{"id":"https://openalex.org/W2542982212","doi":"https://doi.org/10.1109/idt.2010.5724412","title":"Cost-free low-power test in compression-based reconfigurable scan designs","display_name":"Cost-free low-power test in compression-based reconfigurable scan designs","publication_year":2010,"publication_date":"2010-12-01","ids":{"openalex":"https://openalex.org/W2542982212","doi":"https://doi.org/10.1109/idt.2010.5724412","mag":"2542982212"},"language":"en","primary_location":{"id":"doi:10.1109/idt.2010.5724412","is_oa":false,"landing_page_url":"https://doi.org/10.1109/idt.2010.5724412","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2010 5th International Design and Test Workshop","raw_type":"proceedings-article"},"type":"conference-paper","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https://openalex.org/A5067901099","display_name":"Sobeeh Almukhaizim","orcid":null},"institutions":[{"id":"https://openalex.org/I36721946","display_name":"Kuwait University","ror":"https://ror.org/021e5j056","country_code":"KW","type":"education","lineage":["https://openalex.org/I36721946"]}],"countries":["KW"],"is_corresponding":false,"raw_author_name":"Sobeeh Almukhaizim","raw_affiliation_strings":["Computer Engineering Department, Kuwait University, Kuwait"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Computer Engineering Department, Kuwait University, Kuwait","institution_ids":["https://openalex.org/I36721946"]}]},{"author_position":"middle","author":{"id":"https://openalex.org/A5111750243","display_name":"Mohammad Mohammad","orcid":null},"institutions":[{"id":"https://openalex.org/I36721946","display_name":"Kuwait University","ror":"https://ror.org/021e5j056","country_code":"KW","type":"education","lineage":["https://openalex.org/I36721946"]}],"countries":["KW"],"is_corresponding":false,"raw_author_name":"Mohammad Mohammad","raw_affiliation_strings":["Computer Engineering Department, Kuwait University, Kuwait"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Computer Engineering Department, Kuwait University, Kuwait","institution_ids":["https://openalex.org/I36721946"]}]},{"author_position":"last","author":{"id":"https://openalex.org/A5000909851","display_name":"Eman AlQuraishi","orcid":null},"institutions":[{"id":"https://openalex.org/I36721946","display_name":"Kuwait University","ror":"https://ror.org/021e5j056","country_code":"KW","type":"education","lineage":["https://openalex.org/I36721946"]}],"countries":["KW"],"is_corresponding":false,"raw_author_name":"Eman AlQuraishi","raw_affiliation_strings":["Computer Engineering Department, Kuwait University, Kuwait"],"raw_orcid":null,"affiliations":[{"raw_affiliation_string":"Computer Engineering Department, Kuwait University, Kuwait","institution_ids":["https://openalex.org/I36721946"]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":1,"corresponding_author_ids":[],"corresponding_institution_ids":["https://openalex.org/I36721946"],"apc_list":null,"apc_paid":null,"fwci":0.0,"has_fulltext":false,"cited_by_count":1,"citation_normalized_percentile":{"value":0.22959658,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":90,"max":94},"biblio":{"volume":null,"issue":null,"first_page":"78","last_page":"82"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},"topics":[{"id":"https://openalex.org/T11032","display_name":"VLSI and Analog Circuit Testing","score":1.0,"subfield":{"id":"https://openalex.org/subfields/1708","display_name":"Hardware and Architecture"},"field":{"id":"https://openalex.org/fields/17","display_name":"Computer Science"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T14117","display_name":"Integrated Circuits and Semiconductor Failure