{"id":"https://openalex.org/W2094451956","doi":"https://doi.org/10.1109/iecon.2012.6388761","title":"New Method of EMI analysis in power electronics based on semiconductors transient models: Application to SiC MOSFET/Schottky diode","display_name":"New Method of EMI analysis in power electronics based on semiconductors transient models: Application to SiC MOSFET/Schottky diode","publication_year":2012,"publication_date":"2012-10-01","ids":{"openalex":"https://openalex.org/W2094451956","doi":"https://doi.org/10.1109/iecon.2012.6388761","mag":"2094451956"},"language":"en","primary_location":{"id":"doi:10.1109/iecon.2012.6388761","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iecon.2012.6388761","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IECON 2012 - 38th Annual Conference on IEEE Industrial Electronics Society","raw_type":"proceedings-article"},"type":"preprint","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5069412932","display_name":"Slim Hrigua","orcid":null},"institutions":[{"id":"https://openalex.org/I4210136613","display_name":"Laboratoire des syst\u00e8mes et applications des technologies de l'information et de l'\u00e9nergie","ror":"https://ror.org/03vam5b06","country_code":"FR","type":"facility","lineage":["https://openalex.org/I11559806","https://openalex.org/I124158823","https://openalex.org/I1294671590","https://openalex.org/I277688954","https://openalex.org/I277688954","https://openalex.org/I4210134562","https://openalex.org/I4210136613","https://openalex.org/I4210142324","https://openalex.org/I4210154111"]},{"id":"https://openalex.org/I11559806","display_name":"\u00c9cole Normale Sup\u00e9rieure Paris-Saclay","ror":"https://ror.org/00hx6zz33","country_code":"FR","type":"education","lineage":["https://openalex.org/I11559806","https://openalex.org/I277688954"]}],"countries":["FR"],"is_corresponding":true,"raw_author_name":"Slim Hrigua","raw_affiliation_strings":["SATIE ENS Cachan 61, Av President Wilson, Cachan, France","SATIE ENS Cachan 61, Av President Wilson, France"],"affiliations":[{"raw_affiliation_string":"SATIE ENS Cachan 61, Av President Wilson, Cachan, France","institution_ids":["https://openalex.org/I11559806","https://openalex.org/I4210136613"]},{"raw_affiliation_string":"SATIE ENS Cachan 61, Av President Wilson, France","institution_ids":["https://openalex.org/I4210136613","https://openalex.org/I11559806"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5107871565","display_name":"Fran\u00e7ois Costa","orcid":null},"institutions":[{"id":"https://openalex.org/I11559806","display_name":"\u00c9cole Normale Sup\u00e9rieure Paris-Saclay","ror":"https://ror.org/00hx6zz33","country_code":"FR","type":"education","lineage":["https://openalex.org/I11559806","https://openalex.org/I277688954"]},{"id":"https://openalex.org/I197681013","display_name":"Universit\u00e9 Paris-Est Cr\u00e9teil","ror":"https://ror.org/05ggc9x40","country_code":"FR","type":"education","lineage":["https://openalex.org/I197681013"]},{"id":"https://openalex.org/I4210136613","display_name":"Laboratoire des syst\u00e8mes et applications des technologies de l'information et de l'\u00e9nergie","ror":"https://ror.org/03vam5b06","country_code":"FR","type":"facility","lineage":["https://openalex.org/I11559806","https://openalex.org/I124158823","https://openalex.org/I1294671590","https://openalex.org/I277688954","https://openalex.org/I277688954","https://openalex.org/I4210134562","https://openalex.org/I4210136613","https://openalex.org/I4210142324","https://openalex.org/I4210154111"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"Francois Costa","raw_affiliation_strings":["SATIE ENS Cachan 61, Av President Wilson, Cachan, France","SATIE ENS Cachan 61, Av President Wilson, France","Universit\u00e9 Paris-Est Cr\u00e9teil, Saint Denis, France"],"affiliations":[{"raw_affiliation_string":"SATIE ENS Cachan 61, Av President Wilson, Cachan, France","institution_ids":["https://openalex.org/I11559806","https://openalex.org/I4210136613"]},{"raw_affiliation_string":"SATIE ENS Cachan 61, Av President Wilson, France","institution_ids":["https://openalex.org/I4210136613","https://openalex.org/I11559806"]},{"raw_affiliation_string":"Universit\u00e9 Paris-Est Cr\u00e9teil, Saint Denis, France","institution_ids":["https://openalex.org/I197681013"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5026162787","display_name":"Cyrille Gautier","orcid":null},"institutions":[{"id":"https://openalex.org/I4210136613","display_name":"Laboratoire des syst\u00e8mes et applications des technologies de l'information et de l'\u00e9nergie","ror":"https://ror.org/03vam5b06","country_code":"FR","type":"facility","lineage":["https://openalex.org/I11559806","https://openalex.org/I124158823","https://openalex.org/I1294671590","https://openalex.org/I277688954","https://openalex.org/I277688954","https://openalex.org/I4210134562","https://openalex.org/I4210136613","https://openalex.org/I4210142324","https://openalex.org/I4210154111"]},{"id":"https://openalex.org/I4210127465","display_name":"Instituts Universitaires de