{"id":"https://openalex.org/W2542254578","doi":"https://doi.org/10.1109/idt.2013.6727121","title":"Compilation optimization exploration for thermal dissipation reduction in embedded systems","display_name":"Compilation optimization exploration for thermal dissipation reduction in embedded systems","publication_year":2013,"publication_date":"2013-12-01","ids":{"openalex":"https://openalex.org/W2542254578","doi":"https://doi.org/10.1109/idt.2013.6727121","mag":"2542254578"},"language":"en","primary_location":{"id":"doi:10.1109/idt.2013.6727121","is_oa":false,"landing_page_url":"https://doi.org/10.1109/idt.2013.6727121","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2013 8th IEEE Design and Test Symposium","raw_type":"proceedings-article"},"type":"preprint","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5110453765","display_name":"M. Ben Saad","orcid":null},"institutions":[{"id":"https://openalex.org/I142899784","display_name":"University of Sfax","ror":"https://ror.org/04d4sd432","country_code":"TN","type":"education","lineage":["https://openalex.org/I142899784"]}],"countries":["TN"],"is_corresponding":true,"raw_author_name":"M. Ben Saad","raw_affiliation_strings":["National School of Engineering, University of Sfax, Tunisia"],"affiliations":[{"raw_affiliation_string":"National School of Engineering, University of Sfax, Tunisia","institution_ids":["https://openalex.org/I142899784"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5065001343","display_name":"Ahmed Jedidi","orcid":"https://orcid.org/0000-0001-6607-0384"},"institutions":[{"id":"https://openalex.org/I142899784","display_name":"University of Sfax","ror":"https://ror.org/04d4sd432","country_code":"TN","type":"education","lineage":["https://openalex.org/I142899784"]}],"countries":["TN"],"is_corresponding":false,"raw_author_name":"A. Jedidi","raw_affiliation_strings":["National School of Engineering, University of Sfax, Tunisia"],"affiliations":[{"raw_affiliation_string":"National School of Engineering, University of Sfax, Tunisia","institution_ids":["https://openalex.org/I142899784"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5080926469","display_name":"Sma\u00efl Niar","orcid":"https://orcid.org/0000-0002-7550-484X"},"institutions":[{"id":"https://openalex.org/I4210089617","display_name":"Laboratoire d'Automatique, de M\u00e9canique et d'Informatique Industrielles et Humaines","ror":"https://ror.org/006z7v557","country_code":"FR","type":"facility","lineage":["https://openalex.org/I1294671590","https://openalex.org/I1294671590","https://openalex.org/I4210089617","https://openalex.org/I4210159245","https://openalex.org/I4387154098","https://openalex.org/I70348806","https://openalex.org/I70348806"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"S. Niar","raw_affiliation_strings":["LAMIH, Universite de Valenciennes, France"],"affiliations":[{"raw_affiliation_string":"LAMIH, Universite de Valenciennes, France","institution_ids":["https://openalex.org/I4210089617"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5112780554","display_name":"Mohamed Abid","orcid":"https://orcid.org/0009-0005-2082-3287"},"institutions":[{"id":"https://openalex.org/I142899784","display_name":"University of Sfax","ror":"https://ror.org/04d4sd432","country_code":"TN","type":"education","lineage":["https://openalex.org/I142899784"]}],"countries":["TN"],"is_corresponding":false,"raw_author_name":"M. Abid","raw_affiliation_strings":["National School of Engineering, University of Sfax, Tunisia"],"affiliations":[{"raw_affiliation_string":"National School of Engineering, University of Sfax, Tunisia","institution_ids":["https://openalex.org/I142899784"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5110453765"],"corresponding_institution_ids":["https://openalex.org/I142899784"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":0,"citation_normalized_percentile":{"value":0.25811908,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":null,"biblio":{"volume":"25","issue":null,"first_page":"1","last_page":"3"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10054","display_name":"Parallel Computing and Optimization Techniques","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10054","display_name":"Parallel Computing and Optimization Techniques","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10363","display_name":"Low-power high-performance VLSI design","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10904","display_name":"Embedded Systems Design Techniques","score":0.9998000264167786,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/dissipation","display_name":"Dissipation","score":0.7391132116317749},{"id":"https://openalex.org/keywords/thermal-management-of-electronic-devices-and-systems","display_name":"Thermal management of electronic devices and systems","score":0.6473753452301025},{"id":"https://openalex.org/keywords/thermal","display_name":"Thermal","score":0.6005990505218506},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.5536417365074158},{"id":"https://openalex.org/keywords/reduction","display_name":"Reduction (mathematics)","score":0.4891253113746643},{"id":"https://openalex.org/keywords/reliability","display_name":"Reliability (semiconductor)","score":0.4832964241504669},{"id":"https://openalex.org/keywords/power-density","display_name":"Power density","score":0.4741489291191101},{"id":"https://openalex.org/keywords/transistor","display_name":"Transistor","score":0.46788424253463745},{"id":"https://openalex.org/keywords/heat-sink","display_name":"Heat sink","score":0.44205591082572937},{"id":"https://openalex.org/keywords/limit","display_name":"Limit (mathematics)","score":0.4178040027618408},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.4144863486289978},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.3931995630264282},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.3904045820236206},{"id":"https://openalex.org/keywords/nuclear-engineering","display_name":"Nuclear engineering","score":0.38216689229011536},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.3798828721046448},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2577776610851288},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.25522834062576294},{"id":"https://openalex.org/keywords/mechanical-engineering","display_name":"Mechanical engineering","score":0.23765939474105835},{"id":"https://openalex.org/keywords/physics","display_name":"Physics","score":0.1497393548488617},{"id":"https://openalex.org/keywords/thermodynamics","display_name":"Thermodynamics","score":0.079985111951828}],"concepts":[{"id":"https://openalex.org/C135402231","wikidata":"https://www.wikidata.org/wiki/Q898440","display_name":"Dissipation","level":2,"score":0.7391132116317749},{"id":"https://openalex.org/C114834414","wikidata":"https://www.wikidata.org/wiki/Q15477170","display_name":"Thermal management of electronic devices and systems","level":2,"score":0.6473753452301025},{"id":"https://openalex.org/C204530211","wikidata":"https://www.wikidata.org/wiki/Q752823","display_name":"Thermal","level":2,"score":0.6005990505218506},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.5536417365074158},{"id":"https://openalex.org/C111335779","wikidata":"https://www.wikidata.org/wiki/Q3454686","display_name":"Reduction (mathematics)","level":2,"score":0.4891253113746643},{"id":"https://openalex.org/C43214815","wikidata":"https://www.wikidata.org/wiki/Q7310987","display_name":"Reliability (semiconductor)","level":3,"score":0.4832964241504669},{"id":"https://openalex.org/C21881925","wikidata":"https://www.wikidata.org/wiki/Q3503313","display_name":"Power density","level":3,"score":0.4741489291191101},{"id":"https://openalex.org/C172385210","wikidata":"https://www.wikidata.org/wiki/Q5339","display_name":"Transistor","level":3,"score":0.46788424253463745},{"id":"https://openalex.org/C186937647","wikidata":"https://www.wikidata.org/wiki/Q1796959","display_name":"Heat sink","level":2,"score":0.44205591082572937},{"id":"https://openalex.org/C151201525","wikidata":"https://www.wikidata.org/wiki/Q177239","display_name":"Limit (mathematics)","level":2,"score":0.4178040027618408},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.4144863486289978},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.3931995630264282},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.3904045820236206},{"id":"https://openalex.org/C116915560","wikidata":"https://www.wikidata.org/wiki/Q83504","display_name":"Nuclear engineering","level":1,"score":0.38216689229011536},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.3798828721046448},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2577776610851288},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.25522834062576294},{"id":"https://openalex.org/C78519656","wikidata":"https://www.wikidata.org/wiki/Q101333","display_name":"Mechanical engineering","level":1,"score":0.23765939474105835},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.1497393548488617},{"id":"https://openalex.org/C97355855","wikidata":"https://www.wikidata.org/wiki/Q11473","display_name":"Thermodynamics","level":1,"score":0.079985111951828},{"id":"https://openalex.org/C2524010","wikidata":"https://www.wikidata.org/wiki/Q8087","display_name":"Geometry","level":1,"score":0.0},{"id":"https://openalex.org/C165801399","wikidata":"https://www.wikidata.org/wiki/Q25428","display_name":"Voltage","level":2,"score":0.0},{"id":"https://openalex.org/C33923547","wikidata":"https://www.wikidata.org/wiki/Q395","display_name":"Mathematics","level":0,"score":0.0},{"id":"https://openalex.org/C134306372","wikidata":"https://www.wikidata.org/wiki/Q7754","display_name":"Mathematical analysis","level":1,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/idt.2013.6727121","is_oa":false,"landing_page_url":"https://doi.org/10.1109/idt.2013.6727121","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2013 8th IEEE Design and Test Symposium","raw_type":"proceedings-article"},{"id":"pmh:oai:HAL:hal-03612489v1","is_oa":false,"landing_page_url":"https://uphf.hal.science/hal-03612489","pdf_url":null,"source":{"id":"https://openalex.org/S4306402512","display_name":"HAL (Le Centre pour la Communication Scientifique Directe)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I1294671590","host_organization_name":"Centre National de la Recherche Scientifique","host_organization_lineage":["https://openalex.org/I1294671590"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"https://ieeexplore.ieee.org/document/6727121","raw_type":"Conference papers"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Affordable and clean energy","score":0.7300000190734863,"id":"https://metadata.un.org/sdg/7"}],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":6,"referenced_works":["https://openalex.org/W1967136720","https://openalex.org/W2032094184","https://openalex.org/W2102727118","https://openalex.org/W2152165066","https://openalex.org/W3140903683","https://openalex.org/W6792941224"],"related_works":["https://openalex.org/W2347486132","https://openalex.org/W3031568859","https://openalex.org/W2316789606","https://openalex.org/W2901798837","https://openalex.org/W2066200948","https://openalex.org/W1987161438","https://openalex.org/W2903604954","https://openalex.org/W2140614965","https://openalex.org/W2161470416","https://openalex.org/W1978922647"],"abstract_inverted_index":{"International":[0],"audience":[1]},"counts_by_year":[],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}