{"id":"https://openalex.org/W2539623632","doi":"https://doi.org/10.1109/idt.2013.6727081","title":"A BIST method for TSVs pre-bond test","display_name":"A BIST method for TSVs pre-bond test","publication_year":2013,"publication_date":"2013-12-01","ids":{"openalex":"https://openalex.org/W2539623632","doi":"https://doi.org/10.1109/idt.2013.6727081","mag":"2539623632"},"language":"en","primary_location":{"id":"doi:10.1109/idt.2013.6727081","is_oa":false,"landing_page_url":"https://doi.org/10.1109/idt.2013.6727081","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2013 8th IEEE Design and Test Symposium","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5013584926","display_name":"Hakim Zimouche","orcid":null},"institutions":[{"id":"https://openalex.org/I4210101743","display_name":"Laboratoire d'Informatique, de Robotique et de Micro\u00e9lectronique de Montpellier","ror":"https://ror.org/013yean28","country_code":"FR","type":"facility","lineage":["https://openalex.org/I1294671590","https://openalex.org/I1294671590","https://openalex.org/I1326498283","https://openalex.org/I151295451","https://openalex.org/I19894307","https://openalex.org/I4210101743","https://openalex.org/I4210159245","https://openalex.org/I4412460525"]},{"id":"https://openalex.org/I1294671590","display_name":"Centre National de la Recherche Scientifique","ror":"https://ror.org/02feahw73","country_code":"FR","type":"funder","lineage":["https://openalex.org/I1294671590"]}],"countries":["FR"],"is_corresponding":true,"raw_author_name":"Hakim Zimouche","raw_affiliation_strings":["LIRMM - Université Montpellier II/CNRS Montpellier, France"],"affiliations":[{"raw_affiliation_string":"LIRMM - Université Montpellier II/CNRS Montpellier, France","institution_ids":["https://openalex.org/I1294671590","https://openalex.org/I4210101743"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5078888989","display_name":"Giorgio Di Natale","orcid":"https://orcid.org/0000-0001-8063-5388"},"institutions":[{"id":"https://openalex.org/I1294671590","display_name":"Centre National de la Recherche Scientifique","ror":"https://ror.org/02feahw73","country_code":"FR","type":"funder","lineage":["https://openalex.org/I1294671590"]},{"id":"https://openalex.org/I4210101743","display_name":"Laboratoire d'Informatique, de Robotique et de Micro\u00e9lectronique de Montpellier","ror":"https://ror.org/013yean28","country_code":"FR","type":"facility","lineage":["https://openalex.org/I1294671590","https://openalex.org/I1294671590","https://openalex.org/I1326498283","https://openalex.org/I151295451","https://openalex.org/I19894307","https://openalex.org/I4210101743","https://openalex.org/I4210159245","https://openalex.org/I4412460525"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"Giorgio Di Natale","raw_affiliation_strings":["LIRMM - Université Montpellier II/CNRS Montpellier, France"],"affiliations":[{"raw_affiliation_string":"LIRMM - Université Montpellier II/CNRS Montpellier, France","institution_ids":["https://openalex.org/I1294671590","https://openalex.org/I4210101743"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5081237741","display_name":"Marie-Lise Flottes","orcid":"https://orcid.org/0000-0002-7231-3976"},"institutions":[{"id":"https://openalex.org/I4210101743","display_name":"Laboratoire d'Informatique, de Robotique et de Micro\u00e9lectronique de Montpellier","ror":"https://ror.org/013yean28","country_code":"FR","type":"facility","lineage":["https://openalex.org/I1294671590","https://openalex.org/I1294671590","https://openalex.org/I1326498283","https://openalex.org/I151295451","https://openalex.org/I19894307","https://openalex.org/I4210101743","https://openalex.org/I4210159245","https://openalex.org/I4412460525"]},{"id":"https://openalex.org/I1294671590","display_name":"Centre National de la Recherche Scientifique","ror":"https://ror.org/02feahw73","country_code":"FR","type":"funder","lineage":["https://openalex.org/I1294671590"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"Marie-lise