{"id":"https://openalex.org/W2536416664","doi":"https://doi.org/10.1109/idt.2013.6727129","title":"An efficient BER-based reliability method for SRAM-based FPGA","display_name":"An efficient BER-based reliability method for SRAM-based FPGA","publication_year":2013,"publication_date":"2013-12-01","ids":{"openalex":"https://openalex.org/W2536416664","doi":"https://doi.org/10.1109/idt.2013.6727129","mag":"2536416664"},"language":"en","primary_location":{"id":"doi:10.1109/idt.2013.6727129","is_oa":false,"landing_page_url":"https://doi.org/10.1109/idt.2013.6727129","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2013 8th IEEE Design and Test Symposium","raw_type":"proceedings-article"},"type":"preprint","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5060097281","display_name":"Sahraoui Fouad","orcid":null},"institutions":[{"id":"https://openalex.org/I4210142324","display_name":"CY Cergy Paris Universit\u00e9","ror":"https://ror.org/043htjv09","country_code":"FR","type":"education","lineage":["https://openalex.org/I4210142324"]},{"id":"https://openalex.org/I4210148552","display_name":"Equipes Traitement de l'Information et Syst\u00e8mes","ror":"https://ror.org/0592ata02","country_code":"FR","type":"facility","lineage":["https://openalex.org/I1294671590","https://openalex.org/I1294671590","https://openalex.org/I4210142324","https://openalex.org/I4210148552","https://openalex.org/I4210159245","https://openalex.org/I86175216"]}],"countries":["FR"],"is_corresponding":true,"raw_author_name":"Fouad Sahraoui","raw_affiliation_strings":["ETIS, Cergy-Pontoise University, Cergy-Pontoise, FRANCE"],"affiliations":[{"raw_affiliation_string":"ETIS, Cergy-Pontoise University, Cergy-Pontoise, FRANCE","institution_ids":["https://openalex.org/I4210148552","https://openalex.org/I4210142324"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5079435024","display_name":"Fakhreddine Ghaffari","orcid":"https://orcid.org/0000-0002-0928-7963"},"institutions":[{"id":"https://openalex.org/I4210142324","display_name":"CY Cergy Paris Universit\u00e9","ror":"https://ror.org/043htjv09","country_code":"FR","type":"education","lineage":["https://openalex.org/I4210142324"]},{"id":"https://openalex.org/I4210148552","display_name":"Equipes Traitement de l'Information et Syst\u00e8mes","ror":"https://ror.org/0592ata02","country_code":"FR","type":"facility","lineage":["https://openalex.org/I1294671590","https://openalex.org/I1294671590","https://openalex.org/I4210142324","https://openalex.org/I4210148552","https://openalex.org/I4210159245","https://openalex.org/I86175216"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"Fakhreddine Ghaffari","raw_affiliation_strings":["ETIS, Cergy-Pontoise University, Cergy-Pontoise, FRANCE"],"affiliations":[{"raw_affiliation_string":"ETIS, Cergy-Pontoise University, Cergy-Pontoise, FRANCE","institution_ids":["https://openalex.org/I4210148552","https://openalex.org/I4210142324"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5106235156","display_name":"Mohamed El Amine Benkhelifa","orcid":null},"institutions":[{"id":"https://openalex.org/I4210142324","display_name":"CY Cergy Paris Universit\u00e9","ror":"https://ror.org/043htjv09","country_code":"FR","type":"education","lineage":["https://openalex.org/I4210142324"]},{"id":"https://openalex.org/I4210148552","display_name":"Equipes Traitement de l'Information et Syst\u00e8mes","ror":"https://ror.org/0592ata02","country_code":"FR","type":"facility","lineage":["https://openalex.org/I1294671590","https://openalex.org/I1294671590","https://openalex.org/I4210142324","https://openalex.org/I4210148552","https://openalex.org/I4210159245","https://openalex.org/I86175216"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"Mohamed El Amine Benkhelifa","raw_affiliation_strings":["ETIS, Cergy-Pontoise University, Cergy-Pontoise, FRANCE"],"affiliations":[{"raw_affiliation_string":"ETIS, Cergy-Pontoise University, Cergy-Pontoise, FRANCE","institution_ids":["https://openalex.org/I4210148552","https://openalex.org/I4210142324"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5057674250","display_name":"Bertrand Granado","orcid":"https://orcid.org/0000-0002-9667-9737"},"institutions":[{"id":"https://openalex.org/I4210159731","display_name":"LIP6","ror":"https://ror.org/05krcen59","country_code":"FR","type":"facility","lineage":["https://openalex.org/I1294671590","https://openalex.org/I1294671590","https://openalex.org/I39804081","https://openalex.org/I4210159245","https://openalex.org/I4210159731"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"Bertrand