Analysis","score":0.9997000098228455,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}},{"id":"https://openalex.org/T11338","display_name":"Advancements in Photolithography Techniques","score":0.9915000200271606,"subfield":{"id":"https://openalex.org/subfields/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https://openalex.org/fields/22","display_name":"Engineering"},"domain":{"id":"https://openalex.org/domains/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https://openalex.org/keywords/test-compression","display_name":"Test compression","score":0.7063601613044739},{"id":"https://openalex.org/keywords/power","display_name":"Power (physics)","score":0.6492689847946167},{"id":"https://openalex.org/keywords/scan-chain","display_name":"Scan chain","score":0.6481168866157532},{"id":"https://openalex.org/keywords/encoding","display_name":"Encoding (memory)","score":0.6467413306236267},{"id":"https://openalex.org/keywords/computer-science","display_name":"Computer science","score":0.6156225800514221},{"id":"https://openalex.org/keywords/design-for-testing","display_name":"Design for testing","score":0.5082923769950867},{"id":"https://openalex.org/keywords/compression","display_name":"Compression (physics)","score":0.4827398657798767},{"id":"https://openalex.org/keywords/data-compression","display_name":"Data compression","score":0.45441991090774536},{"id":"https://openalex.org/keywords/key","display_name":"Key (lock)","score":0.4115288257598877},{"id":"https://openalex.org/keywords/automatic-test-pattern-generation","display_name":"Automatic test pattern generation","score":0.40950465202331543},{"id":"https://openalex.org/keywords/computer-hardware","display_name":"Computer hardware","score":0.40675127506256104},{"id":"https://openalex.org/keywords/electronic-circuit","display_name":"Electronic circuit","score":0.37888699769973755},{"id":"https://openalex.org/keywords/embedded-system","display_name":"Embedded system","score":0.3218393325805664},{"id":"https://openalex.org/keywords/integrated-circuit","display_name":"Integrated circuit","score":0.26676541566848755},{"id":"https://openalex.org/keywords/algorithm","display_name":"Algorithm","score":0.21432039141654968},{"id":"https://openalex.org/keywords/engineering","display_name":"Engineering","score":0.21127170324325562},{"id":"https://openalex.org/keywords/reliability-engineering","display_name":"Reliability engineering","score":0.19387173652648926},{"id":"https://openalex.org/keywords/artificial-intelligence","display_name":"Artificial intelligence","score":0.11220413446426392},{"id":"https://openalex.org/keywords/electrical-engineering","display_name":"Electrical engineering","score":0.10476180911064148},{"id":"https://openalex.org/keywords/materials-science","display_name":"Materials science","score":0.08950331807136536}],"concepts":[{"id":"https://openalex.org/C29652920","wikidata":"https://www.wikidata.org/wiki/Q7705757","display_name":"Test compression","level":4,"score":0.7063601613044739},{"id":"https://openalex.org/C163258240","wikidata":"https://www.wikidata.org/wiki/Q25342","display_name":"Power (physics)","level":2,"score":0.6492689847946167},{"id":"https://openalex.org/C150012182","wikidata":"https://www.wikidata.org/wiki/Q225990","display_name":"Scan chain","level":3,"score":0.6481168866157532},{"id":"https://openalex.org/C125411270","wikidata":"https://www.wikidata.org/wiki/Q18653","display_name":"Encoding (memory)","level":2,"score":0.6467413306236267},{"id":"https://openalex.org/C41008148","wikidata":"https://www.wikidata.org/wiki/Q21198","display_name":"Computer science","level":0,"score":0.6156225800514221},{"id":"https://openalex.org/C190874656","wikidata":"https://www.wikidata.org/wiki/Q5264347","display_name":"Design for