Technologie","ror":"https://ror.org/03f099r71","country_code":"FR","type":"education","lineage":["https://openalex.org/I4210127465"]},{"id":"https://openalex.org/I11559806","display_name":"\u00c9cole Normale Sup\u00e9rieure Paris-Saclay","ror":"https://ror.org/00hx6zz33","country_code":"FR","type":"education","lineage":["https://openalex.org/I11559806","https://openalex.org/I277688954"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"Cyrille Gautier","raw_affiliation_strings":["IUT de Ville d'Avray, France","SATIE ENS Cachan 61, Av President Wilson, Cachan, France"],"affiliations":[{"raw_affiliation_string":"IUT de Ville d'Avray, France","institution_ids":["https://openalex.org/I4210127465"]},{"raw_affiliation_string":"SATIE ENS Cachan 61, Av President Wilson, Cachan, France","institution_ids":["https://openalex.org/I11559806","https://openalex.org/I4210136613"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5090781617","display_name":"Bertrand Revol","orcid":"https://orcid.org/0000-0002-6068-5086"},"institutions":[{"id":"https://openalex.org/I4210136613","display_name":"Laboratoire des syst\u00e8mes et applications des technologies de l'information et de l'\u00e9nergie","ror":"https://ror.org/03vam5b06","country_code":"FR","type":"facility","lineage":["https://openalex.org/I11559806","https://openalex.org/I124158823","https://openalex.org/I1294671590","https://openalex.org/I277688954","https://openalex.org/I277688954","https://openalex.org/I4210134562","https://openalex.org/I4210136613","https://openalex.org/I4210142324","https://openalex.org/I4210154111"]},{"id":"https://openalex.org/I11559806","display_name":"\u00c9cole Normale Sup\u00e9rieure Paris-Saclay","ror":"https://ror.org/00hx6zz33","country_code":"FR","type":"education","lineage":["https://openalex.org/I11559806","https://openalex.org/I277688954"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"Bertrand Revol","raw_affiliation_strings":["SATIE ENS Cachan 61, Av President Wilson, France"],"affiliations":[{"raw_affiliation_string":"SATIE ENS Cachan 61, Av President Wilson, France","institution_ids":["https://openalex.org/I4210136613","https://openalex.org/I11559806"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5069412932"],"corresponding_institution_ids":["https://openalex.org/I4210136613","https://openalex.org/I11559806"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":10,"citation_normalized_percentile":{"value":0.14654616,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":97},"biblio":{"volume":null,"issue":null,"first_page":"590","last_page":"595"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10361","display_name":"Silicon Carbide Semiconductor Technologies","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10361","display_name":"Silicon Carbide Semiconductor Technologies","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11444","display_name":"Electromagnetic Compatibility and Noise Suppression","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11222","display_name":"Magnetic Properties and Applications","score":0.987500011920929,"subfield":{"id":"https://openalex.org/subfields/2504","display_name":"Electronic, Optical and Magnetic Materials"},"field":{"id":"https://openalex.org/fields/25","display_name":"Materials Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/emi","display_name":"EMI","score":0.9079277515411377},{"id":"https://openalex.org/keywords/silicon-carbide","display_name":"Silicon carbide","score":0.7972489595413208},{"id":"https://openalex.org/keywords/electromagnetic-interference","display_name":"Electromagnetic interference","score":0.7373145818710327},{"id":"https://openalex.org/keywords/transient","display_name":"Transient (computer programming)","score":0.7147058248519897},{"id":"https://openalex.org/keywords/schottky-diode","display_name":"Schottky diode","score":0.6998903751373291},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.5858882665634155},{"id":"https://openalex.org/keywords/electronics","display_name":"Electronics","score":0.5760198831558228},{"id":"https://openalex.org/keywords/power-electronics","display_name":"Power electronics","score":0.5671138167381287},{"id":"https://openalex.org/keywords/waveform","display_name":"Waveform","score":0.5480138063430786},{"id":"https://openalex.org/keywords/mosfet","display_name":"MOSFET","score":0.5388095378875732},{"id":"https://openalex.org/keywords/diode","display_name":"Diode","score":0.45503804087638855},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.4252040386199951},{"id":"https://openalex.org/keywords/semiconductor","display_name":"Semiconductor","score":0.4184940457344055},{"id":"https://openalex.org/keywords/power-semiconductor-device","display_name":"Power semiconductor