{"id":"https://openalex.org/W2532952565","doi":"https://doi.org/10.1109/idt.2011.6123097","title":"Fault detection and diagnoses methodology for adaptive digitally-calibrated pipelined ADCs","display_name":"Fault detection and diagnoses methodology for adaptive digitally-calibrated pipelined ADCs","publication_year":2011,"publication_date":"2011-12-01","ids":{"openalex":"https://openalex.org/W2532952565","doi":"https://doi.org/10.1109/idt.2011.6123097","mag":"2532952565"},"language":"en","primary_location":{"id":"doi:10.1109/idt.2011.6123097","is_oa":false,"landing_page_url":"https://doi.org/10.1109/idt.2011.6123097","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2011 IEEE 6th International Design and Test Workshop (IDT)","raw_type":"proceedings-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5111773669","display_name":"Mohamed Abbas","orcid":"https://orcid.org/0000-0001-8787-8550"},"institutions":[{"id":"https://openalex.org/I74801974","display_name":"The University of Tokyo","ror":"https://ror.org/057zh3y96","country_code":"JP","type":"education","lineage":["https://openalex.org/I74801974"]},{"id":"https://openalex.org/I91041137","display_name":"Assiut University","ror":"https://ror.org/01jaj8n65","country_code":"EG","type":"education","lineage":["https://openalex.org/I91041137"]}],"countries":["EG","JP"],"is_corresponding":true,"raw_author_name":"Mohamed Abbas","raw_affiliation_strings":["Electrical Engineering Department, Assiut University, Asyut, Egypt","VLSI Design & Education Center, University of Tokyo, Tokyo, Japan"],"affiliations":[{"raw_affiliation_string":"Electrical Engineering Department, Assiut University, Asyut, Egypt","institution_ids":["https://openalex.org/I91041137"]},{"raw_affiliation_string":"VLSI Design & Education Center, University of Tokyo, Tokyo, Japan","institution_ids":["https://openalex.org/I74801974"]}]}],"institutions":[],"countries_distinct_count":2,"institutions_distinct_count":1,"corresponding_author_ids":["https://openalex.org/A5111773669"],"corresponding_institution_ids":["https://openalex.org/I74801974","https://openalex.org/I91041137"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":3,"citation_normalized_percentile":{"value":0.32727566,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":94},"biblio":{"volume":null,"issue":null,"first_page":"30","last_page":"35"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T10323","display_name":"Analog and Mixed-Signal Circuit Design","score":1.0,"subfield":{"id":"https://openalex.org/subfields/2204","display_name":"Biomedical Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T10558","display_name":"Advancements in Semiconductor Devices and Circuit Design","score":0.9991999864578247,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":0.9987000226974487,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/fault-coverage","display_name":"Fault coverage","score":0.663579523563385},{"id":"https://openalex.org/keywords/fault-detection-and-isolation","display_name":"Fault detection and isolation","score":0.624378502368927},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6138421297073364},{"id":"https://openalex.org/keywords/matlab","display_name":"MATLAB","score":0.5821607112884521},{"id":"https://openalex.org/keywords/chip","display_name":"Chip","score":0.4775177538394928},{"id":"https://openalex.org/keywords/fault","display_name":"Fault (geology)","score":0.4427699148654938},{"id":"https://openalex.org/keywords/automatic-test-pattern-generation","display_name":"Automatic test pattern generation","score":0.43231871724128723},{"id":"https://openalex.org/keywords/built-in-self-test","display_name":"Built-in self-test","score":0.4253453016281128},{"id":"https://openalex.org/keywords/stuck-at-fault","display_name":"Stuck-at fault","score":0.4190291166305542},{"id":"https://openalex.org/keywords/electronic-engineering","display_name":"Electronic engineering","score":0.38569074869155884},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.24400871992111206},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.2074005901813507},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.14189329743385315}],"concepts":[{"id":"https://openalex.org/C126953365","wikidata":"https://www.wikidata.org/wiki/Q5438152","display_name":"Fault coverage","level":3,"score":0.663579523563385},{"id":"https://openalex.org/C152745839","wikidata":"https://www.wikidata.org/wiki/Q5438153","display_name":"Fault detection and isolation","level":3,"score":0.624378502368927},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6138421297073364},{"id":"https://openalex.org/C2780365114","wikidata":"https://www.wikidata.org/wiki/Q169478","display_name":"MATLAB","level":2,"score":0.5821607112884521},{"id":"https://openalex.org/C165005293","wikidata":"https://www.wikidata.org/wiki/Q1074500","display_name":"Chip","level":2,"score":0.4775177538394928},{"id":"https://openalex.org/C175551986","wikidata":"https://www.wikidata.org/wiki/Q47089","display_name":"Fault (geology)","level":2,"score":0.4427699148654938},{"id":"https://openalex.org/C17626397","wikidata":"https://www.wikidata.org/wiki/Q837455","display_name":"Automatic test pattern generation","level":3,"score":0.43231871724128723},{"id":"https://openalex.org/C2780980493","wikidata":"https://www.wikidata.org/wiki/Q181142","display_name":"Built-in self-test","level":2,"score":0.4253453016281128},{"id":"https://openalex.org/C13625343","wikidata":"https://www.wikidata.org/wiki/Q7627418","display_name":"Stuck-at fault","level":4,"score":0.4190291166305542},{"id":"https://openalex.org/C24326235","wikidata":"https://www.wikidata.org/wiki/Q126095","display_name":"Electronic engineering","level":1,"score":0.38569074869155884},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.24400871992111206},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.2074005901813507},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.14189329743385315},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.0},{"id":"https://openalex.org/C76155785","wikidata":"https://www.wikidata.org/wiki/Q418","display_name":"Telecommunications","level":1,"score":0.0},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.0},{"id":"https://openalex.org/C127313418","wikidata":"https://www.wikidata.org/wiki/Q1069","display_name":"Geology","level":0,"score":0.0},{"id":"https://openalex.org/C172707124","wikidata":"https://www.wikidata.org/wiki/Q423488","display_name":"Actuator","level":2,"score":0.0},{"id":"https://openalex.org/C165205528","wikidata":"https://www.wikidata.org/wiki/Q83371","display_name":"Seismology","level":1,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/idt.2011.6123097","is_oa":false,"landing_page_url":"https://doi.org/10.1109/idt.2011.6123097","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2011 IEEE 6th International Design and Test Workshop (IDT)","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[],"awards":[],"funders":[],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":15,"referenced_works":["https://openalex.org/W433726610","https://openalex.org/W1505940948","https://openalex.org/W1970326411","https://openalex.org/W1978246915","https://openalex.org/W2069067360","https://openalex.org/W2082487225","https://openalex.org/W2106243952","https://openalex.org/W2109570325","https://openalex.org/W2135500792","https://openalex.org/W2140549471","https://openalex.org/W2152714847","https://openalex.org/W2154300649","https://openalex.org/W2161325091","https://openalex.org/W4236480226","https://openalex.org/W6676259397"],"related_works":["https://openalex.org/W2340957901","https://openalex.org/W4256030018","https://openalex.org/W2147400189","https://openalex.org/W3147038789","https://openalex.org/W2068571131","https://openalex.org/W1555400249","https://openalex.org/W2952274626","https://openalex.org/W2092357065","https://openalex.org/W2115005577","https://openalex.org/W2913077774"],"abstract_inverted_index":{"This":[0],"paper":[1],"presents":[2],"a":[3,108],"cost-effective":[4],"methodology":[5],"for":[6,172],"fault":[7,95,98,142,150,153],"detection":[8],"and":[9,85,97,115,123,152],"diagnosis":[10],"in":[11,128],"the":[12,18,21,25,30,43,47,53,56,59,63,68,72,79,82,86,92,106,132,147,156,160,164,174,177],"adaptive":[13],"digitally-calibrated":[14,110],"pipelined":[15,111],"ADCs.":[16],"In":[17,40],"proposed":[19,60],"method,":[20],"analog":[22],"portions":[23],"of":[24,55,67,94,131,140,163,176],"design":[26,179],"are":[27,125],"tested":[28],"utilizing":[29],"digital":[31],"output":[32,65,88],"codes.":[33,89],"The":[34,134],"test":[35,48],"stimulus":[36],"is":[37,49,78,113,170],"generated":[38],"on-chip.":[39],"contrast":[41],"with":[42],"conventional":[44],"method":[45,61],"where":[46],"usually":[50],"done":[51],"at":[52],"end":[54],"calibration":[57],"process,":[58],"utilizes":[62],"uncalibrated":[64,87],"codes":[66],"DUT":[69,165],"to":[70],"generate":[71],"code":[73],"error":[74],"signature":[75],"(C\u03b5s),":[76,91],"which":[77,169],"difference":[80],"between":[81],"expected":[83],"(ideal)":[84],"Interpreting":[90],"process":[93],"isolation":[96],"value":[99],"assessment":[100],"can":[101,166],"be":[102,167],"done.":[103],"To":[104],"demonstrate":[105],"methodology,":[107],"ten-stage":[109],"ADC":[112],"modeled":[114],"simulated":[116],"using":[117],"MATLAB.":[118],"Faults":[119],"having":[120],"different":[121,129],"type":[122,151],"values":[124],"intentionally":[126],"injected":[127],"places":[130],"design.":[133],"simulation":[135],"results":[136],"show":[137],"that":[138],"C\u03b5s":[139],"each":[141],"has":[143],"pattern":[144],"dependence":[145],"on":[146],"faulty":[148,157],"portion,":[149],"value.":[154],"Therefore,":[155],"(or":[158],"even":[159],"weak)":[161],"portion(s)":[162],"identified,":[168],"useful":[171],"enhancing":[173],"reliability":[175],"subsequent":[178],"generation.":[180]},"counts_by_year":[{"year":2019,"cited_by_count":1},{"year":2017,"cited_by_count":1},{"year":2016,"cited_by_count":1}],"updated_date":"2025-11-06T03:46:38.306776","created_date":"2025-10-10T00:00:00"}