testing","level":3,"score":0.5082923769950867},{"id":"https://openalex.org/C180016635","wikidata":"https://www.wikidata.org/wiki/Q2712821","display_name":"Compression (physics)","level":2,"score":0.4827398657798767},{"id":"https://openalex.org/C78548338","wikidata":"https://www.wikidata.org/wiki/Q2493","display_name":"Data compression","level":2,"score":0.45441991090774536},{"id":"https://openalex.org/C26517878","wikidata":"https://www.wikidata.org/wiki/Q228039","display_name":"Key (lock)","level":2,"score":0.4115288257598877},{"id":"https://openalex.org/C17626397","wikidata":"https://www.wikidata.org/wiki/Q837455","display_name":"Automatic test pattern generation","level":3,"score":0.40950465202331543},{"id":"https://openalex.org/C9390403","wikidata":"https://www.wikidata.org/wiki/Q3966","display_name":"Computer hardware","level":1,"score":0.40675127506256104},{"id":"https://openalex.org/C134146338","wikidata":"https://www.wikidata.org/wiki/Q1815901","display_name":"Electronic circuit","level":2,"score":0.37888699769973755},{"id":"https://openalex.org/C149635348","wikidata":"https://www.wikidata.org/wiki/Q193040","display_name":"Embedded system","level":1,"score":0.3218393325805664},{"id":"https://openalex.org/C530198007","wikidata":"https://www.wikidata.org/wiki/Q80831","display_name":"Integrated circuit","level":2,"score":0.26676541566848755},{"id":"https://openalex.org/C11413529","wikidata":"https://www.wikidata.org/wiki/Q8366","display_name":"Algorithm","level":1,"score":0.21432039141654968},{"id":"https://openalex.org/C127413603","wikidata":"https://www.wikidata.org/wiki/Q11023","display_name":"Engineering","level":0,"score":0.21127170324325562},{"id":"https://openalex.org/C200601418","wikidata":"https://www.wikidata.org/wiki/Q2193887","display_name":"Reliability engineering","level":1,"score":0.19387173652648926},{"id":"https://openalex.org/C154945302","wikidata":"https://www.wikidata.org/wiki/Q11660","display_name":"Artificial intelligence","level":1,"score":0.11220413446426392},{"id":"https://openalex.org/C119599485","wikidata":"https://www.wikidata.org/wiki/Q43035","display_name":"Electrical engineering","level":1,"score":0.10476180911064148},{"id":"https://openalex.org/C192562407","wikidata":"https://www.wikidata.org/wiki/Q228736","display_name":"Materials science","level":0,"score":0.08950331807136536},{"id":"https://openalex.org/C159985019","wikidata":"https://www.wikidata.org/wiki/Q181790","display_name":"Composite material","level":1,"score":0.0},{"id":"https://openalex.org/C62520636","wikidata":"https://www.wikidata.org/wiki/Q944","display_name":"Quantum mechanics","level":1,"score":0.0},{"id":"https://openalex.org/C51234621","wikidata":"https://www.wikidata.org/wiki/Q2149495","display_name":"Testability","level":2,"score":0.0},{"id":"https://openalex.org/C121332964","wikidata":"https://www.wikidata.org/wiki/Q413","display_name":"Physics","level":0,"score":0.0},{"id":"https://openalex.org/C111919701","wikidata":"https://www.wikidata.org/wiki/Q9135","display_name":"Operating system","level":1,"score":0.0},{"id":"https://openalex.org/C38652104","wikidata":"https://www.wikidata.org/wiki/Q3510521","display_name":"Computer security","level":1,"score":0.0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109/idt.2010.5724412","is_oa":false,"landing_page_url":"https://doi.org/10.1109/idt.2010.5724412","pdf_url":null,"source":null,"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"2010 5th International Design and Test Workshop","raw_type":"proceedings-article"}],"best_oa_location":null,"sustainable_development_goals":[{"display_name":"Affordable and clean energy","score":0.5799999833106995,"id":"https://metadata.un.org/sdg/7"}],"awards":[],"funders":[{"id":"https://openalex.org/F4320322668","display_name":"Kuwait