{"id":"https://openalex.org/W2539844100","doi":"https://doi.org/10.1109/idt.2011.6123101","title":"The effectiveness of delay and IDDT tests in detecting resistive open defects for nanometer CMOS adder circuits","display_name":"The effectiveness of delay and IDDT tests in detecting resistive open defects for nanometer CMOS adder circuits","publication_year":2011,"publication_date":"2011-12-01","ids":{"openalex":"https://openalex.org/W2539844100","doi":"https://doi.org/10.1109/idt.2011.6123101","mag":"2539844100"},"language":"en","primary_location":{"id":"doi:10.1109/idt.2011.6123101","is_oa":false,"landing_page_url":"https://doi.org/10.1109/idt.2011.6123101","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2011 IEEE 6th International Design and Test Workshop (IDT)","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5065944813","display_name":"Layla Hamieh","orcid":null},"institutions":[{"id":"https://openalex.org/I98635879","display_name":"American University of Beirut","ror":"https://ror.org/04pznsd21","country_code":"LB","type":"education","lineage":["https://openalex.org/I98635879"]}],"countries":["LB"],"is_corresponding":false,"raw_author_name":"Layla Hamieh","raw_affiliation_strings":["Department of Electrical and Computer Engineering, American University of Beirut, Beirut, Lebanon"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, American University of Beirut, Beirut, Lebanon","institution_ids":["https://openalex.org/I98635879"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5021882609","display_name":"Nader Mehdi","orcid":null},"institutions":[{"id":"https://openalex.org/I98635879","display_name":"American University of Beirut","ror":"https://ror.org/04pznsd21","country_code":"LB","type":"education","lineage":["https://openalex.org/I98635879"]}],"countries":["LB"],"is_corresponding":false,"raw_author_name":"Nader Mehdi","raw_affiliation_strings":["Department of Electrical and Computer Engineering, American University of Beirut, Beirut, Lebanon"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, American University of Beirut, Beirut, Lebanon","institution_ids":["https://openalex.org/I98635879"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5055964635","display_name":"Ghazalah Omeirat","orcid":null},"institutions":[{"id":"https://openalex.org/I98635879","display_name":"American University of Beirut","ror":"https://ror.org/04pznsd21","country_code":"LB","type":"education","lineage":["https://openalex.org/I98635879"]}],"countries":["LB"],"is_corresponding":false,"raw_author_name":"Ghazalah Omeirat","raw_affiliation_strings":["Department of Electrical and Computer Engineering, American University of Beirut, Beirut, Lebanon"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, American University of Beirut, Beirut, Lebanon","institution_ids":["https://openalex.org/I98635879"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5060737319","display_name":"Ali Chehab","orcid":"https://orcid.org/0000-0002-1939-2740"},"institutions":[{"id":"https://openalex.org/I98635879","display_name":"American University of Beirut","ror":"https://ror.org/04pznsd21","country_code":"LB","type":"education","lineage":["https://openalex.org/I98635879"]}],"countries":["LB"],"is_corresponding":false,"raw_author_name":"Ali Chehab","raw_affiliation_strings":["Department of Electrical and Computer Engineering, American University of Beirut, Beirut, Lebanon"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, American University of Beirut, Beirut, Lebanon","institution_ids":["https://openalex.org/I98635879"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5074578100","display_name":"Ayman Kayssi","orcid":"https://orcid.org/0000-0002-0569-1395"},"institutions":[{"id":"https://openalex.org/I98635879","display_name":"American University of Beirut","ror":"https://ror.org/04pznsd21","country_code":"LB","type":"education","lineage":["https://openalex.org/I98635879"]}],"countries":["LB"],"is_corresponding":false,"raw_author_name":"Ayman Kayssi","raw_affiliation_strings":["Department of Electrical and Computer Engineering, American University of Beirut, Beirut, Lebanon"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Department of Electrical and Computer Engineering, American University of Beirut, Beirut, Lebanon","institution_ids":["https://openalex.org/I98635879"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I98635879"],"apc_list":null,"apc_paid":null,"fwci":null,"has_fulltext":false,"cited_by_count":5,"citation_normalized_percentile":null,"cited_by_percentile_year":null,"biblio":{"volume":"24","issue":null,"first_page":"53","last_page":"57"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10472","display_name":"Semiconductor materials and devices","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9998999834060669,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/adder","display_name":"Adder","score":0.7142614722251892},{"id":"https://openalex.org/keywords/cmos","display_name":"CMOS","score":0.690537691116333},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.4891710579395294},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.449546754360199},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.4424205422401428},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.4259829521179199},{"id":"https://openalex.org/keywords/transient","display_name":"Transient (computer