/I40527276","display_name":"Universit\u00e4t der Bundeswehr M\u00fcnchen","ror":"https://ror.org/05kkv3f82","country_code":"DE","type":"education","lineage":["https://openalex.org/I1315109972","https://openalex.org/I40527276","https://openalex.org/I4387152969"]}],"countries":["DE"],"is_corresponding":false,"raw_author_name":"Dieter Gerling","raw_affiliation_strings":["Institute of Electrical Drives and Actuators, Universitaet der Bundeswehr Muenchen, Germany"],"affiliations":[{"raw_affiliation_string":"Institute of Electrical Drives and Actuators, Universitaet der Bundeswehr Muenchen, Germany","institution_ids":["https://openalex.org/I40527276"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":2,"corresponding_author_ids":["https://openalex.org/A5061433932"],"corresponding_institution_ids":["https://openalex.org/I40527276"],"apc_list":null,"apc_paid":null,"fwci":0.7365,"has_fulltext":false,"cited_by_count":4,"citation_normalized_percentile":{"value":0.7447671,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":94},"biblio":{"volume":null,"issue":null,"first_page":"394","last_page":"397"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10361","display_name":"Silicon Carbide Semiconductor Technologies","score":0.9994000196456909,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10361","display_name":"Silicon Carbide Semiconductor Technologies","score":0.9994000196456909,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11444","display_name":"Electromagnetic Compatibility and Noise Suppression","score":0.9965999722480774,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10278","display_name":"Electric Motor Design and Analysis","score":0.9937999844551086,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/power-electronics","display_name":"Power electronics","score":0.7861160635948181},{"id":"https://openalex.org/keywords/transistor","display_name":"Transistor","score":0.6376848220825195},{"id":"https://openalex.org/keywords/test-bench","display_name":"Test bench","score":0.5437535047531128},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.5337762832641602},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.5321589708328247},{"id":"https://openalex.org/keywords/power-semiconductor-device","display_name":"Power semiconductor device","score":0.5292187333106995},{"id":"https://openalex.org/keywords/electronics","display_name":"Electronics","score":0.507332980632782},{"id":"https://openalex.org/keywords/chip","display_name":"Chip","score":0.4929211139678955},{"id":"https://openalex.org/keywords/efficient-energy-use","display_name":"Efficient energy use","score":0.4831787645816803},{"id":"https://openalex.org/keywords/diode","display_name":"Diode","score":0.4635187089443207},{"id":"https://openalex.org/keywords/power-module","display_name":"Power module","score":0.4133548140525818},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.4034087061882019},{"id":"https://openalex.org/keywords/automotive-engineering","display_name":"Automotive engineering","score":0.40116259455680847},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.28868305683135986},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.24640387296676636},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.07009461522102356}],"concepts":[{"id":"https://openalex.org/C178911571","wikidata":"https://www.wikidata.org/wiki/Q593143","display_name":"Power electronics","level":3,"score":0.7861160635948181},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.6376848220825195},{"id":"https://openalex.org/C2776266606","wikidata":"https://www.wikidata.org/wiki/Q476482","display_name":"Test bench","level":2,"score":0.5437535047531128},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.5337762832641602},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.5321589708328247},{"id":"https://openalex.org/C129014197","wikidata":"https://www.wikidata.org/wiki/Q906544","display_name":"Power semiconductor device","level":3,"score":0.5292187333106995},{"id":"https://openalex.org/C138331895","wikidata":"https://www.wikidata.org/wiki/Q11650","display_name":"Electronics","level":2,"score":0.507332980632782},{"id":"https://openalex.org/C165005293","wikidata":"https://www.wikidata.org/wiki/Q1074500","display_name":"Chip","level":2,"score":0.4929211139678955},{"id":"https://openalex.org/C2742236","wikidata":"https://www.wikidata.org/wiki/Q924713","display_name":"Efficient energy use","level":2,"score":0.4831787645816803},{"id":"https://openalex.org/C78434282","wikidata":"https://www.wikidata.org/wiki/Q11656","display_name":"Diode","level":2,"score":0.4635187089443207},{"id":"https://openalex.org/C141812795","wikidata":"https://www.wikidata.org/wiki/Q7236534","display_name":"Power module","level":3,"score":0.4133548140525818},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4034087061882019},{"id":"https://openalex.org/C171146098","wikidata":"https://www.wikidata.org/wiki/Q124192","display_name":"Automotive engineering","level":1,"score":0.40116259455680847},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.28868305683135986},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.24640387296676636},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.07009461522102356},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/iecon.2012.6388788","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iecon.2012.6388788","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IECON 2012 - 38th Annual Conference on IEEE Industrial Electronics Society","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"score":0.9100000262260437,"display_name":"Affordable and clean energy","id":"https://metadata.un.org/sdg/7"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":8,"referenced_works":["https://openalex.org/W152663305","https://openalex.org/W1977623571","https://openalex.org/W2140930626","https://openalex.org/W2172068800","https://openalex.org/W2406011150","https://openalex.org/W4229976411","https://openalex.org/W4285719527","https://openalex.org/W4300555804"],"related_works":["https://openalex.org/W274769908","https://openalex.org/W4386159450","https://openalex.org/W1535176231","https://openalex.org/W2184546999","https://openalex.org/W2365691020","https://openalex.org/W1481775718","https://openalex.org/W2545132375","https://openalex.org/W2416033565","https://openalex.org/W3090421928","https://openalex.org/W2328046896"],"abstract_inverted_index":{"In":[0],"this":[1],"paper":[2],"two":[3],"arrangements":[4],"for":[5],"reducing":[6],"the":[7,28,32,40,49,52,70,75,85,98,103,107],"power":[8,11,100,104],"losses":[9,42,101],"in":[10,19,55],"electronics":[12,105],"of":[13,31,51,69,74,84,91,102,109],"an":[14,37],"electric":[15,53],"drive":[16],"are":[17],"verified":[18],"a":[20,67,82],"test":[21],"bench.":[22],"Firstly,":[23],"it":[24,63],"is":[25,64],"proven":[26],"that":[27,66],"chip":[29,72],"area":[30,73],"transistors":[33],"and":[34,43],"diodes":[35],"has":[36,44],"impact":[38],"on":[39],"switching":[41,86],"to":[45,48,57,81,96],"be":[46,94],"adapted":[47],"requirements":[50],"machine":[54],"order":[56],"operate":[58],"at":[59,114],"maximum":[60],"efficiency.":[61],"Secondly,":[62],"demonstrated":[65],"variation":[68],"conducting":[71],"IGBTs":[76],"during":[77],"operation":[78],"also":[79],"leads":[80],"reduction":[83],"losses.":[87],"This":[88],"additional":[89],"degree":[90],"freedom":[92],"can":[93],"used":[95],"optimize":[97],"total":[99],"with":[106],"effect":[108],"higher":[110],"energy":[111],"efficiency":[112],"especially":[113],"partial":[115],"load.":[116]},"counts_by_year":[{"year":2017,"cited_by_count":1},{"year":2015,"cited_by_count":1},{"year":2014,"cited_by_count":1},{"year":2012,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}