Granado","raw_affiliation_strings":["UPMC, CNRS UMR 7606, PARIS Cedex 05, FRANCE"],"affiliations":[{"raw_affiliation_string":"UPMC, CNRS UMR 7606, PARIS Cedex 05, FRANCE","institution_ids":["https://openalex.org/I4210159731"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5060097281"],"corresponding_institution_ids":["https://openalex.org/I4210142324","https://openalex.org/I4210148552"],"apc_list":null,"apc_paid":null,"fwci":0.7212,"has_fulltext":false,"cited_by_count":4,"citation_normalized_percentile":{"value":0.77016658,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":97},"biblio":{"volume":"3","issue":null,"first_page":"1","last_page":"6"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11005","display_name":"Radiation Effects in Electronics","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10772","display_name":"Distributed systems and fault tolerance","score":0.9988999962806702,"subfield":{"id":"https://openalex.org/subfields/1705","display_name":"Computer Networks and Communications"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10904","display_name":"Embedded Systems Design Techniques","score":0.9987000226974487,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/field-programmable-gate-array","display_name":"Field-programmable gate array","score":0.7999218702316284},{"id":"https://openalex.org/keywords/control-reconfiguration","display_name":"Control reconfiguration","score":0.7297626733779907},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.7279068827629089},{"id":"https://openalex.org/keywords/static-random-access-memory","display_name":"Static random-access memory","score":0.7260482907295227},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.7127106189727783},{"id":"https://openalex.org/keywords/overhead","display_name":"Overhead (engineering)","score":0.6476043462753296},{"id":"https://openalex.org/keywords/virtex","display_name":"Virtex","score":0.635804295539856},{"id":"https://openalex.org/keywords/single-event-upset","display_name":"Single event upset","score":0.6130411028862},{"id":"https://openalex.org/keywords/fault-injection","display_name":"Fault injection","score":0.592211127281189},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.5501443147659302},{"id":"https://openalex.org/keywords/soft-error","display_name":"Soft error","score":0.4630031883716583},{"id":"https://openalex.org/keywords/fault-tolerance","display_name":"Fault tolerance","score":0.43259960412979126},{"id":"https://openalex.org/keywords/simple","display_name":"Simple (philosophy)","score":0.41485995054244995},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.3793925642967224},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.13388824462890625},{"id":"https://openalex.org/keywords/operating-system","display_name":"Operating system","score":0.11357268691062927},{"id":"https://openalex.org/keywords/software","display_name":"Software","score":0.09886288642883301},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.07169970870018005}],"concepts":[{"id":"https://openalex.org/C42935608","wikidata":"https://www.wikidata.org/wiki/Q190411","display_name":"Field-programmable gate array","level":2,"score":0.7999218702316284},{"id":"https://openalex.org/C119701452","wikidata":"https://www.wikidata.org/wiki/Q5165881","display_name":"Control reconfiguration","level":2,"score":0.7297626733779907},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.7279068827629089},{"id":"https://openalex.org/C68043766","wikidata":"https://www.wikidata.org/wiki/Q267416","display_name":"Static random-access memory","level":2,"score":0.7260482907295227},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.7127106189727783},{"id":"https://openalex.org/C2779960059","wikidata":"https://www.wikidata.org/wiki/Q7113681","display_name":"Overhead (engineering)","level":2,"score":0.6476043462753296},{"id":"https://openalex.org/C2777674469","wikidata":"https://www.wikidata.org/wiki/Q20741011","display_name":"Virtex","level":3,"score":0.635804295539856},{"id":"https://openalex.org/C2780073065","wikidata":"https://www.wikidata.org/wiki/Q1476733","display_name":"Single event upset","level":3,"score":0.6130411028862},{"id":"https://openalex.org/C2775928411","wikidata":"https://www.wikidata.org/wiki/Q2041312","display_name":"Fault