device","score":0.41141635179519653},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.40340161323547363},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.3799394369125366},{"id":"https://openalex.org/keywords/optoelectronics","display_name":"Optoelectronics","score":0.2620917558670044},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.25866711139678955},{"id":"https://openalex.org/keywords/transistor","display_name":"Transistor","score":0.16455301642417908},{"id":"https://openalex.org/keywords/voltage","display_name":"Voltage","score":0.12287378311157227}],"concepts":[{"id":"https://openalex.org/C43461449","wikidata":"https://www.wikidata.org/wiki/Q2495531","display_name":"EMI","level":3,"score":0.9079277515411377},{"id":"https://openalex.org/C2780722187","wikidata":"https://www.wikidata.org/wiki/Q412356","display_name":"Silicon carbide","level":2,"score":0.7972489595413208},{"id":"https://openalex.org/C184892835","wikidata":"https://www.wikidata.org/wiki/Q1474513","display_name":"Electromagnetic interference","level":2,"score":0.7373145818710327},{"id":"https://openalex.org/C2780799671","wikidata":"https://www.wikidata.org/wiki/Q17087362","display_name":"Transient (computer programming)","level":2,"score":0.7147058248519897},{"id":"https://openalex.org/C205200001","wikidata":"https://www.wikidata.org/wiki/Q176066","display_name":"Schottky diode","level":3,"score":0.6998903751373291},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.5858882665634155},{"id":"https://openalex.org/C138331895","wikidata":"https://www.wikidata.org/wiki/Q11650","display_name":"Electronics","level":2,"score":0.5760198831558228},{"id":"https://openalex.org/C178911571","wikidata":"https://www.wikidata.org/wiki/Q593143","display_name":"Power electronics","level":3,"score":0.5671138167381287},{"id":"https://openalex.org/C197424946","wikidata":"https://www.wikidata.org/wiki/Q1165717","display_name":"Waveform","level":3,"score":0.5480138063430786},{"id":"https://openalex.org/C2778413303","wikidata":"https://www.wikidata.org/wiki/Q210793","display_name":"MOSFET","level":4,"score":0.5388095378875732},{"id":"https://openalex.org/C78434282","wikidata":"https://www.wikidata.org/wiki/Q11656","display_name":"Diode","level":2,"score":0.45503804087638855},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.4252040386199951},{"id":"https://openalex.org/C108225325","wikidata":"https://www.wikidata.org/wiki/Q11456","display_name":"Semiconductor","level":2,"score":0.4184940457344055},{"id":"https://openalex.org/C129014197","wikidata":"https://www.wikidata.org/wiki/Q906544","display_name":"Power semiconductor device","level":3,"score":0.41141635179519653},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.40340161323547363},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.3799394369125366},{"id":"https://openalex.org/C49040817","wikidata":"https://www.wikidata.org/wiki/Q193091","display_name":"Optoelectronics","level":1,"score":0.2620917558670044},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.25866711139678955},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.16455301642417908},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.12287378311157227},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C191897082","wikidata":"https://www.wikidata.org/wiki/Q11467","display_name":"Metallurgy","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/iecon.2012.6388761","is_oa":false,"landing_page_url":"https://doi.org/10.1109/iecon.2012.6388761","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IECON 2012 - 38th Annual Conference on IEEE Industrial Electronics Society","raw_type":"proceedings-article"},{"id":"pmh:oai:HAL:hal-01688430v1","is_oa":false,"landing_page_url":"https://hal.science/hal-01688430","pdf_url":null,"source":{"id":"https://openalex.org/S4306402512","display_name":"HAL (Le Centre pour la Communication Scientifique Directe)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I1294671590","host_organization_name":"Centre National de la Recherche Scientifique","host_organization_lineage":["https://openalex.org/I1294671590"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"IECON 2012 - 38th Annual Conference on IEEE Industrial Electronics Society, Oct 2012, Montreal, Canada. ⟨10.1109/IECON.2012.6388761⟩","raw_type":"Conference papers"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Industry, innovation and infrastructure","id":"https://metadata.un.org/sdg/9","score":0.5899999737739563}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":6,"referenced_works":["https://openalex.org/W1968211401","https://openalex.org/W2113675759","https://openalex.org/W2143006907","https://openalex.org/W2146719088","https://openalex.org/W2164339935","https://openalex.org/W2168882421"],"related_works":["https://openalex.org/W76001227","https://openalex.org/W2349537384","https://openalex.org/W1986241886","https://openalex.org/W2041511579","https://openalex.org/W3120066331","https://openalex.org/W2549052135","https://openalex.org/W4385545073","https://openalex.org/W1921091955","https://openalex.org/W2163032211","https://openalex.org/W2587678315"],"abstract_inverted_index":{"International":[0],"audience":[1]},"counts_by_year":[{"year":2025,"cited_by_count":1},{"year":2022,"cited_by_count":1},{"year":2021,"cited_by_count":1},{"year":2020,"cited_by_count":2},{"year":2018,"cited_by_count":3},{"year":2017,"cited_by_count":1},{"year":2016,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}