Flottes","raw_affiliation_strings":["LIRMM - Université Montpellier II/CNRS Montpellier, France"],"affiliations":[{"raw_affiliation_string":"LIRMM - Université Montpellier II/CNRS Montpellier, France","institution_ids":["https://openalex.org/I1294671590","https://openalex.org/I4210101743"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5035518436","display_name":"Bruno Rouzeyre","orcid":null},"institutions":[{"id":"https://openalex.org/I4210101743","display_name":"Laboratoire d'Informatique, de Robotique et de Micro\u00e9lectronique de Montpellier","ror":"https://ror.org/013yean28","country_code":"FR","type":"facility","lineage":["https://openalex.org/I1294671590","https://openalex.org/I1294671590","https://openalex.org/I1326498283","https://openalex.org/I151295451","https://openalex.org/I19894307","https://openalex.org/I4210101743","https://openalex.org/I4210159245","https://openalex.org/I4412460525"]},{"id":"https://openalex.org/I1294671590","display_name":"Centre National de la Recherche Scientifique","ror":"https://ror.org/02feahw73","country_code":"FR","type":"funder","lineage":["https://openalex.org/I1294671590"]}],"countries":["FR"],"is_corresponding":false,"raw_author_name":"Bruno Rouzeyre","raw_affiliation_strings":["LIRMM - Université Montpellier II/CNRS Montpellier, France"],"affiliations":[{"raw_affiliation_string":"LIRMM - Université Montpellier II/CNRS Montpellier, France","institution_ids":["https://openalex.org/I1294671590","https://openalex.org/I4210101743"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":["https://openalex.org/A5013584926"],"corresponding_institution_ids":["https://openalex.org/I1294671590","https://openalex.org/I4210101743"],"apc_list":null,"apc_paid":null,"fwci":0.2364,"has_fulltext":false,"cited_by_count":5,"citation_normalized_percentile":{"value":0.65385584,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":89,"max":94},"biblio":{"volume":null,"issue":null,"first_page":"1","last_page":"6"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11527","display_name":"3D IC and TSV technologies","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11527","display_name":"3D IC and TSV technologies","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9988999962806702,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/built-in-self-test","display_name":"Built-in self-test","score":0.8022971749305725},{"id":"https://openalex.org/keywords/capacitance","display_name":"Capacitance","score":0.6858292818069458},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.5702298879623413},{"id":"https://openalex.org/keywords/process","display_name":"Process (computing)","score":0.5426666140556335},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.5053809285163879},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.4201427698135376},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.38201242685317993},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.3560376763343811},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.3204382658004761},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.23743745684623718}],"concepts":[{"id":"https://openalex.org/C2780980493","wikidata":"https://www.wikidata.org/wiki/Q181142","display_name":"Built-in self-test","level":2,"score":0.8022971749305725},{"id":"https://openalex.org/C30066665","wikidata":"https://www.wikidata.org/wiki/Q164399","display_name":"Capacitance","level":3,"score":0.6858292818069458},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.5702298879623413},{"id":"https://openalex.org/C98045186","wikidata":"https://www.wikidata.org/wiki/Q205663","display_name":"Process (computing)","level":2,"score":0.5426666140556335},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.5053809285163879},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.4201427698135376},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.38201242685317993},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.3560376763343811},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.3204382658004761},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.23743745684623718},{"id":"https://openalex.org/C147789679","wikidata":"https://www.wikidata.org/wiki/Q11372","display_name":"Physical