injection","level":3,"score":0.592211127281189},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.5501443147659302},{"id":"https://openalex.org/C154474529","wikidata":"https://www.wikidata.org/wiki/Q1658917","display_name":"Soft error","level":2,"score":0.4630031883716583},{"id":"https://openalex.org/C63540848","wikidata":"https://www.wikidata.org/wiki/Q3140932","display_name":"Fault tolerance","level":2,"score":0.43259960412979126},{"id":"https://openalex.org/C2780586882","wikidata":"https://www.wikidata.org/wiki/Q7520643","display_name":"Simple (philosophy)","level":2,"score":0.41485995054244995},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.3793925642967224},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.13388824462890625},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.11357268691062927},{"id":"https://openalex.org/C2777904410","wikidata":"https://www.wikidata.org/wiki/Q7397","display_name":"Software","level":2,"score":0.09886288642883301},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.07169970870018005},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C138885662","wikidata":"https://www.wikidata.org/wiki/Q5891","display_name":"Philosophy","level":0,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C111472728","wikidata":"https://www.wikidata.org/wiki/Q9471","display_name":"Epistemology","level":1,"score":0.0},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/idt.2013.6727129","is_oa":false,"landing_page_url":"https://doi.org/10.1109/idt.2013.6727129","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2013 8th IEEE Design and Test Symposium","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":22,"referenced_works":["https://openalex.org/W89226983","https://openalex.org/W1972974936","https://openalex.org/W1986866754","https://openalex.org/W1993237560","https://openalex.org/W2004885674","https://openalex.org/W2018873598","https://openalex.org/W2021705882","https://openalex.org/W2041252144","https://openalex.org/W2071796522","https://openalex.org/W2085589133","https://openalex.org/W2099760530","https://openalex.org/W2114402375","https://openalex.org/W2131221147","https://openalex.org/W2134054737","https://openalex.org/W2138532468","https://openalex.org/W2143450275","https://openalex.org/W2143839489","https://openalex.org/W2148513374","https://openalex.org/W2157993789","https://openalex.org/W2170154730","https://openalex.org/W3152212851","https://openalex.org/W4243912920"],"related_works":["https://openalex.org/W4290647047","https://openalex.org/W2066033226","https://openalex.org/W2622269177","https://openalex.org/W2363504003","https://openalex.org/W1523508240","https://openalex.org/W2548582980","https://openalex.org/W2044069930","https://openalex.org/W1500230652","https://openalex.org/W3208260600","https://openalex.org/W1553526993"],"abstract_inverted_index":{"Single":[0],"Event":[1],"Upset":[2],"(SEU)":[3],"is":[4,77,90],"a":[5,12,26,107,115,125,130],"major":[6],"concern":[7],"for":[8],"SRAM-based":[9],"FPGAs":[10,57],"where":[11],"simple":[13],"bit-flip":[14],"can":[15],"lead":[16],"to":[17,38,58,114],"an":[18],"abnormal":[19],"execution.":[20],"We":[21,47],"present":[22],"in":[23,100],"this":[24],"paper,":[25],"new":[27],"fault":[28,66],"tolerance":[29],"method":[30,71],"based":[31,92,128],"on":[32,93,124,129],"hardware":[33,60,83,95],"BER":[34],"(Backward":[35],"Error":[36],"Recovery)":[37],"protect/correct":[39],"system":[40],"against":[41],"the":[42,49,86,101],"occurrence":[43],"of":[44,65,82,85],"transient":[45],"faults.":[46],"use":[48,68],"partial":[50],"dynamic":[51],"reconfiguration":[52],"offered":[53],"by":[54],"Xilinx":[55,126],"Virtex-5":[56],"ensure":[59],"checkpoint":[61],"and":[62,103],"upon":[63],"detection":[64],"we":[67,121],"recovery.":[69],"Our":[70],"has":[72,106],"several":[73],"advantages:":[74],"first":[75],"it":[76,89,105,123],"non-intrusive":[78],"(no":[79],"internal":[80],"modification":[81],"modules":[84],"system),":[87],"second":[88],"not":[91],"redundant":[94],"resources":[96],"(like":[97],"most":[98],"methods":[99],"literature),":[102],"finally":[104],"static":[108],"area":[109],"overhead":[110],"ratio":[111],"when":[112],"applied":[113],"system.":[116],"To":[117],"validate":[118],"our":[119],"approach,":[120],"implemented":[122],"platform":[127],"Partial":[131],"Reconfigurable":[132],"Region":[133],"(PRR).":[134]},"counts_by_year":[{"year":2019,"cited_by_count":1},{"year":2014,"cited_by_count":3}],"updated_date":"2026-03-26T15:22:09.906841","created_date":"2025-10-10T00:00:00"}