programming)","score":0.4149097502231598},{"id":"https://openalex.org/keywords/value","display_name":"Value (mathematics)","score":0.41187161207199097},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.35856008529663086},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.2251989245414734},{"id":"https://openalex.org/keywords/machine-learning","display_name":"Machine learning","score":0.08415248990058899}],"concepts":[{"id":"https://openalex.org/C164620267","wikidata":"https://www.wikidata.org/wiki/Q376953","display_name":"Adder","level":3,"score":0.7142614722251892},{"id":"https://openalex.org/C46362747","wikidata":"https://www.wikidata.org/wiki/Q173431","display_name":"CMOS","level":2,"score":0.690537691116333},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.4891710579395294},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.449546754360199},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.4424205422401428},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.4259829521179199},{"id":"https://openalex.org/C2780799671","wikidata":"https://www.wikidata.org/wiki/Q17087362","display_name":"Transient (computer programming)","level":2,"score":0.4149097502231598},{"id":"https://openalex.org/C2776291640","wikidata":"https://www.wikidata.org/wiki/Q2912517","display_name":"Value (mathematics)","level":2,"score":0.41187161207199097},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.35856008529663086},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.2251989245414734},{"id":"https://openalex.org/C119857082","wikidata":"https://www.wikidata.org/wiki/Q2539","display_name":"Machine learning","level":1,"score":0.08415248990058899},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/idt.2011.6123101","is_oa":false,"landing_page_url":"https://doi.org/10.1109/idt.2011.6123101","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2011 IEEE 6th International Design and Test Workshop (IDT)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":25,"referenced_works":["https://openalex.org/W44510937","https://openalex.org/W148516285","https://openalex.org/W1925287862","https://openalex.org/W2006589289","https://openalex.org/W2037102348","https://openalex.org/W2076121845","https://openalex.org/W2076226408","https://openalex.org/W2084974408","https://openalex.org/W2123254638","https://openalex.org/W2127184778","https://openalex.org/W2129267471","https://openalex.org/W2142059378","https://openalex.org/W2153560928","https://openalex.org/W2157210245","https://openalex.org/W2789002725","https://openalex.org/W2911738043","https://openalex.org/W4248190348","https://openalex.org/W4255180953","https://openalex.org/W6601807110","https://openalex.org/W6606014485","https://openalex.org/W6669791539","https://openalex.org/W6671914499","https://openalex.org/W6679301951","https://openalex.org/W6748407623","https://openalex.org/W6758513644"],"related_works":["https://openalex.org/W4390550886","https://openalex.org/W3217463396","https://openalex.org/W2790557758","https://openalex.org/W2516396101","https://openalex.org/W3204929712","https://openalex.org/W4295102875","https://openalex.org/W2300671402","https://openalex.org/W2183015194","https://openalex.org/W2389800961","https://openalex.org/W1995389502"],"abstract_inverted_index":{"In":[0],"this":[1],"paper":[2],"we":[3],"evaluate":[4],"the":[5,34,44,50,61,71,87,91,95,106,111,118,131,140,144,173,178],"effectiveness":[6],"of":[7,37,90,94,110,121,160,180],"different":[8,20,51],"testing":[9,39],"schemes":[10],"in":[11,15,177],"detecting":[12],"resistive-open":[13],"defects":[14],"adder":[16],"circuits":[17],"implemented":[18],"using":[19],"CMOS":[21],"technologies":[22,182],"(45":[23],"nm,":[24,26],"32":[25],"22":[27],"nm":[28],"and":[29,70,184],"16":[30,185],"nm).":[31,186],"We":[32],"assess":[33],"detection":[35],"capabilities":[36],"four":[38],"techniques":[40,57],"taking":[41],"into":[42],"consideration":[43],"wide":[45],"process":[46],"variations":[47],"associated":[48],"with":[49,156],"nanometer":[52],"technologies.":[53],"The":[54,79,102,114,127,135,150,165],"first":[55,80,174],"three":[56],"are":[58],"based":[59,75],"on":[60,76],"transient":[62,96],"supply":[63,98],"current,":[64],"i":[65,81,122,151],"<sub":[66,82,123,152],"xmlns:mml=\"http://www.w3.org/1998/Math/MathML\"":[67,83,124,153],"xmlns:xlink=\"http://www.w3.org/1999/xlink\">DDT</sub>":[68,84,125,154],",":[69],"fourth":[72,128],"technique":[73,129],"is":[74,143],"delay":[77,141],"testing.":[78],"method":[85],"uses":[86,105,117],"RMS":[88,108,158],"value":[89,109,120,159],"wavelet":[92,112,161],"transform":[93,162],"power":[97],"or":[99],"ground":[100],"currents.":[101],"second":[103],"one":[104,116],"normalized":[107,157],"transform.":[113],"third":[115],"peak":[119],".":[126],"measures":[130],"primary":[132],"input-to-output":[133],"delay.":[134],"experimental":[136],"results":[137],"show":[138],"that":[139],"test":[142,155],"most":[145],"effective":[146,171],"among":[147],"all":[148],"tests.":[149],"comes":[163],"second.":[164],"other":[166],"two":[167],"tests":[168],"were":[169],"less":[170],"than":[172],"two,":[175],"especially":[176],"case":[179],"smaller":[181],"(22":[183]},"counts_by_year":[{"year":2018,"cited_by_count":1},{"year":2015,"cited_by_count":1},{"year":2014,"cited_by_count":1},{"year":2013,"cited_by_count":1},{"year":2012,"cited_by_count":1}],"updated_date":"2026-07-14T23:27:15.235271","created_date":"2025-10-10T00:00:00"}