chemistry","level":1,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C185592680","wikidata":"https://www.wikidata.org/wiki/Q2329","display_name":"Chemistry","level":0,"score":0.0},{"id":"https://openalex.org/C17525397","wikidata":"https://www.wikidata.org/wiki/Q176140","display_name":"Electrode","level":2,"score":0.0}],"mesh":[],"locations_count":2,"locations":[{"id":"doi:10.1109/idt.2013.6727081","is_oa":false,"landing_page_url":"https://doi.org/10.1109/idt.2013.6727081","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2013 8th IEEE Design and Test Symposium","raw_type":"proceedings-article"},{"id":"pmh:oai:HAL:lirmm-00989727v1","is_oa":false,"landing_page_url":"https://hal-lirmm.ccsd.cnrs.fr/lirmm-00989727","pdf_url":null,"source":{"id":"https://openalex.org/S4306402512","display_name":"HAL (Le Centre pour la Communication Scientifique Directe)","issn_l":null,"issn":null,"is_oa":false,"is_in_doaj":false,"is_core":false,"host_organization":"https://openalex.org/I1294671590","host_organization_name":"Centre National de la Recherche Scientifique","host_organization_lineage":["https://openalex.org/I1294671590"],"host_organization_lineage_names":[],"type":"repository"},"license":null,"license_id":null,"version":"submittedVersion","is_accepted":false,"is_published":false,"raw_source_name":"http://idtsymposium.org/","raw_type":"Conference papers"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"grobid_xml":false,"pdf":false},"content_urls":null,"referenced_works_count":16,"referenced_works":["https://openalex.org/W1963499756","https://openalex.org/W1965451131","https://openalex.org/W1972808197","https://openalex.org/W2013679798","https://openalex.org/W2022392302","https://openalex.org/W2070204761","https://openalex.org/W2095790208","https://openalex.org/W2102304175","https://openalex.org/W2132155220","https://openalex.org/W2143502515","https://openalex.org/W2150435684","https://openalex.org/W2152880837","https://openalex.org/W2155707315","https://openalex.org/W2169924167","https://openalex.org/W4243369421","https://openalex.org/W6674386616"],"related_works":["https://openalex.org/W2347585086","https://openalex.org/W1527953837","https://openalex.org/W2042100038","https://openalex.org/W2764319374","https://openalex.org/W2075460687","https://openalex.org/W3032934611","https://openalex.org/W3086500945","https://openalex.org/W2781651239","https://openalex.org/W2146606382","https://openalex.org/W2110446288"],"abstract_inverted_index":{"In":[0],"this":[1],"paper":[2,40],"we":[3],"present":[4],"a":[5],"Built-In-Self-Test":[6],"(BIST)":[7],"method":[8,22,65],"dedicated":[9],"to":[10,24,78],"pre-bond":[11],"testing":[12],"of":[13,35,50,56],"TSVs":[14],"in":[15,81],"3D":[16],"stacked":[17],"integrated":[18],"circuits.":[19],"The":[20,39,71],"test":[21,54],"aims":[23],"detect":[25],"full-open":[26],"and":[27],"pin-hole":[28],"defects":[29],"by":[30],"measuring":[31],"the":[32,47,51,57,64,82,86],"discharge":[33,48],"delay":[34,49],"TSVs'":[36],"equivalent":[37],"capacitance.":[38],"presents":[41],"an":[42],"original":[43],"solution":[44],"for":[45],"monitoring":[46],"TSV":[52],"under":[53],"independently":[55],"process":[58],"variations.":[59,70],"Simulation-based":[60],"results":[61],"shows":[62],"that":[63],"is":[66,75],"robust":[67],"w.r.t":[68],"these":[69],"proposed":[72],"BIST":[73],"circuitry":[74],"small":[76],"enough":[77],"be":[79],"inserted":[80],"available":[83],"area":[84],"between":[85],"TSVs.":[87]},"counts_by_year":[{"year":2022,"cited_by_count":1},{"year":2019,"cited_by_count":1},{"year":2018,"cited_by_count":1},{"year":2017,"cited_by_count":1},{"year":2016,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}