University","ror":"https://ror.org/021e5j056"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":29,"referenced_works":["https://openalex.org/W1480380098","https://openalex.org/W1568407911","https://openalex.org/W1915664158","https://openalex.org/W1973512152","https://openalex.org/W2066929800","https://openalex.org/W2095752765","https://openalex.org/W2101818740","https://openalex.org/W2105182837","https://openalex.org/W2112651657","https://openalex.org/W2123172689","https://openalex.org/W2130149750","https://openalex.org/W2133378865","https://openalex.org/W2136680550","https://openalex.org/W2144888713","https://openalex.org/W2147049590","https://openalex.org/W2154471868","https://openalex.org/W2165516518","https://openalex.org/W2168419390","https://openalex.org/W2169854732","https://openalex.org/W3152022554","https://openalex.org/W4230084852","https://openalex.org/W4232226371","https://openalex.org/W6628752396","https://openalex.org/W6674440557","https://openalex.org/W6675519197","https://openalex.org/W6680497249","https://openalex.org/W6682699350","https://openalex.org/W6684123354","https://openalex.org/W6685002992"],"related_works":["https://openalex.org/W2789883751","https://openalex.org/W2143881398","https://openalex.org/W2147986372","https://openalex.org/W1979305473","https://openalex.org/W2274367941","https://openalex.org/W2075356617","https://openalex.org/W2074302528","https://openalex.org/W2092894550","https://openalex.org/W1974621628","https://openalex.org/W3088373974"],"abstract_inverted_index":{"Scan-based":[0],"testing":[1],"of":[2,25,58,81,92,115,119,128],"integrated":[3],"circuits":[4],"produces":[5],"significant":[6],"switching":[7],"activity":[8],"during":[9,121],"shift":[10,129],"and":[11,125,150,159],"capture":[12],"operations,":[13],"dissipating":[14],"excessive":[15],"power":[16,127,152],"levels":[17],"and,":[18],"possibly,":[19],"resulting":[20],"in":[21,33,51,95],"an":[22],"unexpected":[23],"behavior":[24],"the":[26,52,56,90,102,108,113,117],"design.":[27],"The":[28],"problem":[29],"is":[30],"further":[31],"accentuated":[32],"compression-based":[34,71],"scan;":[35],"as":[36,143],"don't":[37],"care":[38,47,93],"bits":[39,48,94],"are":[40,49,131],"exploited":[41],"to":[42,77,157],"compress":[43],"test":[44,68],"patterns,":[45],"additional":[46],"specified":[50],"deliverable":[53],"pattern,":[54],"limiting":[55],"effectiveness":[57],"x-filling":[59],"techniques.":[60],"In":[61,75],"this":[62],"work,":[63],"we":[64,87],"propose":[65],"a":[66,144],"low-power":[67],"method":[69],"for":[70],"reconfigurable":[72,109,140],"scan":[73,96,110,141],"architectures.":[74],"addition":[76],"their":[78],"key":[79],"objective":[80,114],"minimizing":[82],"Test":[83,166],"Data":[84],"Volume":[85],"(TDV),":[86],"illustrate":[88],"how":[89],"distribution":[91],"chains":[97],"can":[98],"be":[99],"manipulated,":[100],"using":[101,137],"different":[103],"encoding":[104],"configurations":[105],"supported":[106],"by":[107,155],"architecture,":[111],"with":[112],"reducing":[116],"number":[118],"transitions":[120],"test.":[122],"Hence,":[123],"peak":[124,151],"average":[126,149],"operation":[130],"effectively":[132],"reduced.":[133],"Experimental":[134],"results,":[135],"performed":[136],"one":[138],"possible":[139],"architecture":[142],"case":[145],"study,":[146],"indicate":[147],"that":[148],"may":[153],"reduce":[154],"up":[156],"33.8%":[158],"26.7%,":[160],"respectively,":[161],"without":[162],"affecting":[163],"TDV":[164],"and/or":[165],"Application":[167],"Time":[168],"(TAT).":[169]},"counts_by_year":[{"year":2015,"cited_by_count":1}],"updated_date":"2026-07-29T14:22:42.915294","created_date":"2025-10-10T00:00:00"}